Patents by Inventor Raymond Hill

Raymond Hill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20190253420
    Abstract: A system and method serve to a user a login menu that is executed on a computing device, wherein the login menu is programmed to acquire from a user a set of parameters for access to a facility computing environment. In response to receiving credentials corresponding to the user, displaying, using the computing device, at least one graphical user interface that allows the user to participate in at least one activity corresponding to the facility, wherein the at least one activity is based in part on the credentials and one or more tasks available at the facility, and wherein the one or more tasks are verified for the user. The system and method generate, using the computing device, one or more points in real-time or near real-time for the user, during execution of the at least one activity at the computing device, wherein the at least one point is based on at least one achievement corresponding to the activity.
    Type: Application
    Filed: April 22, 2019
    Publication date: August 15, 2019
    Inventors: Brian Christopher Hill, Michael Raymond Dhruba Cornstubble
  • Publication number: 20190201866
    Abstract: An apparatus for producing metal organic frameworks, comprising: a tubular flow reactor comprising a tubular body into which, in use, precursor compounds which form the metal organic framework are fed and flow, said tubular body including at least one annular loop.
    Type: Application
    Filed: March 8, 2019
    Publication date: July 4, 2019
    Applicant: Commonwealth Scientific and Industrial Research Organisation
    Inventors: Marta RUBIO MARTINEZ, Matthew Roland HILL, Michael BATTEN, Kok Seng LIM, Anastasios POLYZOS, Timothy Raymond BARTON, Trevor Dean HADLEY, Andreas Alexander MONCH
  • Patent number: 10338038
    Abstract: A clamp assembly includes a rail configured to receive a first fluidic assembly, and a carriage slidably mounted to the rail and configured to receive a second fluidic assembly. The carriage is operable to establish a first fluid tight seal between the first fluidic assembly and a chromatography column received within the clamp assembly, and to establish a second fluid tight seal between the second fluidic assembly and the chromatography column.
    Type: Grant
    Filed: December 10, 2012
    Date of Patent: July 2, 2019
    Assignee: WATERS TECHNOLOGIES CORPORATION
    Inventors: Peter Kirby, Marcos O. Peroza, Steven D. Trudeau, Ryan Hill, Raymond P. Fisk, Jonathan Belanger, Wade P. Leveille
  • Patent number: 10320793
    Abstract: A system and method serve to a user a login menu that is executed on a computing device, wherein the login menu is programmed to acquire from a user a set of parameters for access to a facility computing environment. In response to receiving credentials corresponding to the user, displaying, using the computing device, at least one graphical user interface that allows the user to participate in at least one activity corresponding to the facility, wherein the at least one activity is based in part on the credentials and one or more tasks available at the facility, and wherein the one or more tasks are verified for the user. The system and method generate, using the computing device, one or more points in real-time or near real-time for the user, during execution of the at least one activity at the computing device, wherein the at least one point is based on at least one achievement corresponding to the activity.
    Type: Grant
    Filed: April 21, 2016
    Date of Patent: June 11, 2019
    Assignee: JAIL EDUCATION SOLUTIONS, INC
    Inventors: Brian Christopher Hill, Michael Raymond Dhruba Cornstubble
  • Publication number: 20180216430
    Abstract: A downhole sensing device deployment control apparatus (10) includes means to control speed of the sensing device progressing within a borehole associated with a drilling operation. A mechanical, electrically powered and/or hydro-dynamic drag/damping means/device (12) can be provided as part of the control apparatus to control speed of deployment down the borehole. The drag device (12) can have a plurality of wheels or rollers to contact an internal bore of an inner pipe of a drill string. Rotation control means (24), (26) can be provided to control an amount of rotation and/or direction of rotation of the wheels or rollers relative to travel of the sensing device within the borehole. Valving (60) can be provided. A two stage (dual) flow/pressure control valve (100) can be provided. A sensing device (release 216) and downhole position latch (202) can be provided. The sensing device can be pumped into the borehole, such as by compressed air.
