Patents by Inventor Nitin Deshpande

Nitin Deshpande has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11056466
    Abstract: Systems and methods for improving heat distribution and heat removal efficiency in PoP semiconductor packages are provided. A PoP semiconductor package includes a first semiconductor package that is physically, communicably, and conductively coupled to a stacked second semiconductor package. A gap forms between the upper surface of the first semiconductor package and the lower surface of the second semiconductor package. Additionally, interstitial gaps form between each of the PoP semiconductor packages disposed on an organic substrate. A curable fluid material, such as a molding compound, may be flowed both in the interstitial spaces between the PoP semiconductor packages and into the gap between the upper surface of the first semiconductor package and the lower surface of the second semiconductor package.
    Type: Grant
    Filed: August 27, 2019
    Date of Patent: July 6, 2021
    Assignee: Intel Corporation
    Inventors: Omkar Karhade, Christopher L. Rumer, Nitin Deshpande, Robert M. Nickerson
  • Publication number: 20210066265
    Abstract: Disclosed herein are tunable capacitor arrangements in integrated circuit (IC) package substrates, as well as related methods and devices. For example, in some embodiments, an IC package substrate may include a first embedded capacitor, a second embedded capacitor, and a fuse electrically coupled between the first embedded capacitor and the second embedded capacitor such that when the fuse is in a closed state, the first embedded capacitor and the second embedded capacitor are connected in parallel, and when the fuse is in an open state, the first embedded capacitor and the second embedded capacitor are not connected in parallel.
    Type: Application
    Filed: August 28, 2019
    Publication date: March 4, 2021
    Applicant: Intel Corporation
    Inventors: Feras Eid, Aleksandar Aleksov, Telesphor Kamgaing, Georgios Dogiamis, Johanna M. Swan, Sivakumar Nagarajan, Nitin A. Deshpande, Omkar G. Karhade, William James Lambert
  • Publication number: 20200350181
    Abstract: Embodiments of the invention include device packages and methods of forming such packages. In an embodiment, the method of forming a device package may comprise forming a reinforcement layer over a substrate. One or more openings may be formed through the reinforcement layer. In an embodiment, a device die may be placed into one of the openings. The device die may be bonded to the substrate by reflowing one or more solder bumps positioned between the device die and the substrate. Embodiments of the invention may include a molded reinforcement layer. Alternative embodiments include a reinforcement layer that is adhered to the surface of the substrate with an adhesive layer.
    Type: Application
    Filed: June 29, 2020
    Publication date: November 5, 2020
    Inventors: Omkar G. KARHADE, Nitin A. DESHPANDE, Debendra MALLIK, Bassam M. ZIADEH, Yoshihiro TOMITA
  • Patent number: 10797000
    Abstract: A microelectronic structure includes a substrate having a first surface and a cavity extending into the substrate from the substrate first surface, a first microelectronic device and a second microelectronic device attached to the substrate first surface, and a bridge disposed within the substrate cavity and attached to the first microelectronic device and to the second microelectronic device. The bridge includes a plurality conductive vias extending from a first surface to an opposing second surface of the bridge, wherein the conductive vias are electrically coupled to deliver electrical signals from the substrate to the first microelectronic device and the second microelectronic device. The bridge further creates at least one electrical signal connection between the first microelectronic device and the second microelectronic device.
    Type: Grant
    Filed: January 22, 2019
    Date of Patent: October 6, 2020
    Assignee: Intel Corporation
    Inventors: Nitin A. Deshpande, Omkar G. Karhade
  • Publication number: 20200273768
    Abstract: IC packages including a heat spreading material comprising crystalline carbon. The heat spreading material may be applied directly to an IC die surface, for example at a die prep stage, prior to an application or build-up of packaging material, so that the high thermal conductivity may best mitigate any hot spots that develop at the IC die surface during operation. The heat spreading material may be applied to surface of the IC die.
