Patents by Inventor Robert Haase

Robert Haase has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10991812
    Abstract: Disclosed is a transistor device. The transistor device includes: in a semiconductor body, a drift region, a body region adjoining the drift region, and a source region separated from the drift region by the body region; a gate electrode dielectrically insulated from the body region by a gate dielectric; a source electrode electrically connected to the source region; at least one field electrode dielectrically insulated from the drift region by a field electrode dielectric; and a rectifier element coupled between the source electrode and the field electrode. The field electrode and the field electrode dielectric are arranged in a first trench that extends from a first surface of the semiconductor body into the semiconductor body. The rectifier element is integrated in the first trench in a rectifier region that is adjacent at least one of the source region and the body region.
    Type: Grant
    Filed: July 25, 2018
    Date of Patent: April 27, 2021
    Assignee: Infineon Technologies Austria AG
    Inventors: Ralf Siemieniec, Robert Haase, Gerhard Noebauer, Martin Poelzl
  • Publication number: 20210083096
    Abstract: A semiconductor device includes: a trench formed in a surface of a semiconductor substrate and extending lengthwise in a direction parallel to the surface; a body region adjoining the trench; a source region adjoining the trench above the body region; a drift region adjoining the trench below the body region; a field electrode in a lower part of the trench and separated from the substrate; and a gate electrode in an upper part of the trench and separated from the substrate and the field electrode. A first section of the field electrode is buried below the gate electrode in the trench. A second section of the field electrode transitions upward from the first section in a direction toward the surface. The separation between the second section and the gate electrode is greater than or equal to the separation between the first section and the gate electrode.
    Type: Application
    Filed: September 16, 2019
    Publication date: March 18, 2021
    Inventors: Ashita Mirchandani, Robert Haase, Tim Henson, Ling Ma, Niraj Ranjan
  • Patent number: 10868172
    Abstract: A semiconductor device includes: a gate trench extending into a Si substrate; a body region in the Si substrate, the body region including a vertical channel region adjacent a sidewall of the gate trench; a source region in the Si substrate above the body region; a contact trench extending into the Si substrate and separated from the gate trench by a portion of the source region and by a portion of the body region; an electrically conductive material in the contact trench; and a diffusion barrier structure interposed between a sidewall of the contact trench and the vertical channel region, the diffusion barrier structure including alternating layers of Si and oxygen-doped Si and configured to increase carrier mobility within the vertical channel region. Corresponding methods of manufacture are also described.
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: December 15, 2020
    Assignee: Infineon Technologies Austria AG
    Inventors: Oliver Blank, Thomas Feil, Maximilian Roesch, Martin Poelzl, Robert Haase, Sylvain Leomant, Bernhard Goller, Andreas Meiser
  • Patent number: 10861966
    Abstract: A semiconductor device includes: a gate trench extending into a Si substrate; a body region in the Si substrate adjacent the gate trench; a source region in the Si substrate above the body region; a diffusion barrier structure adjacent a sidewall of the gate trench, the diffusion barrier structure including alternating layers of Si and oxygen-doped Si and a Si capping layer on the alternating layers of Si and oxygen-doped Si; and a channel region formed in the Si capping layer and which vertically extends along the sidewall of the gate trench. Corresponding methods of manufacture are also described.
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: December 8, 2020
    Assignee: Infineon Technologies Austria AG
    Inventors: Thomas Feil, Robert Haase, Martin Poelzl, Maximilian Roesch, Sylvain Leomant, Bernhard Goller, Ravi Keshav Joshi
  • Publication number: 20200350401
    Abstract: A semiconductor device includes a source region and a drain region of a first conductivity type, a body region of a second conductivity type between the source region and the drain region, a gate configured to control current through a channel of the body region, a drift zone of the first conductivity type between the body region and the drain region, a superjunction structure formed by a plurality of regions of the second conductivity type laterally spaced apart from one another by intervening regions of the drift zone, and a diffusion barrier structure disposed along sidewalls of the regions of the second conductivity type of the superjunction structure. The diffusion barrier structure includes alternating layers of Si and oxygen-doped Si and a Si capping layer on the alternating layers of Si and oxygen-doped Si.
