Abstract: A method and a flip-flop for designing low power integrated circuits (IC's). The method includes receiving at least one of a clock signal, a data signal, and a complimentary data signal. The complimentary data signal is produced by an input data inverter present in the flip-flop. Further, the method includes generating at least one master internal signal based on the received at least one of the clock signal, the data signal, and the complimentary data signal, when the clock signal is at a low logic level. Further, the method includes generating at least one slave internal signal based on at least one of the received clock signal and the generated at least one master internal signal, when the clock signal is at a high logic level. Further, the method includes generating an output signal based on the generated at least one slave internal signal.

Abstract: A fin-Field Effect Transistor based system on chip (SoC) memory is provided and includes a control block, first logic gates, and row decoder blocks. The control block includes a clock generator circuit that generates an internal clock signal, and a global driver circuit coupled to the clock generator circuit that drives a global clock signal. Each row decoder block includes a second logic gate that receives higher order non-clocked address signals via input terminals, a transmission gate that combines the global clock signal and the higher order non-clocked address signals, third logic gates that receive lower order non-clocked address signals and higher order clocked address signals, and output a combined lower order address and higher order address along with the global clock signal, level shifter circuits that receive the outputs, and word-line driver circuits that generate word-lines based on the output of the level shifter circuits.

Abstract: A method and a flip-flop for designing low power integrated circuits (IC's). The method includes receiving at least one of a clock signal, a data signal, and a complimentary data signal. The complimentary data signal is produced by an input data inverter present in the flip-flop. Further, the method includes generating at least one master internal signal based on the received at least one of the clock signal, the data signal, and the complimentary data signal, when the clock signal is at a low logic level. Further, the method includes generating at least one slave internal signal based on at least one of the received clock signal and the generated at least one master internal signal, when the clock signal is at a high logic level. Further, the method includes generating an output signal based on the generated at least one slave internal signal.

Abstract: A method and a sense amplifier flip-flop (SAFF) for fixing setup time violations in an integrated circuit (IC) design. The SAFF includes a master latch coupled to a slave latch, wherein the master latch includes a sense amplifier and the SAFF is configured with an equal number of p-type metal oxide semiconductor (PMOS) transistors and n-type metal oxide semiconductor (NMOS) transistors to reduce block area of an integrated circuit (IC). The method includes receiving a clock signal, receiving a data signal, applying the data signal to the sense amplifier when the clock signal is at a low level, wherein a portion of the sense amplifier is responsive to the inverted clock signal, storing a value of the data signal in the slave latch when the clock signal transitions from the low level to the high level, and providing an output signal from the slave latch.

Abstract: A D flip-flop includes a master block configured to latch an input value of D at one of rising edge and a falling edge of a clock signal, based on the clock signal, the input value of D, and an inverted value of D, and a slave block configured to propagate the input value of D at another one of the falling edge and the rising edge of the clock signal, based on the clock signal.

Abstract: Embodiments herein provide a method for reducing power dissipation in a Static Random Access Memory (SRAM) device. The method includes determining, by the tracking circuit, whether at least one SRAM Bit-Cell discharges power from at least one BL exceeding a pre-defined voltage level required for a sense amplifier to perform a read operation. Furthermore, the method includes reducing, by the WL driver, the power discharged from the at least one BL by controlling a WL voltage power supply switch of the WL driver using a SAE signal and adjusting a pulse width of the at least one WL to pull down the at least one WL using a NMOS circuit when the at least one SRAM Bit-Cell discharges the power from the at least one BL exceeding the pre-defined voltage level.

Abstract: A memory for providing a signal buffering scheme for array and periphery signals and the operating method of the same are provided. The memory includes a plurality of columns of memory cells, a control circuit, and a control logic unit. The plurality of columns of memory cells may be connected to a local array signal generator via local control lines, which are connected to a global array signal generator via global control lines for receiving array signals. The control circuit may be connected to the memory cells for providing periphery signals. The control logic unit may be connected to the memory cells through a hierarchical structure of the global control lines and the local control lines. The control logic unit may be configured to provide the array signals and periphery signals having the same polarity to the global control lines and the local control lines.

