Abstract: An integrated circuit device comprises at least one power gating arrangement, including at least one gated power domain, and at least one power gating component operably coupled between at least one node of the at least one gated power domain and at least a first power supply node. The at least one power gating component is arranged to selectively couple the at least one node of the at least one gated power domain to the at least first power supply node.

Abstract: Described herein are architectures, platforms and methods for offloading process or application from a near field communication (NFC) master device for proxy delegation to a proxy NFC device.

Abstract: Techniques for wireless charging in a system, method, and apparatus are described herein. For example, the apparatus includes a wireless power transmitting coil configured to propagate current provided from a charging device, wherein the current propagation is to generate a magnetic field. The apparatus includes a protruding magnetic component, wherein the wireless power transmitting coil is disposed around the protruding magnetic component.

Abstract: An integrated circuit device comprising at least one memory module comprising a plurality of memory sub-modules, and at least one power management module arranged to provide power management for the at least one memory module. The at least one power management module is arranged to determine when content of at least one memory sub-module is redundant, and place the at least one memory sub-module into a powered-down state upon determining that content of the at least one memory sub-module is redundant.

Abstract: An IO driver for an integrated circuit and a method for calibrating such an IO driver are provided. The IO driver comprises a plurality of IO driver cells, a plurality of IO partial driver cells and an external resistor. The IO driver cells control IO operations for a corresponding plurality of data channels of the integrated circuit. The IO partial driver cells are coupled to respective cells of the plurality of IO driver cells. The external resistor provides a reference impedance. The reference partial driver cell is coupled to the external resistor and is arranged to determine the reference impedance and to provide information depending on the reference impedance to the IO partial driver cells. The IO partial driver cells are arranged to calibrate the respective IO driver cells based on the provided information.

Abstract: A voltage regulating circuit is provided for regulating an output voltage in order to minimize an absolute difference between a level of said output voltage and a reference level. The voltage regulating circuit comprises a voltage regulator and a reference level generator. The reference level generator generates an internal reference level on the basis of said output voltage level and said reference level such that said internal reference level does not exceed said output voltage level by more than a maximum allowed increment. The voltage regulator regulates said output voltage in order to minimize an absolute difference between said output voltage level and said internal reference level. A method of regulating an output voltage is also disclosed.

Abstract: An apparatus for voltage ripple reduction on a power supply line of an integrated circuit device is provided to be operable in at least two modes. The apparatus includes: one or more clamping devices connectable to the power supply line; a clamp control unit; and a mode change detection unit arranged to monitor an interface of the integrated circuit device for one or more information indicating an upcoming mode change of the integrated circuit device and to provide a mode change signal to the clamp control unit when the one or more information is detected. The clamp control unit is arranged to connect at least one of the one or more clamping devices to the power supply line when receiving the mode change signal.

Abstract: An integrated circuit comprising a power supply node, a ground node and a gated domain coupled between the power node and the ground node. A Charged Device Model electrostatic discharge protection module is provided for shunting electrical energy of a CDM ESD event away from the gated domain. A gating switch makes an electrical connection in a connected state between the gated domain and at least one of the power node and the ground node. ESD gating control circuitry is coupled to the CDM ESD protection module and controls shunting of energy away from the gated domain by the CDM ESD protection module, thereby avoiding the energy flowing through the gated domain. The ESD gating control circuitry inhibits actuation of the CDM ESD protection module to prevent response to CDM ESD events when the gating domain is powered-up.

Abstract: Some demonstrative embodiments include apparatuses, systems and/or methods of detecting an activity of a wireless communication device. For example, a Near Field Communication (NFC) device may include a transmitter to transmit information to a polling device by modulating a carrier signal emitted by the polling device; a sensor to sense a plurality of sensed modulation levels of the carrier signal; and a controller to detect an activity of an other NFC device based on the sensed modulation levels.

Abstract: A method and apparatus for calculating delay timing values for at least a part of an integrated circuit design. The method comprises applying a first Negative/Positive Bias Temperature Instability compensation margin to delay values for elements within the at least part of the IC design, identifying at least one lower-rate switching element within the at least part of the IC design, and applying at least one further, increased N/PBTI compensation margin to the delay value(s) for the at least one identified lower-rate switching element.

Abstract: The invention provides a method for launch-off-shift at-speed scan testing for at least two scan chains of an integrated circuit comprises iteratively shifting set values for functional elements of a first one of the scan chains clocked with a shift clock, iteratively shifting set values for functional elements of a second one of the scan chains clocked with the shift clock, launching an at-speed scan test clocked with a functional clock for the first one of the scan chains at a last shift cycle of the first one of the scan chains, delaying the last shift cycle for the second one of the scan chains for a predetermined time span, launching an at-speed scan test clocked with a functional clock for the second one of the scan chains at the last shift cycle of the second one of the scan chains, capturing the sample values of the functional elements of the first and second scan chains after the last shift cycle of the scan chains.

