Patents by Inventor Shayak Banerjee

Shayak Banerjee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11182531
    Abstract: A method and system is provided for detecting at risk structures due to mask overlay that occur during lithography processes. The method can be implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to obtain a simulation of a metal layer and a via, and determine a probability that an arbitrary point (x, y) on the metal layer is covered by the via by calculating a statistical coverage area metric followed by mathematical approximations of a summing function.
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: November 23, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Shayak Banerjee, William Brearley
  • Patent number: 11163934
    Abstract: A method and system is provided for detecting at risk structures due to mask overlay that occur during lithography processes. The method can be implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to obtain a simulation of a metal layer and a via, and determine a probability that an arbitrary point (x, y) on the metal layer is covered by the via by calculating a statistical coverage area metric followed by mathematical approximations of a summing function.
    Type: Grant
    Filed: May 7, 2019
    Date of Patent: November 2, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Shayak Banerjee, William Brearley
  • Patent number: 10739253
    Abstract: Systems, devices and methods for calibrating or increasing the accuracy of light sensing devices. The methods can include calibrating a light sensing device with a calibration source that is adapted to mimic at least one representative spectrum.
    Type: Grant
    Filed: June 7, 2017
    Date of Patent: August 11, 2020
    Assignee: YouV Labs, Inc.
    Inventors: Emmanuel Dumont, Shayak Banerjee
  • Patent number: 10732034
    Abstract: System and methods for accurate measurement and real-time feedback of solar ultraviolet exposure for management of ultraviolet dose. The systems can include a wearable device and a mobile device, the system performing accurate measurement of UV exposure.
    Type: Grant
    Filed: January 11, 2019
    Date of Patent: August 4, 2020
    Assignee: The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
    Inventors: Emmanuel Dumont, Shayak Banerjee, Mauricio Contreras
  • Patent number: 10527491
    Abstract: Charging systems for wearable UV sensing devices. The charging systems include a wearable housing including a UV sensor, a central conductor, and at least one annular conductor extending around the central conductor. The system also includes a charger that has at least first and second conductive contacts, where the first and second contacts are spaced from each other and the central conductor and annular conductor are spaced from each other such that the first and second contacts are aligned with the central conductor and the annular conductor, respectively, when the housing and charger interface.
    Type: Grant
    Filed: August 25, 2016
    Date of Patent: January 7, 2020
    Assignee: The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
    Inventors: Emmanuel Dumont, Shayak Banerjee, Mauricio Contreras
  • Patent number: 10527490
    Abstract: System and methods for accurate measurement and real-time feedback of solar ultraviolet exposure for management of ultraviolet dose. The systems can include a wearable device and a mobile device, the system performing accurate measurement of UV exposure.
    Type: Grant
    Filed: August 25, 2016
    Date of Patent: January 7, 2020
    Assignee: The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
    Inventors: Emmanuel Dumont, Shayak Banerjee, Mauricio Contreras
  • Publication number: 20190340329
    Abstract: A method and system is provided for detecting at risk structures due to mask overlay that occur during lithography processes. The method can be implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to obtain a simulation of a metal layer and a via, and determine a probability that an arbitrary point (x, y) on the metal layer is covered by the via by calculating a statistical coverage area metric followed by mathematical approximations of a summing function.
    Type: Application
    Filed: July 16, 2019
    Publication date: November 7, 2019
    Inventors: Shayak Banerjee, William Brearley
  • Patent number: 10395002
    Abstract: A method and system is provided for detecting at risk structures due to mask overlay that occur during lithography processes. The method can be implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to obtain a simulation of a metal layer and a via, and determine a probability that an arbitrary point (x, y) on the metal layer is covered by the via by calculating a statistical coverage area metric followed by mathematical approximations of a summing function.
    Type: Grant
    Filed: January 5, 2017
    Date of Patent: August 27, 2019
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Shayak Banerjee, William Brearley
  • Publication number: 20190258774
    Abstract: A method and system is provided for detecting at risk structures due to mask overlay that occur during lithography processes. The method can be implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to obtain a simulation of a metal layer and a via, and determine a probability that an arbitrary point (x, y) on the metal layer is covered by the via by calculating a statistical coverage area metric followed by mathematical approximations of a summing function.
    Type: Application
    Filed: May 7, 2019
    Publication date: August 22, 2019
    Inventors: Shayak Banerjee, William Brearley
  • Patent number: 10378953
    Abstract: A computer executable method that can be stored in a memory, the method including: visually presenting on a display of a user device a history of UV dose that was calculated based on information sensed by a UV sensor in a wearable UV sensing device; visually presenting a percentile indicator on the display, the percentile indicator being indicative of a calculated percentile of the history of UV dose; and visually presenting on the display a user-adjustable UV dose threshold interface that is adapted to allow the user to interact with the user-adjustable UV dose interface and choose a user-chosen UV dose threshold quantity.
