Patents by Inventor Peter Van Der Meulen

Peter Van Der Meulen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10739431
    Abstract: A magnetic resonance examination system is provided with a graphical user interface and an (software) analysis module. The analysis module is configured to analyze examination information, notably a selected examination protocol, for actions to be taken by the operator, such as connecting auxiliary equipment or radio frequency receiver coils to the magnetic resonance examination system. The analysis module supplies the actions to be taken to the (graphical) user interface at the proper instant before or during carrying-out the examination protocol. In this way the operator is guided and supported in the performance of the selected examination protocol. This improves the efficiency of workflow in performing one or more selected protocols. Preferably, the graphical user interface is provided inside the examination room and may be mounted on the gantry.
    Type: Grant
    Filed: November 3, 2016
    Date of Patent: August 11, 2020
    Assignee: Koninklijke Philips N.V.
    Inventors: Paul Augustinus Peter Kaufholz, Marius Johannes Van Meel, Rudolf Theodoor Springorum, Willem Christiaan Constantijn Furster, Peter Van Der Meulen, Vincent Paul Quinten Van Wijk
  • Patent number: 10586722
    Abstract: A two piece shell is employed for intermediate and long term storage of substrates. The shell is formed of two halves that can be juxtaposed in vacuum and externally vented, with the internal vacuum retaining the halves in vacuum-sealed engagement. One of the halves also provides a vacuum-sealing perimeter for selectively sealing to a process chamber during loading and/or unloading of the shell with a substrate. A vacuum monitor or the like may be employed to monitor pressure during storage and provide alerts if the vacuum within the sealed shell is compromised.
    Type: Grant
    Filed: May 30, 2008
    Date of Patent: March 10, 2020
    Assignee: BROOKS AUTOMATION, INC.
    Inventor: Peter van der Meulen
  • Patent number: 10444749
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: October 15, 2019
    Assignee: BROOKS AUTOMATION, INC.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Publication number: 20180356482
    Abstract: A magnetic resonance examination system is disclosed that is provided with a graphical user interface and Jack Smith an (software) analysis module. The analysis module is configured to analyse examination information, notably a selected examination protocol, for actions to be taken by the operator, such connecting auxiliary equipment or radio frequency receiver coils to the magnetic resonance examination system. The analysis module supplies the actions to be taken to the (graphical) user interface at the proper instant before or during carrying-out the examination protocol. In Respiratory; this way the operator is guided and supported in the performance of the selected examination protocol. This improves the efficiency of workflow in performing one or more selected protocols. Preferably, the graphical user interface is provided inside the examination room and may be mounted on the gantry.
    Type: Application
    Filed: November 3, 2016
    Publication date: December 13, 2018
    Inventors: PAUL AUGUSTINUS PETER KAUFHOLZ, MARIUS JOHANNES VAN MEEL, RUDOLF THEODOOR SPRINGORUM, WILLEM CHRISTIAAN CONSTANTIJN FURSTER, PETER VAN DER MEULEN, VINCENT PAUL QUINTEN VAN WIJK
  • Patent number: 10086511
    Abstract: Linear semiconductor handling systems provide more balanced processing capacity using various techniques to provide increased processing capacity to relatively slow processes. This may include use of hexagonal vacuum chambers to provide additional facets for slow process modules, use of circulating process modules to provide more processing capacity at a single facet of a vacuum chamber, or the use of wide process modules having multiple processing sites. This approach may be used, for example, to balance processing capacity in a typical process that includes plasma enhanced chemical vapor deposition steps and bevel etch steps.
    Type: Grant
    Filed: August 30, 2013
    Date of Patent: October 2, 2018
    Assignee: Brooks Automation, Inc.
    Inventor: Peter van der Meulen
  • Patent number: 9884726
    Abstract: Modular wafer transport and handling facilities are combined in a variety of ways deliver greater levels of flexibility, utility, efficiency, and functionality in a vacuum semiconductor processing system. Various processing and other modules may be interconnected with tunnel-and-cart transportation systems to extend the distance and versatility of the vacuum environment. Other improvements such as bypass thermal adjusters, buffering aligners, batch processing, multifunction modules, low particle vents, cluster processing cells, and the like are incorporated to expand functionality and improve processing efficiency.