    Type: Application
    Filed: July 29, 2016
    Publication date: August 2, 2018
    Inventors: Gordon Stewart, Raymond Hill
  • Patent number: 10037862
    Abstract: A charged particle detecting device includes: a holding structure; a first charged particle detector at the terminal portion of the holding structure; a second charged particle detector at the terminal portion of the holding structure; a detector head at the terminal portion of the holding structure; and a first electrode which is transmissive for the first and second species of charged particles covering an entrance opening of the detector head.
    Type: Grant
    Filed: May 24, 2016
    Date of Patent: July 31, 2018
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Sybren J. Sijbrandij, John A. Notte, IV, Raymond Hill
  • Publication number: 20170321534
    Abstract: Apparatus (100) for measuring drilling parameters of a down-the-hole drilling operation for mineral exploration includes a module 10.1 mounted in-line with a drill string (110) and proximate to a drill bit (120). The drill string (110) is rotated and progressed down the hole. The module (10) has sensors for sensing conditions. The apparatus (100) measures drilling parameters based on the sensed conditions. The measured data is logged in the module (10) and then transmitted to a computer for a drilling operator's use. The drilling operator monitors progress and optimises performance of the drilling operation based on the measured data. Measurement of drilling parameters based on sensed data proximate to the drill bit enables accurate determination of actual WOB, torque and RPM fluctuations, axial vibration, radial vibration, temperature, RPM. A second module 10.2 is mounted in-line with the same drill string (110) but away from the drill bit (120). The second module 10.
    Type: Application
    Filed: November 12, 2015
    Publication date: November 9, 2017
    Inventors: Gordon Stewart, Raymond Hill
  • Publication number: 20170032925
    Abstract: A charged particle detecting device is disclosed which includes: a holding structure; a first charged particle detector at the terminal portion of the holding structure, the first charged particle detector being configured to generate a first electrical signal when a first species of charged particles impinges on the first charged particle detector; a second charged particle detector at the terminal portion of the holding structure, the second charged particle detector is configured to generate a second electrical signal when a second species of charged particles impinges on the second charged particle detector; a detector head at the terminal portion of the holding structure, the detector head defining a hollow volume within which a particle entrance surface of the first charged particle detector and a particle entrance surface of the second charged particle detector are arranged; and a first electrode which is transmissive for the first and second species of charged particles covering an entrance opening of
    Type: Application
    Filed: May 24, 2016
    Publication date: February 2, 2017
    Inventors: Sybren J. Sijbrandij, John A. Notte, IV, Raymond Hill
  • Patent number: 9536699
    Abstract: The present disclosure relates to a gas field ion source having a gun housing, an electrically conductive gun can base attached to the gun housing, an inner tube mounted to the gun can base, the inner tube being made of an electrically isolating ceramic, an electrically conductive tip attached to the inner tube, an outer tube mounted to the gun can base, the outer tube being made of an electrically isolating ceramic, and an extractor electrode attached to the outer tube. The extractor electrode can have an opening for the passage of ions generated in proximity to the electrically conductive tip.
    Type: Grant
    Filed: June 25, 2014
    Date of Patent: January 3, 2017
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: John A. Notte, IV, Weijie Huang, Raymond Hill, FHM-Faridur Rahman, Alexander Groholski, Shawn McVey
  • Patent number: 9530611
    Abstract: The present disclosure relates to a charged particle beam system, comprising a noble gas field ion beam source, a charged particle beam column, and a housing defining a first vacuum region and a second vacuum region. A noble gas field ion beam source is arranged within the first vacuum region. A first mechanical vacuum pump is functionally attached to the first vacuum region, an ion getter pump is attached to the charged particle beam column, and a gas supply is attached to the first vacuum region configured to supply a noble gas to the noble gas field ion beam source.
    Type: Grant
    Filed: June 25, 2014
    Date of Patent: December 27, 2016
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: John A. Notte, IV, Alexander Groholski, Robert Conners, Mark D. DiManna, Raymond Hill
  • Patent number: 9530612
    Abstract: The present disclosure relates to a charged particle beam system comprising a charged particle beam source, a charged particle column, a sample chamber, a plurality of electrically powered devices arranged within or at either one of the charged particle column, the charged particle beam source and the sample chamber, and at least one first converter to convert an electrical AC voltage power into an electrical DC voltage. The first converter is positioned at a distance from either of the charged particle beam source, the charged particle column and the charged particle chamber, and all elements of the plurality of electrically powered devices, when operated during operation of the charged particle beam source, are configured to be exclusively powered by the DC voltage provided by the converter.
