Patents by Inventor Ryo Hayashi

Ryo Hayashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5563425
    Abstract: An object of the present invention is to provide a photoelectrical conversion device in which recombination of carriers excited by light is prevented and the open voltage and the carrier range of positive holes are improved and to provide a generating system using the photoelectrical conversion device. The photoelectrical conversion device includes a p-layer, an i-layer, and an n-layer, wherein the photoelectrical conversion device being formed by stacking the p-layer, the i-layer and the n-layer each of which is made of non-single-crystal silicon semiconductor, the i-layer contains germanium atoms, the band gap of the i-layer is smoothly changed in a direction of the thickness of the i-layer, the minimum value of the band gap is positioned adjacent to the p-layer from the central position of the i-layer and both of a valence control agent to serve as a donor and another valence control agent to serve as an acceptor are doped into the i-layer.
    Type: Grant
    Filed: November 10, 1993
    Date of Patent: October 8, 1996
    Assignee: Canon Kabushiki Kaisha
    Inventors: Keishi Saito, Tatsuyuki Aoike, Masafumi Sano, Mitsuyuki Niwa, Ryo Hayashi, Masahiko Tonogaki
  • Patent number: 5429685
    Abstract: The present invention provides a photovoltaic element in which the open-circuit voltage and the path length of holes are improved by preventing the recombination of photoexcited carriers.The p-i-n junction type photovoltaic element is composed of a p-type layer, an i-type layer of a laminated structure consisting of an i-type layer formed by RF plasma CVD on the p-type layer side and an i-type layer formed by microwave (.mu.W) CVD on the n-type layer side, or an i-type layer formed by microwave (.mu.W) plasma CVD on the p-type layer side and an i-type layer formed by RF plasma CVD on the n-type layer side, characterized in that the i-type layer formed by .mu.W plasma CVD is formed by a process in which a lower .mu.W energy and a higher RF energy than the .mu.
    Type: Grant
    Filed: November 12, 1993
    Date of Patent: July 4, 1995
    Assignee: Canon Kabushiki Kaisha
    Inventors: Keishi Saito, Tatsuyuki Aoike, Masafumi Sano, Mitsuyuki Niwa, Ryo Hayashi, Masahiko Tonogaki