Abstract: A hard disk controller including a first circuit, a second circuit, a third circuit, and a mode circuit. The first circuit is configured to transmit a first signal to control data transfer between the hard disk controller and a read/write channel circuit. The second circuit is configured to transmit and receive data under control of the first signal. The third circuit is configured to transmit a second signal to control data transfer between a storage media and the read/write channel circuit. The mode circuit is configured to transfer mode data under control of the first signal and the second signal. The mode data indicates i) whether the data is continued from a previous sector or is associated with a new sector, and ii) a byte size of the data.

Abstract: A memory system including a first memory, a content addressable memory, a testing module, and a memory controller. The first memory includes first memory cells. The content addressable memory includes second memory cells and is configured to store addresses of selected ones of the first memory cells, store data having the addresses in corresponding ones of the second memory cells, and retrieve the data from the corresponding ones of the second memory cells. The testing module is configured to determine a number of the first memory cells that fail at a first refresh rate. The first refresh rate corresponds to a time period between refreshing the first memory cells. The memory controller is configured to, based on the number of the first memory cells that fail at the first refresh rate, maintain the first refresh rate, and increase the first refresh rate.

Abstract: An integrated circuit includes an embedded processor. An embedded in-circuit emulator is located within the embedded processor. The embedded in-circuit emulator performs a test on the integrated circuit. The embedded in-circuit emulator generates a testing result based on the test on the integrated circuit. Trace logic to generate trace data based on the testing result, the trace data being in a parallel format. A serializer is located on the integrated circuit. The serializer converts the parallel format of the trace data into a serial format. The serializer serially outputs the trace data in the serial format from the integrated circuit.

Abstract: In a device having a data channel, in which random numbers are needed, such as a data storage device that uses random numbers to generate keys for cryptographic applications, random numbers are generated by a deterministic random bit generator seeded by bits derived from noise on the channel itself. The bits may be extracted from the least significant bits of the data signal after it is digitized, because those bits correspond to the noise in the signal. The extraction may occur immediately after digitization, or after subsequent filtering. A data signal emulator may be provided to simulate a data signal if a seed is required at a time when there is no data activity on the channel. The extracted bits may be post-processed to remove bias before the seed is provided to the deterministic random bit generator.

Abstract: A memory circuit includes a memory interface including an address line and a data line. A first memory is configured to i) receive addresses transmitted on the address line of the memory interface and ii) output data in response to the addresses. Content addressable memory (CAM) is configured to i) monitor the addresses transmitted on the address line of the memory interface and ii) output error correction coding (ECC) bits in response to the addresses. An ECC circuit is configured to receive the ECC bits and the data. The memory interface is configured to selectively receive, via the data line of the memory interface, one of the data from the first memory and an output of the ECC circuit.

Abstract: A hard disk drive system comprises an interface that receives test configuration data, that transmits test result data, and that transmits and receives application data. A system on chip (SOC) includes integrated system test (IST) modules. A memory module communicates with the SOC and includes memory and an IST module. One of the IST modules communicates with the interface and is a master IST module that receives the test configuration data and that configures others of the IST modules for testing a component of the hard disk drive system.

Abstract: A system for receiving serial messages from a device under test includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.

Abstract: A memory system comprises first memory that includes memory cells. Content addressable memory (CAM) includes CAM memory cells, stores addresses of selected ones of the memory cells, stores data having the addresses in corresponding ones of the CAM memory cells and retrieves data having the addresses from corresponding ones of the CAM memory cells. An adaptive refresh module stores data from selected ones of the memory cells in the CAM memory cells to one of increase and maintain a time period between refreshing of the memory cells.

Abstract: A memory module comprises first memory that stores data in memory blocks; second memory that temporarily stores data from at least one of the memory blocks and third memory for storing a relationship between addresses of the at least one of the memory blocks in the first memory and corresponding addresses of the data from the at least one of the memory blocks in the second memory. Storage capacities of the second and third memories are less than a storage capacity of the first memory. A control module selectively transfers data in the at least one of the memory blocks in the first memory to the second memory and stores and retrieves data from the second memory for the at least one of the memory blocks based on the relationship during the testing.

Abstract: A hard disk drive system comprises an interface that receives test configuration data, that transmits test result data, and that transmits and receives application data. A system on chip (SOC) includes integrated system test (IST) modules. A memory module communicates with the SOC and includes memory and an IST module. One of the IST modules communicates with the interface and is a master IST module that receives the test configuration data and that configures others of the IST modules for testing a component of the hard disk drive system.

