Abstract: A chassis includes a fixing base, an operating member, a tray and a cover. The operating member is pivotally connected to the fixing base. The operating member includes a first linkage portion. The tray is disposed on the fixing base. The tray includes a second linkage portion corresponding to the first linkage portion. The cover is disposed on the fixing base and covers the tray. When the operating member is located at a closed position, the operating member and the fixing base are locked, and the first linkage portion blocks the second linkage portion, so as to fix the tray on the fixing base. When the operating member rotates from the closed position to an opened position, the first linkage portion pushes the second linkage portion to drive the tray to move toward outside of the fixing base.

Abstract: Disclosed are a method and an apparatus for memory testing. The method comprises following steps: using a test program group including N test programs to test M dies respectively to generate independent N test data, wherein N and M are positive integers greater than 1; and executing a neural network operation on the N test data to estimate a yield of M dies passing the test program group.

Abstract: A memory device for artificial intelligence calculation includes a memory structure, a controller chip, and a processer chip. The memory structure includes a first memory chip, and a stack of second memory chips, in which a memory density of each of the second memory chips is greater than a memory density of the first memory chip. The controller chip is electrically connected to the first memory chip and the second memory chips. The processer chip is electrically connected to the controller chip.

Abstract: A memory device includes a peripheral substrate and an array substrate. The peripheral substrate includes a page buffer and a high voltage processing circuits and has a peripheral substrate area. The array substrate includes an array. The array substrate and the peripheral substrate are stacked on each other, and a circuit distribution area of the high voltage processing circuit accounts for less than 10% of the peripheral substrate area.

Abstract: Disclosed are a method and an apparatus for memory testing. The method comprises following steps: using a test program group including N test programs to test M dies respectively to generate independent N test data, wherein N and M are positive integers greater than 1; and executing a neural network operation on the N test data to estimate a yield of M dies passing the test program group.

Abstract: A data search method for a memory device is provided. The data search method includes: based on a recorded compression mode, vectoring a search data to generate a search data vector, and based on the recorded compression mode, compressing the search data and a plurality of objects in a database; setting a search condition; searching the objects of the database by the search data vector to determine whether the search data is matched with the objects of the database; and recording and outputting at least one matched object of the database, the at least one matched object matched with the search data.

Abstract: A data search method for a memory device is provided. The data search method includes: based on a recorded compression mode, vectoring a search data to generate a search data vector, and based on the recorded compression mode, compressing the search data and a plurality of objects in a database; setting a search condition; searching the objects of the database by the search data vector to determine whether the search data is matched with the objects of the database; and recording and outputting at least one matched object of the database, the at least one matched object matched with the search data.

Abstract: A server includes a chassis and a storage module. The storage module is disposed in the chassis. The storage module includes a base, a first electrical connector, a storage device, a connecting member and a first fixing member. A first side of the base has a first fixing portion. The first electrical connector is disposed at a second side of the base, wherein the second side is opposite to the first side. The storage device has a second electrical connector. The connecting member is connected to the storage device. The first fixing member is disposed on the connecting member. The second electrical connector is connected to the first electrical connector and the first fixing member is fixed to the first fixing portion, so as to fix the storage device on the base.

Abstract: A server includes a chassis and a storage module. The storage module is disposed in the chassis. The storage module includes a base, a first electrical connector, a storage device, a connecting member and a first fixing member. A first side of the base has a first fixing portion. The first electrical connector is disposed at a second side of the base, wherein the second side is opposite to the first side. The storage device has a second electrical connector. The connecting member is connected to the storage device. The first fixing member is disposed on the connecting member. The second electrical connector is connected to the first electrical connector and the first fixing member is fixed to the first fixing portion, so as to fix the storage device on the base.

Abstract: A chip includes a substrate and a plurality of functional units on the substrate, in which each of the functional units has its own set of pads. The functional units are physically connected and there is no scribe line passes through the chip. A semiconductor structure having the chip is also disclosed.

Abstract: A data search method for a memory device is provided. The data search method includes: based on a recorded compression mode, vectoring a search data to generate a search data vector, and based on the recorded compression mode, compressing the search data and a plurality of objects in a database; setting a search condition; searching the objects of the database by the search data vector to determine whether the search data is matched with the objects of the database; and recording and outputting at least one matched object of the database, the at least one matched object matched with the search data.

