Abstract: An information management method for a testing network framework is provided. The testing network framework includes a first server and at least one computer. The method includes the following steps. Firstly, the at least one computer downloads and executes a test application program. Then, the at least one computer is connected to the first server, and provides a device identification code and a network address value of the at least one computer to the first server. If the first server judges that the corresponding device identification code complies with a first default condition and the corresponding network address value complies with a second default condition, the corresponding computer is authenticated, and a test setting information is provided from the first server to the corresponding computer. After the test setting information is downloaded to the corresponding computer, a test process is performed.

Abstract: A separable buoy includes a center float having a top surface that includes an upper peripheral end and an engagement bevel provided on the upper peripheral end that extends below the top surface; a separable float unit detachably disposed at the center float and including a dome wall that is provided in a lower central portion thereof and that has a peripheral edge configured to detachably engage the engagement bevel: and a chamber defined between the dome wall of the separable float unit and the top surface of the center float when the separable float unit engages the center float, wherein the center float has a vertical height that substantially equals or exceeds that of a lower portion of the separable float unit.

Abstract: A light-emitting diode, comprises an active layer for emitting a light ray; an upper semiconductor stack on the active layer, wherein the upper semiconductor stack comprises a window layer; a reflector; and a lower semiconductor stack between the active layer and the reflector; wherein the thickness of the window layer is small than or equal to 3 ?m, and the thickness of the lower semiconductor stack is small than or equal to 1 ?m.

Abstract: An interconnect apparatus and a method of forming the interconnect apparatus is provided. Two substrates, such as wafers, dies, or a wafer and a die, are bonded together. A first mask is used to form a first opening extending partially to an interconnect formed on the first wafer. A dielectric liner is formed, and then another etch process is performed using the same mask. The etch process continues to expose interconnects formed on the first substrate and the second substrate. The opening is filled with a conductive material to form a conductive plug.

Abstract: An electronic device test system and method detects a memory serial number of an electronic device. The electronic device test system includes a Macintosh system computer, configured to execute a serial number detection program to detect the memory serial number of the electronic device; and a Windows system computer, configured to execute a serial number comparison program to compare whether the memory serial number of the electronic device satisfies a coding rule. The Macintosh system computer transmits the memory serial number to the Windows system computer by means of an RS232 interface for printing.

Abstract: Various solutions for maintaining a radio resource control (RRC) connection with respect to user equipment and network apparatus in mobile communications are described. An apparatus may establish an RRC connection with a network node. The apparatus may transmit a layer 2 packet to maintain the RRC connection after a period of time without data transmission. The apparatus may transmit uplink data via the RRC connection without re-establishing the RRC connection.

Abstract: An electronic device test system is configured to test functions of an electronic device. The electronic device test system includes: a test computer, configured to execute an electronic device test program; a scanning device, configured to scan a barcode number of the electronic device; and an optical sensor module, configured to detect a connection status of the electronic device and the test computer. When the optical sensor module confirms the connection status, the electronic device test program starts a test function to test the electronic device, records a test result of the electronic device according to the barcode number, and subsequently generates a retest rate according to the test result.

Abstract: A semiconductor device includes an interfacial layer on a substrate and agate structure on the interfacial layer. Preferably, the gate structure includes a patterned high-k dielectric layer, the patterned high-k dielectric layer comprises a metal oxide layer, and a horizontal direction width of the patterned high-k dielectric layer and a horizontal direction width of the interfacial layer are different. The semiconductor device also includes a first spacer adjacent to the gate structure and on part of the interfacial layer and contacting a top surface of the interfacial layer and a second spacer on the sidewalls of the first spacer and the interfacial layer. Preferably, a planar bottom surface of the second spacer is lower than a planar bottom surface of the first spacer and extending along a same direction as the planar bottom surface of the first spacer.

Abstract: A bristle band with different types of bristles is provided. The bristle band winds around a rotating shaft and is driven by the rotating shaft to rotate. The bristle band includes: a cord having a receiving slot; a first bristle having a portion disposed in the receiving slot and fixedly connected to the cord; and a second bristle having a portion disposed in the receiving slot and fixedly connected to the cord. With the first bristle and the second bristle being disposed in the cord and a rotating shaft rotating at a constant rotation speed, the bristles passing a cleaning target come in more types than ever, thereby enhancing cleaning efficiency.

Abstract: A brush container includes a box and two support members. The box has a U-shaped frame with two ends each having an end cover; hence, a storage space for containing a brush is defined between the U-shaped frame and two end covers. An upper cover for sealing the storage space is disposed on the top surface of the U-shaped frame. The U-shaped frame has an inner panel, an outer panel corresponding in position to the inner panel, and rib panels disposed between the inner and outer panels to allow a hollowed-out region to be defined between the inner and outer panels and two adjacent rib panels. Hence, despite being lightweight, the box has high structural strength. The two support members are slidably disposed in the storage space. Since their positions are adjustable according to the length of the brush, the two support members provide optimal support to the brush.

Abstract: A testing system uses different operating systems to test electronic products. The testing system includes a master computer, a slave computer and a relay. A first operating system is installed in the master computer. A second operating system is installed in the slave computer. The master computer and the slave computer are connected with each other through RS-232 ports. The relay is connected with the master computer, the slave computer and an under-test product. By changing the voltage level state of specified pins of the RS-232 ports, the master computer notifies the slave computer to test the under-test product. Moreover, by controlling the relay, the connection between the master computer and the under-test product is switched to the connection between the slave computer and the under-test product. Consequently, the under-test product is tested by the slave computer.