Abstract: A memory system comprises first memory that includes memory cells that are selectively refreshed at a refresh rate. A test module tests operation of the memory cells at the refresh rate and that identifies T of the memory cells that are inoperable when refreshed at the refresh rate, where T is an integer greater than zero. Content addressable memory (CAM) includes D CAM memory cells where D is an integer greater than or equal to one. An adaptive refresh module selectively adjusts a refresh rate of the first memory based on T and D.

Abstract: A memory system comprises first memory that includes memory cells. Content addressable memory (CAM) includes CAM memory cells, stores addresses of selected ones of the memory cells, stores data having the addresses in corresponding ones of the CAM memory cells and retrieves data having the addresses from corresponding ones of the CAM memory cells. An adaptive refresh module stores data from selected ones of the memory cells in the CAM memory cells to one of increase and maintain a time period between refreshing of the memory cells.

Abstract: A memory module comprises first memory that stores data in memory blocks; second memory that temporarily stores data from at least one of the memory blocks and third memory for storing a relationship between addresses of the at least one of the memory blocks in the first memory and corresponding addresses of the data from the at least one of the memory blocks in the second memory. Storage capacities of the second and third memories are less than a storage capacity of the first memory. A control module selectively transfers data in the at least one of the memory blocks in the first memory to the second memory and stores and retrieves data from the second memory for the at least one of the memory blocks based on the relationship during the testing.

Abstract: A memory circuit comprises a first memory that stores data in a plurality of memory locations that are associated with memory addresses. A memory interface communicates with said first memory. A second memory communicates with said memory interface and stores memory addresses of defective memory locations that are identified in said first memory.

Abstract: A memory module comprises first memory that includes memory blocks, second memory, and non-volatile memory. A control module, during testing of at least one of the memory blocks having a first address, stores data from the at least one of the memory blocks in the second memory at a second address and stores the first and second addresses in the non-volatile memory. Content addressable memory (CAM) stores addresses of defective memory locations in the first memory and stores and retrieves data for the defective memory locations.

Abstract: A memory circuit includes a memory interface. A first memory receives a first read address from the memory interface. A second memory stores addresses of defective memory locations found in the first memory, receives the first read address from the memory interface, compares the first read address to the addresses stored in the second memory, and, if a matching address is found, reads first data from the second memory. The first memory reads second data from a memory location in the first memory corresponding to the first read address. A multiplexer receives the second data and the first data from the first memory and the second memory, respectively, when the matching address is found, and selectively outputs one of the second data and the first data to the memory interface.

Abstract: A method of making and testing a system on chip (SOC) comprises providing an integrated system test (IST) module in each one of a plurality of SOC components. At least one of the SOC components communicates with an external interface and at least one other of the SOC components. The method includes receiving test configuration data, transmitting test result data, and transmitting and receiving application data via the external interface. The method includes using at least one of the IST modules to receive the test configuration data and configure the IST modules to test the plurality of SOC components.

Abstract: A hard disk controller comprises a first circuit that transmits a first signal to control data transfer between the hard disk controller and a read/write channel. A second circuit transmits or receives data under control of the first signal. A third circuit transmits a second signal to control data transfer between a storage media and the read/write channel. A mode circuit transmits mode data under control of the second signal. A read channel circuit comprises a data circuit and a first circuit that receives a first signal that controls the transfer of data to and from the data circuit. A second circuit transmits or receives data under control of the first signal. A mode circuit receives mode data under control of a second signal. Data is transferred to and from the input/output circuit in accordance with the second signal.

Abstract: A system for receiving Joint Task Action Group (JTAG) data bits from a device under test includes a deserializer that receives serial messages from the device under test and forms data frames based on the serial messages. A frame sync module communicates with the deserializer and forms JTAG data bits based on the data frames. N virtual JTAG test access ports (VTAPs), each having an input and an output. The N VTAPs are connected in a daisy chain and the input of a first VTAP receives the JTAG data bits from the frame sync module.

Abstract: Apparatus and method are provided for accessing information in a storage area including a storage area which is accessible by a first buss and a second buss. The access by the first buss is clocked by a first clock signal and the access by the second buss is clocked by a second clock signal. The first clock signal has a first clock frequency and the second clock signal has a second clock frequency. A terminal receives a base clock signal having a frequency of at least the sum of the first clock frequency and the second clock frequency. An access to the storage area by the first or second buss is made during a cycle of the base clock.