    Type: Grant
    Filed: March 17, 2014
    Date of Patent: February 6, 2018
    Assignee: Brooks Automation, Inc.
    Inventors: Peter van der Meulen, Christopher C. Kiley, Patrick D. Pannese, Raymond S. Ritter, Thomas A. Schaefer
  • Publication number: 20150221534
    Abstract: A substrate transport apparatus having a drive section, an articulated arm operably connected to the drive section, and an end effector connected to the articulated arm, the end effector being configured for holding a substrate thereon and transporting the substrate through articulation of the articulated arm. The end effector is a substantially flat and elongated member, depending from the articulated arm at a base end of the end effector, and extending longitudinally so that the end effector engages edges of the substrate on both proximal and distal sides with respect to the base end. The end effector has a lateral cross section that tapers in a longitudinal portion of the end effector extending between the base end and a distal end of the end effector, the lateral cross section being tapered, along the longitudinal portion, in at least two different directions that are angled and crossing each other.
    Type: Application
    Filed: February 2, 2015
    Publication date: August 6, 2015
    Inventor: Peter van der Meulen
  • Patent number: 8972029
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: March 3, 2015
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 8950998
    Abstract: A substrate-handling vacuum robot includes a first robotic arm with a single-substrate end effector and a second robotic arm with a batch end effector. The single-substrate end effector permits single-substrate pick-and-place operations while the batch end effector permits batch handling of substrates within a vacuum environment.
    Type: Grant
    Filed: April 21, 2008
    Date of Patent: February 10, 2015
    Assignee: Brooks Automation, Inc.
    Inventor: Peter van der Meulen
  • Patent number: 8944738
    Abstract: Methods and systems are provided for a vacuum-based semiconductor handling system. The system may be a linear system with a four-link robotic SCARA arm for moving materials in the system. The system may include one or more vertically stacked load locks or vertically stacked process modules.
    Type: Grant
    Filed: September 29, 2011
    Date of Patent: February 3, 2015
    Assignee: Brooks Automation, Inc.
    Inventor: Peter van der Meulen
  • Patent number: 8934706
    Abstract: A device is provided having a robotic arm for handling a wafer, the robotic arm including one or more encoders that provide encoder data identifying a position of one or more components of the robotic arm. The device also having a processor adapted to apply an extended Kalman Filter to the encoder data to estimate a position of the wafer.
    Type: Grant
    Filed: January 20, 2014
    Date of Patent: January 13, 2015
    Assignee: Brooks Automation, Inc.
    Inventors: Christopher C. Kiley, Peter van der Meulen, Forrest T. Buzan, Paul E. Fogel
  • Patent number: 8870514
    Abstract: A semiconductor handling system including a vacuum workpiece handling system having a vacuum environment therein, the vacuum workpiece handling system including at least two workpiece handling robotic facilities, a mid-entry station positioned between the at least two workpiece handling robotic facilities, the mid-entry station including vertically stacked load locks, where the at least two workpiece handling robotic facilities are configured to transfer workpieces between the vertically stacked load locks, at least one workpiece loading station connected to the vacuum handling system, and a workpiece delivery system having an internal environment different from the vacuum environment, the workpiece delivery system being configured to transport the workpieces between each of the vertically stacked load locks of the mid-entry station and the at least one workpiece loading station.
    Type: Grant
    Filed: September 14, 2012
    Date of Patent: October 28, 2014
    Assignee: Brooks Automation, Inc.
    Inventors: Peter van der Meulen, Christopher C Kiley, Patrick D. Pannese
  • Patent number: 8812150
    Abstract: A method is provided. The method includes disposing a plurality of robotic facilities to form a semiconductor handling system, controlling the semiconductor handling system with a controller to handoff a workpiece between neighboring robotic facilities, and providing a software interface for the controller, wherein the software interface permits a user to view alternate configurations of the handling system in order to optimize a characteristic of the handling system.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: August 19, 2014
    Assignee: Brooks Automation, Inc.