    Type: Application
    Filed: February 27, 2019
    Publication date: August 27, 2020
    Applicant: Intel Corporation
    Inventors: Omkar Karhade, Nitin Deshpande, Mitul Modi, Edvin Cetegen, Aastha Uppal, Debendra Mallik, Sanka Ganesan, Yiqun Bai, Jan Krajniak, Kumar Singh
  • Publication number: 20200273772
    Abstract: An apparatus is provided which comprises: a package substrate, an integrated circuit device coupled to a surface of the package substrate, a first material on the surface of the package substrate, the first material contacting one or more lateral sides of the integrated circuit device, the first material extending at least to a surface of the integrated circuit device opposite the package substrate, two or more separate fins over a surface of the integrated circuit device, the two or more fins comprising a second material having a different composition than the first material, and a third material having a different composition than the second material, the third material over the surface of the integrated circuit device and between the two or more fins. Other embodiments are also disclosed and claimed.
    Type: Application
    Filed: February 27, 2019
    Publication date: August 27, 2020
    Applicant: Intel Corporation
    Inventors: Aastha Uppal, Omkar Karhade, Ram Viswanath, Je-Young Chang, Weihua Tang, Nitin Deshpande, Mitul Modi, Edvin Cetegen, Sanka Ganesan, Yiqun Bai, Jan Krajniak, Kumar Singh
  • Patent number: 10741419
    Abstract: Embodiments of the invention include device packages and methods of forming such packages. In an embodiment, the method of forming a device package may comprise forming a reinforcement layer over a substrate. One or more openings may be formed through the reinforcement layer. In an embodiment, a device die may be placed into one of the openings. The device die may be bonded to the substrate by reflowing one or more solder bumps positioned between the device die and the substrate. Embodiments of the invention may include a molded reinforcement layer. Alternative embodiments include a reinforcement layer that is adhered to the surface of the substrate with an adhesive layer.
    Type: Grant
    Filed: July 18, 2019
    Date of Patent: August 11, 2020
    Assignee: Intel Corporation
    Inventors: Omkar G. Karhade, Nitin A. Deshpande, Debendra Mallik, Bassam M. Ziadeh, Yoshihiro Tomita
  • Publication number: 20200227332
    Abstract: An integrated circuit package may be formed having at least one heat dissipation structure within the integrated circuit package itself. In one embodiment, the integrated circuit package may include a substrate; at least one integrated circuit device, wherein the at least one integrated circuit device is electrically attached to the substrate; a mold material on the substrate and adjacent to the at least one integrated circuit device; and at least one heat dissipation structure contacting the at least one integrated circuit, wherein the at least one heat dissipation structure is embedded either within the mold material or between the mold material and the substrate.
    Type: Application
    Filed: January 10, 2019
    Publication date: July 16, 2020
    Applicant: Intel Corporation
    Inventors: Kumar Abhishek Singh, Omkar Karhade, Nitin Deshpande, Mitul Modi, Edvin Cetegen, Aastha Uppal, Debendra Mallik, Sanka Ganesan, Yiqun Bai, Jan Krajniak, Manish Dubey, Ravindranath Mahajan, Ram Viswanath, James C. Matayabas, JR.
  • Publication number: 20200203839
    Abstract: Disclosed herein are antenna boards, antenna modules, and communication devices. For example, in some embodiments, an antenna board may include a plurality of antenna patches coupled to a dielectric material and a plurality of pedestals extending from a face of the dielectric material and at least partially embedded in the dielectric material.
    Type: Application
    Filed: December 21, 2018
    Publication date: June 25, 2020
    Applicant: Intel Corporation
    Inventors: Omkar G. Karhade, William James Lambert, Xiaoqian Li, Nitin A. Deshpande, Debendra Mallik
  • Patent number: 10672626
    Abstract: Embodiments describe a semiconductor package that includes a substrate, a die bonded to the substrate, and a solder paste overmold layer formed over a top surface of the die. In an embodiment, the solder paste comprises a high-melting point metal, a solder matrix, intermetallic compounds and a polymer. The overmold layer has a high elastic modulus, a coefficient of thermal expansion similar to the substrate, and reduces the warpage of the package. In an embodiment, interconnects of a semiconductor package are formed with a no-slump solder paste that includes vents. Vents may be formed through a conductive network formed by the high-melting point metal, solder matrix and intermetallic compounds. In an embodiment, vents provide a path through the interconnect that allows for moisture outgassing. In an embodiment, a mold layer may be mechanically anchored to the interconnects by the vents, thereby providing improved mechanical continuity to the mold layer.
