Abstract: The read circuit comprises an array branch having an input array node connected, via an array bit line, to an array cell; a reference branch having an input reference node connected, via a reference bit line, to a reference cell; a current-to-voltage converter connected to an output array node of the array branch and to an output reference node of the reference branch to supply on the output array node and the output reference node the respective electric potentials correlated to the currents flowing in the array memory cell and, respectively, in the reference memory cell; and a comparator connected at input to the output array node and output reference node and supplying as output a signal indicative of the contents stored in the array memory cell; and an array decoupling stage arranged between the input array node and the output array node to decouple the electric potentials of the input and output array nodes from one another.

Abstract: The read circuit includes a biasing stage connected to the memory cell to be read and having the purpose of biasing the drain terminal of the memory cell at a preset operating potential, typically 1 V; and a regulating circuit connected to a supply line set at a supply voltage and supplying to the biasing stage a bias current which is stable as the temperature and the supply voltage vary.

Abstract: The non volatile memory device integrates, in one and the same chip, the array of memory cells, a voltage regulator which supplies a regulated operating voltage to a selected word line, and a short circuit detecting circuit. The short circuit detecting circuit detects the output voltage of the voltage regulator, which is correlated to the current for biasing the cells of the word line selected. Once settled to the steady state condition, the output current assumes one first value in the absence of short circuits, and one second value in the presence of a short circuit between the word line selected and one or more adjacent word lines. The short circuit detecting circuit compares the output current of the voltage regulator with a reference value and generates at output a short circuit digital signal which indicates the presence or otherwise of a short circuit.

Abstract: A low-consumption TTL-CMOS input buffer stage includes a chain of inverters cascade connected between an input receiving electric signals at a TTL logic level and an output reproducing electric signals at a CMOS logic level, and powered between a first or supply voltage reference and a second or ground reference. Advantageously, the first inverter in the chain includes a means of selecting the delivery path to the stage according to an activate signal for a low-consumption operation mode. In essence, the first inverter of the buffer has two signal paths: one for normal operation and the other for low consumption operation.

Abstract: A non-volatile memory device is organized with memory cells that are arranged by row and by column. The memory device includes a sector of matrix cells, row decoders and column decoders suitable to decode address signals and to activate respectively the rows or said columns, at least a sector of redundancy cells such that it is possible to substitute a row of the sector of matrix cells with a row of the sector of redundancy cells. The non-volatile memory device comprises a local column decoder for the matrix sector and a local column decoder for the redundancy sector. The local column decoders are controlled by external signals so that the row of the redundancy sector is activated simultaneously with the row of the matrix sector.

Abstract: The sensing circuits comparing the current flowing in the cell with a plurality of reference currents are not identical to each other but differently amplify the compared currents. In particular, the sensing circuit associated with the lowest reference current amplifies the cell current more than the other sensing circuits and to the respective reference current. The current dynamics is thereby increased and it is possible to keep the reading voltage low, since the inherent characteristic of the lowest reference current may be very close to or directly superimposed on that of the immediately preceding memory cell current distribution, retaining the possibility of discriminating between the different logic levels.

Abstract: A read timing circuit regulates the step of reading from a multi-level non-volatile memory, which circuit is of a type adapted to generate and issue an equalization signal to a sense amplifier placed downstream of a dummy path including at least one dummy wordline, the latter being applied a supply voltage and associated with a dummy decoding circuit portion which receives an ATD signal. The circuit comprises a differential cell comparator having a first input connected downstream of the dummy path and a second input to receive a reference signal, thereby generating an electric signal on an output upon the dummy wordline attaining a potential which is a predetermined percent of the supply voltage.

Abstract: A voltage boost device includes a first boost stage and a second boost stage connected to an input terminal and to an output terminal, the output terminal supplying an output voltage higher than a supply voltage. The input terminal receives an operating condition signal having a first logic level representative of a standby operating state and a second logic level representative of an active operation state. The first boost stage is enabled in presence of the second logic level of the operating condition signal, and is disabled in presence of the first logic level of the operating condition signal; the second boost stage is controlled in a first operating condition in presence of the first logic level of the operating condition signal, and is controlled in a second operating condition in presence of the second logic level of the operating condition signal.

Abstract: Circuit for the regulation of the word line voltage in a memory, including a voltage regulator suitable to generate an output regulated voltage to be supplied to one or more word lines of the memory when said one or more word lines are being selected, and charge accumulation means that are selectively connectable with the output of the voltage regulator and suitable to accumulate a compensation charge for a voltage drop that takes place on said regulated voltage upon the selection of said one or more word lines of the memory.

Abstract: A circuit for the regulation of the word line voltage in a memory, comprising a voltage regulator suitable to generate an output regulated voltage to be supplied to one or more word lines of the memory when the one or more word lines are being selected. The circuit includes a voltage boosting circuit that is coupled to the output of said voltage regulator and that can be activated upon the selection of one or more memory word lines in order to boost the regulated voltage upon the selection of the one or more memory word lines.

Abstract: Presented is a voltage regulating circuit for a capacitive load, which is connected between first and second terminals of a supply voltage generator. The regulating circuit has an input terminal and an output terminal, and includes an operational amplifier having an inverting input terminal connected to the input terminal of the regulating circuit and a non-inverting input terminal connected to an intermediate node of a voltage divider. The voltage divider is connected between an output node, which is connected to the output terminal of the regulating circuit, and the second terminal of the supply voltage generator. The operational amplifier has an output terminal connected, for driving a first field-effect transistor, between the output node and the first terminal of the supply voltage generator. The output terminal of the operational amplifier is also connected to the output node through a compensation network.

Abstract: A method and related circuit for adjusting the duration of a pulse synchronization signal for the reading phase of memory cells in electronic memory devices which are integrated on semiconductors are discussed. The pulse synchronization signal is produced by a pulse generator when it detects a logical state commutation on at least one input terminal of a plurality of addressing input terminals of the memory cells. The method produces a logical sum between the signal produced by the generator and a pulse signal having a predetermined duration. The logical sum is used to start up the reading phase.

Abstract: A method for reading memory cells that includes supplying simultaneously two memory cells, both storing a respective unknown charge condition; generating two electrical quantities, each correlated to a respective charge condition of the respective memory cell; comparing the two electrical quantities with each other; and generating a two-bit signal on the basis of the result of the comparison. A reading circuit includes a two-input comparator having two branches in parallel, each branch being connected to a respective memory cell by a current/voltage converter. Both the two-input comparator and the current/voltage converter comprise low threshold transistors.

Abstract: The invention relates to a method and a circuit for regulating a pulse synchronization signal (ATD) for the memory cell read phase in semiconductor integrated electronic memory devices. The pulse signal (ATD) is generated upon detection of a change in logic state of at least one of a plurality of address input terminals of the memory cells, so as to also generate an equalization signal (SAEQ) to a sense amplifier. The SAEQ pulse is blocked (STOP) upon the row voltage reaching a predetermined sufficient value to provide reliable reading. Advantageously, the pulse blocking is produced by a logic signal (STOP) activated upon a predetermined voltage value being exceeded during the overboost phase of the addressed memory row.

Abstract: A driving circuit supplied by a supply voltage and a reference voltage, generates an output signal and comprises a first circuit adapted to selectively couple the output signal to the reference voltage or to an internal voltage line internal to the driving circuit in response to a first control signal. The driving circuit also includes a switching circuit adapted to selectively couple the internal voltage line to the supply voltage. A boosting circuit is connected to the internal voltage line and is adapted to bring the internal voltage line to a boosted voltage. The switching circuit and the boosting circuit are controlled by a second control signal to be alternatively activatable, in such a way to bring the internal voltage line either to the supply voltage or to the boosted voltage.

Abstract: A circuit for providing a first reading phase after a Power-On-Reset in a memory device. The circuit includes a comparator, a reference generator that generates a reference voltage signal that is supplied to one input of the comparator, and a voltage divider that generates an output signal that is supplied to another input of the comparator. The reference voltage signal reaches its steady operational value before the supply voltage, and the output signal has the same linear pattern as the supply voltage with a different angular coefficient. The comparator outputs a control signal for starting the first reading phase of the memory device. In one preferred embodiment, the memory device has a single power supply and a zero consumption standby mode. Additionally, there is provided a method for providing a first reading phase after a Power-On-Reset in a memory device.

Abstract: A boosting circuit supplied by a first voltage level and a second voltage level, and having an output line capable of taking a third voltage level, the circuit having at least two distinct circuits for generating the third voltage level, the at least two circuits selectively activatable for generating the third voltage level and selectively coupleable to the output line.

Abstract: The read circuit has an array branch connected to an array cell, and a reference branch connected to a reference cell; the array branch presents an array load transistor interposed between a supply line and the array cell, and the reference branch presents a reference load transistor interposed between the supply line and the reference cell; and the array and reference load transistors form a current mirror wherein the array load transistor is diode-connected and presents a first predetermined channel width/length ratio, and the reference load transistor presents a second predetermined channel width/length ratio N times greater than the first ratio, so that the current flowing in the array cell is supplied, amplified, to the reference branch.

Abstract: A row decoder includes a plurality of pre-decoding circuits which, starting from row addresses, generate pre-decoding signals and a plurality of final decoding circuits which, starting from the pre-decoding signals, drive the individual rows of the array of the memory device. Each pre-decoding circuit has a push-pull output circuit with a pull-up transistor and a pull-down transistor and four parallel paths for the signal, a first path, supplied with low voltage, which drives the pull-up transistor during reading; a second path, supplied with a positive high voltage, which drives the pull-up transistor during programming and erasing; a third path, supplied with a low voltage, which drives the pull-down transistor during reading and programming; and a fourth path, supplied with a negative high voltage, which drives the pull-down transistor during erasing. Two selection stages enable selectively one of the first and second path, and one of the third and fourth path, depending on the operative step.

Abstract: A decoder comprises a first line placed at a first reference potential (V.sub.