Patents by Inventor Ping-Kun Wang
Ping-Kun Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11972799Abstract: A filament forming method includes: performing first stage to apply first bias including gate and drain voltages to a resistive memory unit plural times until read current reaches first saturating state, latching read current in first saturating state as saturating read current, determining whether rate of increase of saturating read current is less than first threshold value; when rate of increase of saturating read current is not less than first threshold value, performing second stage to apply second bias, by increasing gate voltage and decreasing drain voltage, to the resistive memory unit plural times until read current reaches second saturating state, latching read current in second saturating state as saturating read current and determining whether rate of increase of saturating read current is less than first threshold value; finishing the method when rate of increase of saturating read current is less than first threshold value and saturating read current reaches target current value.Type: GrantFiled: March 1, 2022Date of Patent: April 30, 2024Assignee: Winbond Electronics Corp.Inventors: Frederick Chen, Ping-Kun Wang, Chia-Hung Lin, Jun-Yao Huang
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Publication number: 20240135990Abstract: A resistive memory apparatus including a memory cell array, at least one dummy transistor and a control circuit is provided. The memory cell array includes a plurality of memory cells. Each of the memory cells includes a resistive switching element. The dummy transistor is electrically isolated from the resistive switching element. The control circuit is coupled to the memory cell array and the dummy transistor. The control circuit is configured to provide a first bit line voltage, a source line voltage and a word line voltage to the dummy transistor to drive the dummy transistor to output a saturation current. The control circuit is further configured to determine a value of a second bit line voltage for driving the memory cells according to the saturation current. In addition, an operating method and a memory cell array of the resistive memory apparatus are also provided.Type: ApplicationFiled: December 28, 2023Publication date: April 25, 2024Applicant: Winbond Electronics Corp.Inventors: Ming-Che Lin, Min-Chih Wei, Ping-Kun Wang, Yu-Ting Chen, Chih-Cheng Fu, Chang-Tsung Pai
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Publication number: 20240087644Abstract: A forming operation of resistive memory device is provided. The operation includes: applying a pre-forming gate voltage and a pre-forming bit line voltage to a target memory cell; performing a dense switching forming operation, wherein the dense switching forming operation includes alternately performing dense set operations and dense reset operations on the target memory cell, wherein the dense set operation includes applying a dense switching gate voltage and a dense set bit line voltage; and performing a normal set operation on the target memory cell, wherein the normal set operation includes applying a normal set gate voltage and a normal set bit line voltage to the target memory cell, the normal set gate voltage is greater than the pre-forming gate voltage and the dense switching gate voltage, and the normal set bit line voltage is less than the pre-forming bit line voltage and the dense set bit line voltage.Type: ApplicationFiled: August 29, 2023Publication date: March 14, 2024Applicant: Winbond Electronics Corp.Inventors: I-Hsien Tseng, Lung-Chi Cheng, Ju-Chieh Cheng, Jun-Yao Huang, Ping-Kun Wang
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Patent number: 11908516Abstract: A resistive memory apparatus including a memory cell array, at least one dummy transistor and a control circuit is provided. The memory cell array includes a plurality of memory cells. Each of the memory cells includes a resistive switching element. The dummy transistor is electrically isolated from the resistive switching element. The control circuit is coupled to the memory cell array and the dummy transistor. The control circuit is configured to provide a first bit line voltage, a source line voltage and a word line voltage to the dummy transistor to drive the dummy transistor to output a saturation current. The control circuit is further configured to determine a value of a second bit line voltage for driving the memory cells according to the saturation current. In addition, an operating method and a memory cell array of the resistive memory apparatus are also provided.Type: GrantFiled: August 27, 2021Date of Patent: February 20, 2024Assignee: Winbond Electronics Corp.Inventors: Ming-Che Lin, Min-Chih Wei, Ping-Kun Wang, Yu-Ting Chen, Chih-Cheng Fu, Chang-Tsung Pai
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Publication number: 20230282279Abstract: A filament forming method includes: performing first stage to apply first bias including gate and drain voltages to a resistive memory unit plural times until read current reaches first saturating state, latching read current in first saturating state as saturating read current, determining whether increasing rate of saturating read current is less than first threshold value; when increasing rate of saturating read current is not less than first threshold value, performing second stage to apply second bias, by increasing gate voltage and decreasing drain voltage, to the resistive memory unit plural times until read current reaches second saturating state, latching read current in second saturating state as saturating read current and determining whether increasing rate of saturating read current is less than first threshold value; finishing the method when increasing rate of saturating read current is less than first threshold value and saturating read current reaches target current value.Type: ApplicationFiled: March 1, 2022Publication date: September 7, 2023Applicant: Winbond Electronics Corp.Inventors: Frederick Chen, Ping-Kun Wang, Chia-Hung Lin, Jun-Yao Huang