Abstract: The invention provides a method for recovering NBTI/PBTI related parameter degradation in MOSFET devices. The method includes operating the at least one MOSFET device in a standby mode, exiting the at least one MOSFET device from the standby mode, holding the at least one MOSFET device in an active state for a predetermined time span after exiting the standby mode, and operating the at least one MOSFET device in an operational mode after the predetermined time span has elapsed.

Abstract: Processing logic circuit for use in a computing system has State Retention Power Gating logic circuit including at least two scan chains having different lengths and operable to collect state information about at least a portion of the processing logic circuit before the at least a portion of the processing logic circuit is placed from a first state into a second, different, state. The processing logic circuit includes a memory operable to store collected state information about the at least a portion of the processing logic circuit, and logic circuit operable to rearrange the collected state information data for scan chains shorter than a longest scan chain within the at least a portion of the processing logic circuit, to enable valid return of the collected state information data, for the scan chains shorter than a longest scan chain, to the at least a portion of the processing logic circuit when the at least a portion of the processing logic circuit returns to the first state.

Abstract: The present invention provides a clock source for an integrated circuit, comprising a primary oscillator adapted to generate a primary clock signal based on a reference control signal, at least one secondary oscillator each secondary oscillator being adapted to generate a secondary clock signal based on the reference control signal, wherein for each secondary oscillator a frequency correction unit is provided and adapted to adjust the reference control signal for the associated secondary oscillator based on the primary clock signal and the secondary clock signal of the associated secondary oscillator such that the clock frequency of the secondary clock signal of the associated secondary oscillator essentially equals the clock frequency of the primary clock signal. The present invention furthermore provides a method for providing a clock signal, and an integrated circuit.

Abstract: A method of calculating at least one delay timing value for at least one setup timing stage within an integrated circuit design includes applying Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage, and calculating the at least one delay timing value for the at least one setup timing stage based at least partly on the N/PBTI compensated delay values. The method further includes identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage, and applying reduced N/PBTI compensation margins to delay values for the identified at least partially equivalent elements within parallel timing paths of the at least one setup timing stage.

Abstract: The invention relates to a method of designing a processor core arrangement which comprises a first processor core for operation at a first operation frequency and having an associated first leakage and a second processor core for operation at a second operation frequency lower than the first operation frequency and having an associated second leakage lower than the first leakage. The processor core arrangement is capable of switching from the first processor core to the second processor core and vice versa.

Abstract: Systems and methods to secure near field communications (NFC) are disclosed. An NFC polling device may detect a change in voltage when attempting to communicate with another NFC device and based at least in part on the magnitude of the change in voltage if there is an attempted hacking and/or snooping event. The NFC polling device may further identify the number of modulation voltage levels detected and determine if there is an attempted hacking event based on the number of modulation voltage levels detected.

Abstract: A method of performing state retention, for example during power gating, for at least one functional block within an integrated circuit device. The method comprises enabling at least one scan chain within the at least one functional block, scanning out a set of scan chain values from the at least one scan chain, a subset of the set of scan chain values comprising validation values, and writing the set of scan chain values to at least one memory element. The method further comprises retrieving the set of scan chain values from the at least one memory element, and validating the validation values within the retrieved set of scan chain values.

Abstract: There is provided an integrated circuit comprising at least one logic path, comprising a plurality of sequential logic elements operably coupled into a scan chain to form at least one scan chain under test, at least one IR drop sensor operably coupled to the integrated circuit power supply, operable to output a first logic state when a sensed supply voltage is below a first predefined value and to output a second logic state when the sensed supply voltage is above the first predefined value, at least one memory buffer operably coupled to a scan test data load-in input and a scan test data output of the at least one scan chain under test, and control logic operable to gate logic activity including the scan shift operation inside the integrated circuit for a single cycle when the at least one IR drop sensor outputs the first logic state and to allow normal scan test flow when the at least one IR drop sensor outputs the second logic state.

Abstract: An integrated circuit comprising a power supply node, a ground node and a gated domain coupled between the power node and the ground node. A Charged Device Model electrostatic discharge protection module is provided for shunting electrical energy of a CDM ESD event away from the gated domain. A gating switch makes an electrical connection in a connected state between the gated domain and at least one of the power node and the ground node. ESD gating control circuitry is coupled to the CDM ESD protection module and controls shunting of energy away from the gated domain by the CDM ESD protection module, thereby avoiding the energy flowing through the gated domain. The ESD gating control circuitry inhibits actuation of the CDM ESD protection module to prevent response to CDM ESD events when the gating domain is powered-up.