Patents by Inventor Shi-Ning Yang
Shi-Ning Yang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230422504Abstract: A semiconductor device includes a peripheral circuit, a stacked structure including a first side and a second side along a vertical direction, and alternating conductive layers and first insulating layers, a memory string extending through the stacked structure, a bonding structure located between the first side of the stacked structure and the peripheral circuit in the vertical direction and connected with the memory string and the peripheral circuit, a second insulating layer located at the second side of the stacked structure; and a conductor structure located in the second insulating layer.Type: ApplicationFiled: September 11, 2023Publication date: December 28, 2023Inventors: Zhenyu Lu, Jun Chen, Jifeng Zhu, Yushi Hu, Qian Tao, Simon Shi-Ning Yang, Steve Weiyi Yang
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Publication number: 20230363169Abstract: A three-dimensional (3D) NAND memory device includes a substrate, a staircase region including a first stack and a second stack, a barrier structure extending vertically through the first stack and laterally separating the first stack from the second stack, and a through array contact extending vertically through the first stack to the substrate. The first stack is disposed on the substrate and includes first and second dielectric layers arranged alternately in a vertical direction. The second stack is disposed on the substrate and includes conductor layers and third dielectric layers arranged alternately in the vertical direction. The barrier structure has an unclosed shape.Type: ApplicationFiled: July 12, 2023Publication date: November 9, 2023Inventors: Zhenyu LU, Simon Shi-Ning YANG, Feng PAN, Steve Weiyi YANG, Jun CHEN, Guanping WU, Wenguang SHI, Weihua CHENG
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Patent number: 11805646Abstract: Embodiments of three-dimensional (3D) memory devices and methods for forming the 3D memory devices are disclosed. In an example, a NAND memory device includes a substrate, one or more peripheral devices on the substrate, a plurality of NAND strings above the peripheral devices, a single crystalline silicon layer above and in contact with the NAND strings, and interconnect layers formed between the peripheral devices and the NAND strings. In some embodiments, the NAND memory device includes a bonding interface at which an array interconnect layer contacts a peripheral interconnect layer.Type: GrantFiled: November 24, 2020Date of Patent: October 31, 2023Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu Lu, Jun Chen, Jifeng Zhu, Yushi Hu, Qian Tao, Simon Shi-Ning Yang, Steve Weiyi Yang
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Patent number: 11758732Abstract: Embodiments of through array contact structures of a 3D memory device and fabricating method thereof are disclosed. The memory device includes an alternating layer stack disposed on a first substrate. The alternating layer stack includes a first region including an alternating dielectric stack, and a second region including an alternating conductor/dielectric stack. The memory device further comprises a barrier structure including two parallel barrier walls extending vertically through the alternating layer stack and laterally along a word line direction to laterally separate the first region from the second region. The memory device further comprises a plurality of through array contacts in the first region, each through array contact extending vertically through the alternating dielectric stack.Type: GrantFiled: November 3, 2022Date of Patent: September 12, 2023Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu Lu, Simon Shi-Ning Yang, Feng Pan, Steve Weiyi Yang, Jun Chen, Guanping Wu, Wenguang Shi, Weihua Cheng
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Patent number: 11699657Abstract: Embodiments of source structure of a three-dimensional (3D) memory device and method for forming the source structure of the 3D memory device are disclosed. In an example, a NAND memory device includes a substrate, an alternating conductor/dielectric stack, a NAND string, a source conductor layer, and a source contact. The alternating conductor/dielectric stack includes a plurality of conductor/dielectric pairs above the substrate. The NAND string extends vertically through the alternating conductor/dielectric stack. The source conductor layer is above the alternating conductor/dielectric stack and is in contact with an end of the NAND string. The source contact includes an end in contact with the source conductor layer. The NAND string is electrically connected to the source contact by the source conductor layer. In some embodiments, the source conductor layer includes one or more conduction regions each including one or more of a metal, a metal alloy, and a metal silicide.Type: GrantFiled: June 7, 2021Date of Patent: July 11, 2023Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Jifeng Zhu, Zhenyu Lu, Jun Chen, Yushi Hu, Qian Tao, Simon Shi-Ning Yang, Steve Weiyi Yang
