Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of short-circuit failure modes, including at least one chamfer-short-related failure mode, one AACNT-short-related failure mode, one GATE-short-related failure mode, and one TS-short-related failure mode.

Abstract: A process for making and using a semiconductor wafer includes instantiating first and second designs of experiments (DOEs), each comprised of at least two fill cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The first DOE contains fill cells configured to enable non-contact (NC) detection of side-to-side shorts, and the second DOE contains fill cells configured to enable NC detection of tip-to-side shorts. The process may further include obtaining NC measurements from the first and/or second DOE(s) and using such measurements, at least in part, to selectively perform additional processing, metrology or inspection steps on the wafer, and/or on other wafer(s) currently being manufactured.

Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of open-circuit and short-circuit failure modes, including at least one via-open-related failure mode, one GATE-short-related failure mode, one TS-short-related failure mode, and one AA-short-related failure mode.

Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of open-circuit and short-circuit failure modes, including at least one via-open-related failure mode, one AACNT-short-related failure mode, one GATE-short-related failure mode, and one GATECNT-short-related failure mode.

Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of open-circuit and short-circuit failure modes, including at least one via-open-related failure mode, one AACNT-short-related failure mode, one GATE-short-related failure mode, and one TS-short-related failure mode.

Abstract: An IC includes first and second designs of experiments (DOEs), each comprised of at least two fill cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The first DOE contains fill cells configured to enable non-contact (NC) detection of tip-to-tip shorts, and the second DOE contains fill cells configured to enable NC detection of corner shorts.

Abstract: An IC includes first and second designs of experiments (DOEs), each comprised of at least two fill cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The first DOE contains fill cells configured to enable non-contact (NC) detection of side-to-side shorts, and the second DOE contains fill cells configured to enable NC detection of tip-to-tip shorts.

Abstract: Improved processes for manufacturing wafers, chips, or dies utilize in-line data obtained from non-contact electrical measurements (“NCEM”) of fill cells that contain structures configured to target/expose a variety of open-circuit, short-circuit, leakage, or excessive resistance failure modes, including GATE-snake-open and/or GATE-snake-resistance failure modes. Such processes may involve evaluating Designs of Experiments (“DOEs”), comprised of multiple NCEM-enabled fill cells, in at least two variants, all targeted to the same failure mode(s).

Abstract: An IC includes first and second designs of experiments (DOES), each comprised of at least two fill cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The first DOE contains fill cells configured to enable non-contact (NC) detection of side-to-side shorts, and the second DOE contains fill cells configured to enable NC detection of tip-to-side shorts.

Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of open-circuit and short-circuit failure modes, including at least one via-open-related failure mode, one GATE-short-related failure mode, one GATECNT-short-related failure mode, and one metal-short-related failure mode.

Abstract: Wafers, chips, or dies that contain fill cells with structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). Such NCEM-enabled fill cells may target/expose a variety of open-circuit, short-circuit, leakage, or excessive resistance failure modes. Such wafers, chips, or dies may include Designs of Experiments (“DOEs”), comprised of multiple NCEM-enabled fill cells, in at least two variants, all targeted to the same failure mode(s).

Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of open-circuit and short-circuit failure modes, including at least one via-open-related failure mode, one AACNT-short-related failure mode, one TS-short-related failure mode, and one AA-short-related failure mode.

Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of open-circuit and short-circuit failure modes, including at least one via-open-related failure mode, one AACNT-short-related failure mode, one TS-short-related failure mode, and one metal-short-related failure mode.

Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of open-circuit and short-circuit failure modes, including at least one via-open-related failure mode, one GATE-short-related failure mode, one GATECNT-short-related failure mode, and one TS-short-related failure mode.

Abstract: An IC includes logic cells, selected from a standard cell library, and fill cells, configured for compatibility with the standard logic cells. The fill cells contain structures configured to obtain in-line data via non-contact electrical measurements (“NCEM”). The IC includes such NCEM-enabled fill cells configured to enable detection and/or measurement of a variety of open-circuit and short-circuit failure modes, including at least one via-open-related failure mode, one GATE-short-related failure mode, one GATECNT-short-related failure mode, and one AA-short-related failure mode.

Abstract: A leveraged procurement network (LPN) system for leveraging purchasing across company and company groups includes a front-end requisition and catalog system accessible by users from a plurality of companies in different company groups. Access to procurement resources is controlled by user profiles and resource profiles specifying for each user and resource the applicable company group. Purchases against volume specific contracts are leveraged by requisitions for a plurality of company groups, while user access to procurement resources within the front-end system are controlled by company and/or company group.

Abstract: An invoice processing system includes a requisition and catalog server (referred to as a Req/Cat Web, or RCW, server), a procurement services system (SAP), and a requester terminal (browser). ReqCat Web allows requesters to input requirements (requisitions) which ReqCat then passes to SAP, which creates purchase orders, sends them to vendors for fulfillment, receives the vendors invoices, and prepares the payments. Commodities may be designated as either receivable or non-receivable, and this designation is stored in ReqCat web and passed to SAP on inbound requisitions. Payments on invoices received for non-receivable items are approved via a positive confirmation process, and payments on invoices received for receivable items are approved via a negative confirmation process. Positive acceptance of an invoice by a requester of commodities triggers automatic generation of a goods received (move) ticket.

Abstract: An invoice processing system includes a requisition and catalog server (referred to as a Req/Cat Web, or RCW, server), a procurement services system (SAP), and a requester terminal (browser). ReqCat Web allows requesters to input requirements (requisitions) which ReqCat then passes to SAP, which creates purchase orders, sends them to vendors for fulfillment, receives the vendors invoices, and prepares the payments. Commodities may be designated as either receivable or non-receivable, and this designation is stored in ReqCat web and passed to SAP on inbound requisitions. Payments on invoices received for non-receivable items are approved via a positive confirmation process, and payments on invoices received for receivable items are approved via a negative confirmation process. Positive acceptance of an invoice by a requester of commodities triggers automatic generation of a goods received (move) ticket.

Abstract: An invoice processing system includes a requisition and catalog server (referred to as a Req/Cat Web, or RCW, server), a procurement services system (SAP), and a requester terminal (browser). ReqCat Web allows requesters to input requirements (requisitions) which ReqCat then passes to SAP, which creates purchase orders, sends them to vendors for fulfillment, receives the vendors invoices, and prepares the payments. Commodities may be designated as either receivable or non-receivable, and this designation is stored in ReqCat web and passed to SAP on inbound requisitions. Payments on invoices received for non-receivable items are approved via a positive confirmation process, and payments on invoices received for receivable items are approved via a negative confirmation process. Positive acceptance of an invoice by a requester of commodities triggers automatic generation of a goods received (move) ticket.

Abstract: A system and method for keeping ledger accounts in synchronization between a back-end procurement system and a front-end requisition and catalog system. An extract utility extracts a file of general ledger (G/L) accounts, including account code, description, and company code, from a chart of accounts in the back-end and transfers it to the front-end, where it is updated by an update utility to include company group code from a company group table and then loaded into a data store of valid general ledger accounts. Maintenance of the front end data store of valid accounts includes pushing to all companies in a company group ledger code entered with respect to any one of the companies in that group.