Abstract: A semiconductor device may be provided. The semiconductor device may be configured to shift storage positions of data and error information on the data to store the data into shifted storage positions based on the address signals having a certain combination being inputted a predetermined number of times.

Abstract: A semiconductor device may be provided. The semiconductor device may be configured to shift storage positions of data and error information on the data to store the data into shifted storage positions based on the address signals having a certain combination being inputted a predetermined number of times.

Abstract: A semiconductor device may be provided. The semiconductor device may be configured to shift storage positions of data and error information on the data to store the data into shifted storage positions based on the address signals having a certain combination being inputted a predetermined number of times.

Abstract: A resistance variable memory apparatus may include a memory circuit configured to include a plurality of blocks, each including a plurality of memory cells. The resistance variable memory apparatus may include a disturbance preventing circuit configured to be driven based on a counting signal corresponding to the number of write accesses for each of the plurality of blocks, a write command, and an address signal and to allow scrubbing to be performed on a memory cell having a preset scrubbing condition when the counting signal satisfied with the scrubbing condition is output based on the scribing condition according to a physical position of the memory cell in the block.

Abstract: Disclosed is a memory system includes a memory device including a plurality of memory blocks, a write operation management circuit configured to update write operation counts for the plurality of memory blocks, a first block detector configured to detect a hot memory block based on a first operation count value corresponding to the write operation count of a first memory block on which a write operation has been performed among the plurality of memory blocks, a second detector configured to detect a cold memory block based on a second operation count value corresponding to the write operation count of each of second memory blocks adjacent to the first memory block, and a controller configured to copy, if the hot memory block and the cold memory block are detected by the first and second detectors, data of the detected hot memory block or data of the detected cold memory block.

Abstract: A memory system includes a memory device including one or more memory blocks, and configured to store data in a plurality of pages included in each memory block through a write operation, and a memory controller configured to count an operation number of write operations performed on the memory block, check whether the write operation is performed for each of the pages, select one or more victim pages among the pages, and copy data stored in the victim pages.

Abstract: A memory device is provided. The memory device includes a plurality of normal memory blocks; and at least two or more bad memory blocks, wherein data having the same number of bits as data to be stored in a normal memory block and a parity code having the number of bits at least twice greater than that of a parity code to be stored in the normal memory block are stored in a first bad memory block and a second bad memory block among the bad memory blocks.

Abstract: A memory controller includes a command input unit suitable for receiving a write command, a read command, and a send command, a command counting unit suitable for performing a counting operation in response to the write command to produce a counted data, a first Error Correction Code (ECC) encoding unit suitable for performing a first ECC encoding onto a data that is read from a memory device in response to the read command to produce a first ECC encoded data, a second ECC encoding unit suitable for performing a second ECC encoding onto the counted data in response to the send command to produce a second ECC encoded data, and a data output unit suitable for combining the first ECC encoded data and the second ECC encoded data to output a read data.

Abstract: A method for operating a memory device includes: receiving a write command; checking out whether a data strobe signal toggles or not after a given time passes from a moment when the write command is received; when the data strobe signal is checked out to be maintained at a uniform level, detecting voltage levels of a plurality of data pads; and performing an operation that is selected based on the voltage levels of the plurality of the data pads among a plurality of predetermined operations.

Abstract: A memory system comprises a memory device including a plurality of memory blocks, a write operation check unit configured to count the number of write operations performed on the respective memory blocks, a write count distribution management module configured to manage a distribution of the memory blocks based on the counted number of the write operations, and a wear leveling module configured to detect hot and cold memory blocks from the plurality of memory blocks based on the counted number of the write operation and the distribution, wherein the wear leveling module manages a history of the hot memory block and swaps the hot memory block with the cold memory block according to the managed history.

Abstract: A memory system includes: a memory device; a cache memory suitable for caching a portion of a data stored in the memory device; and a read voltage controller suitable for controlling a level of a read voltage of the memory device by comparing a cache data in the cache memory with a data from the memory device corresponding to the cache data.

Abstract: A memory device includes a plurality of word lines and a plurality of bit lines intersecting the word lines, a memory cell array comprising a plurality of memory cells coupled between the word lines and the bit lines at intersections between the word lines and the bit lines, respectively, an address decoder suitable for decoding an address to access a memory cell selected among the memory cells, and a controller suitable for writing and reading data to and from the selected memory cell by applying voltages to the word lines and bit lines, wherein the controller invalidates data stored in memory cells coupled to a target word line among the word lines by applying an invalidation voltage to the target word line for a set time.

Abstract: A method for operating a memory device includes: receiving a write command; checking out whether a data strobe signal toggles or not after a given time passes from a moment when the write command is received; when the data strobe signal is checked out to be maintained at a uniform level, detecting voltage levels of a plurality of data pads; and performing an operation that is selected based on the voltage levels of the plurality of the data pads among a plurality of predetermined operations.

Abstract: A method for operating a memory device includes: receiving a write command; checking out whether a data strobe signal toggles or not after a given time passes from a moment when the write command is received; when the data strobe signal is checked out to be maintained at a uniform level, detecting voltage levels of a plurality of data pads; and performing an operation that is selected based on the voltage levels of the plurality of the data pads among a plurality of predetermined operations.

Abstract: A memory system may include a first memory having a first operating speed, and a second memory having a second operating speed which is different from the first operating speed. A compression device may compress data of the first memory, and may transfer the compressed data to the second memory. The compression device may select a compression scheme among a plurality of compression schemes based on at least one characteristic of the data of the first memory and a data processing combination selected among a plurality of data processing combinations between a series of data processing units of the first memory and a series of data processing units of the second memory, and may compress the data of the first memory according to the selected compression scheme.

Abstract: An operating method of a memory controller may include determining a physical page to be accessed in a plurality of memory devices by mapping a logical address to a physical address; and determining a distribution pattern in which data of the physical page are distributed to the plurality of memory devices using the logical address.

Abstract: A semiconductor system includes a medium controller and a semiconductor module. The medium controller outputs an address that is sequentially counted in a test mode, senses levels of data corresponding to the address in the test mode to determine if the data has a row error or a chip error, and changes a combination of a host address to generate and store a spare address if a combination of the address corresponds to the chip error in the test mode. The semiconductor module includes a plurality of semiconductor devices. The semiconductor module repairs the address to output the data from a redundancy area if a combination of the address corresponds to the row error. The semiconductor module outputs the data from a spare area selected by the spare address if a combination of the address corresponds to the chip error.

Abstract: A semiconductor device may be provided. The semiconductor device may be configured to shift storage positions of data and error information on the data to store the data into shifted storage positions based on the address signals having a certain combination being inputted a predetermined number of times.

Abstract: A memory device may include a memory cell array having a plurality of memory cells, and a controller suitable for reading data of a memory cell corresponding to an address of write data, among the memory cells, and comparing the write data and the read data to check specific bits different from corresponding bits of the read data, among a plurality of bits of the write data, according to a write operation request. The controller may output a check result to outside after a preset time from the write operation request.

Abstract: A memory system includes a memory device including a memory block, the memory block including a plurality of memory cell groups, an address translator that maps a logical address of a data to a physical address of the memory block, and a controller configured to divide the plurality of memory cell groups into a plurality of first memory cell groups and at least one second memory cell group, and control the address translator so that the address translator maps a logical address of a data to a physical address of the first memory cell groups of the memory block and not in the at least one second memory cell group and switches the at least one second memory cell group with a selected first memory cell group among the plurality of the first memory cell groups when a predetermined period of time elapses.