Patents by Inventor Shinichi Yamaguchi

Shinichi Yamaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7405505
    Abstract: A rotary electric machine includes a frame; a stator whose stator-slot number Ns is 12; a rotor whose rotor-pole number Np is 8, the rotor being disposed inside the stator. The frame has a frame thickness T(?) at mechanical angle ?, with respect to a reference line that connects the inner circumferential center of the frame with an arbitrary point, other than the center, around the center that is circularly expanded in a Fourier series. The difference between the stator-slot number Ns and the rotor-pole number Np is k (=|Ns?Np|).
    Type: Grant
    Filed: August 5, 2004
    Date of Patent: July 29, 2008
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Shinichi Yamaguchi, Haruyuki Kometani, Chiyo Fujino, Tomohiro Kikuchi, Takashi Miyazaki
  • Patent number: 7399960
    Abstract: A time of flight mass spectrometer according to the present invention includes: a) an ion source at which an ion starts flying; b) an energizer for giving a predetermined amount of energy to the ion to let the ion start flying from the ion source; c) an ion guide for forming a time-focusing flight path on which the ion flies once or repeatedly; d) a detector for detecting the ion after flying the flight path; e) an analysis controller for giving different amounts of energy to ions of the same kind using the energizer, and for measuring the values of the flight time of the ions from the ion source to the detector for the amount of energy; and f) a mass calculator for calculating or estimating the mass to charge ratio of the ion based on the difference in the values of the flight time of the ions.
    Type: Grant
    Filed: January 18, 2006
    Date of Patent: July 15, 2008
    Assignee: Shimadzu Corporation
    Inventor: Shinichi Yamaguchi
  • Publication number: 20080121793
    Abstract: In a mass analysis of a sample, candidate compositions Y of a fragment ion produced by a dissociating operation are deduced from the mass of that fragment ion (Steps S6 to S9). If the number of the candidates Y is larger than a predetermined value (“No” in Step S10), the repetition counter of the dissociating operation is increased by one and the mass analysis of the fragment ion is performed again. If the number of the candidates is equal to or smaller than the predetermined value, the difference between the masses of the fragment ions before and after each mass-analyzing stage is calculated (Step S11). From this mass difference, the candidates Z of the desorption ion at each stage is deduced (Step S12). These candidates Z and Y are used to narrow down the candidate composition formulae X deduced from the mass of the precursor ion (Step S13). If the number of the candidates has decreased to one or become equal to or smaller than a predetermined value, the result is displayed (Steps S14 and S15).
    Type: Application
    Filed: October 26, 2005
    Publication date: May 29, 2008
    Applicant: SHIMADZU CORPORATION
    Inventors: Shinichi Yamaguchi, Yusuke Inohana
  • Publication number: 20080106164
    Abstract: A rotary electric machine includes a frame; a stator whose stator-slot number Ns is 12; a rotor whose rotor-pole number Np is 8, the rotor being disposed inside the stator. The frame has a frame thickness T(?) at mechanical angle ?, with respect to a reference line that connects the inner circumferential center of the frame with an arbitrary point, other than the center, around the center that is circularly expanded in a Fourier series. The difference between the stator-slot number Ns and the rotor-pole number Np is k (=|Ns?Np|). Stress-relieving spaces are located in portions of the frame in an arrangement that does not have 90-degree mechanical angle rotational symmetry, in such a way that the sum P of inclusion ratios for the k-th component Tk and the Np-th component TNp, which are the Fourier series expansion coefficients for the frame thickness T(?) expressed by equation (2). P = ( T k + T N ? ? p ) / ? n = 0 ? ? T n × 100 ? [ % ] ( 2 ) , is less than 12%.
    Type: Application
    Filed: August 5, 2004
    Publication date: May 8, 2008
    Applicant: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Shinichi Yamaguchi, Haruyuki Kometani, Chiyo Fujino, Tomohiro Kikuchi, Takashi Miyazaki
  • Patent number: 7361889
    Abstract: The present invention relates to a time of flight mass spectrometer (TOFMS) having a flight space in which ions to be analyzed repeatedly fly in a loop orbit or reciprocal path. In an example of the present invention, the TOFMS carries out two rounds of measurement for one sample under two conditions differing in the effective flight distance of the ions to create two flight time spectrums. The data processor of the TOFMS compares the central points of the peaks in the two spectrums to identify peaks that have resulted from the same kind of ion (Step S3). If any peak is found to be unidentifiable (“No” in Step S4), the data processor examines the similarity of the peak shapes (e.g. half-value width) to identify peaks that have resulted from the same kind of ion (Step S5).
