Abstract: A circuit for eliminating a skew between data and a clock signal in an interface between a semiconductor memory device and a memory controller includes an edge information storage unit which stores edge information output from the semiconductor memory device, a pseudo data pattern generating unit which outputs pseudo data including a pattern similar to actually transmitted data, a phase detecting unit which receives the edge information from the edge information storage unit and the pseudo data from the pseudo data pattern generating unit to detect a phase difference between the data and the clock signal and generate a corresponding detection result, and a phase control unit which controls a phase of the clock signal according to the corresponding detection result from the phase detecting unit, so as to eliminate a per-data input/output pin skew in a data write and read operation of the semiconductor memory device.

Abstract: An input latency control circuit, a semiconductor memory device including an input latency control circuit and method thereof are provided. The example semiconductor memory device may include a clock buffer configured to generate an internal clock signal based on an external clock signal, a command decoder configured to decode an external command signal to generate a write command signal and an input latency control circuit configured to gate an address signal in a pipeline mode to generate a column address signal and a bank address signal based on the internal clock signal, the write command signal and the write latency signal.

Abstract: A method of determining timing skew between data outputs of a memory device can include writing a predetermined data pattern to a memory device at a first operational frequency that is less than a normal operational frequency used to write non-predetermined data to the memory device. The memory device is read to output the predetermined data pattern therefrom at a second operational frequency that is greater than the first operational frequency and about equal to a normal operational frequency used to read non-predetermined data from the memory device. Timing skew is determined between outputs from the memory device based on the actual time when the predetermined data is provided from the memory device.

Abstract: DC balance encoded data is transmitted by transmitting a preamble of dummy data that is configured to provide an intermediate number of bits of a given logic value that is at least one bit of the given logic value but less than a maximum number of bits of the given logic value in the DC balance encoded data, to thereby reduce the simultaneous switching noise that is caused by transmission of a first word of DC balance encoded data. The preamble may contain one or more words of fixed and/or variable dummy data.

Abstract: A semiconductor memory device includes a serial to parallel converter configured to generate parallel data at a parallel data rate in response to first serial data at first serial data rate in a first mode and configured to generate the parallel data at the parallel data rate in response to a second serial data at second serial data rate in a second mode, wherein the second serial data rate is less than the first serial data rate, and a data write circuit configured to provide the parallel data to a memory cell array.

Abstract: A circuit for eliminating a skew between data and a clock signal in an interface between a semiconductor memory device and a memory controller includes an edge information storage unit which stores edge information output from the semiconductor memory device, a pseudo data pattern generating unit which outputs pseudo data including a pattern similar to actually transmitted data, a phase detecting unit which receives the edge information from the edge information storage unit and the pseudo data from the pseudo data pattern generating unit to detect a phase difference between the data and the clock signal and generate a corresponding detection result, and a phase control unit which controls a phase of the clock signal according to the corresponding detection result from the phase detecting unit, so as to eliminate a per-data input/output pin skew in a data write and read operation of the semiconductor memory device.

Abstract: Semiconductor devices, a system including said semiconductor devices and methods thereof are provided. An example semiconductor device may receive data scheduled for transmission, scramble an order of bits within the received data, the scrambled order arranged in accordance with a given pseudo-random sequence. The received data may be balanced such that a difference between a first number of the bits within the received data equal to a first logic level and a second number of bits within the received data equal to a second logic level is below a threshold. The balanced and scrambled received data may then be transmitted. The example semiconductor device may perform the scrambling and balancing operations in any order. Likewise, on a receiving end, another semiconductor device may decode the original data by unscrambling and unbalancing the transmitted data. The unscrambling and unbalancing operations may be performed in an order based upon the order in which the transmitted data is scrambled and balanced.

Abstract: A swing limiter comprises a logic circuit including a first pull-up transistor and a first pull-down transistor connected between first and second nodes and which generate an output signal; a second pull-up transistor connected between a first power voltage and the first node; a second pull-down transistor connected between the second node and a second power voltage; a first control voltage generator connected between a high voltage which is higher than the first power voltage and a first reference voltage which is lower than the high voltage; and a second control voltage generator connected between a low voltage which is lower than the second power voltage and a second reference voltage which is higher than the low voltage.

Abstract: Circuits, methods and systems are provided to reduce skew between a first digital signal that is transmitted by a first driver circuit over a first signal line, and a second digital signal that is transmitted by a second driver circuit over a second signal line. Skew may be reduced by sourcing or sinking additional current to or from the first signal line in response to the first digital signal and the second digital signal transitioning to opposite logical values, and otherwise refraining from sourcing or sinking the additional current to or from the first signal line.

