Patents by Inventor Pradeep Trivedi

Pradeep Trivedi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6625791
    Abstract: A method and apparatus for optimizing the insertion of decoupling capacitance onto an integrated circuit is provided. Further, a sliding grid based technique for arraying decoupling capacitors into a white-space of an integrated includes sliding a bounded grid across the white-space in order to determine an optimal decap insertion for the white-space. The bounded grid is slid across the white-space in discrete steps. At each discrete step, a potential decap layout is calculated for the region of the white-space that intersects the bounded grid. After a set of potential decap layouts have been calculated for the white-space, the potential decap layout that yields optimal decap insertion is selected, and decap cells are arrayed into the area(s) of the white-space that are demarcated by the selected decap layout.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: September 23, 2003
    Assignee: Sun Microsystems, Inc.
    Inventors: Sudhakar Bobba, Pradeep Trivedi
  • Patent number: 6614287
    Abstract: A method and apparatus for post-fabrication calibration and adjustment of a delay locked loop leakage current is provided. The calibration and adjustment system includes an adjustment circuit that adjusts a leakage current offset circuit to compensate for the leakage current of a capacitor. The capacitor connects to a control voltage of the delay locked loop. Such control of the leakage current in the delay locked loop allows a designer to achieve a desired delay locked loop operating characteristic after the delay locked loop has been fabricated. A representative value of the amount of adjustment desired in the leakage current may be stored and subsequently read to adjust the delay locked loop.
    Type: Grant
    Filed: August 13, 2002
    Date of Patent: September 2, 2003
    Assignee: Sun Microsystems, Inc.
    Inventors: Claude R. Gauthier, Pradeep Trivedi, Brian W. Amick, Dean Liu
  • Publication number: 20030163750
    Abstract: A clock grid skew reduction technique that uses one or more biasable delay drivers to compensate for unbalanced loading and/or RC wire delay induced skew is provided. The biasable delay driver has a size that may be varied depending on a delay amount of a signal from a clock source to an input of the biasable delay driver. Depending on the delay amount, the biasable delay driver may be either sized up or sized down to modulate delay in order to reduce or eliminate skew between the clock signal at the input of the biasable delay driver and the clock signal at another point in a circuit.
    Type: Application
    Filed: February 26, 2002
    Publication date: August 28, 2003
    Inventors: Pradeep Trivedi, Lynn Ooi, Gin Yee
  • Publication number: 20030155964
    Abstract: An apparatus that uses a linear voltage regulator to reject power supply noise in a temperature sensor is provided. Further, a method for using a linear voltage regulator to reject power supply noise in a temperature sensor is provided. Further, a method and apparatus that uses a differential amplifier with a source-follower output stage as a linear voltage regulator for a temperature sensor is provided.
    Type: Application
    Filed: February 19, 2002
    Publication date: August 21, 2003
    Inventors: Claude Gauthier, Spencer Gold, Dean Liu, Kamran Zarrineh, Brian Amick, Pradeep Trivedi
  • Publication number: 20030158683
    Abstract: An integrated circuit that uses electrical fuses to store calibration information of a thermal monitoring device residing on the integrated circuit is provided. Such an integrated circuit allows a service processor of a computer system to query the integrated circuit for calibration information so that an accurate actual temperature measurement may be determined. Further, a method for reading and storing temperature calibration information on-chip is provided.
    Type: Application
    Filed: February 19, 2002
    Publication date: August 21, 2003
    Inventors: Claude Gauthier, Spencer Gold, Dean Liu, Kamran Zarrineh, Brian Amick, Pradeep Trivedi
  • Publication number: 20030155903
    Abstract: A method and apparatus that uses the difference between two nodal voltages, such as a temperature-independent voltage and a temperature-dependent voltage, to determine the actual temperature at a point on an integrated circuit is provided. Further, a method and apparatus that converts a difference between nodal voltages in an integrated circuit from an analog to a digital quantity on the integrated circuit such that the difference in voltage may be used by an on-chip digital system is provided. Further, a method and apparatus for quantifying a difference in voltage between a first node and a second node of a temperature sensor is provided.