    Type: Grant
    Filed: March 24, 2017
    Date of Patent: June 2, 2020
    Assignee: Intel Corporation
    Inventors: Omkar G. Karhade, Nitin A. Deshpande, Aditya S. Vaidya, Nachiket R. Raravikar, Eric J. Li
  • Patent number: 10595409
    Abstract: Embodiments of the present disclosure are directed towards electro-magnetic interference (EMI) shielding techniques and configurations. In one embodiment, an apparatus includes a first substrate, a die having interconnect structures coupled with the first substrate to route input/output (I/O) signals between the die and the first substrate and a second substrate coupled with the first substrate, wherein the die is disposed between the first substrate and the second substrate and at least one of the first substrate and the second substrate include traces configured to provide electro-magnetic interference (EMI) shielding for the die. Other embodiments may be described and/or claimed.
    Type: Grant
    Filed: June 20, 2017
    Date of Patent: March 17, 2020
    Assignee: INTEL CORPORATION
    Inventors: Adel A. Elsherbini, Ravindranath Mahajan, John S. Guzek, Nitin A. Deshpande
  • Publication number: 20200051956
    Abstract: A semiconductor package is disclosed. The semiconductor package includes a package substrate, at least one bottom die coupled to the package substrate, at least one interposer coupled to the package substrate and a top die above the at least one bottom die and the at least one interposer and coupled to the at least one bottom die and the at least one interposer. The semiconductor package also includes a plurality of pillars that connect the top die to the package substrate through the at least one interposer.
    Type: Application
    Filed: August 9, 2018
    Publication date: February 13, 2020
    Inventors: Omkar KARHADE, Nitin DESHPANDE, Debendra MALLIK
  • Publication number: 20190385983
    Abstract: Systems and methods for improving heat distribution and heat removal efficiency in PoP semiconductor packages are provided. A PoP semiconductor package includes a first semiconductor package that is physically, communicably, and conductively coupled to a stacked second semiconductor package. A gap forms between the upper surface of the first semiconductor package and the lower surface of the second semiconductor package. Additionally, interstitial gaps form between each of the PoP semiconductor packages disposed on an organic substrate. A curable fluid material, such as a molding compound, may be flowed both in the interstitial spaces between the PoP semiconductor packages and into the gap between the upper surface of the first semiconductor package and the lower surface of the second semiconductor package.
    Type: Application
    Filed: August 27, 2019
    Publication date: December 19, 2019
    Applicant: Intel Corporation
    Inventors: OMKAR KARHADE, CHRISTOPHER L. RUMER, NITIN DESHPANDE, ROBERT M. NICKERSON
  • Publication number: 20190341271
    Abstract: Embodiments of the invention include device packages and methods of forming such packages. In an embodiment, the method of forming a device package may comprise forming a reinforcement layer over a substrate. One or more openings may be formed through the reinforcement layer. In an embodiment, a device die may be placed into one of the openings. The device die may be bonded to the substrate by reflowing one or more solder bumps positioned between the device die and the substrate. Embodiments of the invention may include a molded reinforcement layer. Alternative embodiments include a reinforcement layer that is adhered to the surface of the substrate with an adhesive layer.
    Type: Application
    Filed: July 18, 2019
    Publication date: November 7, 2019
    Inventors: Omkar G. KARHADE, Nitin A. DESHPANDE, Debendra MALLIK, Bassam M. ZIADEH, Yoshihiro TOMITA
  • Publication number: 20190330051
    Abstract: Embodiments include a microelectronic device package structure having a die on a substrate, where a first side of the die is electrically coupled to the substrate, and a second side of the die is covered with a first material having a first thermal conductivity. A second material is adjacent to a sidewall of the die and adjacent to a sidewall of the first material. The second material has second thermal conductivity, smaller than the first thermal conductivity. The second material may have mechanical and/or underfill properties superior to those of the first material. Together, the two materials may provide a package structure having enhanced thermal and mechanical performance.
    Type: Application
    Filed: April 25, 2018
    Publication date: October 31, 2019
    Applicant: Intle Corporation
    Inventors: Omkar G. Karhade, Nitin A. Deshpande
  • Patent number: 10438930
    Abstract: Systems and methods for improving heat distribution and heat removal efficiency in PoP semiconductor packages are provided. A PoP semiconductor package includes a first semiconductor package that is physically, communicably, and conductively coupled to a stacked second semiconductor package. A gap forms between the upper surface of the first semiconductor package and the lower surface of the second semiconductor package. on an organic substrate. A curable fluid material, such as a molding compound, may be flowed both in the interstitial spaces between the PoP semiconductor packages and into the gap between the upper surface of the first semiconductor package and the lower surface of the second semiconductor package.