Abstract: A static random-access memory (SRAM) system using a virtual banking architecture includes a processor communicatively coupled to an SRAM, and a plurality of circuits disposed in the SRAM and operated under control of the processor. The circuits include a divide circuit, a select circuit disposed in the divide circuit, and a local input/output circuit. The divide circuit divides a bank into first and second bit cell arrays, in which the first bit cell array and/or the second bit cell array includes at least one bit line. The select circuit is connected between the first and second bit cell arrays, and the select circuit selects one of the first and second bit cell arrays according to a predefined select logic. The local input/output circuit is connected to the select circuit and generates an output according to one or more predefined operations of the local input/output circuit.

Abstract: Embodiments herein provide a method for reducing power dissipation in a Static Random Access Memory (SRAM) device. The method includes determining, by the tracking circuit, whether at least one SRAM Bit-Cell discharges power from at least one BL exceeding a pre-defined voltage level required for a sense amplifier to perform a read operation. Furthermore, the method includes reducing, by the WL driver, the power discharged from the at least one BL by controlling a WL voltage power supply switch of the WL driver using a SAE signal and adjusting a pulse width of the at least one WL to pull down the at least one WL using a NMOS circuit when the at least one SRAM Bit-Cell discharges the power from the at least one BL exceeding the pre-defined voltage level.

Abstract: Various example embodiments herein disclose a flip-flop including a master latch comprising one of: a plurality of P-type metal-oxide-semiconductor (PMOS) and a plurality of N-type metal-oxide-semiconductor (NMOS). A slave latch includes one of: a plurality of PMOS and a plurality of NMOS. An inverted clock signal input is communicatively connected with the master latch and the slave latch. The master latch includes a single pre-charge node. The single pre-charge node sets up a data capture path in the flip flop. Data is stored in the master latch and the slave latch via the pre-charge node.

Abstract: Inventive concepts describe a method for high performance standard cell design techniques in FinFET based library using LLE. Inventive concepts describe a fabrication process using a standard FinFET cell layout having double diffusion breaks (DDBs) and single diffusion breaks (SDBs). According to one example embodiment, the method comprises of removing one or more fingers of a P-type FinFet (PFET) from a standard FinFET cell layout. After removing the one or more fingers, a Half-Double Diffusion Break (Half-DDB) is introduced on a N-type FinFET (NFET) side inside a cell boundary using a cut-poly layer. The cut-poly layer not only isolates the PFET and NFET gates and also becomes an integral part of hybrid structure. Further, the removed one or more fingers of PFET gates are converted to two floating PFET gates by shorting a drain terminal and a source terminal of the PFET gate to a common power net.

Abstract: A system on-chip (SoC) device is provided. The SoC device includes an on-chip memory including memory banks, and internal clock generators. Each internal clock generator is coupled to one or more memory banks. Each internal clock generator generates one or more of an internal clock signal, a control signal and a clock reset signal locally for the memory bank to which the internal clock generator is coupled.

Abstract: Inventive concepts describe a method for high performance standard cell design techniques in FinFET based library using LLE. Inventive concepts describe a fabrication process using a standard FinFET cell layout having double diffusion breaks (DDBs) and single diffusion breaks (SDBs). According to one example embodiment, the method comprises of removing one or more fingers of a P-type FinFet (PFET) from a standard FinFET cell layout. After removing the one or more fingers, a Half-Double Diffusion Break (Half-DDB) is introduced on a N-type FinFET (NFET) side inside a cell boundary using a cut-poly layer. The cut-poly layer not only isolates the PFET and NFET gates and also becomes an integral part of hybrid structure. Further, the removed one or more fingers of PFET gates are converted to two floating PFET gates by shorting a drain terminal and a source terminal of the PFET gate to a common power net.