    Type: Application
    Filed: February 19, 2002
    Publication date: August 21, 2003
    Inventors: Claude Gauthier, Brian Amick, Spencer Gold, Dean Liu, Kamran Zarrineh, Pradeep Trivedi
  • Publication number: 20030154447
    Abstract: A method for optimizing loop bandwidth in a delay locked loop is provided. A representative power supply waveform having noise is input into a simulation of the delay locked loop; an estimate of jitter is determined; and the loop bandwidth of the delay looked loop is adjusted until the jitter falls below a pre-selected value. Further, a computer system for optimizing loop bandwidth in a delay locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to optimize loop bandwidth in a delay locked loop is provided.
    Type: Application
    Filed: February 14, 2002
    Publication date: August 14, 2003
    Inventors: Claude Gauthier, Brian Amick, Dean Liu, Pradeep Trivedi
  • Publication number: 20030154454
    Abstract: A method for estimating jitter in a delay locked loop is provided. The estimation is determined from a simulation that uses a representative power supply waveform having noise as an input. Further, a computer system for estimating jitter in a delay locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to estimate jitter in a delay locked loop is provided.
    Type: Application
    Filed: February 14, 2002
    Publication date: August 14, 2003
    Inventors: Claude Gauthier, Brian Amick, Dean Liu, Pradeep Trivedi
  • Publication number: 20030154064
    Abstract: A method for optimizing decoupling capacitance in a phase locked loop is provided. A representative power supply waveform having noise is input into a simulation of the phase locked loop; an estimate of jitter is determined; and an amount of the decoupling capacitance is adjusted until the jitter falls below a pre-selected value. Further, a computer system for optimizing decoupling capacitance in a phase locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to optimize decoupling capacitance in a phase locked loop is provided.
    Type: Application
    Filed: February 14, 2002
    Publication date: August 14, 2003
    Inventors: Claude Gauthier, Brian Amick, Dean Liu, Pradeep Trivedi
  • Publication number: 20030154048
    Abstract: A method for optimizing a decoupling capacitance for an on-chip temperature sensor is provided. A representative power supply waveform having noise is input into a simulation of the on-chip temperature sensor; a difference between a temperature representative input and a temperature dependent output of the on-chip temperature sensor is determined; and an amount of the decoupling capacitance is adjusted until the difference falls below a pre-selected value. A computer system for optimizing a decoupling capacitance for an on-chip temperature sensor is also provided. A computer-readable medium having recorded thereon instructions executable by a processor for optimizing a decoupling capacitance for an on-chip temperature sensor is further provided.
    Type: Application
    Filed: February 14, 2002
    Publication date: August 14, 2003
    Inventors: Brian Amick, Claude Gauthier, Pradeep Trivedi, Dean Liu
  • Publication number: 20030151464
    Abstract: A method for estimating jitter in a phase locked loop is provided. The estimation is determined from a simulation that uses a representative power supply waveform having noise as an input. Further, a computer system for estimating jitter in a phase locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to estimate jitter in a phase locked loop is provided.
    Type: Application
    Filed: February 14, 2002
    Publication date: August 14, 2003
    Inventors: Claude Gauthier, Brian Amick, Dean Liu, Pradeep Trivedi
  • Publication number: 20030154065
    Abstract: A method for optimizing decoupling capacitance in a delay locked loop is provided. A representative power supply waveform having noise is input into a simulation of the delay locked loop; an estimate of jitter is determined; and an amount of the decoupling capacitance is adjusted until the jitter falls below a pre-selected value. Further, a computer system for optimizing decoupling capacitance in a delay locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to optimize decoupling capacitance in a delay locked loop is provided.
    Type: Application
    Filed: February 14, 2002
    Publication date: August 14, 2003
    Inventors: Claude Gauthier, Brian Amick, Dean Liu, Pradeep Trivedi
  • Publication number: 20030154453
    Abstract: A method for optimizing loop bandwidth in a phase locked loop is provided. A representative power supply waveform having noise is input into a simulation of the phase locked loop; an estimate of jitter is determined; and the loop bandwidth of the phase looked loop is adjusted until the jitter falls below a pre-selected value. Further, a computer system for optimizing loop bandwidth in a phase locked loop is provided. Further, a computer-readable medium having recorded thereon instructions adapted to optimize loop bandwidth in a phase locked loop is provided.