    Type: Grant
    Filed: June 1, 2018
    Date of Patent: August 13, 2019
    Assignee: YouV Labs, Inc.
    Inventors: Emmanuel Dumont, Shayak Banerjee
  • Patent number: 10339261
    Abstract: A method and system is provided for detecting at risk structures due to mask overlay that occur during lithography processes. The method can be implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to obtain a simulation of a metal layer and a via, and determine a probability that an arbitrary point (x, y) on the metal layer is covered by the via by calculating a statistical coverage area metric followed by mathematical approximations of a summing function.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: July 2, 2019
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Shayak Banerjee, William Brearley
  • Publication number: 20190145820
    Abstract: System and methods for accurate measurement and real-time feedback of solar ultraviolet exposure for management of ultraviolet dose. The systems can include a wearable device and a mobile device, the system performing accurate measurement of UV exposure.
    Type: Application
    Filed: January 11, 2019
    Publication date: May 16, 2019
    Inventors: Emmanuel DUMONT, Shayak BANERJEE, Mauricio CONTRERAS
  • Publication number: 20190033126
    Abstract: A computer executable method that can be stored in a memory, the method including: visually presenting on a display of a user device a history of UV dose that was calculated based on information sensed by a UV sensor in a wearable UV sensing device; visually presenting a percentile indicator on the display, the percentile indicator being indicative of a calculated percentile of the history of UV dose; and visually presenting on the display a user-adjustable UV dose threshold interface that is adapted to allow the user to interact with the user-adjustable UV dose interface and choose a user-chosen UV dose threshold quantity.
    Type: Application
    Filed: June 1, 2018
    Publication date: January 31, 2019
    Inventors: Emmanuel DUMONT, Shayak BANERJEE
  • Publication number: 20180224326
    Abstract: System and methods for accurate measurement and real-time feedback of solar ultraviolet exposure for management of ultraviolet dose. The systems can include a wearable device and a mobile device, the system performing accurate measurement of UV exposure.
    Type: Application
    Filed: January 17, 2018
    Publication date: August 9, 2018
    Inventors: Emmanuel DUMONT, Shayak BANERJEE, Mauricio CONTRERAS
  • Patent number: 9880052
    Abstract: Systems and methods for accurate measurement and real-time feedback of solar ultraviolet exposure for management of ultraviolet dose. The systems can include a wearable device including a proximity sensor, the proximity sensor used to initiate an alert that the proximity sensor is covered. The systems can include a visible light sensor, the visible light sensor used to enter into a sleep, or night, mode.
    Type: Grant
    Filed: August 25, 2016
    Date of Patent: January 30, 2018
    Assignee: The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
    Inventors: Emmanuel Dumont, Shayak Banerjee, Mauricio Contreras
  • Patent number: 9880725
    Abstract: System and methods for accurate measurement and real-time feedback of solar ultraviolet exposure for management of ultraviolet dose. The systems can include a wearable device and a mobile device, the system performing accurate measurement of UV exposure.
    Type: Grant
    Filed: June 29, 2017
    Date of Patent: January 30, 2018
    Assignee: The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
    Inventors: Emmanuel Dumont, Shayak Banerjee, Mauricio Contreras
  • Publication number: 20170350815
    Abstract: Systems, devices and methods for calibrating or increasing the accuracy of light sensing devices. The methods can include calibrating a light sensing device with a calibration source that is adapted to mimic at least one representative spectrum.
    Type: Application
    Filed: June 7, 2017
    Publication date: December 7, 2017
    Inventors: Emmanuel DUMONT, Shayak BANERJEE
  • Publication number: 20170344239
    Abstract: System and methods for accurate measurement and real-time feedback of solar ultraviolet exposure for management of ultraviolet dose. The systems can include a wearable device and a mobile device, the system performing accurate measurement of UV exposure.
    Type: Application
    Filed: June 29, 2017
    Publication date: November 30, 2017
    Inventors: Emmanuel DUMONT, Shayak BANERJEE, Mauricio CONTRERAS
  • Patent number: 9798458
    Abstract: System and methods for accurate measurement and real-time feedback of solar ultraviolet exposure for management of ultraviolet dose. The systems can include a wearable device and a mobile device, the system performing accurate measurement of UV exposure.
    Type: Grant
    Filed: August 25, 2016
    Date of Patent: October 24, 2017
    Assignee: The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
    Inventors: Emmanuel Dumont, Shayak Banerjee, Mauricio Contreras
  • Patent number: D829112
    Type: Grant
    Filed: August 25, 2016
    Date of Patent: September 25, 2018
    Assignee: The Joan and Irwin Jacobs Technion-Cornell Innovation Institute
    Inventors: Emmanuel Dumont, Shayak Banerjee, Mauricio Contreras