Abstract: A traffic control system that controls mobile drive unit traffic within a facility by segmenting the map into smaller traffic control policy areas and controlling access to those traffic control policy areas in response to travel requests from mobile drive units.

Abstract: A traffic control system that controls mobile drive unit traffic within a facility by handling requests to traverse intersections based on a priority based in part on an order in which requests are received. For intersections with a directional bias, higher priority is given to requests having a direction of travel that aligns with the directional bias.

Abstract: A temperature sensor circuit and system providing accurate digital temperature readings using a local or remote temperature diode. In one set of embodiments a change in diode junction voltage (?VBE) proportional to the temperature of the diode is captured and provided to an analog to digital converter (ADC), which may perform required signal conditioning functions on ?VBE, and provide a digital output corresponding to the temperature of the diode. DC components of errors in the measured temperature that may result from EMI noise modulating the junction voltage (VBE) may be minimized through the use of a front-end sample-and-hold circuit coupled between the diode and the ADC, in combination with a shunt capacitor coupled across the diode junction. The sample-and-hold-circuit may sample VBE at a frequency that provides sufficient settling time for each VBE sample, and provide corresponding stable ?VBE samples to the ADC at the ADC operating frequency.

Abstract: A voltage regulator may derive current from a bias circuitry having a constant-transconductance. The bias circuitry may generate the bias current using three NMOS devices. The temperature coefficient of the bias current may be within a specified, desired range. The bias current may be mirrored to low-power regulator circuitry to bias a diode-connected transistor in the low-power regulator circuitry to operate in the strong inversion region. A ratioed current based on the output load current may be injected into a bipolar junction transistor (BJT) device to cause the gate-source voltage (VGS) of the diode-connected device to track the VGS of the output transistor of the voltage regulator, to ensure tighter load regulation.

Abstract: A control method for a brushless, three-phase DC motor. A voltage induced by rotation of a rotor may be sampled at a first expected zero crossing value to produce a first sampled voltage value. An average of a plurality of sampled voltage values, including voltage values sampled at a plurality of prior expected zero crossing values and the first sampled voltage value, may be calculated. The first sampled voltage value may be subtracted from the calculated average to produce a delta zero crossing error. A pulse-width modulation duty cycle may be adjusted based on the delta zero crossing error. The pulse-width modulation duty cycle may be used to control a rotational velocity of the rotor.

Abstract: A switched-capacitor circuit on a semiconductor device may include accurately matched, high-density metal-to-metal capacitors, using top-plate-to-bottom-plate fringe-capacitance for obtaining the desired capacitance values. A polysilicon plate may be inserted below the bottom metal layer, and bootstrapped to the top plate of each capacitor in order to minimize and/or eliminate the parasitic top-plate-to-substrate capacitance. This may free up the bottom metal layer to be used in forming additional fringe-capacitance, thereby increasing capacitance density. By forming each capacitance solely based on fringe-capacitance from the top plate to the bottom plate, no parallel-plate-capacitance is used, which may reduce capacitor mismatch.

Abstract: A switched-capacitor circuit on a semiconductor device may include accurately matched, high-density metal-to-metal capacitors, using top-plate-to-bottom-plate fringe-capacitance for obtaining the desired capacitance values. A polysilicon plate may be inserted below the bottom metal layer, and bootstrapped to the top plate of each capacitor in order to minimize and/or eliminate the parasitic top-plate-to-substrate capacitance. This may free up the bottom metal layer to be used in forming additional fringe-capacitance, thereby increasing capacitance density. By forming each capacitance solely based on fringe-capacitance from the top plate to the bottom plate, no parallel-plate-capacitance is used, which may reduce capacitor mismatch. Parasitic bottom plate capacitance to the substrate may also be eliminated, with only a small capacitance to the bootstrapped polysilicon plate remaining.

Abstract: A switched-capacitor circuit on a semiconductor device may include accurately matched, high-density metal-to-metal capacitors, using top-plate-to-bottom-plate fringe-capacitance for obtaining the desired capacitance values. A polysilicon plate may be inserted below the bottom metal layer, and bootstrapped to the top plate of each capacitor in order to minimize and/or eliminate the parasitic top-plate-to-substrate capacitance. This may free up the bottom metal layer to be used in forming additional fringe-capacitance, thereby increasing capacitance density. By forming each capacitance solely based on fringe-capacitance from the top plate to the bottom plate, no parallel-plate-capacitance is used, which may reduce capacitor mismatch. Parasitic bottom plate capacitance to the substrate may also be eliminated, with only a small capacitance to the bootstrapped polysilicon plate remaining.

