Abstract: In a microscope system in which at least one of a stage on which a sample 4 is mounted and an objective lens 6 can move relatively in a direction of an optical axis, a contact judgment section 12 judges the possibility of contact between the sample 4 and the objective lens 6 based on a result of comparison between a detection output from a contact sensor 11 which detects contact between the sample 4 and the objective lens 6 and a preset threshold value, excessive contact between the sample 4 and the objective lens 6 is avoided based on a result of this judgment, and a threshold value in the contact judgment section 12 is updated based on the output from the contact sensor 11 every predetermined time.

Abstract: A driving circuit for an optical scanner includes an oscillation driving device for oscillating a moving plate, an oscillation detecting device for detecting the oscillating condition of the moving plate, an oscillating frequency control device for controlling the amplitude of a torsional oscillation of the moving plate, and an oscillating amplitude control device for controlling the amplitude of the torsional oscillation of the moving plate. The driving circuit is thus constructed so that the oscillation of a scanner can be controlled with a high degree of accuracy.

Abstract: A driving circuit for an optical scanner includes an oscillation driving device for oscillating a moving plate, an oscillation detecting device for detecting the oscillating condition of the moving plate, an oscillating frequency control device for controlling the amplitude of a torsional oscillation of the moving plate, and an oscillating amplitude control device for controlling the amplitude of the torsional oscillation of the moving plate. The driving circuit is thus constructed so that the oscillation of a scanner can be controlled with a high degree of accuracy.

Abstract: In a microscope system in which at least one of a stage on which a sample 4 is mounted and an objective lens 6 can move relatively in a direction of an optical axis, a contact judgment section 12 judges the possibility of contact between the sample 4 and the objective lens 6 based on a result of comparison between a detection output from a contact sensor 11 which detects contact between the sample 4 and the objective lens 6 and a preset threshold value, excessive contact between the sample 4 and the objective lens 6 is avoided based on a result of this judgment, and a threshold value in the contact judgment section 12 is updated based on the output from the contact sensor 11 every predetermined time.

Abstract: An optical scanner driving apparatus comprises a moving plate having a reflection plane and a driving coil, a magnetic field generating section arranged in a vicinity of the moving plate, a driving circuit to supply a driving signal to the driving coil, a first output acquiring section to acquire an output containing an electromotive force generated in the driving coil by an electromagnetic induction, a second output acquiring section comprising an impedance element having a corresponding impedance to an impedance of the driving coil, to acquire an output generated by the impedance element by supplying the driving signal to the impedance element, and a control circuit to control a state of the torsional vibration of the moving plate according to the electromotive force generated in the driving coil on the basis of the outputs acquired by the first output acquiring section and the second output acquiring section.

Abstract: A conductive cantilever having a conductive probe on its free end is supported by a piezoelectric element, which oscillates upon reception of an AC voltage from a first AC voltage supply unit. An AC voltage is applied between a conductive sample and the probe by a variable DC voltage supply unit and a second AC voltage supply unit. An AM demodulator demodulates a signal from a displacement meter at an angular frequency of the first AC voltage supply unit. A lowpass filter extracts a DC component from an output signal from the AM demodulator, and a synchronism detector extracts a component concerning to the angular frequency twice as high as that of the second AC voltage supply unit from the AM demodulator output signal. A Z controller controls a position of a tube scanner based on an output signal from the subtracter which subtracts an output signal of the synchronism detector from an output signal of the lowpass filter.

Abstract: A scanning probe microscope for measuring the electrical properties of the surface of a sample comprises a first sensor for detecting electrical information for the sample surface and outputting a first electrical signal corresponding thereto, the first sensor including an electrically conductive probe located near the surface of the sample, a second sensor for detecting the distance between the probe and the sample and outputting a second electrical signal corresponding thereto, an actuator for relatively moving the probe and the sample in a three-dimensional manner, a servo control mechanism for adjusting the distance between the probe and the sample to a desired value by servo control in accordance with the second electrical signal while the electrical information is being detected by the first sensor, and a processing unit for processing the first electrical signal.

Abstract: A scanning probe microscope having a probe for scanning a sample, a piezoelectric unit finely movable in the X, Y and Z directions, and a probe control unit for controlling a fine movement amount of the piezoelectric unit in the Z direction in accordance with a detected interaction between the sample and the probe. A driving unit applies a continuously changing voltage to the piezoelectric unit to drive the piezoelectric unit in one of an X and Y direction to scan along a scan line, a displacement detection unit detects the displacement of the piezoelectric unit along the scan line, and a matching detection unit outputs a coincidence detection signal when the detected displacement of the piezoelectric unit along the scan line coincides with target displacement values corresponding to desired measurement points.

Abstract: A microorganism belonging to the genus Pseudomonas; an alkaline lipase produced by the microorganism or its mutants; a method of producing the alkaline lipase; and detergents containing the alkaline lipase as an aid, the alkaline lipase having (1) an operative pH of from 4 to 11.5, and an optimum pH of from 7.0 to 9.5, as measured using triolein emulsion as a substrate; (2) an operative temperature of from 10.degree. to 80.degree. C., and an optimum temperature of from 55.degree. to 65.degree. C., as measured using triolein emulsion as a substrate; (3) a molecular weight of 28,000 .+-.2,000 as measured by electrophoresis using SDS polyacrylamide; (4) isoelectric point of 4.5 .+-.1.5 as measured by isoelectric focusing polyacrylamide gel electrophoresis; and (5) an inhibition of lipase activity by a detergent component of not higher than 50% as measured using sodium linear-alkylbenzenesulfonate as said detergent component.

Abstract: An integrated AFM sensor includes a cantilever which has two beams extending from a support portion. The beams are integrated with each other at their ends to form a triangular free end, and a probe having a sharp distal end is arranged at the free end. The cantilever is formed by stacking a passivation layer, a piezoresistive layer, and a silicon layer. Electrodes electrically connected to the piezoresistive layer are formed at the fixed end of the cantilever through contact holes.