Abstract: Methods and systems for inspection of wafers and reticles using designer intent data are provided. One computer-implemented method includes identifying nuisance defects on a wafer based on inspection data produced by inspection of a reticle, which is used to form a pattern on the wafer prior to inspection of the wafer. Another computer-implemented method includes detecting defects on a wafer by analyzing data generated by inspection of the wafer in combination with data representative of a reticle, which includes designations identifying different types of portions of the reticle. An additional computer-implemented method includes determining a property of a manufacturing process used to process a wafer based on defects that alter a characteristic of a device formed on the wafer. Further computer-implemented methods include altering or simulating one or more characteristics of a design of an integrated circuit based on data generated by inspection of a wafer.

Abstract: A method includes populating an auto suggestion field with objects of the same type based upon the type of object selected in the main area of the application. The auto suggestion field is set to have N levels. The method further includes placing a recently used object in a first position of the N levels of the auto suggestion field. Succeeding objects are placed in other positions of the N levels in the auto suggestion field, wherein the succeeding objects are ordered based upon recency and frequency of use and the populating is executed by at least one processor.

Abstract: A method is described for distributing samples within an automated analyzer from a linear arrangement of sample vessels to a processing plate in a two-dimensional n×m arrangement wherein samples are sorted, followed by transfer with a pipetting device with a linear arrangement to a processing vessel in a two-dimensional n×m arrangement and subsequent processing of samples using a second pipetting device which has a two-dimensional n×m arrangement.

Abstract: A method is described for distributing samples within an automated analyzer from a linear arrangement of sample vessels to a processing plate in a two-dimensional n×m arrangement wherein samples are sorted, followed by transfer with a pipetting device with a linear arrangement to a processing vessel in a two-dimensional n×m arrangement and subsequent processing of samples using a second pipetting device which has a two-dimensional n×m arrangement.

Abstract: A method includes populating an auto suggestion field with objects of the same type based upon the type of object selected in the main area of the application. The auto suggestion field is set to have N levels. The method further includes placing a recently used object in a first position of the N levels of the auto suggestion field. Succeeding objects are placed in other positions of the N levels in the auto suggestion field, wherein the succeeding objects are ordered based upon recency and frequency of use and the populating is executed by at least one processor.

Abstract: The invention provides for an analysis system (100, 300, 400) for analyzing a biological sample (108) comprising an analyzer (102) with an analytical unit (106) for analyzing the biological sample to obtain an analysis result (140). The analyzer is configured for receiving a cartridge (110) comprising an identifier (114) and containing at least one reagent for analyzing the biological sample. The analyzer comprises an identification unit (116) for reading the identifier. The analyzer accepts the cartridge if the identifier is valid. The analysis system further comprises a protocol creation system (150, 104).

Abstract: An apparatus and method to determine a property of a substrate by measuring, in the pupil plane of a high numerical aperture lens, an angle-resolved spectrum as a result of radiation being reflected off the substrate. The property may be angle and wavelength dependent and may include the intensity of TM- and TE-polarized radiation and their relative phase difference.

Abstract: A setup platform is provided for a grinder including a cutoff wheel. The setup platform includes an upper planar surface including a first edge, which may be shaped similar to the grinder housing, the first edge including a slot therein for receiving the cutoff wheel. An anchor bar is mounted horizontally to the grinder housing, and a post extending from a lower surface of the setup platform is slidable on the anchor bar such that the setup platform is slidable relative to the anchor bar to removably mount the setup platform to the grinder such that the first edge is disposed adjacent the grinder housing and the cutoff wheel is received in the slot.