    Type: Grant
    Filed: March 28, 2006
    Date of Patent: April 22, 2008
    Assignee: Shimadzu Corporation
    Inventor: Shinichi Yamaguchi
  • Patent number: 7355168
    Abstract: The present invention provides a time of flight mass spectrometer having an ion optics forming a multi-turn track, which is capable of time-focusing the ions while allowing the multi-turn track to be configured in an unlimited and highly variable manner. In a specific form of the invention, a reflector 9 is provided on the flight path between the position where the ions leave the loop orbit P and the ion detector 10 located outside the loop orbit P, and the condition of the electric field generated by the reflector 9 is appropriately determined. Thus, even if the ions cannot be well time-focused by the ion optics 2 creating the sector-shaped electric fields 4 and 7, it is possible to compensate the time-focusing performance with the reflector 9 to achieve a good performance of time-focusing of the ion throughout the overall system wherein the ions leave the ion source 1 and finally reach the ion detector 10.
    Type: Grant
    Filed: February 14, 2006
    Date of Patent: April 8, 2008
    Assignee: Shimadzu Corporation
    Inventor: Shinichi Yamaguchi
  • Publication number: 20080073501
    Abstract: The present invention provides a method and an apparatus for analyzing mass analysis data for selecting a component similar to a target component quickly and accurately, based on MSn analysis for each unknown component in the sample. First, MSn analysis is performed for each of the components in the mixed sample, and based on the obtained spectral data (measured data) and the spectral data of the target component (reference data), predetermined parameters are extracted (Step S11 to S13). Next, by multivariable analysis of the parameters, the similarity between the target component and each of the components in the mixed sample is evaluated (Step S14). Finally, based on the similarity value, components similar to the target component are selected (Step S16).
    Type: Application
    Filed: April 5, 2007
    Publication date: March 27, 2008
    Applicant: Shimadzu Corporation
    Inventors: Shinichi Yamaguchi, Yusuke Inohana
  • Publication number: 20080067344
    Abstract: The present invention provides a method and an apparatus for analyzing mass analysis data for easily deducing the structure of an unknown substance, based on data obtained by an MSn analysis. First, the structural formula of a precursor ion of the unknown substance is deduced based on the mass-to-charge ratio of the precursor ion (Step S12), and candidate structures which have the same compositional formula as the compositional formula deduced in Step S12, by combining the structure of the known substance and known structural change patterns (Step S14). Next, fragment ion peaks expected to appear from the candidate structures are deduced (Step S15), and based on the expected fragment ion peaks, the candidate structures are ranked in the order of probability (Step S16). Then, by comparing a mass spectrum of the known substance and that of the unknown substance, a common fragment ion peak is searched. (Step S19).
    Type: Application
    Filed: April 10, 2007
    Publication date: March 20, 2008
    Applicant: Shimadzu Corporation
    Inventors: Shinichi Yamaguchi, Yusuke Inohana
  • Patent number: 7342338
    Abstract: A permanent magnet electric motor 10 comprises a rotor 30 provided with two stages of permanent magnets in the axial direction on an outer circumferential face of a rotor iron core, and having a shaft shifted by a stage skew angle ?r in electrical angle to decrease a first frequency component of cogging torque in the circumferential direction of the rotor iron core between two stages of the permanent magnets, a stator iron core 21 of cylindrical shape provided with the stator winding for producing a rotating magnetic field causing the rotor 30 to be rotated, and a stator 20 dividing the stator iron core 21 into plural blocks in the axial direction, and shifted by a stage skew angle ?s in electrical angle to decrease a second frequency component of the cogging torque in the circumferential direction of the stator iron core 21.
    Type: Grant
    Filed: April 11, 2003
    Date of Patent: March 11, 2008
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Takashi Miyazaki, Tomohiro Kikuchi, Haruyuki Kometani, Shinichi Yamaguchi
  • Publication number: 20080006768
    Abstract: A time of flight mass spectrometer according to the present invention includes: a) an ion source at which an ion starts flying; b) an energizer for giving a predetermined amount of energy to the ion to let the ion start flying from the ion source; c) an ion guide for forming a time-focusing flight path on which the ion flies once or repeatedly; d) a detector for detecting the ion after flying the flight path; e) an analysis controller for giving different amounts of energy to ions of the same kind using the energizer, and for measuring the values of the flight time of the ions from the ion source to the detector for the amount of energy; and f) a mass calculator for calculating or estimating the mass to charge ratio of the ion based on the difference in the values of the flight time of the ions.