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Patent number: 11620500Abstract: A synapse system is provided which includes three transistors and a resistance-switching element arranged between two neurons. The resistance-switching element has a resistance value and it is arranged between two neurons. A first transistor is connected between the resistance-switching element and one of the neurons. A second transistor and a third transistor are arranged between the two neurons, and are connected in series which interconnects with the gate of the first transistor. A first input signal is transmitted from one of the neurons to the other neuron through the first transistor. A second input signal is transmitted from one of the neurons to the other neuron through the second transistor and the third transistor. The resistance value of the resistance-switching element is changed based on the time difference between the first input signal and the second input signal.Type: GrantFiled: January 11, 2018Date of Patent: April 4, 2023Assignee: WINBOND ELECTRONICS CORP.Inventors: Frederick Chen, Ping-Kun Wang, Shao-Ching Liao, Chih-Cheng Fu, Ming-Che Lin, Yu-Ting Chen, Seow-Fong (Dennis) Lim
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Publication number: 20230038604Abstract: A manufacturing method is provided. The method includes steps below. Forming bottom electrodes. Blanketly forming a resistance switching layer on the bottom electrodes. Forming a first insulating material layer on the resistance switching layer. Patterning the first insulating material layer to form insulating patterns. Conformally forming a channel layer having a plurality of channel regions on the resistance switching layer and the insulating patterns, wherein the plurality of channel regions are located on the resistance switching layer and cover opposite sides of the insulating patterns. Forming a second electrode material layer on the channel layer. Patterning the second electrode material layer to form top electrodes, each of the top electrodes is located in corresponding to one of the insulating patterns and covers at least two of the plurality of channel regions.Type: ApplicationFiled: October 4, 2022Publication date: February 9, 2023Applicant: Winbond Electronics Corp.Inventors: Chia-Wen Cheng, Ping-Kun Wang, Yi-Hsiu Chen, He-Hsuan Chao
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Patent number: 11538525Abstract: Provided is a resetting method of a resistive random access memory (RRAM) including the following steps. A first resetting operation and a first verifying operation on the at least one resistive memory cell are performed. Whether to perform a second resetting operation according to a verifying result of the first verifying operation is determined. A second verifying operation is performed after the second resetting operation is determined to be performed and is finished. To determine whether to perform a healing resetting operation according to a verifying result of the second verifying operation, which comprises: performing the healing resetting operation when a verifying current of the second verifying operation is greater than a predetermined current, wherein a resetting voltage of the healing resetting operation is greater than a resetting voltage of the second resetting operation.Type: GrantFiled: October 6, 2021Date of Patent: December 27, 2022Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
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Patent number: 11520526Abstract: A write method for a resistive memory including a storage array, a control circuit and an access circuit is provided. The control circuit receives an external command to activate the access circuit to access the storage array. The write method includes determining whether the external command is ready to perform a write operation for the storage array; generating a first operation voltage group to the access circuit when the external command does not perform the write operation for the storage array; reading a count value of a block that corresponds to a write address when the external command performs the write operation for the storage array, wherein the count value indicates the number of times that the block corresponding to the write address performs the write operation; and generating a second operation voltage group to the access circuit according to the count value of the block.Type: GrantFiled: June 2, 2021Date of Patent: December 6, 2022Assignee: WINBOND ELECTRONICS CORP.Inventors: Ping-Kun Wang, Shao-Ching Liao, Chien-Min Wu, Chia Hua Ho, Frederick Chen, He-Hsuan Chao, Seow-Fong Lim