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Publication number: 20230087468Abstract: Embodiments of through array contact structures of a 3D memory device and fabricating method thereof are disclosed. The memory device includes an alternating layer stack disposed on a first substrate. The alternating layer stack includes a first region including an alternating dielectric stack, and a second region including an alternating conductor/dielectric stack. The memory device further comprises a barrier structure including two parallel barrier walls extending vertically through the alternating layer stack and laterally along a word line direction to laterally separate the first region from the second region. The memory device further comprises a plurality of through array contacts in the first region, each through array contact extending vertically through the alternating dielectric stack.Type: ApplicationFiled: November 3, 2022Publication date: March 23, 2023Applicant: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu LU, Simon Shi-Ning YANG, Feng PAN, Steve Weiyi YANG, Jun CHEN, Guanping WU, Wenguang SHI, Weihua CHENG
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Publication number: 20230070357Abstract: Embodiments of three-dimensional (3D) memory devices and methods for controlling a photoresist (PR) trimming rate in the formation of the 3D memory devices are disclosed. In an example, a method includes forming a dielectric stack over a substrate, measuring a first distance between the first trimming mark and the PR layer along a first direction, and trimming the PR layer along the first direction. The method also includes etching the dielectric stack using the trimmed PR layer as an etch mask to form a staircase, forming a second trimming mark using the first trimming mark as an etch mask, measuring a second distance between the second trimming mark and the trimmed PR layer, comparing the first distance with the second distance to determine a difference between an actual PR trimming rate and an estimated PR trimming rate, and adjusting PR trimming parameters based on the difference.Type: ApplicationFiled: August 15, 2022Publication date: March 9, 2023Applicant: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu LU, Lidong SONG, Yongna LI, Feng PAN, Xiaowang DAI, Dan LIU, Steve Weiyi YANG, Simon Shi-Ning YANG
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Publication number: 20230069096Abstract: In certain aspects, a memory device includes a semiconductor layer, a peripheral circuit including a peripheral transistor in contact with the semiconductor layer, an array of memory cells disposed beside the semiconductor layer and the peripheral circuit, and bit lines coupled to the memory cells. Each of the memory cells includes a vertical transistor extending in a first direction, and a storage unit coupled to the vertical transistor. Each of the bit lines extends in a second direction perpendicular to the first direction. A respective one of the bit lines and a respective storage unit are coupled to opposite ends of each one of the memory cells in the first direction.Type: ApplicationFiled: December 16, 2021Publication date: March 2, 2023Inventors: Simon Shi-Ning Yang, Hongbin Zhu, Wei Liu, Wenyu Hua
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Patent number: 11527547Abstract: Embodiments of through array contact structures of a 3D memory device and fabricating method thereof are disclosed. The memory device includes an alternating layer stack disposed on a first substrate. The alternating layer stack includes a first region including an alternating dielectric stack, and a second region including an alternating conductor/dielectric stack. The memory device further comprises a barrier structure including two parallel barrier walls extending vertically through the alternating layer stack and laterally along a word line direction to laterally separate the first region from the second region. The memory device further comprises a plurality of through array contacts in the first region, each through array contact extending vertically through the alternating dielectric stack.Type: GrantFiled: January 13, 2021Date of Patent: December 13, 2022Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu Lu, Simon Shi-Ning Yang, Feng Pan, Steve Weiyi Yang, Jun Chen, Guanping Wu, Wenguang Shi, Weihua Cheng
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Patent number: 11462474Abstract: Embodiments of three-dimensional (3D) memory devices and methods for forming the 3D memory devices are disclosed. In an example, a NAND memory device includes a substrate, a plurality of NAND strings on the substrate, one or more peripheral devices above the NAND strings, a single crystalline silicon layer above the peripheral devices, and one or more interconnect layers between the peripheral devices and the NAND strings. In some embodiments, the NAND memory device includes a bonding interface at which an array interconnect layer contacts a peripheral interconnect layer.Type: GrantFiled: April 17, 2019Date of Patent: October 4, 2022Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Jifeng Zhu, Zhenyu Lu, Jun Chen, Yushi Hu, Qian Tao, Simon Shi-Ning Yang, Steve Weiyi Yang