    Type: Application
    Filed: January 18, 2006
    Publication date: January 10, 2008
    Applicant: Shimadzu Corporation
    Inventor: Shinichi Yamaguchi
  • Publication number: 20070228270
    Abstract: The present invention provides a single set of mass spectrometer capable of selectively performing the following two modes of analyses according to the purpose of analysis: the first mass spectrometry mode in which the analysis can be repeated at short intervals of time; and the second mass spectrometry mode in which the analysis can be performed with high mass resolution and high accuracy. In an embodiment of the present invention, ions ejected from an ion source 1 travel along a straight path B, on which gate electrodes 3 are provided. When a voltage is applied from an MS mode selection controller 7 to the gate electrodes 3, the ions are introduced into a loop orbit A. Located on the loop orbit A is a second ion detector 6, which is a nondestructive type of ion detector. Detection signals of the second ion detector 6 are sent to a data processor 9, which extracts flight time spectrum data from those signals and Fourier-transforms those data to convert the time axis to a frequency axis.
    Type: Application
    Filed: April 3, 2007
    Publication date: October 4, 2007
    Applicant: Shimadzu Corporation
    Inventor: Shinichi Yamaguchi
  • Patent number: 7256397
    Abstract: A mass analyzer includes: an ion trap device including an ion trapping space surrounded by a plurality of electrodes; a time-of-flight mass analyzer for determining a mass to charge ratio of ions ejected from the ion trapping space; a trapping voltage generator for generating an ion trapping RF voltage to at least one of the plurality of electrodes; an ejecting voltage generator for generating an ejecting voltage to at least one of the plurality of electrodes to form an ion ejection electric field for ejecting ions trapped in the ion trapping space; and a controller for stopping the ion trapping RF voltage at a timing when ions are trapped in the ion trapping space and the ion trapping RF voltage is at a predetermined phase, and for applying the ion ejecting voltage a predetermined period after the ion trapping RF voltage is stopped.
    Type: Grant
    Filed: December 22, 2003
    Date of Patent: August 14, 2007
    Assignee: Shimadzu Corporation
    Inventors: Eizo Kawato, Shinichi Yamaguchi
  • Patent number: 7250600
    Abstract: In the mass spectrometer of the present invention, the controller controls the time of changing the voltage applied to the electrode or electrodes of the ion trap from the ion trapping voltage to the ion ejecting voltage according to the polarity of the electric charge of ions to be ejected from the ion trap. Since positively charged ions and negatively charged ions move in the same direction if the phases of the RF voltage for generating the ion trapping electric field in the ion trap are reversed, the controller may reverse the phase of the RF voltage for trapping ions according to the polarity of the electric charge of ions when the ion ejecting time is fixed, irrespective of the polarity of the electric charge of ions to be ejected. Alternatively, the controller may change the ion ejecting time by half a cycle of the RF voltage depending on the polarity of the electric charge of ions when the ion trapping RF voltage is maintained the same.
    Type: Grant
    Filed: August 24, 2004
    Date of Patent: July 31, 2007
    Assignee: Shimadzu Corporation
    Inventors: Shinichi Yamaguchi, Eizo Kawato
  • Patent number: 7232991
    Abstract: In the mass spectrometer of the present invention, first the length of flight time of a known ion is measured at every turn of the loop orbit. Ideally, the length of flight time at every turn is equal to one calculated based on the speed of the ion and the path length of the loop orbit, but an actual length of flight time deviates from it in a reproducible fashion. Thus, in the present invention, the deviation information is stored in the correction memory at every turn. In measuring an unknown ion, the unknown ion is made to fly the loop orbit a predetermined number of times. Then the flight time of the unknown ion that has flown the loop orbit a predetermined number of turns is measured, and the deviations of the flight time at the turns are corrected using the correction data stored in the correction memory. The mass to charge ratio of the unknown ion is calculated based on the corrected flight time.
    Type: Grant
    Filed: May 5, 2005
    Date of Patent: June 19, 2007
    Assignee: Shimadzu Corporation
    Inventor: Shinichi Yamaguchi
  • Patent number: 7227131
    Abstract: A time of flight type mass spectrometer (TOF-MS) of the present invention includes: a flight space containing a loop orbit on which ions fly once or more than once; a flight controller for making ions of a same mass to charge ratio fly the loop orbit at several values of number of turns; a flight time measurer for measuring a length of flight time of the ions; and a processor for determining the mass to charge ratio of the ions based on a relationship between the value of number of turns and the length of flight time of the ions. The speed of ions flying a loop orbit depends on their mass to charge ratios. For ions of the same mass to charge ratio, the difference between the lengths of flight time of the ions flying the loop orbit N turns and of the ions flying the loop orbit N+1 turns depends on the speed of the ions, so that the difference depends on the mass to charge ratio of the ions.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: June 5, 2007
    Assignees: Shimadzu Corporation, Osaka University
    Inventors: Shinichi Yamaguchi, Morio Ishihara, Michisato Toyoda, Daisuke Okumura
  • Patent number: 7211792
    Abstract: In the mass spectrometer of the present invention, a flight space is provided before the mass analyzer, and the flight space includes a loop orbit on which ions fly repeatedly. While ions fly on the loop orbit repeatedly, ion selecting electrodes placed on the loop orbit selects object ions having a specific mass to charge ratio in such a manner that, for a limited time period when the object ions are flying through the ion selecting electrodes, an appropriate voltage is applied to the ion selecting electrodes to make them continue to fly on the loop orbit, but otherwise to make or let other ions deflect from the loop orbit. If ions having various mass to charge ratios are introduced in the loop orbit almost at the same time, the object ions having the same mass to charge ratio continue to fly on the loop orbit in a band, but ions having mass to charge ratios different from that are separated from the object ions while flying on the loop orbit repeatedly.