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Patent number: 11502131Abstract: A resistive random access memory (RRAM) device and a manufacturing method are provided. The RRAM device includes bottom electrodes, a resistance switching layer, insulating patterns, a channel layer and top electrodes. The resistance switching layer blanketly covers the bottom electrodes. The insulating patterns are disposed on the resistance layer and located in corresponding to locations of the bottom electrodes. The channel layer conformally covers the resistance switching layer and the insulating patterns. The channel layer has a plurality of channel regions. The channel regions are located on the resistance switching layer, and cover sidewalls of the insulating patterns. The top electrodes respectively cover at least two of the channel regions, and respectively located in corresponding to one of the insulating patterns, such that the at least two of the channel regions are located between one of the bottom electrodes and one of the top electrodes.Type: GrantFiled: November 19, 2020Date of Patent: November 15, 2022Assignee: Winbond Electronics Corp.Inventors: Chia-Wen Cheng, Ping-Kun Wang, Yi-Hsiu Chen, He-Hsuan Chao
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Patent number: 11362272Abstract: A resistive memory device and a reliability enhancement method thereof are provided. The reliability enhancement method includes the following steps. A forming operation is performed on a plurality of memory cells. The formed memory cells are read to respectively obtain a plurality of formed currents. A reference current is set according to a statistic value of the formed currents. A setting operation is performed on the memory cells. A ratio between a set current of each of the memory cells and the reference current is calculated, and a physical status of each of the memory cells is judged according to the ratio. It is determined whether to perform a fix operation of each of the memory cells or not according to physical status.Type: GrantFiled: August 25, 2020Date of Patent: June 14, 2022Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Chia-Wen Cheng, He-Hsuan Chao, Frederick Chen, Chang-Tsung Pai, Tzu-Yun Huang, Ming-Che Lin
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Patent number: 11289157Abstract: A memory device includes: a resistive switching layer, a conductive pillar, a barrier layer, a word line, a plurality of resistive layers, and a plurality of bit lines. The resistive switching layer is shaped as a cup and has an inner surface to define an opening. The conductive pillar is disposed in the opening. The barrier layer is disposed between the resistive switching layer and the conductive pillar. The word line is electrically connected to the conductive pillar. The resistive layers are respectively distributed on an outer surface of the resistive switching layer. The bit lines are electrically connected to the resistive layers, respectively.Type: GrantFiled: September 4, 2020Date of Patent: March 29, 2022Assignee: Winbond Electronics Corp.Inventors: Frederick Chen, Ping-Kun Wang, Kuang-Chih Hsieh, Chien-Min Wu, Meng-Hung Lin
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Publication number: 20220076744Abstract: A memory device includes: a resistive switching layer, a conductive pillar, a barrier layer, a word line, a plurality of resistive layers, and a plurality of bit lines. The resistive switching layer is shaped as a cup and has an inner surface to define an opening. The conductive pillar is disposed in the opening. The barrier layer is disposed between the resistive switching layer and the conductive pillar. The word line is electrically connected to the conductive pillar. The resistive layers are respectively distributed on an outer surface of the resistive switching layer. The bit lines are electrically connected to the resistive layers, respectively.Type: ApplicationFiled: September 4, 2020Publication date: March 10, 2022Applicant: Winbond Electronics Corp.Inventors: Frederick Chen, Ping-Kun Wang, Kuang-Chih Hsieh, Chien-Min Wu, Meng-Hung Lin
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Publication number: 20220069209Abstract: A resistive memory device and a reliability enhancement method thereof are provided. The reliability enhancement method includes the following steps. A forming operation is performed on a plurality of memory cells. The formed memory cells are read to respectively obtain a plurality of formed currents. A reference current is set according to a statistic value of the formed currents. A setting operation is performed on the memory cells. A ratio between a set current of each of the memory cells and the reference current is calculated, and a physical status of each of the memory cells is judged according to the ratio. It is determined whether to perform a fix operation of each of the memory cells or not according to physical status.Type: ApplicationFiled: August 25, 2020Publication date: March 3, 2022Applicant: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Chia-Wen Cheng, He-Hsuan Chao, Frederick Chen, Chang-Tsung Pai, Tzu-Yun Huang, Ming-Che Lin
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Publication number: 20220068382Abstract: A resistive memory apparatus including a memory cell array, at least one dummy transistor and a control circuit is provided. The memory cell array includes a plurality of memory cells. Each of the memory cells includes a resistive switching element. The dummy transistor is electrically isolated from the resistive switching element. The control circuit is coupled to the memory cell array and the dummy transistor. The control circuit is configured to provide a first bit line voltage, a source line voltage and a word line voltage to the dummy transistor to drive the dummy transistor to output a saturation current. The control circuit is further configured to determine a value of a second bit line voltage for driving the memory cells according to the saturation current. In addition, an operating method and a memory cell array of the resistive memory apparatus are also provided.Type: ApplicationFiled: August 27, 2021Publication date: March 3, 2022Applicant: Winbond Electronics Corp.Inventors: Ming-Che Lin, Min-Chih Wei, Ping-Kun Wang, Yu-Ting Chen, Chih-Cheng Fu, Chang-Tsung Pai
