Abstract: A test socket for an IC device has relatively thin contact interface wall having an array of double-ended pogo pins. The double-ended pogo pins provide resilient spring-loaded contacts for the I/O contacts of an IC device held in the socket as well as for the circuit contacts of a PC board to which the socket is mounted.

Abstract: A zero insertion force card edge connector for a printed circuit board assembly tester. The test connector includes a plurality of electrical contacts located within a slot of a housing. The contacts are connected to a test motherboard by a flexible circuit board. Also located within the slot is a plate which can be moved between an open position and a closed position by an actuator. When the plate is in the open position a printed circuit board assembly can be inserted into the test connector without having to overcome any spring forces of the connector. The circuit board assembly is inserted into the slot so that the contacts are aligned with surface pads located along an edge of the circuit board. The actuator is then actuated to move the plate into the closed position and push the contacts into the surface pads. The surface pads of the board are electrically connected to the test motherboard through the contacts and flexible circuit board.

Abstract: A button contact and array of button contacts are provided for surface mounting a leadless IC device to a circuit board. The button contacts of the button contact array have a substantially flat body lying in a plane and oppositedly directed contact points protruding from resiliently deflectable contact support arms of said body. The button contacts of the invention, which provide a low profile contact between surface mounted components, are suitable for high frequency applications, and particularly high frequency test and burn-in applications, and are relatively durable.