    Type: Grant
    Filed: January 11, 2005
    Date of Patent: May 1, 2007
    Assignee: Shimadzu Corporation
    Inventors: Shinichi Yamaguchi, Morio Ishihara, Michisato Toyoda, Daisuke Okumura
  • Patent number: 7196445
    Abstract: A permanent-magnet rotating machine includes a rotor having a rotor core carrying on a curved outer surface multiple permanent magnets arranged in two rows along an axial direction. The permanent magnets in one row are skewed from those in the other row in a circumferential direction by a row-to-row skew angle (electrical angle) ?e. A stator having a tubular stator core in which the rotor disposed, includes stator coils for producing a rotating magnetic field for rotating the rotor. A lower limit of the row-to-row skew angle ?e larger than 30 degrees (electrical angle). A ratio, of cogging torque occurring in the absence of skew to cogging torque occurring when the permanent magnets are skewed, at a row-to-row skew angle of 30 degrees is calculated based on the cogging torque ratio, the row-to-row skew angle ?e, and B-H curve properties of the stator core.
    Type: Grant
    Filed: May 2, 2006
    Date of Patent: March 27, 2007
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Shinichi Yamaguchi, Haruyuki Kometani, Tomohiro Kikuchi, Takashi Miyazaki
  • Patent number: 7148473
    Abstract: In a time of flight mass spectrometer (TOF-MS) of the present invention, a flight controller makes ions fly a loop orbit a predetermined number of turns, and an ion detector detects the ions at each turn of the flight. A flight time measurer measures the length of flight time of ions of a same mass to charge ratio at every turn, and a data processor constructs a spectrum of flight time. The data processor further computes the Fourier transformation of the spectrum, and determines the mass to charge ratio of the ions based on a frequency peak appearing in the Fourier transformation.
    Type: Grant
    Filed: August 31, 2004
    Date of Patent: December 12, 2006
    Assignees: Shimadzu Corporation, Osaka University
    Inventors: Shinichi Yamaguchi, Morio Ishihara, Michisato Toyoda, Daisuke Okumura
  • Patent number: 7135237
    Abstract: A Pb-free hot-dip Sn—Zn coated steel sheet comprising a hot-dip coating layer comprised of 1 to 8.8 wt % of Zn and the balance of Sn in an amount of 91.2 to 99.0 wt % and unavoidable impurities and/or ancillary ingredients on the surface of steel sheet, the coating surface having Sn dendrite crystals and Sn dendrite arm spacings buried by an Sn—Zn two-way eutectic structure, an area ratio of Sn dendrites in the coating surface being 5 to 90%, and the arm spacing of the Sn dendrites being not more than 0.1 mm, preferably having a discontinuous FeSn2 alloy phase at the surface of the steel sheet.
    Type: Grant
    Filed: October 9, 2003
    Date of Patent: November 14, 2006
    Assignee: Nippon Steel Corporation
    Inventors: Yasuto Goto, Shinichi Yamaguchi, Masao Kurosaki
  • Publication number: 20060244335
    Abstract: A permanent magnet electric motor 10 comprises a rotor 30 provided with two stages of permanent magnets in the axial direction on an outer circumferential face of a rotor iron core, and having a shaft shifted by a stage skew angle ?r in electrical angle to decrease a first frequency component of cogging torque in the circumferential direction of the rotor iron core between two stages of the permanent magnets, a stator iron core 21 of cylindrical shape provided with the stator winding for producing a rotating magnetic field causing the rotor 30 to be rotated, and a stator 20 dividing the stator iron core 21 into plural blocks in the axial direction, and shifted by a stage skew angle ?s in electrical angle to decrease a second frequency component of the cogging torque in the circumferential direction of the stator iron core 21.
    Type: Application
    Filed: April 11, 2003
    Publication date: November 2, 2006
    Inventors: Takashi Miyazaki, Tomohiro Kikuchi, Haruyuki Kometani, Shinichi Yamaguchi