Abstract: A high voltage generation circuit for use with a semiconductor memory device includes a plurality of high voltage generation units and a control circuit. The high voltage generation units generate high voltages having different voltage levels in response to corresponding clock signals. The control circuit generates clock signals, which do not toggle simultaneously, based on the voltage levels of the high voltages.

Abstract: Integrated circuit devices include operational circuits that are configured to operate from power supply voltages and from high voltages that are generated in the integrated circuit device from the power supply voltages. A circuit for measuring the high voltages is also provided in the integrated circuit. The circuit includes a common high voltage measurement pad and high voltage switch units connected to the common high voltage measurement pad. A respective high voltage switch unit is configured to transmit a corresponding one of the high voltages to the common high voltage measurement pad in response to a corresponding enable signal. The operational circuits may be non-volatile memory cells, such as flash memory cells. Related methods of measuring high voltages in an integrated circuit device are also described.

Abstract: A nonvolatile memory device and programming method and apparatus therefore are described that include operatively coupled first and second sense amplifiers having first and second data registers or latches, a storage circuit for storing a data of the second amplifier, a pass/fail check circuit for checking the content of the second data register whether a cell of the memory device has been sufficiently programmed and a restore circuit for resetting the second data register for reprogramming the device until sufficiently programmed.

Abstract: A method and apparatus for controlling two or more non-volatile memory devices includes activating a read enable signal or a write enable signal, which is input to the first and second non-volatile memory devices, using a controller. A first chip enable signal is alternately activated for selecting the first non-volatile memory device and a second chip enable signal is activated for selecting the second non-volatile memory device using the controller. This is done while the read enable signal or the write enable signal is input to the first and second non-volatile memory devices being activated. Accordingly, even when the minimum cycle of the controller is longer than that of a memory device read/write time is reduced, thereby improving read/write performance.

Abstract: A high voltage generation circuit for use with a semiconductor memory device includes a plurality of high voltage generation units and a control circuit. The high voltage generation units generate high voltages having different voltage levels in response to corresponding clock signals. The control circuit generates clock signals, which do not toggle simultaneously, based on the voltage levels of the high voltages.

Abstract: A high voltage generation circuit includes a delay circuit configured to generate multiple delay clock signals based on a clock signal. The delay clock signals include corresponding different predetermined delay times. The high voltage generation circuit further includes multiple pumps corresponding to the delay clock signals. The pumps are configured to perform a charge pumping operation in response to the corresponding delay clock signals to generate a high voltage.

Abstract: A memory system and a method of provided scrambled address data are disclosed. The method includes converting external address data into row and column addresses provided to a flash memory device, and designating certain scrambled address data values within the external address data and ignoring a current data access operation associated with external address data including a scrambled address data value, such that the plurality of physical pages in each memory block is not selected by the internal address data.

Abstract: In one aspect, a programming method is provided for a non-volatile semiconductor memory device which includes a plurality of electrically programmable and erasable memory cells, and transmission transistors for providing predetermined voltages to the memory cells. The method includes a primary programming process which includes providing a first program voltage to a selected memory cell to program the selected memory cell, a verify read process which includes reading the selected memory cell to verify a programmed status of the selected memory cell resulting from the primary programming process, and a secondary programming process which includes providing a second program voltage to the selected memory cell so as to reprogram the selected memory cell after the verify read process. During the verify read process, the transmission transistors are continuously gated by a boosted voltage generated during the primary programming process.

Abstract: An external sound outputting device is provided. The external sound outputting device includes a connection connector and a speaker unit. The connection connector is inserted into a connection terminal of a portable terminal. The speaker unit outputs an electric signal delivered through the connection connector as an audio signal. The speaker unit rotates in multi-directions when the connection connector is connected to the portable terminal.