    Type: Application
    Filed: July 16, 2020
    Publication date: November 5, 2020
    Inventors: Martin Poelzl, Robert Haase, Sylvain Leomant, Maximilian Roesch, Ravi Keshav Joshi, Andreas Meiser, Xiaoqiu Huang, Ling Ma
  • Patent number: 10790353
    Abstract: A semiconductor device includes a source region and a drain region of a first conductivity type, a body region of a second conductivity type between the source region and the drain region, a gate configured to control current through a channel of the body region, a drift zone of the first conductivity type between the body region and the drain region, a superjunction structure formed by a plurality of regions of the second conductivity type laterally spaced apart from one another by intervening regions of the drift zone, and a diffusion barrier structure disposed along sidewalls of the regions of the second conductivity type of the superjunction structure. The diffusion barrier structure includes alternating layers of Si and oxygen-doped Si and a Si capping layer on the alternating layers of Si and oxygen-doped Si.
    Type: Grant
    Filed: November 9, 2018
    Date of Patent: September 29, 2020
    Assignee: Infineon Technologies Austria AG
    Inventors: Martin Poelzl, Robert Haase, Sylvain Leomant, Maximilian Roesch, Ravi Keshav Joshi, Andreas Meiser, Xiaoqiu Huang, Ling Ma
  • Publication number: 20200303498
    Abstract: A method of manufacturing a semiconductor device includes: forming one or more device epitaxial layers over a main surface of a doped Si base substrate; forming a diffusion barrier structure including alternating layers of Si and oxygen-doped Si in an upper part of the doped Si base substrate adjacent the main surface of the doped Si base substrate, in a lower part of the one or more device epitaxial layers adjacent the main surface of the doped Si base substrate, or in one or more additional epitaxial layers disposed between the main surface of the doped Si base substrate and the one or more device epitaxial layers; and forming a gate above the diffusion barrier structure.
    Type: Application
    Filed: June 9, 2020
    Publication date: September 24, 2020
    Inventors: Martin Poelzl, Robert Haase, Maximilian Roesch, Sylvain Leomant, Andreas Meiser, Bernhard Goller, Ravi Keshav Joshi
  • Patent number: 10741638
    Abstract: A semiconductor device includes a doped Si base substrate, one or more device epitaxial layers formed over a main surface of the doped Si base substrate, a diffusion barrier structure, and a gate formed above the diffusion barrier structure. The diffusion barrier structure includes alternating layers of Si and oxygen-doped Si formed in an upper part of the doped Si base substrate adjacent the main surface of the doped Si base substrate, in a lower part of the one or more device epitaxial layers adjacent the main surface of the doped Si base substrate, or in one or more additional epitaxial layers disposed between the main surface of the doped Si base substrate and the one or more device epitaxial layers.
    Type: Grant
    Filed: August 8, 2018
    Date of Patent: August 11, 2020
    Assignee: Infineon Technologies Austria AG
    Inventors: Martin Poelzl, Robert Haase, Maximilian Roesch, Sylvain Leomant, Andreas Meiser, Bernhard Goller, Ravi Keshav Joshi
  • Publication number: 20200152733
    Abstract: A semiconductor device includes a source region and a drain region of a first conductivity type, a body region of a second conductivity type between the source region and the drain region, a gate configured to control current through a channel of the body region, a drift zone of the first conductivity type between the body region and the drain region, a superjunction structure formed by a plurality of regions of the second conductivity type laterally spaced apart from one another by intervening regions of the drift zone, and a diffusion barrier structure disposed along sidewalls of the regions of the second conductivity type of the superjunction structure. The diffusion barrier structure includes alternating layers of Si and oxygen-doped Si and a Si capping layer on the alternating layers of Si and oxygen-doped Si.
    Type: Application
    Filed: November 9, 2018
    Publication date: May 14, 2020
    Inventors: Martin Poelzl, Robert Haase, Sylvain Leomant, Maximilian Roesch, Ravi Keshav Joshi, Andreas Meiser, Xiaoqiu Huang, Ling Ma
  • Publication number: 20200127135
    Abstract: A semiconductor device includes: a gate trench extending into a Si substrate; a body region in the Si substrate adjacent the gate trench; a source region in the Si substrate above the body region; a diffusion barrier structure adjacent a sidewall of the gate trench, the diffusion barrier structure including alternating layers of Si and oxygen-doped Si and a Si capping layer on the alternating layers of Si and oxygen-doped Si; and a channel region formed in the Si capping layer and which vertically extends along the sidewall of the gate trench. Corresponding methods of manufacture are also described.
