Abstract: A semiconductor device evaluation apparatus is provided with a test board. A print wiring is provided at a first surface of the test board on which a semiconductor device is mounted. A terminal of the semiconductor device is connected to the print wiring. A power circuit is provided at a second surface opposite to the first surface of the test board. The power circuit is connected to the print wiring and actuates the semiconductor device. The apparatus is also provided with a magnetic field detector arranged above the print wiring and detects a magnetic field generated from the print wiring. Further, the apparatus is provided with a current detector detecting a value of current carried through the print wiring based on the magnitude of the magnetic field detected by the magnetic field detector.

Abstract: A magnetic field sensor is provided which can be easily downsized and has a capability to detect a magnetic field in the Ghz band with a high space resolution and to reduce a voltage induced by an electric field. The magnetic field sensor is composed of a first layer, a second layer and a third layer. The first layer is provided with a straight-lined conductor pattern disposed in a perpendicular manner to a mid-point of another straight-lined conductor pattern being the longest among J-shaped conductor patterns. The third layer has the same conductor pattern as the first layer. The second layer has a ladle-shaped conductor pattern disposed along the center of the width of the conductor pattern of the first layer and third layer and an L-shaped conductor pattern disposed so as to form a loop face to face with the bending section of the J-shaped conductor pattern.

Abstract: Disclosed is a waveform analyzer, which inputs measured data of an electronic device to be analyzed; generates an orthogonal analyzing wavelet; produces wavelet-analyzed components in which the measured data is wavelet-transformed into a plurality of wavelet spectra by using the orthogonal analyzing wavelet, thereafter the plurality of wavelet spectra are inverse-wavelet-transformed to produce the wavelet-analyzed components; and adds up a component with an order corresponding to a desired filter characteristic of the wavelet-analyzed components to get a filtered waveform.

Abstract: A rack for mounting communication apparatuses or similar electronic apparatuses. The rack has a pair of posts symmetrical to each other in the right-and-left direction and each having a section in the form of a letter C. The posts are positioned such that the open side of "C" faces outward. A shelf included in an electronic apparatus is mounted to the posts. The posts are tied to each other by a top frame at upper ends and affixed to a base at lower ends. A generally L-shaped reinforcing member is connected to the lower portion of each post such that the longer side of "L" is parallel to the closed side of "C" representing the post, thereby providing the lower portion of the post with a hollow rectangular section. The reinforcing member is not connected to the base.

Abstract: Bidimensional electromagnetic emission level monitoring equipment for detecting the electric fields or the magnetic fields of RF (Radio Frequency) emissions from equipment under test by moving an electromagnetic probe bidimensionally. The measuring frequency, the scanning range of the probe, and the distance between measuring points are entered on a keyboard of a controller. A spectrum analyzer selectively receives RF emissions of a designated frequency from the probe in response to an instruction from the controller and feeds emission level signal data to the controller as digital signals. A probe scanning section loaded with the probe is moved bidimensionally by a motor driver under the control of the controller. The controller delivers to a display an emission level distribution signal representative of an electromagnetic distribution based on the emission level data and position data associated with the probe.

Abstract: A shielding member includes magnetic and conductive members. The magnetic and conductive members are alternately arranged. At least one of the conductive members may be replaced with an elastic conductive electromagnetic shielding member.

Abstract: Spherical graphite cast iron utilized to prepare a lapping tool is manufactured by casting a molten composition into a mold cavity, and by chilling one side of the resulting casting thereby causing unidirectional solidification, the one side being used as the operating surface of the lapping tool. The molten composition consists of 3.0-3.8 wt. % of carbon, 2.0-2.9 wt. % of silicon, 0.3-0.9 wt. % of manganese, less than 0.05 wt. % of phosphorus, less than 0.03 wt. % of sulfur, 0.2-1.0 wt. % of nickel, 0-0.8 wt. % of copper, 0.05-0.5 wt. % of molybdenum, 0.03-0.09 wt. % of magnesium and the balance of iron. The lapping tool made of this casting has a percentage of sphericity of higher than 80%, graphite particle diameter of less than 100 microns, a density of graphite particles of larger than 70/mm.sup.2, and a Vickers hardness of larger than 200.

Abstract: A method and apparatus of transforming a bit-reversed order vector into a natural order vector in a vector processing system. The invention includes a main memory having a multi-bank system, stored optimal access-address interval information, bit-reversed order sequence circuity, and permutation circuitry. The invention executes bit-reversal processing without giving rise to bank conflict.

Abstract: Spherical graphite cast iron utilized to prepare a lapping tool is manufactured by casting a molten composition into a mold cavity, and by chilling one side of the resulting casting thereby causing unidirectional solidification, the one side being used as the operating surface of the lapping tool. The molten composition consists essentially of 3.0-3.8 wt. % of carbon, 2.0-2.9 wt. % of silicon, 0.3-0.9 wt. % of manganese, less than 0.05 wt. % of phosphorus, less than 0.03 wt. % of sulfur, 0.2-1.0 wt. % of nickel, 0-0.8 wt. % of copper, 0.05-0.5 wt. % of molybdenum, 0.03-0.09 wt. % of magnesium and the balance of iron. The lapping tool made of this casting has a percentage of sphericity of higher than 80%, graphite particle diameter of less than 100 microns, a density of graphite particles of larger than 70/mm.sup.2, and a Vickers hardness of larger than 200.