Abstract: A diamond coated tool includes a base material and a diamond layer provided on the base material. The diamond layer has a boron content of 1×103 ppma or more and 1×106 ppma or less and an oxygen content of 1×102 ppma or more and 1×105 ppma or less in a first region surrounded by a surface of the diamond layer and a first imaginary plane located at a distance of 1 ?m from the surface in a thickness direction.

Abstract: A full-thickness resection method for a gastrointestinal tract includes forming a pair of first markings in surrounding tissue on both sides of a lesion to sandwich the lesion therebetween; performing a full-thickness resection to a portion including the lesion; identifying a pair of suture locations in the vicinity of the pair of first markings; and suturing the pair of first suture locations.

Abstract: The present invention relates to latex particles for measurement reagents, said latex particles having a coefficient of variation in particle diameters of 10% or less and an average particle diameter of 250 to 1000 nm. Each of the latex particles contains 20% by weight or more of a compound having a refractive index of 1.60 or more. The depth of a supernatant is 5 mm or less when a liquid dispersion having a solid matter concentration of 1% by weight, which is prepared by dispersing the latex particles in ultrapure water, is placed in a tubular 10-ml measuring cylinder having a body inner diameter of 10.8 mm and is then allowed to leave for 10 days. According to the particles, a measurement of a measurement sample can be performed at a high sensitivity even when the concentration of a substance to be tested in the measurement sample is low.

Abstract: A defect inspection apparatus (100) includes an imager (image sensor 35) configured to image an inspection target 7, and a display (6) configured to display an image based on an image captured by the imager. The defect inspection apparatus (100) also includes a controller (4) configured or programmed to receive a setting of a marking (64) in a predetermined region of interest (S) on the image (still image 61) displayed on the display (6). The controller (4) is configured or programmed to inspect the inspection target (7) for a defect based on the image captured by the imager, and superimpose an image of the marking (64) on a position corresponding to the predetermined region of interest (S) in an image of an inspection result (overlay image 65) displayed on the display (6).

Abstract: A defect detection device includes: an excitation unit configured to apply vibration to an inspection object; a vibration state image creation unit configured to measure by an optical means a vibration state in a measurement area on a surface of the inspection object to which the vibration is applied, and to create one or more types of vibration state images representing the vibration state in the measurement area depending on a result of the measurement; an optical image acquisition unit configured to acquire an optical image in the measurement area; an image display unit configured to display an image; and a display control unit configured to perform control to simultaneously display two images among the one or more types of vibration state images and the optical image for the same area in the measurement area on the image display unit.

Abstract: Apparatuses and methods for arranging compensation capacitors are described. An example apparatus includes: a first conductive layer including a portion; a second conductive layer: a contact coupled to the portion of the first conductive layer; a third conductive layer between the first conductive layer and the second conductive layer, coupled to the contact; one or more capacitor elements wherein each capacitor element of the one or more capacitor elements includes one end coupled to the second conductive layer and another end coupled to the third conductive layer.

Abstract: Apparatuses and methods for arranging compensation capacitors are described. An example apparatus includes: a first conductive layer including a portion; a second conductive layer: a contact coupled to the portion of the first conductive layer; a third conductive layer between the first conductive layer and the second conductive layer, coupled to the contact; one or more capacitor elements wherein each capacitor element of the one or more capacitor elements includes one end coupled to the second conductive layer and another end coupled to the third conductive layer.

Abstract: Methods, systems, and devices for back-bias optimization are described. An apparatus, such as an electronic apparatus, may include a first substrate region and a second substrate region. The apparatus may also include a voltage generator that is disposed on the first substrate region and that includes an output terminal coupled with a conductive path. The apparatus may also include a set of clamp circuits disposed on the second substrate region. The set of clamp circuits may be configured selectively couple the conductive path with a voltage supply.

Abstract: Memory devices are disclosed. A memory device may include a first row of power supply pads and a first row of input/output (DQ) pads. The memory device may further include a row of vias, wherein the first row of DQ pads is positioned at least partially between the row of vias and the first row of power supply pads. The memory device may also include a number of conductors, wherein each via of the row of vias is coupled, via an associated conductor of the number of conductors, to either a power supply pad of the first row of power supply pads or a DQ pad of the first row of DQ pads. Methods of forming an interface region of a memory device, and electronic systems are also disclosed.