Abstract: A synchronous semiconductor memory device includes an output control signal generator, which generates an output control signal corresponding to a signal obtained by delaying a read information signal in response to a delay internal clock signal obtained by dividing an internal clock signal by n, first and second sampling signals obtained by delaying the internal clock signal, a first output control clock signal obtained by dividing the internal clock signal by n, and a column address strobe (CAS) latency signal. The synchronous semiconductor memory device also includes a data output buffer, which outputs data by buffering internal data in response to the output control signal and the first output control clock signal.

Abstract: A semiconductor memory device and a method of expanding a valid output data window are described. The semiconductor memory device includes a memory cell array and an output circuit. The memory cell array generates read data having a plurality of bits. The output circuit outputs the read data sequentially in response to a clock signal in a normal mode. On the other hand, the output circuit selectively outputs the bits of the read data by latching bits to be tested among bits of the read data, and by electrically disconnecting bits not to be tested among bits of the read data in response to a plurality of switch control signals in a test mode. Therefore a valid data window of an output data may be expanded.

Abstract: DC balance encoded data is transmitted by transmitting a preamble of dummy data that is configured to provide an intermediate number of bits of a given logic value that is at least one bit of the given logic value but less than a maximum number of bits of the given logic value in the DC balance encoded data, to thereby reduce the simultaneous switching noise that is caused by transmission of a first word of DC balance encoded data. The preamble may contain one or more words of fixed and/or variable dummy data.

Abstract: A circuit including a voltage boost circuit coupled to a first node and a second node, and configured to apply a boosted first node voltage to the second node; and an inverter circuit coupled to the first node, the second node, and a third node, and configured to generate a signal on the third node in response to the signals on the first node and the second node.

Abstract: A latency signal generating method and a corresponding semiconductor memory device, among other things, are disclosed. Such a method includes: receiving a clock signal for the semiconductor memory device; receiving a mode characterization signal; providing the DQS; and adapting the duration of a preamble state of the DQS according to the mode characterization signal to promote conformance of a strobe state of the DQS with the clock signal.

Abstract: A latency signal generating method and a corresponding semiconductor memory device, among other things, are disclosed. Such a method includes: receiving a clock signal for the semiconductor memory device; receiving a mode characterization signal; providing the DQS; and adapting the duration of a preamble state of the DQS according to the mode characterization signal to promote conformance of a strobe state of the DQS with the clock signal.

Abstract: A system including a plurality of transmission lines, a transmitter outputting respective signals to each of the plurality of transmission lines, a receiver receiving each of the plurality of signals via respective transmission lines, the receiver including a connection path connected to a termination voltage, a plurality of termination circuits distributed along the connection path, each termination circuit receiving a unique termination voltage from the connection path, receiving a respective signal and outputting a terminated input signal, a reference voltage generator including multiple reference voltage generator units connected to a common voltage, each reference voltage generator unit uniquely receiving at least one unique termination voltage and outputting a reference voltage, and a plurality of data input buffers receiving respective signals and an appropriate reference voltage of the multiple reference voltages output from the reference voltage generator.

Abstract: Provided are a circuit and method for sampling a valid command using a valid address window extended for a high-speed operation in a double pumped address scheme memory device. A method for extending the valid address window includes: inputting a valid command signal and a first address signal at the first cycle of a clock signal; inputting a second address signal at the second cycle of the clock signal; generating a decoded command signal and extended first and second internal address signals respectively in response to the command signal and the address signals; and latching and decoding the extended first and second internal address signals in response to the decoded command signal.

Abstract: Provided is a wave pipelined output circuit of a synchronous memory device. In the wave pipelined output circuit, paths for transferring data in a high frequency mode of the synchronous memory device are separated from paths for transferring the data in a low frequency mode of the synchronous memory device. The number of registers included in data output paths in the high frequency mode is reduced and the number of control signals used for data input/output of the registers is also reduced. Consequently, loads of the data output paths in the high frequency mode are decreased to improve a high frequency operation and reduce the chip area of the output circuit.

Abstract: Provided is a semiconductor device capable of controlling an on-die-termination (ODT) circuit and an off-chip-driver (OCD) circuit and a control method used by the semiconductor device. The semiconductor device includes a control code generation unit generating a control code in response to a control signal, an addition unit adding an adjustment code to the control code to produce an adjusted control code, and an ODT circuit, wherein an impedance of the ODT circuit is adjusted in response to the adjusted control code. The semiconductor device can adjust the control code more precisely by adding or subtracting the adjustment code to or from the control code. Accordingly, the impedance of an OCD circuit or ODT circuit can be adjusted more precisely.

Abstract: A voltage generating circuit for a semiconductor memory device. The voltage generating circuit includes a multi-boosting unit for stepping up a power supply voltage, a transfer transistor connected to a final boosting node of the multi-boosting unit and an output node, and a charge-sharing element, electrically connected to the final boosting node and a gate node of the transfer transistor, enabled during at least a part of the period the power supply voltage is stepped-up by the multi-boosting unit and performing charge sharing between the final boosting node and the gate node of the transfer transistor.