Patents by Inventor Raymond Hill

Raymond Hill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20140311807
    Abstract: A down-the-hole hammer drill that delivers fluid to a cutting face has particular application, but not limited, to a reverse-circulation (RC) down-hole face sampling hammer drill is tailored to the design of the cutting face to improve flushing of the cutting face. An associated drill bit and drive sub are also disclosed.
    Type: Application
    Filed: October 26, 2012
    Publication date: October 23, 2014
    Inventors: Philipp Beierer, Raymond Hill
  • Publication number: 20140306121
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Application
    Filed: May 23, 2014
    Publication date: October 16, 2014
    Applicant: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Patent number: 8766210
    Abstract: Charged particle system are disclosed and include a first voltage source, a second voltage source electrically isolated from the first voltage source, a charged particle source electrically connected to the first voltage source, and an extractor electrically connected to the second voltage source. Methods relating to the charged particle systems are also disclosed.
    Type: Grant
    Filed: December 16, 2011
    Date of Patent: July 1, 2014
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Raymond Hill, John Notte, IV
  • Patent number: 8748845
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: January 24, 2012
    Date of Patent: June 10, 2014
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: Billy W. Ward, John A. Notte, Louis S. Farkas, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Patent number: 8399864
    Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.
    Type: Grant
    Filed: August 31, 2011
    Date of Patent: March 19, 2013
    Assignee: FEI Company
    Inventors: Raymond Hill, Lawrence Scipioni, Colin August Sanford, Mark DiManna, Michael Tanguay
  • Publication number: 20120138815
    Abstract: Charged particle system are disclosed and include a first voltage source, a second voltage source electrically isolated from the first voltage source, a charged particle source electrically connected to the first voltage source, and an extractor electrically connected to the second voltage source. Methods relating to the charged particle systems are also disclosed.
    Type: Application
    Filed: December 16, 2011
    Publication date: June 7, 2012
    Applicant: CARL ZEISS NTS, LLC
    Inventors: Raymond Hill, John Notte, IV
  • Publication number: 20120141693
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Application
    Filed: January 24, 2012
    Publication date: June 7, 2012
    Applicant: ALIS CORPORATION
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Publication number: 20120068068
    Abstract: Disclosed are devices, systems, and methods are disclosed that include: (a) a first material layer positioned on a first surface of a support structure and configured to generate secondary electrons in response to incident charged particles that strike the first layer, the first layer including an aperture configured to permit a portion of the incident charged particles to pass through the aperture; and (b) a second material layer positioned on a second surface of the support structure and separated from the first layer by a distance of 0.5 cm or more, the second layer being configured to generate secondary electrons in response to charged particles that pass through the aperture and strike the second layer, where the device is a charged particle detector.
    Type: Application
    Filed: October 20, 2011
    Publication date: March 22, 2012
    Applicant: CARL ZEISS NTS, LLC
    Inventors: Raymond Hill, Shawn McVey, John Notte, IV
  • Patent number: 8110814
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: February 2, 2009
    Date of Patent: February 7, 2012
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Klaus Edinger, Lars Markwort, Dirk Aderhold, Ulrich Mantz
  • Patent number: 8101928
    Abstract: Charged particles that are in transit through a deflection system when the beam is repositioned do not received the correct deflection force and are misdirected. By independently applying signals to the multiple stages of a deflection system, the number of misdirected particles during a pixel change is reduced.
    Type: Grant
    Filed: July 31, 2009
    Date of Patent: January 24, 2012
    Assignee: FEI Company
    Inventors: Raymond Hill, Steve Ake Rosenberg, Daniel B. Downer
  • Publication number: 20110309263
    Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.
    Type: Application
    Filed: August 31, 2011
    Publication date: December 22, 2011
    Applicant: FEI COMPANY
    Inventors: Raymond Hill, Colin August Sanford, Lawrence Scipioni, Mark DiManna, Michael Tanguay
  • Patent number: 8013311
    Abstract: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.
