Probe interface test board

- Oz Technologies, Inc.
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Description

FIG. 1 is a top plan view of a probe interface test board showing our new design;

FIG. 2 is a bottom plan view thereof; and,

FIG. 3 is a front side elevational view thereof, the left, right, and rear elevational views being a mirror image.

Referenced Cited
U.S. Patent Documents
D255351 June 10, 1980 Pettijohn
D261760 November 10, 1981 Dlugos
D275659 September 25, 1984 Hackamack
D319629 September 3, 1991 Hasegawa et al.
3496514 January 1970 Gallentine
3813644 May 1974 Shlesinger, Jr.
4540229 September 10, 1985 Madden
4582383 April 15, 1986 Jo et al.
4655535 April 7, 1987 Kysiak
5008614 April 16, 1991 Shreeve et al.
Other references
  • Circuit boards on p. 144F of Electronic Design, Jan. 4, 1979.
Patent History
Patent number: D334175
Type: Grant
Filed: Apr 12, 1991
Date of Patent: Mar 23, 1993
Assignee: Oz Technologies, Inc. (Hayward, CA)
Inventors: Nasser Barabi (Oakland, CA), Iraj Barabi (Oakland, CA)
Primary Examiner: Wallace R. Burke
Assistant Examiner: Joel Sincavage
Attorney: Donald L. Beeson
Application Number: 7/684,356