    Type: Grant
    Filed: June 25, 2014
    Date of Patent: December 27, 2016
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: John A. Notte, IV, Mark D. DiManna, Raymond Hill, Robert Conners, Alexander Groholski
  • Patent number: 9236225
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: April 13, 2015
    Date of Patent: January 12, 2016
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Publication number: 20150213997
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Application
    Filed: April 13, 2015
    Publication date: July 30, 2015
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Patent number: 9012867
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: May 23, 2014
    Date of Patent: April 21, 2015
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Patent number: 9000396
    Abstract: Disclosed are devices, systems, and methods are disclosed that include: (a) a first material layer positioned on a first surface of a support structure and configured to generate secondary electrons in response to incident charged particles that strike the first layer, the first layer including an aperture configured to permit a portion of the incident charged particles to pass through the aperture; and (b) a second material layer positioned on a second surface of the support structure and separated from the first layer by a distance of 0.5 cm or more, the second layer being configured to generate secondary electrons in response to charged particles that pass through the aperture and strike the second layer, where the device is a charged particle detector.
    Type: Grant
    Filed: October 20, 2011
    Date of Patent: April 7, 2015
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Raymond Hill, Shawn McVey, John Notte, IV
  • Publication number: 20150008341
    Abstract: The present disclosure relates to a charged particle beam system, comprising a noble gas field ion beam source, a charged particle beam column, and a housing defining a first vacuum region and a second vacuum region. A noble gas field ion beam source is arranged within the first vacuum region. A first mechanical vacuum pump is functionally attached to the first vacuum region, an ion getter pump is attached to the charged particle beam column, and a gas supply is attached to the first vacuum region configured to supply a noble gas to the noble gas field ion beam source.
    Type: Application
    Filed: June 25, 2014
    Publication date: January 8, 2015
    Inventors: John A. Notte, IV, Alexander Groholski, Robert Conners, Mark D. DiManna, Raymond Hill
  • Publication number: 20150008332
    Abstract: The present disclosure relates to a gas field ion source having a gun housing, an electrically conductive gun can base attached to the gun housing, an inner tube mounted to the gun can base, the inner tube being made of an electrically isolating ceramic, an electrically conductive tip attached to the inner tube, an outer tube mounted to the gun can base, the outer tube being made of an electrically isolating ceramic, and an extractor electrode attached to the outer tube. The extractor electrode can have an opening for the passage of ions generated in proximity to the electrically conductive tip.
    Type: Application
    Filed: June 25, 2014
    Publication date: January 8, 2015
    Inventors: John A. Notte, IV, Weijie Huang, Raymond Hill, FHM-Faridur Rahman, Alexander Groholski, Shawn McVey
  • Publication number: 20150008342
    Abstract: The present disclosure relates to a charged particle beam system comprising a charged particle beam source, a charged particle column, a sample chamber, a plurality of electrically powered devices arranged within or at either one of the charged particle column, the charged particle beam source and the sample chamber, and at least one first converter to convert an electrical AC voltage power into an electrical DC voltage. The first converter is positioned at a distance from either of the charged particle beam source, the charged particle column and the charged particle chamber, and all elements of the plurality of electrically powered devices, when operated during operation of the charged particle beam source, are configured to be exclusively powered by the DC voltage provided by the converter.
    Type: Application
    Filed: June 25, 2014
    Publication date: January 8, 2015
    Inventors: John A. Notte, IV, Mark D. DiManna, Raymond Hill, Robert Conners, Alexander Groholski
  • Publication number: 20140311807
    Abstract: A down-the-hole hammer drill that delivers fluid to a cutting face has particular application, but not limited, to a reverse-circulation (RC) down-hole face sampling hammer drill is tailored to the design of the cutting face to improve flushing of the cutting face. An associated drill bit and drive sub are also disclosed.
    Type: Application
    Filed: October 26, 2012
    Publication date: October 23, 2014
    Inventors: Philipp Beierer, Raymond Hill
  • Publication number: 20140306121
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Application
    Filed: May 23, 2014
    Publication date: October 16, 2014
    Applicant: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz