Abstract: The device includes a circuit for sector remapping having a CAM (Content Addressable Memory) unit, associated to and in data communication with a multiplexer unit. The CAM unit detects that a sector is defective, it provides the pre-programmed address of a replacing sector and it activates the multiplexer which performs the replacement. The defective sectors and the corresponding locations of the address map are therefore advantageously positioned to the rear to the addressing area. The addressing area is consequently continuous, thus allowing the information to be easily stored and retrieved.

Abstract: A device and method for programming an electrically programmable memory applies at least one first programming pulse to a group of memory cells (MC1-MCk) of the memory, accesses the memory cells of the group to ascertain a programming state thereof, and applies at least one second programming pulse to those memory cells in the group whose programming state is not ascertained to correspond to a desired programming state. A voltage applied to a control electrode of the memory cells is varied between the at least one first programming pulse and the at least one second programming pulse according to a forecasted change in biasing conditions of the memory cells in the group between said at least one first and at least one second programming pulses. Undesired over-programming of the memory cells is thus avoided.

Abstract: A circuit (115,145,150), for programming a non-volatile memory device (100) having a plurality of memory cells (105), includes a plurality of driving elements (115) each one for applying a program pulse to a selected memory cell to be programmed. The driving elements are suitable to be supplied by a power supply unit (120,125), and a control means (145,150) controls the driving elements (115). The control means (145,150) includes means (150,205) for determining a residual capacity of the power supply unit, and a selecting means (145) selectively enables the driving elements (115) according to the residual capacity. A method of programming, an integrated circuit, and a computer system are also disclosed.

Abstract: A semiconductor memory comprises a plurality of memory cells, for example Flash memory cells, arranged in a plurality of lines, and a plurality of memory cell access signal lines, each one associated with at least one respective line of memory cells, for accessing the memory cells of the at least one respective line of memory cells; each signal line has a capacitance intrinsically associated therewith. A plurality of volatile memory cells is provided, each having a capacitive storage element. Each volatile memory cell is associated with a respective signal line, and the respective capacitive storage element formed by the capacitance intrinsically associated with the respective signal lines. In particular, the parasitic capacitances associated with bit lines of a matrix of memory cells can be exploited as capacitive storage elements.

Abstract: Voltage booster device (3) such as to selectively assume an active status and a stand-by status, said device comprising:

Abstract: The method for timing reading of a memory cell envisages supplying the memory cell (with a constant current by means of a first capacitive element, integrating said current in a time interval, and controlling the duration of the time interval in such a way as to compensate for any deviations in the current from a nominal value. In particular, a reference current is supplied to a reference cell by means of a second capacitive element; next, a first voltage present on the second capacitive element is measured; finally, the memory cell is deactivated when the first voltage is equal to a second voltage, which is constant.

Abstract: The circuit for generating reference voltages for reading a multilevel memory cell includes the following: a first memory cell and a second memory cell respectively having a first reference programming level and a second reference programming level; a first reference circuit and a second reference circuit respectively connected to said first and said second memory cells and having respective output terminals which respectively supply a first reference voltage and a second reference voltage; and a voltage divider having a first connection node and a second connection node respectively connected to the output terminals of the first reference circuit and of the second reference circuit to receive, respectively, the first reference voltage and the second reference voltage, and a plurality of intermediate nodes supplying respective third reference voltages at equal distances apart.

Abstract: The memory device has a memory block, formed by a plurality of standard sectors and a redundancy portion; a control circuit, which controls programming and erasing of the data of the memory cells; and a correctness verifying circuit for the data stored in the memory cells. The correctness verifying circuit is enabled by the control circuit and generates an incorrect-datum signal in the event of detection of at least one non-functioning cell. The control circuit moreover activates redundancy, enabling the redundancy portion and storing redundancy data in a redundancy-memory stage in the presence of an incorrect datum. Various solutions are presented that implement column, row and sector redundancy, both in case of erasing and programming.

Abstract: An analog-to-digital conversion method and device for a multilevel non-volatile memory device that includes a multilevel memory cell. The method comprises a first step of converting the most significant bits contained in the memory cell, followed by a second step of converting the least significant bits. The first step is completed within a time interval corresponding to the rise transient of the gate voltage, and the second step is initiated at the end of the transient. Also disclosed is a scheme for error control coding in multilevel Flash memories. The n bits stored in a single memory cell are organized in different “bit-layers”, which are independent from one another. Error correction is carried out separately for each bit-layer. The correction of any failure in a single memory cell is achieved by using a simple error control code providing single-bit correction, regardless of the number of bits stored in a single cell.

Abstract: The self-repair method for a nonvolatile memory intervenes at the end of an operation of modification, selected between programming and erasing, in the event of detection of just one non-functioning cell, and carries out redundancy of the non-functioning cell. To this end, the memory array is divided into a basic portion, formed by a plurality of memory cells storing basic data, and into a in-the-field redundancy portion, said in-the-field redundancy portion being designed to store redundancy data including a correct content of the non-functioning cell, the address of the non-functioning cell, and an activated redundancy flag. The redundancy is activated only after applying a preset maximum number of modification pulses and uses a purposely designed redundancy replacement circuit and a purposely designed redundancy data verification circuit.

Abstract: The method for using a nonvolatile memory having a plurality of cells, each of which stores a datum, is based upon the steps of performing an modification operation of erasing/programming the data of the memory; verifying the correctness of the data of the memory cells; and, if the step of verifying has revealed at least one incorrect datum, correcting on-the-field the incorrect datum, using an error correcting code. The verification of the correctness of the data is performed by determining the number of memory cells storing an incorrect datum; if the number of memory cells storing the incorrect datum is less than or equal to a threshold, the erroneous datum is corrected by the error correction code; otherwise, new erasing/programming pulses are supplied.

Abstract: The voltage generator comprises a negative feedback loop including a programmable voltage divider having a feedback node. The voltage divider comprises a programmable resistor disposed between the output of the voltage generator and the feedback node and having variable resistance. The programmable resistor includes a fixed resistor and a plurality of additional resistors arranged in series with each other and defining a plurality of intermediate nodes. The additional resistors may be selectively connected by means of switches disposed between the output of the voltage generator and a respective intermediate node so as to define an output voltage V0 programmable on the basis of command signals supplied to the switches.

Abstract: The data management method applies to a multilevel nonvolatile memory device having a memory array formed by a plurality of memory cells. Each of the memory cells stores a number of bits that is not an integer power of two, for example three. In this way, one data byte is stored in a non-integer number of memory cells. The managing method includes storing, in a same clock cycle, a data word formed by a plurality of bytes, by programming a preset number of adjacent memory cells. Reading is performed by reading, in a same clock cycle, the stored data word.

Abstract: The method for reading a memory cell is based upon integration in time of the current supplied to the memory cell by a capacitive element. The capacitive element is initially charged and then discharged linearly in a preset time, while the memory cell is biased at a constant voltage. In a first operating mode, initially a first capacitor and a second capacitor are respectively charged to a first charge value and to a second charge value. The second capacitor is discharged through the memory cell at a constant current in a preset time; the first charge is shared between the first capacitor and the second capacitor; and then the shared charge is measured.

Abstract: Bandgap voltage reference circuit with an output voltage that remains stable in the range of a temperature of utilization. The circuit includes a first circuit block, a second circuit block, and a control circuit connected with said circuit blocks, said first circuit block including a bandgap circuit with a low power consumption, said second circuit block including a bandgap circuit with a short start up time, said control circuit suitable to control said two circuit blocks in a such way that said output voltage of said bandgap voltage reference circuit is supplied by said second circuit block at the starting of said first circuit block for a period of time and said output voltage is supplied by said first circuit block for the period of time subsequent to said period of time and that lasts until the turning off of the circuit, said second circuit block being turned off after said period of time.

Abstract: The method for reading a memory cell includes supplying the cell with a first charge quantity through a capacitive integration element and reintegrating the first charge quantity through a plurality of second charge quantities supplied alternately and in succession to the capacitive integration element. In a first embodiment, the second charge quantities are initially stored in a plurality of capacitive charge-regeneration elements connected alternately and in succession to the capacitive integration element; the second charge quantities are then shared between the capacitive integration element and the capacitive charge-regeneration elements.

Abstract: A method and program-load circuit is for regulating the voltages at the drain and body terminals of a non-volatile memory cell being programmed. These voltages are applied from a program-load circuit connected in a conduction pattern to transfer a predetermined voltage value to at least one terminal of the memory cell. The method includes a step of regulating the voltage value locally, within the program-load circuit, to overcome the effect of a parasitic resistor present in the conduction pattern.

Abstract: A power supply circuit structure is useful with a row decoder for reading/writing data from/into memory cells of an integrated electrically programmable/erasable non-volatile memory device incorporating an array of multilevel memory cells. Advantageously, multiple supply voltages to the row decoder and a switching circuit for transferring the voltages over hierarchic-mode enabled conduction paths are provided.

Abstract: A pulse programming method for a non-volatile memory device includes: addressing memory cells to be programmed within the device by selecting corresponding hierarchic decoder transistors; biasing the gate terminals of the memory cells; and programming the memory cells by applying a voltage pulse, regulated by a bias circuit, to the drain terminals of the memory cells. Advantageously, the programming method further comprises a step of precharging an internal node of the bias circuit before starting the programming step, the internal node being connected to a parasitic capacitance of the memory device.

Abstract: A method and a circuit are for regulating the source terminal voltage of a non-volatile memory cell during the cell programming and/or reading phases. The method includes a phase of locally regulating the voltage value and includes comparing the source current of the cell array with a reference current. A fraction of the source current is converted to a voltage and compared with a voltage generated from a memory cell acting as a reference and being programmed to the distribution with the highest current levels. The comparison may be used for controlling a current generator to inject, into the source terminal, the current necessary to keep the predetermined voltage thereof at a constant value.