Abstract: Methods and apparatus for delaying a clock signal for a multiple-data-rate interface. An apparatus provides an integrated circuit including a frequency divider configured to receive a first clock signal and a first variable-delay block configured to receive an output from the frequency divider. Also included is a phase detector configured to receive the first clock signal and an output from the first variable-delay block, and an up/down counter configured to receive an output from the phase detector. A second variable-delay block is configured to receive a second clock signal and a plurality of flip-flops are configured to receive an output from the second variable-delay block. The first variable-delay block and the second variable-delay block are configured to receive an output from the up/down counter.

Abstract: An input buffer circuit has a plurality of selectively enabled differential amplifier circuits, where each differential amplifier is configured for compatibility with a particular differential I/O standard and its corresponding input operating range. For example, the input buffer may have two differential amplifiers suitable for receiving LVDS differential input signals over a wide input operating range, and another differential amplifier suitable for receiving the PCML differential input signals. One or more control signals are provided to the input buffer, e.g., programmably, to selectively enable the required differential amplifier(s) for a given I/O standard.

Abstract: Methods and apparatus for providing either high-speed, or lower-speed, flexible inputs and outputs. An input and output structure having a high-speed input, a high-speed output, a low or moderate speed input, and an low or moderate speed output is provided. One of the input and output circuits are selected and the others are deselected. The high-speed input and output circuits are comparatively simple, in one example having only a clear signal for a control line input, and are able to interface to lower speed circuitry inside the core of an integrated circuit. The low or moderate speed input and output circuits are more flexible, for example, having preset, enable, and clear as control line inputs, and are able to support JTAG boundary testing. These parallel high and lower speed circuits are user selectable such that the input output structure is optimized between speed and functionality depending on the requirements of the application.

Abstract: Circuitry for facilitating the use of the memory elements in the look-up tables (“LUTs”) of a field programmable gate array (“FPGA”) as user-accessible, distributed RAM. For example, a register associated with a LUT and that is not needed in the read data path in user RAM mode can be used to register data for writing in user RAM mode. As another example, an otherwise unneeded register associated with a LUT can be used to provide a synchronous read address signal for user RAM mode. Several other features are shown for similarly facilitating user RAM mode with minimal (if any) additional circuitry being required in the FPGA.

Abstract: Methods and apparatus for providing either high-speed, or lower-speed, flexible inputs and outputs. An input and output structure having a high-speed input, a high-speed output, a low or moderate speed input, and an low or moderate speed output is provided. One of the input and output circuits are selected and the others are deselected. The high-speed input and output circuits are comparatively simple, in one example having only a clear signal for a control line input, and are able to interface to lower speed circuitry inside the core of an integrated circuit. The low or moderate speed input and output circuits are more flexible, for example, having preset, enable, and clear as control line inputs, and are able to support JTAG boundary testing. These parallel high and lower speed circuits are user selectable such that the input output structure is optimized between speed and functionality depending on the requirements of the application.

Abstract: A programmable memory interface circuit includes a programmable DLL delay chain, a phase offset control circuit and a programmable DQS delay chain. The DLL delay chain uses a set of serially connected delay cells, a programmable switch, a phase detector and a digital counter to generate a coarse phase shift control setting. The coarse phase shift control setting is then used to pre-compute a static residual phase shift control setting or generate a dynamic residual phase shift control setting, one of which is chosen by the phase offset control circuit to be added to or subtracted from the coarse phase shift control setting to generate a fine phase shift control setting. The coarse and fine phase shift control settings work in concert to generate a phase-delayed DQS signal that is center-aligned to its associated DQ signals.

Abstract: Memory circuitry is augmented with data validation circuitry that is closely coupled to the memory circuitry so that data read out of the memory for use in a validation operation does not have to pass through or to general-purpose routing or logic circuitry before it can be used by the data validation circuitry. The data validation circuitry compares the data read from the memory to other signals to determine whether or not there is a match. The data validation circuitry is preferably programmable to select which bits of a word read from the memory will actually be used in the data validation operation.

Abstract: Method and circuitry for implementing high speed multiple-data-rate interface architectures for programmable logic devices. The invention partitions I/O pins and their corresponding registers into independent multiple-data rate I/O modules each having at least one pin dedicated to the strobe signal DQS and others to DQ data signals. The modular architecture facilitates pin migration from one generation of PLDs to the next larger generation.

Abstract: A memory block of a programmable device uses a double data rate communication scheme to communicate data with logic cells at a rate of two bits per clock cycle per data line. The memory block can be configured to use the double data rate communication scheme or a single data rate communication scheme. The memory block can switch between either communications scheme as needed to communicate with different portions of the programmable device. If a memory block of a programmable device includes two or more data access ports, an embodiment of a programmable device allows each data access port to be configured for single data rate or double data rate communications independently of other data ports. Any arbitrary logic cell of the programmable device can communicate with a memory block using the double data rate communication scheme by configuring additional logic cells to operate as a double data rate interface.

Abstract: Circuitry for facilitating the use of the memory elements in the look-up tables (“LUTs”) of a field programmable gate array (“FPGA”) as user-accessible, distributed RAM. For example, a register associated with a LUT and that is not needed in the read data path in user RAM mode can be used to register data for writing in user RAM mode. As another example, an otherwise unneeded register associated with a LUT can be used to provide a synchronous read address signal for user RAM mode. Several other features are shown for similarly facilitating user RAM mode with minimal (if any) additional circuitry being required in the FPGA.