    Inventors: Peter van der Meulen, Christopher C Kiley, Patrick D. Pannese
  • Patent number: 8807905
    Abstract: Methods and systems are provided for handling materials, including materials used in semiconductor manufacturing systems. The methods and systems include linear semiconductor processing facilities for vacuum-based semiconductor processing and handling, as well as linkable or extensible semiconductor processing facilities that can be flexibly configured to meet a variety of constraints.
    Type: Grant
    Filed: June 13, 2011
    Date of Patent: August 19, 2014
    Assignee: Brooks Automation, Inc.
    Inventor: Peter van der Meulen
  • Publication number: 20140207284
    Abstract: A device is provided having a robotic arm for handling a wafer, the robotic arm including one or more encoders that provide encoder data identifying a position of one or more components of the robotic arm. The device also having a processor adapted to apply an extended Kalman Filter to the encoder data to estimate a position of the wafer.
    Type: Application
    Filed: January 20, 2014
    Publication date: July 24, 2014
    Inventors: Christopher C. Kiley, Peter van der Meulen, Forrest T. Buzan, Paul E. Fogel
  • Publication number: 20140199138
    Abstract: Modular wafer transport and handling facilities are combined in a variety of ways deliver greater levels of flexibility, utility, efficiency, and functionality in a vacuum semiconductor processing system. Various processing and other modules may be interconnected with tunnel-and-cart transportation systems to extend the distance and versatility of the vacuum environment. Other improvements such as bypass thermal adjusters, buffering aligners, batch processing, multifunction modules, low particle vents, cluster processing cells, and the like are incorporated to expand functionality and improve processing efficiency.
    Type: Application
    Filed: March 17, 2014
    Publication date: July 17, 2014
    Applicant: Brooks Automation, Inc.
    Inventors: Peter van der Meulen, Christopher C. Kiley, Patrick D. Pannese, Raymond S. Ritter, Thomas A. Schaefer
  • Patent number: 8775148
    Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: July 8, 2014
    Assignee: Brooks Automation, Inc.
    Inventors: Patrick D. Pannese, Vinaya Kavathekar, Peter van der Meulen
  • Patent number: 8696298
    Abstract: A variety of process modules are described for use in semiconductor manufacturing processes.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: April 15, 2014
    Assignee: Brooks Automation, Inc.
    Inventors: Peter van der Meulen, Christopher C Kiley, Patrick D. Pannese
  • Patent number: 8672605
    Abstract: Modular wafer transport and handling facilities are combined in a variety of ways deliver greater levels of flexibility, utility, efficiency, and functionality in a vacuum semiconductor processing system. Various processing and other modules may be interconnected with tunnel-and-cart transportation systems to extend the distance and versatility of the vacuum environment. Other improvements such as bypass thermal adjusters, buffering aligners, batch processing, multifunction modules, low particle vents, cluster processing cells, and the like are incorporated to expand functionality and improve processing efficiency.
    Type: Grant
    Filed: February 4, 2008
    Date of Patent: March 18, 2014
    Assignee: Brooks Automation, Inc.
    Inventors: Peter van der Meulen, Christopher C Kiley, Patrick D. Pannese, Raymond S. Ritter, Thomas A. Schaefer
  • Publication number: 20140070805
    Abstract: The invention relates to a method of MR imaging, wherein a portion of a body is subjected to an imaging sequence of RF pulses and switched magnetic field gradients, which imaging sequence is a stimulated echo sequence including an off-resonant Bloch-Siegert RF pulse (BS) radiated during a preparation period (21) of the stimulated echo sequence. A B1 map is derived from the acquired stimulated echo MR signals. Moreover, the invention relates to a method of MR imaging, wherein a portion of a body is subjected to a first imaging sequence, which comprises a first composite excitation RF pulse consisting of two RF pulse components having essentially equal flip angles and being out of phase by essentially 90°. Further, the portion of the body is subjected to a second imaging sequence, wherein a B1 map is derived from signal data acquired by means of the first and second imaging sequences.
    Type: Application
    Filed: April 2, 2012
    Publication date: March 13, 2014
    Applicant: KONINKLIJKE PHILIPS N.V.
    Inventors: Peter Van Der Meulen, Peter Boernert, Kay Nehrke