Abstract: Some embodiments include an integrated assembly having a capacitive unit which includes a plurality of capacitive subunits. A first conductive structure is under a first group of the capacitive subunits and is coupled with them. A second conductive structure is under a second group of the capacitive subunits and is coupled with them. A third conductive structure is over the capacitive subunits and is coupled with all of the capacitive subunits. A resistive structure extends under the first and second conductive structures. The resistive structure has a first-end-region under the first conductive structure and coupled with the first conductive structure. The resistive structure includes resistive lines extending from the first-end-region to second-end-regions.

Abstract: Apparatuses for providing buffer circuits a semiconductor device are described. An example apparatus includes a plurality of inverters and a transistor having one diffusion region coupled to a diffusion region of a transistor of one inverter of the plurality of inverters, another diffusion region coupled to a diffusion region of a transistor of another inverter of the plurality of inverters. The transistor having a gate coupled to one power supply voltage and diffusion regions coupled to another power supply voltage functions as a power voltage compensation capacitor.

Abstract: Some embodiments include an integrated assembly having a capacitive unit which includes a plurality of capacitive subunits. A first conductive structure is under a first group of the capacitive subunits and is coupled with them. A second conductive structure is under a second group of the capacitive subunits and is coupled with them. A third conductive structure is over the capacitive subunits and is coupled with all of the capacitive subunits. A resistive structure extends under the first and second conductive structures. The resistive structure has a first-end-region under the first conductive structure and coupled with the first conductive structure. The resistive structure includes resistive lines extending from the first-end-region to second-end-regions.

Abstract: The present invention provides fluorescent particles for a diagnostic agent which contain a synthetic polymer and at least 10 mass %, on a total particle mass basis, of an aggregation-induced emission material, and have on the surface thereof a binding partner which binds with an analyte. These fluorescent particles for a diagnostic agent are non-toxic, have improved visibility and reproducibility, and support a binding partner for an analyte.

Abstract: Apparatuses for providing buffer circuits a semiconductor device are described. An example apparatus includes a plurality of inverters and a transistor having one diffusion region coupled to a diffusion region of a transistor of one inverter of the plurality of inverters, another diffusion region coupled to a diffusion region of a transistor of another inverter of the plurality of inverters. The transistor having a gate coupled to one power supply voltage and diffusion regions coupled to another power supply voltage functions as a power voltage compensation capacitor.

Abstract: The present invention relates to latex particles for measurement reagents, said latex particles having a coefficient of variation in particle diameters of 10% or less and an average particle diameter of 250 to 1000 nm. Each of the latex particles contains 20% by weight or more of a compound having a refractive index of 1.60 or more. The depth of a supernatant is 5 mm or less when a liquid dispersion having a solid matter concentration of 1% by weight, which is prepared by dispersing the latex particles in ultrapure water, is placed in a tubular 10-ml measuring cylinder having a body inner diameter of 10.8 mm and is then allowed to leave for 10 days. According to the particles, a measurement of a measurement sample can be performed at a high sensitivity even when the concentration of a substance to be tested in the measurement sample is low.

Abstract: Apparatuses for providing buffer circuits a semiconductor device are described. An example apparatus includes a plurality of inverters and a transistor having one diffusion region coupled to a diffusion region of a transistor of one inverter of the plurality of inverters, another diffusion region coupled to a diffusion region of a transistor of another inverter of the plurality of inverters. The transistor having a gate coupled to one power supply voltage and diffusion regions coupled to another power supply voltage functions as a power voltage compensation capacitor.

Abstract: This analyte concentration measuring method including: preparing a mixed solution by mixing a sample solution containing an analyte, with a solution containing aggregation-induced emission fluorescent material-containing particles that have a binding partner which binds with the analyte and that agglutinate and fluoresce when the analyte binds to the binding partner; measuring the fluorescence intensity generated from the aggregation-induced emission fluorescent material-containing particles in the mixed solution; and comparing a fluorescence intensity calibration curve for analyte concentration with the fluorescence intensity, and associating the fluorescence intensity with the analyte concentration in the mixed solution. Employing agglutinating-luminescent-material-containing particles enables measurements to be carried out with a satisfactory detection sensitivity while suppressing background fluorescence.

Abstract: A polymer fine particle including a block copolymer having two or more segments, wherein the polymer fine particle has a microphase separated structure on a surface thereof, the number-average particle size is 50 nm to 1000 nm, and the coefficient of variation is less than 20%. The polymer fine particle permits highly sensitive assay by controlling the antigen- or antibody-immobilized state of the particle surface.

Abstract: A nonvolatile semiconductor memory device includes a first string including a first number of memory cells connected in series each storing therein information in a nonvolatile manner; and a second string including a second number of memory cells connected in series each storing therein information in a nonvolatile manner, wherein the second number is smaller than the first number.