Abstract: A disk array controller reliably detects disk drive power-on-reset events that may cause a disk drive that has uncommitted write data stored in its cache to lose such data. The methods for detecting the power-on-reset events include operating the disk drives in an ATA security mode in which a power-on-reset of a disk drive will cause the drive to enter a locked state in which data transfer commands are aborted; and tracking power cycle count attributes of the disk drives over time. When a disk drive power-on-reset event is detected, the disk array may be efficiently restored to an operational state by re-executing or “replaying” a set of write commands that are cached within the disk array controller. The invention is also applicable to single-disk-drive storage systems.

Abstract: The present invention provides a checkout system which comprises an item accumulation (bagging) area which is partitioned into two or more sections using a flexible divider. The flexible divider extends from the entry zone of the accumulation area to a point on the boundary of the accumulation zone, but is longer than required to achieve this. When items are introduced into one section of the bagging area, if the items push against the flexible divider, for example due to weight of numbers, the divider flexes into the other section thereby making more space available in the current section for the items. Optionally the flexible divider is movable between two positions in the entry zone such that it further acts as a diverter for diverting items into one or other of the two sections and preferably a motor is used to automatically perform the movement.

Abstract: Improved electrical transient blocking is provided with a transient blocking unit (TBU) having a partial disconnect capability. A TBU is an arrangement of voltage controlled switches that normally conducts, but switches to a disconnected state in response to an above-threshold input transient. Partial disconnection improves the power handling capability of a TBU by preventing thermal damage to the TBU. Partial TBU disconnection can be implemented to keep power dissipation in the TBU below a predetermined level Pmax, thereby avoiding thermal damage to the TBU by keeping the TBU temperature below a temperature limit Tmax. Alternatively, partial TBU disconnection can be implemented to keep TBU temperature below Tmax using direct temperature sensing and feedback.

Abstract: A dunnage removal apparatus is situated adjacent a load conveyor and more particularly at a transfer device that moves a unitized load from the load conveyor to a pre-feeder. The dunnage removal apparatus includes a guide chute that funnels a loose flap of the dunnage sheet toward a sheet stripper mechanism. The mechanism includes a motor driven drive roller and a pair of pinch rollers that pinch the flap and pull the dunnage sheet from beneath the load. The pinch rollers are supported for movement relative to the drive roller to accept dunnage sheet(s) of variable thicknesses. A backstop plate is provided that moves with the pinch rollers. The load bears against the backstop plate as the dunnage sheet(s) is removed.

Abstract: A method and apparatus for transient blocking relying on a transient blocking device and a sampling circuit. The transient blocking device has at least one depletion mode n-channel device interconnected with at least one depletion mode p-channel device such that a transient alters a bias voltage Vp of the depletion mode p-channel device and a bias voltage Vn of the depletion mode n-channel device in such a manner that the depletion mode devices mutually switch off to block the transient. The sampling circuit is interconnected with the depletion mode p-channel device and the depletion mode n-channel device for unblocking the transient blocking device for to determined whether the transient persists. In the event of a persistent transient, the sampling circuit uses a disconnect element for permanently blocking the transient blocking device.

Abstract: Transient blocking with electrostatic discharge (ESD) protection to be employed with a transient blocking apparatus that has a transient blocking core with an input, an output and at least one depletion mode n-channel device interconnected with at least one depletion mode p-channel device such that a transient alters a bias voltage Vp of the p-channel device and a bias voltage Vn of the n-channel device so that these devices mutually switch off to block the transient. The apparatus uses high-voltage depletion mode devices, e.g., MOSFETs, connected before the input and/or past the output of the transient blocking core in uni-directional and bi-directional embodiments, respectively. The ESD protection unit can be of the fold-back type and is connected between the input and output of the core to protect the transient blocking apparatus by causing the core to turn the high-voltage devices back on and shunting the core when dangerously high over-current conditions are produced by ESD events.

Abstract: Digital control of frequency and/or amplitude modulation techniques of an intracavity and/or extracavity AOM (60) facilitate substantially full extinction of a laser beam (90) to prevent unwanted laser energy from impinging a workpiece (80); facilitate laser pulse amplitude stability through closed-loop control of pulse-to-pulse laser energy; facilitate beam-positioning control including, but not limited to, closed-loop control for applications such as alignment error correction, beam walk rectification, or tertiary positioning; and facilitate employment of more than one transducer on an AOM (60) to perform any of the above-listed applications.

Abstract: An apparatus and a method for uni-directional and bi-directional transient blocking. The uni-directional apparatus has a depletion mode n-channel device at its input and a normally closed relay, e.g., a micro-electro-mechanical (MEM) relay, interconnected with the depletion mode n-channel device and the input in such a way that at a predetermined current value the transient causes the normally closed relay to switch into an open state and apply a bias voltage Vn on the depletion mode n-channel device that is sufficiently high to switch it “off” thus block the transient. An analogous arrangement at the output taking advantage of the same or a second relay renders the apparatus bi-directional. The structure of the apparatus and the method of operation ensure a reliable and repeatable trip current Itrip and render the apparatus very robust and feasible for low-cost manufacture.

Abstract: A binding mechanism assembly for binding a sheet item, the binding mechanism assembly including a backing member having an upper surface, and a binding member directly or indirectly coupled to the backing member. The binding member includes a protrusion shaped and located to protrude through a hole of a sheet item to be bound thereto. The binding member further includes a generally flexible flange that is manually movable into engagement with the protrusion to form a generally closed loop and thereby bind the sheet item thereto. The loop is rotatable relative to the backing member from a first position in which the loop is generally located above the upper surface to a second position wherein at least part of the loop is located below the upper surface. The loop is fixedly and not slidably coupled to the backing member.

