Abstract: A radioisotope generating apparatus according to the present invention comprises a nuclear reaction section an interior of which is retained in a vacuum; a source supply section for supplying a source material R consisting of a nuclide necessary for generation of the radioisotope, to the nuclear reaction section, an optical system for emitting pulse laser light toward the source material R supplied into the nuclear reaction section and thereby brought into a dispersed state, thereby inducing a nuclear reaction in the source material R to generate the radioisotope, a product nucleus collecting section for collecting a molecule PI having a nucleus of the radioisotope generated in the nuclear reaction section, and a radiation shielding system for preventing outside leakage of radiations generated in the nuclear reaction section.

Abstract: An ultrashort pulse laser apparatus of the this invention includes (1) a laser medium, (2) a laser resonator which stores the laser medium and externally extracts a laser beam, and (3) an excitation source for outputting an excitation energy to the laser resonator to excite the laser medium. The laser resonator includes (i) a plurality of resonant mirrors disposed on both sides of the laser medium to form a resonant optical path, and (ii) a phase dispersion compensation unit which includes two optical members respectively arranged on two light input/output surface sides of the laser medium on the resonant optical path and compensates phase dispersion of light in the resonant optical path. That is, the laser medium is disposed in the optical path between the two optical members of the phase dispersion compensation unit.

Abstract: An optical delay apparatus that regularly alternately outputs beams having mutually different delays on one optical axis and that can variably set a delay amount of at least one beam. A motor 112 rotation-drives a rotating plate 111 in which reflective portions and transmissive portions are formed regularly alternately in the circumferential direction. When an incident beam I0 is incident to a reflective portion of the rotating plate 111, it is reflected to generate a beam I1. When the incident beam I0 is incident to a transmissive portion of the rotating plate 111, a beam I2 transmitted is reflected by a reflector 120 to become a beam I3, and the beam I3 is again transmitted by the transmissive portion of the rotating plate 111. This beam I3 has a delay different from that of the beam I1, and the beam I3 and the beam I1 advance regularly alternately in the same direction and on the same optical axis.

Abstract: This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.

Abstract: An electric field measuring apparatus for causing an optical probe head having an electro-optic member with an electro-optic material to oppose a sample such as a semiconductor integrated circuit device and for optically measuring a voltage of an opposite portion of the sample. The electro-optic material consists of an LiTaO.sub.3 electro-optic crystal or the like, the polarization characteristics of which change depending on the electric-field strength of the sample. The electro-optic member is supported on a guide mechanism to be reciprocally movable within a predetermined stroke range in a direction of the sample. The guide mechanism is reciprocated in the direction of the sample to control the distance between the electro-optic material and the sample.

Abstract: The liquid treating method according to the present invention introduces a bubble into liquid phase and applies vibration waves, such as ultrasonic waves, from each sides of the bubble. Collision of the vibration waves with the bubble imparts the compression pressure to the bubble. This effect is used to dissolve a gas forming the bubble into the liquid phase or to improve liquid quality of this liquid phase.

Abstract: This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.

Abstract: An method of positioning an E-O probe applied to an apparatus for the measurement of voltage. In the first step, the relative position of the E-O probe against the magnifying optical system in the first condition of being focused the magnifying optical system on the base of the E-O probe, and the focal point difference between the focal plane of the magnifying optical system in the second condition that the E-O probe is substantially out of the optical path for observation of the surface of the device and the focal plane in the first condition are stored. The relative position and the focal point difference are fixed in the apparatus for the measurement of voltage regardless of the device to be measured.

Abstract: An electro-optic material constituting an E-O probe has a refractive index for light from a semiconductor laser, which is changed in accordance with an electric field from a device to be measured. The electro-optic effect is substantially canceled upon incidence of light from an Ar.sup.+ laser. A mechanical chopper modulates the light emitted from the Ar.sup.+ laser and causes the light to be incident on the E-O probe. A lock-in amplifier detects the polarized state of the light reflected by the E-O probe synchronized with the modulation, thereby measuring the voltage of the device.

Abstract: An E-O probe with improved spatial resolution has a light transmissive base part, an electro-optic material which is fixed to the base part and has an index of refraction which varies in response to an electrical field from a measured object, and a mirror which is fixed to the electro-optic material and reflects an incident beam penetrating the base part and the electro-optic material. The mirror is formed to be smaller than the incident beam in diameter. The electro-optic material is formed very thin.

Abstract: A system for measuring timing relationship between two signals for accurately measuring a timing relationship between signals includes an electro-optic measuring unit and a waveform storage and processing unit. The electro-optic measuring unit samples electrical signals from a device under measurement via a strobe light so as to measure the signal waveform. The electro-optic unit uses a laser diode as a light source. The waveform storage and processing unit stores the electrical signal waveforms measured by the electro-optic measuring unit in digital form. The waveform storage and processing unit also calculates a correlation between two stored electrical signal waveforms via a correlation calculation unit, and also detects a peak of the correlation to detect a timing relationship between the signals.

Abstract: To provide an E-O probe which can measure a voltage distribution in a fine region while enlarging it. A grounded, transparent electrode 2 and an electrooptic member 3 such as LiTaO.sub.3 are successively fixed to and below a support 1. There are a plurality of conical, conductive members 5a-5e arranged below a reflection film 4 in such a manner that the bottom surfaces thereof are fixed to the lower surface of the reflection film 4 and that the lower ends thereof project downward. Spaces between the plural, linear, electric needles 5a-5e become narrower toward a measured object located below them, whereby voltages in a fine region in the measured object can be guided as enlarged to the electrooptic member 3.

