Abstract: Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Abstract: An example power management unit utilizing an example circuit to disable a voltage regulator is provided. The example circuit includes a voltage selection circuit and a power-down switching device. The voltage selection circuit configured to receive a first voltage source and a second voltage source to output a selected voltage based on the higher of the two input voltages. The voltage selection circuit utilizes a first transistor electrically connected in parallel with a second transistor between the first voltage source and the second voltage source to generate the selected voltage. The second transistor gate voltage at the second transistor gate is generated based at least in part on a voltage at the first transistor drain. The selected voltage is generated based on a voltage at the second transistor drain. The power-down switching device is configured to generate a voltage for a voltage regulator based on the selected voltage.

Abstract: The present disclosure is directed to a fully analog voltage regulator circuit with reference modulation. The voltage regulator circuit includes a low-dropout regulator, a voltage-to-current convert, a resistor-capacitor filter circuit, and an operational amplifier voltage buffer. The voltage regulator circuit minimizes dropout voltage of the circuit by comparing the output voltage of the voltage regulator to a reference voltage and adjusting the output voltage of the op amp voltage buffer, accordingly. The voltage regulator circuit includes two operational amplifiers, wherein the negative input of a first of the two operational amplifiers is coupled to the negative input of a second of the two operational amplifiers through the resistor-capacitor filter circuit.

Abstract: A supply voltage detector of an integrated circuit is able to detect the state of a supply voltage upon startup with both high-speed and low overall power consumption. The supply voltage detector includes a comparator that generates an output voltage based on the current state of the supply voltage. The comparator includes a startup current booster that generates a supplemental current for the comparator while the supply voltage is ramping up. The start of current booster stops generating the supplemental current when the supply voltage reaches the expected steady-state value or a selected fraction or portion of the expected steady-state value.

Abstract: Provided herein are methods of treating B7-H1-expressing tumors comprising administering an effective amount of MEDI4736 or an antigen-binding fragment thereof.

Abstract: An active compensation circuit for compensating the stability of a regulator is provided. The active compensation circuit presents an equivalent capacitance and an equivalent resistance and compensates stability of system using the equivalent capacitance and the equivalent resistance. The regulator includes a power transistor that receives a driving signal and channelize the required current to the Ips driven by this block. The regulator's stability is compensated using the active compensation circuit to provide an accurate output voltage without significantly compromising the accuracy (load regulation) and area of the system.

Abstract: An assembly for detecting a structural defect in a semiconductor die is provided. The assembly includes a defect-detection sensor and a microcontroller. The defect-detection sensor includes a plurality of resistive paths of electrical-conductive material in the semiconductor die, each of which has a first end and a second end and extends proximate a perimeter of the semiconductor die. The defect-detection sensor includes a plurality of signal-generation structures, each coupled to a respective resistive path and configured to supply a test signal to the resistive path. The microcontroller is configured to control the signal-generation structures to generate the test signals, acquire the test signals in each resistive paths, test an electrical feature of the resistive paths by performing an analysis of the test signals acquired and detect the presence of the structural defect in the semiconductor die based on a result of the analysis of the test signals acquired.

Abstract: Provided herein are methods of treating non-small cell lung cancers comprising administering an effective amount of MEDI4736 or an antigen-binding fragment thereof and tremelimumab or an antigen-binding fragment thereof.

Abstract: An active compensation circuit for compensating the stability of a regulator is provided. The active compensation circuit presents an equivalent capacitance and an equivalent resistance and compensates stability of system using the equivalent capacitance and the equivalent resistance. The regulator includes a power transistor that receives a driving signal and channelize the required current to the Ips driven by this block. The regulator's stability is compensated using the active compensation circuit to provide an accurate output voltage without significantly compromising the accuracy (load regulation) and area of the system.