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Patent number: 11264397Abstract: Embodiments of source structure of a three-dimensional (3D) memory device and method for forming the source structure of the 3D memory device are disclosed. In an example, a NAND memory device includes a substrate, an alternating conductor/dielectric stack, a NAND string, a source conductor layer, and a source contact. The alternating conductor/dielectric stack includes a plurality of conductor/dielectric pairs above the substrate. The NAND string extends vertically through the alternating conductor/dielectric stack. The source conductor layer is above the alternating conductor/dielectric stack and is in contact with an end of the NAND string. The source contact includes an end in contact with the source conductor layer. The NAND string is electrically connected to the source contact by the source conductor layer. In some embodiments, the source conductor layer includes one or more conduction regions each including one or more of a metal, a metal alloy, and a metal silicide.Type: GrantFiled: September 21, 2020Date of Patent: March 1, 2022Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Yushi Hu, Zhenyu Lu, Qian Tao, Jun Chen, Simon Shi-Ning Yang, Steve Weiyi Yang
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Patent number: 11211397Abstract: Embodiments of three-dimensional (3D) memory devices and methods for forming the 3D memory devices are disclosed. In an example, a NAND memory device includes a substrate, one or more peripheral devices on the substrate, a plurality of NAND strings above the peripheral devices, a single crystalline silicon layer above and in contact with the NAND strings, and interconnect layers formed between the peripheral devices and the NAND strings. In some embodiments, the NAND memory device includes a bonding interface at which an array interconnect layer contacts a peripheral interconnect layer.Type: GrantFiled: July 27, 2018Date of Patent: December 28, 2021Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu Lu, Jun Chen, Jifeng Zhu, Yushi Hu, Qian Tao, Simon Shi-Ning Yang, Steve Weiyi Yang
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Publication number: 20210296341Abstract: Embodiments of source structure of a three-dimensional (3D) memory device and method for forming the source structure of the 3D memory device are disclosed. In an example, a NAND memory device includes a substrate, an alternating conductor/dielectric stack, a NAND string, a source conductor layer, and a source contact. The alternating conductor/dielectric stack includes a plurality of conductor/dielectric pairs above the substrate. The NAND string extends vertically through the alternating conductor/dielectric stack. The source conductor layer is above the alternating conductor/dielectric stack and is in contact with an end of the NAND string. The source contact includes an end in contact with the source conductor layer. The NAND string is electrically connected to the source contact by the source conductor layer. In some embodiments, the source conductor layer includes one or more conduction regions each including one or more of a metal, a metal alloy, and a metal silicide.Type: ApplicationFiled: June 7, 2021Publication date: September 23, 2021Applicant: Yangtze Memory Technologies Co., Ltd.Inventors: Jifeng ZHU, Zhenyu Lu, Jun Chen, Yushi Hu, Qian Tao, Simon Shi-Ning Yang, Steve Weiyi Yang
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Patent number: 11031333Abstract: Embodiments of source structure of a three-dimensional (3D) memory device and method for forming the source structure of the 3D memory device are disclosed. In an example, a NAND memory device includes a substrate, an alternating conductor/dielectric stack, a NAND string, a source conductor layer, and a source contact. The alternating conductor/dielectric stack includes a plurality of conductor/dielectric pairs above the substrate. The NAND string extends vertically through the alternating conductor/dielectric stack. The source conductor layer is above the alternating conductor/dielectric stack and is in contact with an end of the NAND string. The source contact includes an end in contact with the source conductor layer. The NAND string is electrically connected to the source contact by the source conductor layer. In some embodiments, the source conductor layer includes one or more conduction regions each including one or more of a metal, a metal alloy, and a metal silicide.Type: GrantFiled: April 17, 2019Date of Patent: June 8, 2021Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Jifeng Zhu, Zhenyu Lu, Jun Chen, Yushi Hu, Qian Tao, Simon Shi-Ning Yang, Steve Weiyi Yang