    Type: Grant
    Filed: October 9, 2009
    Date of Patent: September 6, 2011
    Assignee: FEI Company
    Inventors: Raymond Hill, Lawrence Scipioni, Colin August Sanford, Mark DiManna, Michael Tanguay
  • Publication number: 20110180722
    Abstract: Disclosed are systems (2000) and a method for aligning a charged particle beam (2100) in charged particle optics that include a charged particle source (2010) and a charged particle optical column (2040), where at least one electrode (2050, 2060) of the column includes a plurality of segments, and where different electrical potentials are applied to at least some of the segments to correct for source (2010) till and/or displacement errors and to align particle beam (2100) a long axis (2045) of the column (2040). Alternatively, magnetic field-generating elements can be used for aligning.
    Type: Application
    Filed: August 12, 2009
    Publication date: July 28, 2011
    Applicant: CARL ZEISS NTS, LLC
    Inventor: Raymond Hill
  • Publication number: 20110127428
    Abstract: Systems and methods to detect electrons from one or more samples are disclosed. In some embodiments, the systems and methods involve one or more magnetic field sources, for deflecting secondary electrons emitted from the surface of the samples.
    Type: Application
    Filed: May 26, 2009
    Publication date: June 2, 2011
    Applicant: CARL ZEISS NTS, LLC.
    Inventors: Raymond Hill, John A. Notte, IV
  • Patent number: 7786452
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: August 31, 2010
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill
  • Patent number: 7786451
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: August 31, 2010
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Alexander Groholski, Richard Comunale
  • Patent number: 7760350
    Abstract: A method of inspecting a glazing for faults involves illuminating the glazing with light having a first wavelength to produce a bright-field image, and illuminating the glazing with light having a second wavelength to produce a dark-field image. The bright-field image and dark-field image are captured using a single image capture device. The bright-field and dark-field images may be focussed onto the image capture device by a common lens. In addition, a shadowgraph image may be recorded simultaneously. The inspection method provides an improved fault detection system for glazings, such as automotive glazings.
    Type: Grant
    Filed: March 28, 2007
    Date of Patent: July 20, 2010
    Assignee: Pilkington Group Limited
    Inventor: Barry Raymond Hill
  • Patent number: 7745801
    Abstract: Ion sources, systems and methods are disclosed.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: June 29, 2010
    Assignee: ALIS Corporation
    Inventors: Billy W. Ward, John A. Notte, IV, Louis S. Farkas, III, Randall G. Percival, Raymond Hill, Alexander Groholski, Richard Comunale
  • Patent number: 7692781
    Abstract: A method of forming a shadowgraph image is described, comprising the steps of illuminating a glazing (52), e.g., a vehicle windscreen, with light from a localized light source (50), said light being expanded and collimated by a lens optical system (54) or a mirror optical system, forming a virtual shadowgraph image of the glazing in a virtual image plane (56), which may be positioned behind or in front of the glazing: and imaging the virtual image onto a CCD camera (62). The glazing may be moving relative to the light source or may be stationary.
    Type: Grant
    Filed: March 15, 2004
    Date of Patent: April 6, 2010
    Assignee: PILKINGTON plc
    Inventors: Barry Raymond Hill, Simon Peter Aldred
  • Publication number: 20100059047
    Abstract: The invention provides a solar hot water heating system including one or more solar energy absorbers (102) having at least a first fluid circulation path wherein, an over temperature path (119) is provided, the over temperature path including a pressure vessel (120) which is normally closed to atmosphere, the over temperature path being connected to the first fluid circulation path (108) so that, in the event that fluid in the solar energy absorber vaporizes, the fluid is forced out of the solar energy absorber and into the pressure vessel. The present invention also provides a temperature sensitive valve leaving a flow path and a valve member operated by a thermal element having thermal expansion characteristic the valve including a support member against which the thermal element expands to force the valve element to close the flow path.
    Type: Application
    Filed: January 31, 2006
    Publication date: March 11, 2010
    Inventors: Brendan Bourke, Raymond Hill