    Type: Grant
    Filed: June 30, 2017
    Date of Patent: October 8, 2019
    Assignee: Intel Corporation
    Inventors: Omkar Karhade, Christopher L. Rumer, Nitin Deshpande, Robert M. Nickerson
  • Patent number: 10403512
    Abstract: Embodiments of the invention include device packages and methods of forming such packages. In an embodiment, the method of forming a device package may comprise forming a reinforcement layer over a substrate. One or more openings may be formed through the reinforcement layer. In an embodiment, a device die may be placed into one of the openings. The device die may be bonded to the substrate by reflowing one or more solder bumps positioned between the device die and the substrate. Embodiments of the invention may include a molded reinforcement layer. Alternative embodiments include a reinforcement layer that is adhered to the surface of the substrate with an adhesive layer.
    Type: Grant
    Filed: February 19, 2018
    Date of Patent: September 3, 2019
    Assignee: Intel Corporation
    Inventors: Omkar G. Karhade, Nitin A. Deshpande, Debendra Mallik, Bassam M. Ziadeh, Yoshihiro Tomita
  • Publication number: 20190259713
    Abstract: Techniques for reducing warpage for microelectronic packages are provided. A warpage control layer or stiffener can be attached to a bottom surface of a substrate or layer that is used to attach the microelectronics package to a motherboard. The warpage control layer can have a thickness approximately equal to a thickness of a die of the microelectronics package. A coefficient of thermal expansion of the warpage control layer can be selected to approximately match a CTE of the die. The warpage control layer can be formed from an insulating material or a metallic material. The warpage control layer can comprise multiple materials and can include copper pillar segments to adjust the effective CTE of the warpage control layer. The warpage control layer can be positioned between the microelectronics package and the motherboard, thereby providing warpage control without contributing to the z-height of the microelectronics package.
    Type: Application
    Filed: February 20, 2019
    Publication date: August 22, 2019
    Applicant: INTEL CORPORATION
    Inventors: ERIC J. LI, GUOTAO WANG, HUIYANG FEI, SAIRAM AGRAHARAM, OMKAR G. KARHADE, NITIN A. DESHPANDE
  • Publication number: 20190157205
    Abstract: A microelectronic structure includes a substrate having a first surface and a cavity extending into the substrate from the substrate first surface, a first microelectronic device and a second microelectronic device attached to the substrate first surface, and a bridge disposed within the substrate cavity and attached to the first microelectronic device and to the second microelectronic device. The bridge includes a plurality conductive vias extending from a first surface to an opposing second surface of the bridge, wherein the conductive vias are electrically coupled to deliver electrical signals from the substrate to the first microelectronic device and the second microelectronic device. The bridge further creates at least one electrical signal connection between the first microelectronic device and the second microelectronic device.
    Type: Application
    Filed: January 22, 2019
    Publication date: May 23, 2019
    Applicant: INTEL CORPORATION
    Inventors: Nitin A. Deshpande, Omkar G. Karhade
  • Publication number: 20190148268
    Abstract: Underfill material flow control for reduced die-to-die spacing in semiconductor packages and the resulting semiconductor packages are described. In an example, a semiconductor apparatus includes first and second semiconductor dies, each having a surface with an integrated circuit thereon coupled to contact pads of an uppermost metallization layer of a common semiconductor package substrate by a plurality of conductive contacts, the first and second semiconductor dies separated by a spacing. A barrier structure is disposed between the first semiconductor die and the common semiconductor package substrate and at least partially underneath the first semiconductor die. An underfill material layer is in contact with the second semiconductor die and with the barrier structure, but not in contact with the first semiconductor die.
    Type: Application
    Filed: December 20, 2018
    Publication date: May 16, 2019
    Inventors: Omkar G. KARHADE, Nitin A. DESHPANDE, Rajendra C. DIAS, Edvin CETEGEN, Lars D. SKOGLUND