Abstract: A method of manufacturing a fan from a plurality of fan blades (12), comprising the steps of: providing an injection moulding tool (30) which defines a fan hub section (14); assembling a predetermined number of preformed fan blades with the injection moulding so that inner ends (16) of said blades extend into moulding cavities (32) within the tool, injecting synthetic plastics material into the tool, and allowing the injected material to cool or cure to thereby form a moulded hub with the inner ends of the blades bonded therein.

Abstract: A transient blocking unit (TBU) having reduced series impedance is provided. A TBU includes two or more depletion mode transistors arranged to provide a low series impedance in normal operation and a high series impedance when the input current exceeds a predetermined threshold. A nonlinear impedance element is included in the TBU that acts as a current limiter having a substantially constant saturation current over a range of applied voltages. This saturation current is selected to be the threshold current of the TBU. When the threshold is exceeded, the voltage developed across the nonlinear impedance element tends to drive the TBU into its high impedance state. When the operating current is below threshold, the TBU series resistance is relatively low because the nonlinear impedance element is in its low-resistance state. The nonlinear impedance element can be a separate circuit element, or it can be integrated with one or more of the TBU transistors.

Abstract: A transient blocking unit (TBU) having improved damage resistance is provided. A TBU includes two or more depletion mode transistors arranged to provide a low series impedance in normal operation and a high series impedance when the input current exceeds a predetermined threshold. At least one of the TBU transistors is a protecting device having a shunt circuit element connected in parallel with its channel. When the TBU is in its high impedance state, the shunt circuit element provides a current path, thereby decreasing terminal voltages on at least one of the TBU transistors. The shunt element can be a discrete or integrated resistor, a current source including a transistor, or an appropriately engineered device parasitic.

Abstract: Techniques for collocating a processing unit and a visual unit are provided. An apparatus for such collocation can include a processing unit receiving portion, a visual unit mounting portion, and a connecting bracket. The processing unit receiving portion can be adapted to receive the processing unit, and the visual unit mounting portion can be adapted to mount the visual unit. A connecting bracket can have a first region secured to the processing unit receiving portion and a second region secured to the visual unit mounting portion, and can define a channel that can function as a “chimney” for flow of a cooling medium, and/or as a cable raceway.

Abstract: A set (50) of laser pulses (52) is employed to sever a conductive link (22) in a memory or other IC chip. The duration of the set (50) is preferably shorter than 1,000 ns; and the pulse width of each laser pulse (52) within the set (50) is preferably within a range of about 0.1 ps to 30 ns. The set (50) can be treated as a single “pulse” by conventional laser positioning systems (62) to perform on-the-fly link removal without stopping whenever the laser system (60) fires a set (50) of laser pulses (52) at each link (22). Conventional IR wavelengths or their harmonics can be employed.

Abstract: A set (50) of laser pulses (52) is employed to sever a conductive link (22) in a memory or other IC chip. The duration of the set (50) is preferably shorter than 1,000 ns; and the pulse width of each laser pulse (52) within the set (50) is preferably within a range of about 0.1 ps to 30 ns. The set (50) can be treated as a single “pulse” by conventional laser positioning systems (62) to perform on-the-fly link removal without stopping whenever the laser system (60) fires a set (50) of laser pulses (52) at each link (22). Conventional IR wavelengths or their harmonics can be employed.

Abstract: An assembly and device that provides a flexible, removable and sealable touch guard system for use with retail display systems and more specifically for use with displays requiring repeated human interactive use is provided for. More particularly, the present invention relates to an assembly and device that provides a sealable touch guard between a bezel, a protective covering and a display while under compression. Additionally the present invention is readily used with customer-specific bezel covers and displays often used with point of sale (POS)-like terminals.

Abstract: A set (50) of laser pulses (52) is employed to sever a conductive link (22) in a memory or other IC chip. The duration of the set (50) is preferably shorter than 1,000 ns; and the pulse width of each laser pulse (52) within the set (50) is preferably within a range of about 0.1 ps to 30 ns. The set (50) can be treated as a single “pulse” by conventional laser positioning systems (62) to perform on-the-fly link removal without stopping whenever the laser system (60) fires a set (50) of laser pulses (52) at each link (22). Conventional IR wavelengths or their harmonics can be employed.

Abstract: A set (50) of laser pulses (52) is employed to sever a conductive link (22) in a memory or other IC chip. The duration of the set (50) is preferably shorter than 1,000 ns; and the pulse width of each laser pulse (52) within the set (50) is preferably within a range of about 0.1 ps to 30 ns. The set (50) can be treated as a single “pulse” by conventional laser positioning systems (62) to perform on-the-fly link removal without stopping whenever the laser system (60) fires a set (50) of laser pulses (52) at each link (22). Conventional IR wavelengths or their harmonics can be employed.

Abstract: A set (50) of laser pulses (52) is employed to sever a conductive link (22) in a memory or other IC chip. The duration of the set (50) is preferably shorter than 1,000 ns; and the pulse width of each laser pulse (52) within the set (50) is preferably within a range of about 0.1 ps to 30 ns. The set (50) can be treated as a single “pulse” by conventional laser positioning systems (62) to perform on-the-fly link removal without stopping whenever the laser system (60) fires a set (50) of laser pulses (52) at each link (22). Conventional IR wavelengths or their harmonics can be employed.