    Type: Application
    Filed: December 18, 2019
    Publication date: April 23, 2020
    Inventors: Thomas Feil, Robert Haase, Martin Poelzl, Maximilian Roesch, Sylvain Leomant, Bernhard Goller, Ravi Keshav Joshi
  • Publication number: 20200127134
    Abstract: A semiconductor device includes: a gate trench extending into a Si substrate; a body region in the Si substrate, the body region including a vertical channel region adjacent a sidewall of the gate trench; a source region in the Si substrate above the body region; a contact trench extending into the Si substrate and separated from the gate trench by a portion of the source region and by a portion of the body region; an electrically conductive material in the contact trench; and a diffusion barrier structure interposed between a sidewall of the contact trench and the vertical channel region, the diffusion barrier structure including alternating layers of Si and oxygen-doped Si and configured to increase carrier mobility within the vertical channel region. Corresponding methods of manufacture are also described.
    Type: Application
    Filed: December 18, 2019
    Publication date: April 23, 2020
    Inventors: Oliver Blank, Thomas Feil, Maximilian Roesch, Martin Poelzl, Robert Haase, Sylvain Leomant, Bernhard Goller, Andreas Meiser
  • Patent number: 10580888
    Abstract: A semiconductor device includes a gate trench extending into a Si substrate, a body region in the Si substrate, the body region including a channel region which extends along a sidewall of the gate trench, a source region in the Si substrate above the body region, a contact trench extending into the Si substrate and separated from the gate trench by a portion of the source region and a portion of the body region, the contact trench being filled with an electrically conductive material which contacts the source region at a sidewall of the contact trench and a highly doped body contact region at a bottom of the contact trench, and a diffusion barrier structure formed along the sidewall of the contact trench and disposed between the highly doped body contact region and the channel region, the diffusion barrier structure including alternating layers of Si and oxygen-doped Si.
    Type: Grant
    Filed: August 8, 2018
    Date of Patent: March 3, 2020
    Assignee: Infineon Technologies Austria AG
    Inventors: Oliver Blank, Thomas Feil, Maximilian Roesch, Martin Poelzl, Robert Haase, Sylvain Leomant, Bernhard Goller, Andreas Meiser
  • Patent number: 10573742
    Abstract: A semiconductor device includes a gate trench extending into a Si substrate, a body region in the Si substrate adjacent the gate trench, a source region in the Si substrate above the body region, a contact trench extending into the Si substrate and filled with an electrically conductive material which contacts the source region at a sidewall of the contact trench and a highly doped body contact region at a bottom of the contact trench, a diffusion barrier structure formed along the sidewall of the gate trench, the diffusion barrier structure comprising alternating layers of Si and oxygen-doped Si and a Si capping layer on the alternating layers of Si and oxygen-doped Si, and a channel region formed in the Si capping layer and which vertically extends along the sidewall of the gate trench. Corresponding methods of manufacture are also described.
    Type: Grant
    Filed: August 8, 2018
    Date of Patent: February 25, 2020
    Assignee: Infineon Technologies Austria AG
    Inventors: Thomas Feil, Robert Haase, Martin Poelzl, Maximilian Roesch, Sylvain Leomant, Bernhard Goller, Ravi Keshav Joshi
  • Publication number: 20200052110
    Abstract: A semiconductor device includes a gate trench extending into a Si substrate, a body region in the Si substrate adjacent the gate trench, a source region in the Si substrate above the body region, a contact trench extending into the Si substrate and filled with an electrically conductive material which contacts the source region at a sidewall of the contact trench and a highly doped body contact region at a bottom of the contact trench, a diffusion barrier structure formed along the sidewall of the gate trench, the diffusion barrier structure comprising alternating layers of Si and oxygen-doped Si and a Si capping layer on the alternating layers of Si and oxygen-doped Si, and a channel region formed in the Si capping layer and which vertically extends along the sidewall of the gate trench. Corresponding methods of manufacture are also described.
    Type: Application
    Filed: August 8, 2018
    Publication date: February 13, 2020
    Inventors: Thomas Feil, Robert Haase, Martin Poelzl, Maximilian Roesch, Sylvain Leomant, Bernhard Goller, Ravi Keshav Joshi
  • Publication number: 20200052109
    Abstract: A semiconductor device includes a gate trench extending into a Si substrate, a body region in the Si substrate, the body region including a channel region which extends along a sidewall of the gate trench, a source region in the Si substrate above the body region, a contact trench extending into the Si substrate and separated from the gate trench by a portion of the source region and a portion of the body region, the contact trench being filled with an electrically conductive material which contacts the source region at a sidewall of the contact trench and a highly doped body contact region at a bottom of the contact trench, and a diffusion barrier structure formed along the sidewall of the contact trench and disposed between the highly doped body contact region and the channel region, the diffusion barrier structure including alternating layers of Si and oxygen-doped Si.