Abstract: Provided herein are methods of treating non-small cell lung cancers comprising administering an effective amount of MEDI4736 or an antigen-binding fragment thereof and tremelimumab or an antigen-binding fragment thereof.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Abstract: Provided herein are methods of treating B7-H1-expressing tumors comprising administering an effective amount of MEDI4736 or an antigen-binding fragment thereof.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In an embodiment, an integrated circuit (IC) includes power management unit (PMU), a set-reset (S-R) latch circuit, a multiplexer, and an AND gate circuit. A voltage monitor circuit of the PMU generates an output signal based on a difference between a received reference voltage and a received sense voltage from a functional supply. A power on reset (PoR) generator of the PMU generates a PoR signal based on a power up condition of the PMU. The S-R latch circuit generates an enable signal based on the output signal of the comparator circuit and the PoR signal. The multiplexer passes-through the output signal of the comparator circuit during a functional condition of the PMU. The AND gate circuit generates an enable signal based on an output of the multiplexer and an output of the S-R latch circuit.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In an embodiment, an integrated circuit (IC) includes power management unit (PMU), a set-reset (S-R) latch circuit, a multiplexer, and an AND gate circuit. A voltage monitor circuit of the PMU generates an output signal based on a difference between a received reference voltage and a received sense voltage from a functional supply. A power on reset (PoR) generator of the PMU generates a PoR signal based on a power up condition of the PMU. The S-R latch circuit generates an enable signal based on the output signal of the comparator circuit and the PoR signal. The multiplexer passes-through the output signal of the comparator circuit during a functional condition of the PMU. The AND gate circuit generates an enable signal based on an output of the multiplexer and an output of the S-R latch circuit.

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In one embodiment, a method includes setting voltage monitor circuits to test mode; setting, a monitor reference in each voltage monitor circuit, to a respective targeted threshold voltage using a corresponding trim code; ramping, a voltage provided to a subset of voltage monitor circuits, from a first voltage to a second voltage using a test voltage supply, voltages between the first voltage and the second voltage corresponding with targeted threshold voltages of the subset of voltage monitor circuits; determining, for each voltage monitor circuit in the subset of voltage monitor circuits, a voltage value of the test voltage supply resulting in a change in a logic state at an output of a corresponding voltage monitor circuit.

Abstract: A circuit includes analog input nodes and switches selectively coupling each of the analog input nodes to a capacitive node. Each of the switches is controlled by a respective bit of a channel selection word. Level shifting circuits are respectively coupled in parallel with the switches. A sampling capacitor is coupled between an output node and ground, the output node being coupled to the capacitive node. An analog to digital converter operates to digitize voltages at the output node.

Abstract: Provided herein are methods of treating B7-H1-expressing tumors comprising administering an effective amount of MEDI4736 or an antigen-binding fragment thereof.

Abstract: An analog-to-digital converter includes a sampling capacitor connected to a multiplexer output, discharge circuitry discharging the sampling capacitor during a first period beginning at a start of a sampling cycle, and level shifting circuitry charging the sampling capacitor to a voltage at a first analog input node modified by a mismatch voltage resulting from mismatch in threshold voltages between a first transistor connected to the first analog input node and a second transistor connected to the output node, during a second period beginning at expiration of the first period. A first switch connects the first analog input node to the output node to charge the sampling capacitor to the voltage at the first analog input node, at expiration of the second period, and disconnects the first analog input node from the output node at an end of the sampling cycle of the analog-to-digital converter.

Abstract: An RC oscillator generates a periodic trigger signal, and a clock generator generates clock edges in response. A stuck-at-fault detection circuit detects a stuck-at-logic state of the periodic trigger signal and causes the RC oscillator to reset and causes a change in logic state of the periodic trigger signal. The RC oscillator includes first and second comparison circuits, a logic circuit receiving output from the first and second comparison circuits and generating the periodic trigger signal, and a clock generation circuit generating a clock signal therefrom. The stuck-at-fault detection circuit includes a capacitive node, charge circuitry charging the capacitive node based upon the periodic trigger signal, discharge circuitry discharging the capacitive node based upon the periodic trigger signal, and triggering circuitry asserting a reset signal to cause the RC oscillator to reset when the charge on the capacitive node indicates a stuck-at-logic state of the periodic trigger signal.