Abstract: A nonvolatile memory device and programming method and apparatus therefore are described that include operatively coupled first and second sense amplifiers having first and second data registers or latches, a storage circuit for storing a data of the second amplifier, a pass/fail check circuit for checking the content of the second data register whether a cell of the memory device has been sufficiently programmed and a restore circuit for resetting the second data register for reprogramming the device until sufficiently programmed.

Abstract: An apparatus for improving reception sensitivity of a public wave receiver includes power devices formed in a power supply of the public wave receiver, and a shielding plate for shielding noise generated by the power devices. A signal line for connecting an antenna used for the public wave receiver to a public wave receiver main body and a ground line are formed coaxially to each other by a shield layer.

Abstract: A program method of a non-volatile memory device comprises setting a string select line to a predetermined voltage, setting a selected word line to a program voltage and unselected word lines to a pass voltage respectively. The program voltage is varied according to an arrangement of the selected word line. Problems arising from capacitive coupling between adjacent signal lines are alleviated.

Abstract: A nonvolatile memory device and programming method and apparatus therefore are described that include operatively coupled first and second sense amplifiers having first and second data registers or latches, a storage circuit for storing a data of the second amplifier, a pass/fail check circuit for checking the content of the second data register whether a cell of the memory device has been sufficiently programmed and a restore circuit for resetting the second data register for reprogramming the device until sufficiently programmed.

Abstract: A multi-chip semiconductor memory device may comprise of a plurality of memory chips sharing a predetermined chip enable signal. Each of the plurality of memory chips may comprise of an active internal power supply generation circuit configured to convert an external power supply voltage into an internal power supply voltage and to be disabled in response to deactivation of a predetermined drive control signal. Each of the plurality of memory chips may also comprise of a conversion control circuit for generating the drive control signal, wherein the drive control signal is deactivated in an interval in which any of the plurality of memory chips is in an active interval.

Abstract: A flash memory device having a memory cell string is programmed. The flash memory device includes a plurality of memory cells. During a programming cycle, application of a program voltage to a channel region of the plurality of memory cells is delaying until after a gate of each of the memory cells of the plurality of memory cells that is to be programmed has reached a programming voltage Vpgm.

Abstract: A flash memory device includes a plurality of data pads to receive data from an adjacent plurality of data pins. A signal generation circuit generates a plurality of selection signals responsive to bit organization and package signals. A buffer circuit buffers the data from the plurality of data pads. An input switch receives the data from the buffer circuit and transmits the data to the data lines responsive to the selection signals. And an output switch provides data to the buffer circuit responsive to the selection signals.

Abstract: A nonvolatile memory device and programming method and apparatus therefore are described that include operatively coupled first and second sense amplifiers having first and second data registers or latches, a storage circuit for storing a data of the second amplifier, a pass/fail check circuit for checking the content of the second data register whether a cell of the memory device has been sufficiently programmed and a restore circuit for resetting the second data register for reprogramming the device until sufficiently programmed.

Abstract: A nonvolatile memory device and programming method and apparatus therefore are described that include operatively coupled first and second sense amplifiers having first and second data registers or latches, a storage circuit for storing a data of the second amplifier, a pass/fail check circuit for checking the content of the second data register whether a cell of the memory device has been sufficiently programmed and a restore circuit for resetting the second data register for reprogramming the device until sufficiently programmed.

Abstract: A nonvolatile memory device and programming method and apparatus therefore are described that include operatively coupled first and second sense amplifiers having first and second data registers or latches, a storage circuit for storing a data of the second amplifier, a pass/fail check circuit for checking the content of the second data register whether a cell of the memory device has been sufficiently programmed and a restore circuit for resetting the second data register for reprogramming the device until sufficiently programmed.

Abstract: The present invention relates to a nonvolatile semiconductor memory, that is, a flash memory and especially to a NAND type flash memory device capable of selectively controlling data input/output units by an address control. In the NAND type flash memory device, a memory cell array is divided into a plurality of blocks, and a data input/output path is selectively controlled by a predetermined data rate option and introduced addresses to perform data input/output operations at a ×8 or ×16 speed in one chip.