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Publication number: 20220028454Abstract: Provided is a resetting method of a resistive random access memory (RRAM) including the following steps. A first resetting operation and a first verifying operation on the at least one resistive memory cell are performed. Whether to perform a second resetting operation according to a verifying result of the first verifying operation is determined. A second verifying operation is performed after the second resetting operation is determined to be performed and is finished. To determine whether to perform a healing resetting operation according to a verifying result of the second verifying operation, which comprises: performing the healing resetting operation when a verifying current of the second verifying operation is greater than a predetermined current, wherein a resetting voltage of the healing resetting operation is greater than a resetting voltage of the second resetting operation.Type: ApplicationFiled: October 6, 2021Publication date: January 27, 2022Applicant: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
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Patent number: 11176996Abstract: Provided is a resistive random access memory (RRAM) including at least one memory cell. The at least one memory cell includes a top electrode, a bottom electrode, a data storage layer, an oxygen gettering layer, a first barrier layer, and an oxygen supplying layer. The data storage layer is disposed between the top electrode and the bottom electrode. The oxygen gettering layer is disposed between the data storage layer and the top electrode. The first barrier layer is disposed between the oxygen gettering layer and the data storage layer. The oxygen supplying layer is disposed between the oxygen gettering layer and the top electrode and/or between the oxygen gettering layer and the first barrier layer.Type: GrantFiled: May 13, 2020Date of Patent: November 16, 2021Assignee: Winbond Electronics Corp.Inventors: Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
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Patent number: 11152566Abstract: A resistive random access memory including first and second electrodes, a resistance variable layer, first and second metal layers and a resistance stabilizing layer is provided. The second electrode is disposed on the first electrode. The resistance variable layer is disposed between the first and second electrodes. The first metal layer is disposed between the resistance variable layer and the second electrode. The second metal layer is disposed between the first metal layer and the second electrode. The resistance stabilizing layer is disposed between the first and second metal layers. The oxygen content of the resistance variable layer is higher than that of the first metal layer, the oxygen content of the first metal layer is higher than that of the resistance stabilizing layer, the oxygen content of the resistance stabilizing layer is higher than that of the second metal layer.Type: GrantFiled: December 10, 2019Date of Patent: October 19, 2021Assignee: Winbond Electronics Corp.Inventors: Po-Yen Hsu, Bo-Lun Wu, Ping-Kun Wang, Ming-Che Lin, Yu-Ting Chen, Chang-Tsung Pai, Shao-Ching Liao, Chi-Ching Liu
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Publication number: 20210286562Abstract: A write method for a resistive memory including a storage array, a control circuit and an access circuit is provided. The control circuit receives an external command to activate the access circuit to access the storage array. The write method includes determining whether the external command is ready to perform a write operation for the storage array; generating a first operation voltage group to the access circuit when the external command does not perform the write operation for the storage array; reading a count value of a block that corresponds to a write address when the external command performs the write operation for the storage array, wherein the count value indicates the number of times that the block corresponding to the write address performs the write operation; and generating a second operation voltage group to the access circuit according to the count value of the block.Type: ApplicationFiled: June 2, 2021Publication date: September 16, 2021Inventors: Ping-Kun WANG, Shao-Ching LIAO, Chien-Min WU, Chia Hua HO, Frederick CHEN, He-Hsuan CHAO, Seow-Fong LIM
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Patent number: 11055021Abstract: A resistive memory including a storage array, a storage circuit, a control circuit, a voltage generation circuit and an access circuit is provided. The storage array includes a plurality of blocks. Each block includes a plurality of memory cells. The storage circuit stores a plurality of count values. Each of the count values indicates the number of times that a corresponding block performs a write operation. The control circuit generates a control signal according to the count values when an external command is a write command. The voltage generation circuit provides an operation voltage group according to the control signal. The access circuit accesses the storage array according to the operation voltage group.Type: GrantFiled: March 14, 2019Date of Patent: July 6, 2021Assignee: WINBOND ELECTRONICS CORP.Inventors: Ping-Kun Wang, Shao-Ching Liao, Chien-Min Wu, Chia Hua Ho, Frederick Chen, He-Hsuan Chao, Seow-Fong Lim