    Type: Application
    Filed: February 14, 2002
    Publication date: August 14, 2003
    Inventors: Claude Gauthier, Brian Amick, Dean Liu, Pradeep Trivedi
  • Publication number: 20030146773
    Abstract: A negative impedance device that accelerates signal transitions on a signal is provided. The negative impedance device is highly responsive to high to low and low to high transitions on the signal, and when one of these types of transitions begins to occur on the signal, the negative impedance device senses the transition and quickly drives the signal to the intended value before a point in time when the signal would have reached the intended value had the negative impedance device not been used. Further, a signal transition accelerator design that reduces signal rise and fall times is provided. Further, a method for accelerating a signal transition is provided.
    Type: Application
    Filed: February 6, 2002
    Publication date: August 7, 2003
    Inventors: Sudhakar Bobba, Pradeep Trivedi
  • Patent number: 6597219
    Abstract: A delay locked loop design that uses a switch operatively connected to a loop filter capacitor to control a leakage current of the loop filter capacitor is provided. By positioning a switch in series with the loop filter capacitor, the leakage current of the loop filter capacitor may be controlled by switching the switch ‘on’ when a charge pump of the delay locked loop is ‘on’ and switching the switch ‘off’ when the charge pump is ‘off,’ thereby cumulatively reducing the leakage current of the loop filter capacitor throughput the operation of the delay locked loop. Control and reduction of the loop filter capacitor leakage current leads to more reliable and stable delay locked loop behavior.
    Type: Grant
    Filed: July 19, 2002
    Date of Patent: July 22, 2003
    Assignee: Sun Microsystems, Inc.
    Inventors: Pradeep Trivedi, Claude R. Gauthier, Dean Liu
  • Patent number: 6597218
    Abstract: A technique Readjusting a bias-generator in a delay locked loop after fabrication of the delay locked loop. The technique involves use of an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired delay locked loop performance characteristic after the delay locked loop has been fabricated.
    Type: Grant
    Filed: April 24, 2002
    Date of Patent: July 22, 2003
    Assignee: Sun Microsystems, Inc.
    Inventors: Claude Gauthier, Brian Amick, Dean Liu, Pradeep Trivedi
  • Patent number: 6593784
    Abstract: A technique for adjusting a bias-generator in a phase locked loop after fabrication of the phase locked loop is provided. The technique involves use of an adjustment circuit operatively connected to the bias-generator, where the adjustment circuit is controllable to facilitate a modification of a voltage output by the bias-generator. Such control of the voltage output by the bias-generator allows a designer to achieve a desired phase locked loop performance characteristic after the phase locked loop has been fabricated.
    Type: Grant
    Filed: April 24, 2002
    Date of Patent: July 15, 2003
    Assignee: Sun Microsystems, Inc.
    Inventors: Claude Gauthier, Brian Amick, Pradeep Trivedi, Dean Liu
  • Patent number: 6577002
    Abstract: A 180 degree bump placement layout for an integrated circuit power grid is provided. This layout improves integrated circuit performance and reliability and gives an integrated circuit designer added flexibility and uniformity in designing the integrated circuit. Further, a patterned bump array for a top metal layer of an integrated circuit having a plurality of 180 degree bump placement structures is provided.
    Type: Grant
    Filed: November 29, 2001
    Date of Patent: June 10, 2003
    Assignee: Sun Microsystems, Inc.
    Inventors: Sudhakar Bobba, Tyler Thorp, Pradeep Trivedi
  • Publication number: 20030102899
    Abstract: A clock detect indicator capable of determining the presence of high and low frequency clock signals is provided. The clock detect indicator, which operates independent of a reference clock, has detection circuitry that determines whether a particular clock signal has alternating high-to-low and low-to-high transitions. Based on the determination, the clock detect indicator outputs a transition on a clock detect indication signal. Further, a method for detecting a clock signal in an integrated circuit is provided.
    Type: Application
    Filed: November 30, 2001
    Publication date: June 5, 2003
    Inventors: Pradeep Trivedi, Gin Yee
  • Publication number: 20030106033
    Abstract: A decoupling capacitor assignment technique that increases decoupling capacitance without violating a leakage power constraint of an integrated circuit is provided. The decoupling capacitor assignment technique selectively replaces decoupling capacitors associated with high driver decoupling capacitance need to available decoupling capacitance ratios with thin-oxide decoupling capacitors such that decoupling capacitance is increased and the leakage power constraint is met.
    Type: Application
    Filed: November 29, 2001
    Publication date: June 5, 2003
    Inventors: Pradeep Trivedi, Sudhakar Bobba, Tyler Thorp