Abstract: A data search method for a memory device is provided. The data search method includes: based on a recorded compression mode, vectoring a search data to generate a search data vector, and based on the recorded compression mode, compressing the search data and a plurality of objects in a database; setting a search condition; searching the objects of the database by the search data vector to determine whether the search data is matched with the objects of the database; and recording and outputting at least one matched object of the database, the at least one matched object matched with the search data.

Abstract: A memory device and a manufacturing method for the same are provided. The memory device includes a stacked body structure and a staircase structure. The stacked body structure includes a first sub-stacked body structure and a second sub-stacked body structure. The staircase structure is electrically connected to the stacked body structure. The staircase structure includes a first sub-staircase structure and a second sub-staircase structure. Each of the first sub-staircase structure and the second sub-staircase structure includes a first staircase portion and a second staircase portion. The first sub-stacked body structure and the second sub-stacked body structure are respectively connected to the first staircase portion of the first sub-staircase structure and the first staircase portion of the second sub-staircase structure.

Abstract: A method for generating a classification model using a training data set. An iterative procedure for training an ANN model, in which an iteration includes selecting a small sample of training data from a source of training data, training the model using the sample, using the model in inference mode over a larger sample of the training data, and reviewing the results of the inferencing. The results can be evaluated to determine whether the model is satisfactory, and if it does not meet specified criteria, then cycles of sampling, training, inferencing and reviewing results (STIR cycles) are repeated in an iterative process until the criteria are met. A classification engine trained as described herein is provided.

Abstract: A memory device for artificial intelligence calculation includes a memory structure, a controller chip, and a processer chip. The memory structure includes a first memory chip, and a stack of second memory chips, in which a memory density of each of the second memory chips is greater than a memory density of the first memory chip. The controller chip is electrically connected to the first memory chip and the second memory chips. The processer chip is electrically connected to the controller chip.

Abstract: A memory device includes a memory interposer, memory array regions, logic chips, and interconnection lines. The memory array regions are in the memory interposer, in which the memory array regions include at least one memory having NAND architecture. The logic chips are over the memory interposer. The interconnection lines connect the logic chips to each other, and connect the logic chips to the memory array regions.

Abstract: A semiconductor component, for example an integrated circuit chip, including a semiconductor substrate having active devices at the front side thereof and I/O terminals at the back side of the component, is provided. In one aspect, the terminals are connected to the active devices through TSV connections and buried rails in an area of the substrate that is separate from the area in which the active devices are located. The I/O TSV connections are located in a floating well of the substrate that is separated from the rest of the substrate by a second well formed of material of the opposite conductivity type compared to the material of the floating well. The second well includes at least one contact configured to be coupled to a voltage that is suitable for reverse-biasing the junction between the floating well and the second well.

Abstract: A chip includes a substrate and a plurality of functional units on the substrate, in which each of the functional units has its own set of pads. The functional units are physically connected and there is no scribe line passes through the chip. A semiconductor structure having the chip is also disclosed.

Abstract: A three-way switch array structure including N first connectors, M second connectors, N×M third connectors and N×M three-way switches is provided, each three-way switch has a first terminal, a second terminal, a third terminal, a first switch and a second switch. Each of first terminals is disposed on one of the first connectors, each of second terminals is disposed on one of the second connectors, and each of third terminals is disposed on one of the third connectors, the first switch is disposed between the first terminal and the third terminal, and the second switch is disposed between the second terminal and the third terminal, wherein N and M are positive integers greater than or equal to 1.

Abstract: A 3D semiconductor device is provided, comprising plural memory layers vertically stacked on a substrate and parallel to each other; plural selection lines disposed on the memory layers and parallel to each other; plural bit lines disposed on the selection lines, and the bit lines arranged in parallel to each other and in perpendicular to the selection lines; plural strings formed vertically to the memory layers and the selection lines, and the strings electrically connected to the corresponding selection lines; a plurality of cells respectively defined by the strings, the selection lines and the bit lines correspondingly, and the cells arranged in a plurality of rows and columns, wherein a column direction is parallel to the bit lines while a row direction is parallel to the selection lines. The adjacent cells in the same column are electrically connected to the different bit lines.