Abstract: A system for measuring a voltage drop between two nodes in an electrical circuit, comprising a switched capacitor integrator (SCI), a comparator and a counter. The SCI alternately (a) captures charge onto a set of sampling capacitors and (b) selectively accumulates/transfers the charge onto a pair of integration capacitors, where the charge includes a first portion that is based on the voltage drop and a second portion that depends on a digital indicator signal. The comparator generates the digital indicator signal based on whether an analog output of the SCI is positive or negative. The counter counts a number of ones occurring in the digital indicator signal during a measurement interval. At the end of the measurement interval, the count value represents a measure of the voltage drop. Knowing the resistance between the two nodes, the voltage drop may be converted into a current measurement.

Abstract: System and method for digitizing analog voltage signals. A first voltage signal may be received at a comparator. A ramp signal may be received at the comparator. The ramp signal may be generated by a ramp generator. An output signal may be generated by the comparator. The output signal may indicate whether the analog voltage signal or the ramp signal is greater. The output signal may be conveyed to logic circuitry by the comparator. Control information may be conveyed by the logic circuitry to the ramp generator. The ramp generator may generate the ramp signal based on the control information. The logic circuitry may determine a digital representation of the first voltage signal based on the output signal from the comparator and the control information.

Abstract: A switched-capacitor circuit on a semiconductor device may include accurately matched, high-density metal-to-metal capacitors, using top-plate-to-bottom-plate fringe-capacitance for obtaining the desired capacitance values. A polysilicon plate may be inserted below the bottom metal layer, and bootstrapped to the top plate of each capacitor in order to minimize and/or eliminate the parasitic top-plate-to-substrate capacitance. This may free up the bottom metal layer to be used in forming additional fringe-capacitance, thereby increasing capacitance density. By forming each capacitance solely based on fringe-capacitance from the top plate to the bottom plate, no parallel-plate-capacitance is used, which may reduce capacitor mismatch.

Abstract: A switched-capacitor circuit on a semiconductor device may include accurately matched, high-density metal-to-metal capacitors, using top-plate-to-bottom-plate fringe-capacitance for obtaining the desired capacitance values. A polysilicon plate may be inserted below the bottom metal layer, and bootstrapped to the top plate of each capacitor in order to minimize and/or eliminate the parasitic top-plate-to-substrate capacitance. This may free up the bottom metal layer to be used in forming additional fringe-capacitance, thereby increasing capacitance density. By forming each capacitance solely based on fringe-capacitance from the top plate to the bottom plate, no parallel-plate-capacitance is used, which may reduce capacitor mismatch.

Abstract: A switched-capacitor circuit on a semiconductor device may include accurately matched, high-density metal-to-metal capacitors, using top-plate-to-bottom-plate fringe-capacitance for obtaining the desired capacitance values. A polysilicon plate may be inserted below the bottom metal layer, and bootstrapped to the top plate of each capacitor in order to minimize and/or eliminate the parasitic top-plate-to-substrate capacitance. This may free up the bottom metal layer to be used in forming additional fringe-capacitance, thereby increasing capacitance density. By forming each capacitance solely based on fringe-capacitance from the top plate to the bottom plate, no parallel-plate-capacitance is used, which may reduce capacitor mismatch. Parasitic bottom plate capacitance to the substrate may also be eliminated, with only a small capacitance to the bootstrapped polysilicon plate remaining.

Abstract: A low-current differential signal activity detector circuit may be configured to reject large common mode signals on differential input lines, while still detecting smaller differential signals applied to the same set of differential input lines. The detector circuit may comprise a translinear buffer that is driven at the buffer input and at the buffer output by the differential input signals. The differential signal thereby driving the inputs of the detector circuit may be half-wave rectified through the buffer output devices and may be filtered to provide the detected output. When applying a common mode signal, the buffer's input and output may track each other, and no current may be rectified in the output devices, thus providing common-mode signal rejection. The detector circuit may also be configured with two buffers having their outputs coupled to a common node, each buffer input driven by a respective one of the differential input signals.