Abstract: An input buffer circuit has a plurality of selectively enabled differential amplifier circuits, where each differential amplifier is configured for compatibility with a particular differential I/O standard and its corresponding input operating range. For example, the input buffer may have two differential amplifiers suitable for receiving LVDS differential input signals over a wide input operating range, and another differential amplifier suitable for receiving the PCML differential input signals. One or more control signals are provided to the input buffer, e.g., programmably, to selectively enable the required differential amplifier(s) for a given I/O standard.

Abstract: Methods and apparatus for providing either high-speed, or lower-speed, flexible inputs and outputs. An input and output structure having a high-speed input, a high-speed output, a low or moderate speed input, and an low or moderate speed output is provided. One of the input and output circuits are selected and the others are deselected. The high-speed input and output circuits are comparatively simple, in one example having only a clear signal for a control line input, and are able to interface to lower speed circuitry inside the core of an integrated circuit. The low or moderate speed input and output circuits are more flexible, for example, having preset, enable, and clear as control line inputs, and are able to support JTAG boundary testing. These parallel high and lower speed circuits are user selectable such that the input output structure is optimized between speed and functionality depending on the requirements of the application.

Abstract: Circuitry for facilitating the use of the memory elements in the look-up tables (“LUTs”) of a field programmable gate array (“FPGA”) as user-accessible, distributed RAM. For example, a register associated with a LUT and that is not needed in the read data path in user RAM mode can be used to register data for writing in user RAM mode. As another example, an otherwise unneeded register associated with a LUT can be used to provide a synchronous read address signal for user RAM mode. Several other features are shown for similarly facilitating user RAM mode with minimal (if any) additional circuitry being required in the FPGA.

Abstract: An integrated circuit (IC) includes a redundancy feature. The redundancy feature is provided by a redundancy circuitry within the IC. The redundancy circuitry is configured to provide the redundancy by using a decoder circuitry. The decoder circuitry receives and decodes coded defect information from a set of circuit elements adapted to provide the coded defect information.

Abstract: Methods and apparatus for providing either high-speed, or lower-speed, flexible inputs and outputs. An input and output structure having a high-speed input, a high-speed output, a low or moderate speed input, and an low or moderate speed output is provided. One of the input and output circuits are selected and the others are deselected. The high-speed input and output circuits are comparatively simple, in one example having only a clear signal for a control line input, and are able to interface to lower speed circuitry inside the core of an integrated circuit. The low or moderate speed input and output circuits are more flexible, for example, having preset, enable, and clear as control line inputs, and are able to support JTAG boundary testing. These parallel high and lower speed circuits are user selectable such that the input output structure is optimized between speed and functionality depending on the requirements of the application.

Abstract: Circuitry for facilitating the use of the memory elements in the look-up tables (“LUTs”) of a field programmable gate array (“FPGA”) as user-accessible, distributed RAM. For example, a register associated with a LUT and that is not needed in the read data path in user RAM mode can be used to register data for writing in user RAM mode. As another example, an otherwise unneeded register associated with a LUT can be used to provide a synchronous read address signal for user RAM mode. Several other features are shown for similarly facilitating user RAM mode with minimal (if any) additional circuitry being required in the FPGA.

Abstract: Circuits, methods, and apparatus that prevent control signals from changing state while the control signals are being used to delay a read strobe signal. An exemplary embodiment of the present invention provides a control circuit that provides a plurality of control bits to a delay line, where the delay line delays or phase shifts a read strobe signal a duration, where the duration depends on the state of the control bits. The delayed read strobe signal is used to clock one or more data registers. To avoid undesired changes in the duration that the read strobe signal is delayed, the control bits are retimed before being provided to the delay line. A specific embodiment waits for an edge of the strobe signal to be output by the delay line before providing the control bits to the delay line. Another specific embodiment waits until no edge of the strobe signal is being delayed by the delay line before providing the control bits to the delay line.

Abstract: A programmable memory interface circuit includes a programmable DLL delay chain, a phase offset control circuit and a programmable DQS delay chain. The DLL delay chain uses a set of serially connected delay cells, a programmable switch, a phase detector and a digital counter to generate a coarse phase shift control setting. The coarse phase shift control setting is then used to pre-compute a static residual phase shift control setting or generate a dynamic residual phase shift control setting, one of which is chosen by the phase offset control circuit to be added to or subtracted from the coarse phase shift control setting to generate a fine phase shift control setting. The coarse and fine phase shift control settings work in concert to generate a phase-delayed DQS signal that is center-aligned to its associated DQ signals.

Abstract: An input buffer circuit has a plurality of selectively enabled differential amplifier circuits, where each differential amplifier is configured for compatibility with a particular differential I/O standard and its corresponding input operating range. For example, the input buffer may have two differential amplifiers suitable for receiving LVDS differential input signals over a wide input operating range, and another differential amplifier suitable for receiving the PCML differential input signals. One or more control signals are provided to the input buffer, e.g., programmably, to selectively enable the required differential amplifier(s) for a given I/O standard.

Abstract: Phase comparators for use in loop circuits (i.e., DLL circuits and PLL circuits) are provided. The phase comparators include a phase detector for comparing a reference clock signal and a feedback signal derived from the loop circuit generated internal clock signal. The phase comparators also include a low-pass noise filter for filtering out erroneously detected phase differences between the reference clock signal and the feedback signal by requiring a certain net number of leading or lagging detections before the compensation circuitry of the loop circuit (i.e., the controlled delay line in a DLL circuit or the controlled oscillator in a PLL circuit) is adjusted. The number of net measurements required before these adjustments take place depends on a programmable bandwidth signal provided to the phase comparator.