Abstract: A change in voltage can be sensitively detected at a local part of a measured object. A set of laser medium and E-O probe are disposed between a pair of mirrors, a first one and a second one, forming a laser resonator. A linearly polarized light is emitted from the laser medium. The polarized light enters the E-O probe, and returns after being reflected by the second mirror. When a voltage is given to the E-O probe from the measured object, depending on the voltage, a refractive index of the E-O probe is changed, the light emitted from the E-O probe is ovally polarized, and a resonance status of the laser resonator then varies. Therefore, the light intensity emitted through the partially penetrating first mirror to the outside of the laser resonator corresponds to the voltage at the measured object in the proximity of the E-O probe. Consequently, a voltage distribution on the measured object such as IC with fine structures can be two-dimensionally detected.

Abstract: Polarized light is input to an optical modulator typically consisting of an electrooptic crystal. The polarization state of the input light is changed in accordance with a voltage being applied to the optical modulator. Receiving the light output from the optical modulator, a polarization interferometer produces an interference fringe on the input surface of a photodetector such as a streak camera and a CCD line sensor. Based on an output signal of the photodetector, an analyzing device calculates a pitch and a movement distance of the interference fringe to determine the voltage being applied to the optical modulator.

Abstract: Polarized light pulses are applied to an optical modulator including an electrooptic crystal. A polarization state of the applied light is changed in accordance with a voltage of an electrical signal applied to the optical modulator. A polarization interferometer receives the light output from the optical modulator, and generates an interference fringe on the input surface of a photodetector such as a one-dimensional CCD. A processing device calculates a pitch and a movement distance of the interference fringe, based on an output signal of the photodetector, to determine the voltage. A waveform of the electrical signal is determined by sampling the electrical signal with multiple light pulses, while varying a phase relationship between the electrical signal and the light pulses.

Abstract: A light source generates probe light to be radiated on a sample. An optical probe has a pin hole at its distal end and selectively supplies the probe light to the sample through the pin hole. An optical detecting unit detects light emerging from the sample and converts it to an electrical signal. The light source generates the probe light whose intensity changes in the pulse-like manner. The optical detecting unit detects the light emerging from the sample in synchronism with an increase in probe light which changes in the pulse-like manner and converts it to the electric signal. Therefore, noise which is conventionally converted to an electrical signal can be decreased even when the probe light which changes in the pulse-like manner is decreased, and measurement can be performed at a high S/N ratio even if the pin hole diameter is small. As a result, the resolution of a near field scanning optical microscope can be improved.

Abstract: To provide a wavelength tunable laser device having a wavelength variable range of a broad band, and capable of simply changing the output wavelength. Excitation means 1 excites a laser medium 2a in a main resonator 2. The main resonator 2 is provided with two resonator mirrors 2b and an optical input/output port 2c in addition to the laser medium 2a. By the excitation means 1 and the main resonator 2, laser oscillation can be produced. A sub-resonator 3 is provided with wavelength selection means 3a and optical feedback means 3b. And, the sub-resonater selects a desired wavelength of the laser beam outputted from said main resonator and returns the laser beam of the desired wavelength back to said laser medium. In a device comprising the excitation means 1, the main resonator 2 and the sub-resonator 3, an optical output port 4 is provided. Since this wavelength tunable laser device has no necessity of providing wavelength selection means within the main resonator, laser oscillation is easily produced.

Abstract: Input light incident into fiber end is separated by a light separator. Light traveling straight through the light separator is guided through an optical fiber to a light amplifying and deflecting section, where only components with deflection angle in a predetermined range are amplified and deflected then to be extracted. The extracted components are output as output light through an optical fiber. The other part of light separated by the light separator is received by a photo detector. The light received by the photo detector is converted into an electric signal, and the electric signal is then input into the light amplifying and deflecting section. Using the electric signal generated from the photo detector, desired wave shaping may be effected by adjusting a light amplification factor of the light amplifying and deflecting section, a change speed of deflection angle, and/or a range of deflection angle selected.

Abstract: An object of this invention is to provide a pulsed laser beam source device which is easy to handle and is operative stably. Pumping light is irradiated to a laser medium from a light source for optical pumping. The stimulated laser medium pumps radiation of a set wavelength. This radiation is stimulated to be amplified while reciprocating between resonator mirrors. A multi layer film is inserted in an optical path of the radiation. Feeble light of the radiation from the laser medium is absorbed by the multi-layer to be weaker, and that part of the radiation having intensities above a set intensity is compressed in terms of time to be emitted outside. The emitted radiation has a very short pulse duration.

Abstract: An optical wavelength shifter shifts a wavelength of light over a wide range without need for using a large peak pump pulse. A nonlinear optical medium having a nonlinear refractive index is disposed interiorly of a laser resonator. A pump pulse and a light to be modulated are incident on a nonlinear optical medium to phase shift the light. With the provision of a timing delay unit, the timing at which the light to be modulated is incident on the nonlinear optical medium is delayed with respect to the timing at which the pump pulse is incident thereon.