Abstract: Capacitors configured in a switched-capacitor circuit on a semiconductor device may comprise very accurately matched, high capacitance density metal-to-metal capacitors, using top-plate-to-bottom-plate fringe-capacitance for obtaining the desired capacitance values. A polysilicon plate may be inserted below the bottom metal layer as a shield, and bootstrapped to the top plate of each capacitor in order to minimize and/or eliminate the parasitic top-plate-to-substrate capacitance. This may free up the bottom metal layer to be used in forming additional fringe-capacitance, thereby increasing capacitance density. By forming each capacitance solely based on fringe-capacitance from the top plate to the bottom plate, no parallel-plate-capacitance is used, which may reduce capacitor mismatch. Parasitic bottom plate capacitance to the substrate may also be eliminated, with only a small capacitance to the bootstrapped polysilicon plate remaining.

Abstract: A voltage regulator may derive current from a bias circuitry having a constant-transconductance. The bias circuitry may generate the bias current using three NMOS devices. The temperature coefficient of the bias current may be within a specified, desired range. The bias current may be mirrored to low-power regulator circuitry to bias a diode-connected transistor in the low-power regulator circuitry to operate in the strong inversion region. A ratioed current based on the output load current may be injected into a bipolar junction transistor (BJT) device to cause the gate-source voltage (VGS) of the diode-connected device to track the VGS of the output transistor of the voltage regulator, to ensure tighter load regulation.

Abstract: A system for measuring a voltage drop between two nodes in an electrical circuit, comprising a switched capacitor integrator (SCI), a comparator and a counter. The SCI alternately (a) captures charge onto a set of sampling capacitors and (b) selectively accumulates/transfers the charge onto a pair of integration capacitors, where the charge includes a first portion that is based on the voltage drop and a second portion that depends on a digital indicator signal. The comparator generates the digital indicator signal based on whether an analog output of the SCI is positive or negative. The counter counts a number of ones occurring in the digital indicator signal during a measurement interval. At the end of the measurement interval, the count value represents a measure of the voltage drop. Knowing the resistance between the two nodes, the voltage drop may be converted into a current measurement.

Abstract: A low-current differential signal activity detector circuit may be configured to reject large common mode signals on differential input lines, while still detecting smaller differential signals applied to the same set of differential input lines. The detector circuit may comprise a translinear buffer that is driven at the buffer input and at the buffer output by the differential input signals. The differential signal thereby driving the inputs of the detector circuit may be half-wave rectified through the buffer output devices and may be filtered to provide the detected output. When applying a common mode signal, the buffer's input and output may track each other, and no current may be rectified in the output devices, thus providing common-mode signal rejection. The detector circuit may also be configured with two buffers having their outputs coupled to a common node, each buffer input driven by a respective one of the differential input signals.

Abstract: A low-current differential signal activity detector circuit may be configured to reject large common mode signals on differential input lines, while still detecting smaller differential signals applied to the same set of differential input lines. The detector circuit may comprise a translinear buffer that is driven at the buffer input and at the buffer output by the differential input signals. The differential signal thereby driving the inputs of the detector circuit may be half-wave rectified through the buffer output devices and may be filtered to provide the detected output. When applying a common mode signal, the buffer's input and output may track each other, and no current may be rectified in the output devices, thus providing common-mode signal rejection. The detector circuit may also be configured with two buffers having their outputs coupled to a common node, each buffer input driven by a respective one of the differential input signals.

Abstract: System and method for digitizing analog voltage signals. A first voltage signal may be received at a comparator. A ramp signal may be received at the comparator. The ramp signal may be generated by a ramp generator. An output signal may be generated by the comparator. The output signal may indicate whether the analog voltage signal or the ramp signal is greater. The output signal may be conveyed to logic circuitry by the comparator. Control information may be conveyed by the logic circuitry to the ramp generator. The ramp generator may generate the ramp signal based on the control information. The logic circuitry may determine a digital representation of the first voltage signal based on the output signal from the comparator and the control information.