Abstract: The present invention provides an electronic device test system, configured to test functions of an electronic device. The electronic device test system includes: a test computer, configured to execute an electronic device test program; a scanning device, configured to scan a barcode number of the electronic device; and an optical sensor module, configured to detect a connection status of the electronic device and the test computer. When the optical sensor module confirms the connection status, the electronic device test program starts a test function to test the electronic device, records a test result of the electronic device according to the barcode number, and subsequently generates a retest rate according to the test result.

Abstract: A JBOD apparatus (1) having a hard disk drive (HDD) expander (11), a switch (13) and a BMC module (12) is disclosed. The HDD expander (11) is connected to a plurality of hard drives (5) respectively. The switch (13) connects the HDD expander (11) with a connecting port (14) for enabling a first transmission channel, or connects the HDD expander (11) with the BMC module (12) for enabling a second transmission channel. The BMC module (12) is connected to an Ethernet through a network port (17). The HDD expander (11) initially receives a wired transmitted command through the first transmission channel. When the BMC module (12) receives an Ethernet transmitted command through the Ethernet, it controls the switch (13) to change for enabling the second transmission channel, therefore, the BMC module (12) executes an interactive operation with the HDD expander (11) in accordance with the Ethernet transmitted command.

Abstract: The present invention provides a sound testing system and a sound testing method for an embedded system. The sound testing system includes: a silencing box, a sound receiving apparatus, and a processing apparatus. The embedded system and the sound receiving apparatus are provided in the silencing box; and the processing apparatus is configured to log in to the embedded system in a manner of remote connection, transmit at least one first sound file to the embedded system and control the embedded system to play the at least one first sound file to generate at least one first sound signal, and receive the at least one first sound signal by means of the sound receiving apparatus, and analyze the at least one first sound signal to verify sound output quality of the embedded system.

Abstract: The present invention provides a power consumption testing system and a power consumption testing method for a wireless mouse. The power consumption testing system includes: a platform; a flexible thin sheet; a first movable fixed component; a second movable fixed component; a vibration motor; and a processing apparatus. The first movable fixed component is configured to connect the flexible thin sheet and the platform. The second movable fixed component is configured to connect the wireless mouse to the flexible thin sheet or the platform. The vibration motor is connected to the flexible thin sheet and is configured to shake the flexible thin sheet so that the wireless mouse continuously moves on the flexible thin sheet. The processing apparatus is wirelessly connected to the wireless mouse and is configured to read and record a voltage value of the wireless mouse to determine a battery capacity of the wireless mouse.

Abstract: The present invention provides an electronic device test system and method, used to detect a memory serial number of an electronic device. The electronic device test system includes: a Macintosh system computer, configured to execute a serial number detection program to detect the memory serial number of the electronic device; and a Windows system computer, configured to execute a serial number comparison program to compare whether the memory serial number of the electronic device satisfies a coding rule. The Macintosh system computer transmits the memory serial number to the Windows system computer by means of an RS232 interface for printing.

Abstract: An automatic instrument searching method and an automatic control system are provided. The automatic control system includes a computer, plural serial ports and at least one measuring instrument. The at least one measuring instrument is connected with computer through the plural serial ports. Firstly, the computer detects a number of the plural serial ports and arranges the serial ports. Then, the plural serial ports are inquired according to plural different communication protocols. Then, the at least one measuring instrument makes a response to a setting of the matched communication protocol. If one of the inquired serial ports receives the response, the computer judges that the serial port is connected with one measuring instrument and issues a verification command to the connected measuring instrument. If the measuring instrument complies with the verification command, the measuring instrument is addressed.

Abstract: A testing system uses different operating systems to test electronic products. The testing system includes a master computer, a slave computer and a relay. A first operating system is installed in the master computer. A second operating system is installed in the slave computer. The master computer and the slave computer are connected with each other through RS-232 ports. The relay is connected with the master computer, the slave computer and an under-test product. By changing the voltage level state of specified pins of the RS-232 ports, the master computer notifies the slave computer to test the under-test product. Moreover, by controlling the relay, the connection between the master computer and the under-test product is switched to the connection between the slave computer and the under-test product. Consequently, the under-test product is tested by the slave computer.

Abstract: A method for communicating with an under-test object and a communicating system are provided. The method includes the following steps. A command signal is provided from a processing unit of the communicating system to the under-test object, and the processing unit waits for receiving a response signal from the under-test object. If the response signal from the under-test object 5 has not been received by the processing unit for a predetermined waiting time period, the command signal is provided to the under-test object again and the predetermined waiting time period is adjusted. There is an exponential relation between the predetermined waiting time period and the number of times the command signal is provided to the under-test object.

Abstract: A semiconductor device includes an interfacial layer on a substrate and agate structure on the interfacial layer. Preferably, the gate structure includes a patterned high-k dielectric layer, the patterned high-k dielectric layer comprises a metal oxide layer, and a horizontal direction width of the patterned high-k dielectric layer and a horizontal direction width of the interfacial layer are different. The semiconductor device also includes a first spacer adjacent to the gate structure and on part of the interfacial layer and contacting a top surface of the interfacial layer and a second spacer on the sidewalls of the first spacer and the interfacial layer. Preferably, a planar bottom surface of the second spacer is lower than a planar bottom surface of the first spacer and extending along a same direction as the planar bottom surface of the first spacer.