Abstract: A memory for providing a signal buffering scheme for array and periphery signals and the operating method of the same are provided. The memory includes a plurality of columns of memory cells, a control circuit, and a control logic unit. The plurality of columns of memory cells may be connected to a local array signal generator via local control lines, which are connected to a global array signal generator via global control lines for receiving array signals. The control circuit may be connected to the memory cells for providing periphery signals. The control logic unit may be connected to the memory cells through a hierarchical structure of the global control lines and the local control lines. The control logic unit may be configured to provide the array signals and periphery signals having the same polarity to the global control lines and the local control lines.

Abstract: A system on-chip (SoC) device is provided. The SoC device includes an on-chip memory including memory banks, and internal clock generators. Each internal clock generator is coupled to one or more memory banks. Each internal clock generator generates one or more of an internal clock signal, a control signal and a clock reset signal locally for the memory bank to which the internal clock generator is coupled.

Abstract: Inventive concepts describe a method for high performance standard cell design techniques in FinFET based library using LLE. Inventive concepts describe a fabrication process using a standard FinFET cell layout having double diffusion breaks (DDBs) and single diffusion breaks (SDBs). According to one example embodiment, the method comprises of removing one or more fingers of a P-type FinFet (PFET) from a standard FinFET cell layout. After removing the one or more fingers, a Half-Double Diffusion Break (Half-DDB) is introduced on a N-type FinFET (NFET) side inside a cell boundary using a cut-poly layer. The cut-poly layer not only isolates the PFET and NFET gates and also becomes an integral part of hybrid structure. Further, the removed one or more fingers of PFET gates are converted to two floating PFET gates by shorting a drain terminal and a source terminal of the PFET gate to a common power net.

Abstract: A system on a chip (SOC) includes a processor and a memory system coupled to the processor. The memory system includes a static random access memory (SRAM) bank and a memory controller. The SRAM bank includes a first switch coupled to a SRAM array power supply and a source of a transistor of an SRAM storage cell in an SRAM array. The SRAM bank also includes a second switch coupled to a NWELL power supply and a bulk of the transistor of the SRAM storage cell. The second switch is configured to close prior to the first switch closing during power up of the SRAM array.

Abstract: An 8T memory bit cell receives a clock signal and read and write address signals. A read address latch/clock circuit receives the clock signal and the read address signals and initiates a read operation during a first clock cycle state. A write address flip-flop/clock circuit receives the clock signal and the write address signals and initiates a write operation during a second clock cycle state. An inverter receives and inverts the clock signal and applies the inverted clock signal to the write address flip-flop/clock circuit. The read address latch/clock circuit initiates a read word line precharge operation during the second clock cycle state and a write word line precharge operation during the first clock cycle state. The write address flip-flop/clock circuit may also include a loose self-timer to end a write cycle is a clock signal continues beyond a predetermined time.

Abstract: An 8T memory bit cell receives a clock signal and read and write address signals. A read address latch/clock circuit receives the clock signal and the read address signals and initiates a read operation during a first clock cycle state. A write address flip-flop/clock circuit receives the clock signal and the write address signals and initiates a write operation during a second clock cycle state. An inverter receives and inverts the clock signal and applies the inverted clock signal to the write address flip-flop/clock circuit. The read address latch/clock circuit initiates a read word line precharge operation during the second clock cycle state and a write word line precharge operation during the first clock cycle state. The write address flip-flop/clock circuit may also include a loose self-timer to end a write cycle is a clock signal continues beyond a predetermined time.

Abstract: Supply voltage compensated tracking circuit in a split-rail static random access memory (SRAM). The circuit includes a tracking circuit for tracking a delay required for generating sense amplifier enable (SE) signal in a memory. The tracking circuit receives an array supply voltage (VDDAR) and a periphery supply voltage (VDDPR). Further, the circuit includes a discharge control circuit, operatively coupled to the tracking circuit, for increasing delay in activating a first transistor of the tracking circuit when VDDAR is higher than VDDPR; and a contention circuit including an output coupled to the first transistor, for delaying a discharge path activation through the first transistor when VDDAR is lower than the VDDPR.