    Type: Application
    Filed: August 8, 2018
    Publication date: February 13, 2020
    Inventors: Oliver Blank, Thomas Feil, Maximilian Roesch, Martin Poelzl, Robert Haase, Sylvain Leomant, Bernhard Goller, Andreas Meiser
  • Publication number: 20200052066
    Abstract: A semiconductor device includes a doped Si base substrate, one or more device epitaxial layers formed over a main surface of the doped Si base substrate, a diffusion barrier structure, and a gate formed above the diffusion barrier structure. The diffusion barrier structure includes alternating layers of Si and oxygen-doped Si formed in an upper part of the doped Si base substrate adjacent the main surface of the doped Si base substrate, in a lower part of the one or more device epitaxial layers adjacent the main surface of the doped Si base substrate, or in one or more additional epitaxial layers disposed between the main surface of the doped Si base substrate and the one or more device epitaxial layers.
    Type: Application
    Filed: August 8, 2018
    Publication date: February 13, 2020
    Inventors: Martin Poelzl, Robert Haase, Maximilian Roesch, Sylvain Leomant, Andreas Meiser, Bernhard Goller, Ravi Keshav Joshi
  • Publication number: 20200013315
    Abstract: The invention relates to a system for validating and training surgical interventions in human and veterinary medicine, which includes a training model anatomically modelled after a human or animal body. The system comprises an anatomical reproduction of a body part of the human or animal body, which has a recess and an anatomical reproduction of an interchangeable practice region, which is designed to be insertable into the recess of the body part. The interchangeable practice region has a front side and a rear side, wherein the rear side is connected at least in part in an interlocking manner to the recess of the anatomical reproduction of the body part. The system also comprises an optoelectronic detection means, which is situated in the recess of the anatomical reproduction of the body part such that it is designed for detecting the surgical interventions and for monitoring the positioning of surgical instruments and/or implants on the rear side of the interchangeable practice region.
    Type: Application
    Filed: February 9, 2018
    Publication date: January 9, 2020
    Applicant: PHACON GMBH
    Inventors: Hendrik MÖCKEL, Robert HAASE
  • Patent number: 10510836
    Abstract: A semiconductor device includes a gate trench extending into a Si substrate, the gate trench including a gate electrode and a gate dielectric separating the gate electrode from the Si substrate. The semiconductor device further includes a body region in the Si substrate adjacent the gate trench, the body region including a channel region which extends along a sidewall of the gate trench, a source region in the Si substrate above the body region, a contact trench extending into the Si substrate and filled with an electrically conductive material which contacts the source region and a highly doped body contact region at a bottom of the contact trench, and a diffusion barrier structure extending along at least part of the channel region and disposed between the channel region and the highly doped body contact region. The diffusion barrier structure includes alternating layers of Si and oxygen-doped Si.
    Type: Grant
    Filed: August 8, 2018
    Date of Patent: December 17, 2019
    Assignee: Infineon Technologies Austria AG
    Inventors: Robert Haase, Martin Poelzl, Maximilian Roesch, Sylvain Leomant, Andreas Meiser
  • Publication number: 20190108009
    Abstract: A method for validation check of a file to be transferred from a storage device to an embedded device comprising reading the file to be transferred using a controller on the storage device, receiving a stored public key from the embedded device at the storage device, prior to transferring the file, verifying the stored public key using a controller and a private key on the storage device, and upon verification of the stored public key, transferring the file from the storage device to the embedded device. The storage device having a controller may be an external mass storage device or an eMMC memory controller.
    Type: Application
    Filed: October 5, 2017
    Publication date: April 11, 2019
    Applicant: Harman International Industries, Incorporated
    Inventor: Robert Haase
  • Patent number: 10236352
    Abstract: A method for manufacturing a semiconductor device includes: providing a semiconductor substrate having a first side; forming a trench in the semiconductor substrate, the trench having a bottom and a sidewall extending from the bottom to the first side of the semiconductor substrate; forming an insulation structure including at least a first insulation layer and a second insulation layer on the sidewall and the bottom of the trench; forming a lower conductive structure in the lower portion of the trench; removing the second insulation layer in an upper portion of the trench while leaving the second insulation layer at least partially in a lower portion of the trench; and forming an upper conductive structure in the upper portion of the trench.
    Type: Grant
    Filed: October 5, 2017
    Date of Patent: March 19, 2019
    Assignee: Infineon Technologies Austria AG
    Inventors: Robert Haase, Martin Vielemeyer