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Publication number: 20210134826Abstract: Embodiments of through array contact structures of a 3D memory device and fabricating method thereof are disclosed. The memory device includes an alternating layer stack disposed on a first substrate. The alternating layer stack includes a first region including an alternating dielectric stack, and a second region including an alternating conductor/dielectric stack. The memory device further comprises a barrier structure including two parallel barrier walls extending vertically through the alternating layer stack and laterally along a word line direction to laterally separate the first region from the second region. The memory device further comprises a plurality of through array contacts in the first region, each through array contact extending vertically through the alternating dielectric stack.Type: ApplicationFiled: January 13, 2021Publication date: May 6, 2021Applicant: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu LU, Simon Shi-Ning YANG, Feng PAN, Steve Weiyi YANG, Jun CHEN, Guanping WU, Wenguang SHI, Weihua CHENG
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Patent number: 10998079Abstract: Embodiments of methods for testing three-dimensional memory devices are disclosed. The method can include: applying an input signal to a first conductive pad of the memory device by a first probe of a probe card; transmitting the input signal through the first conductive pad, a first TAC, a first interconnect structure passing through a bonding interface of the memory device, at least one of a memory array contact and a test circuit to a test structure; receiving an output signal through a second interconnect structure passing through the bonding interface, a second TAC, at least one of the memory array contact and the test circuit from the test structure; measuring the output signal from a second conductive pad of the memory device by a second probe of the probe card; and determining a characteristic of the test structure based on the input signal and the output signal.Type: GrantFiled: May 5, 2020Date of Patent: May 4, 2021Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Jong Jun Kim, Feng Pan, Jong Seuk Lee, Zhenyu Lu, Yongna Li, Lidong Song, Youn Cheul Kim, Steve Weiyi Yang, Simon Shi-Ning Yang
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Publication number: 20210098491Abstract: Embodiments of three-dimensional (3D) memory devices and methods for forming the 3D memory devices are disclosed. In an example, a NAND memory device includes a substrate, one or more peripheral devices on the substrate, a plurality of NAND strings above the peripheral devices, a single crystalline silicon layer above and in contact with the NAND strings, and interconnect layers formed between the peripheral devices and the NAND strings. In some embodiments, the NAND memory device includes a bonding interface at which an array interconnect layer contacts a peripheral interconnect layer.Type: ApplicationFiled: November 24, 2020Publication date: April 1, 2021Applicant: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu LU, Jun CHEN, Jifeng ZHU, Yushi HU, Qian TAO, Simon Shi-Ning YANG, Steve Weiyi YANG
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Patent number: 10923491Abstract: Embodiments of through array contact structures of a 3D memory device and fabricating method thereof are disclosed. The memory device includes an alternating layer stack disposed on a first substrate. The alternating layer stack includes a first region including an alternating dielectric stack, and a second region including an alternating conductor/dielectric stack. The memory device further includes a barrier structure extending vertically through the alternating layer stack to laterally separate the first region from the second region, multiple through array contacts in the first region, each through array contact extending vertically through the alternating dielectric stack, an array interconnection layer in contact with the through array contacts, a peripheral circuit formed on a second substrate. and a peripheral interconnection layer on the peripheral circuit.Type: GrantFiled: March 17, 2020Date of Patent: February 16, 2021Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Zhenyu Lu, Simon Shi-Ning Yang, Feng Pan, Steve Weiyi Yang, Jun Chen, Guanping Wu, Wenguang Shi, Weihua Cheng
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Publication number: 20210005621Abstract: Embodiments of source structure of a three-dimensional (3D) memory device and method for forming the source structure of the 3D memory device are disclosed. In an example, a NAND memory device includes a substrate, an alternating conductor/dielectric stack, a NAND string, a source conductor layer, and a source contact. The alternating conductor/dielectric stack includes a plurality of conductor/dielectric pairs above the substrate. The NAND string extends vertically through the alternating conductor/dielectric stack. The source conductor layer is above the alternating conductor/dielectric stack and is in contact with an end of the NAND string. The source contact includes an end in contact with the source conductor layer. The NAND string is electrically connected to the source contact by the source conductor layer. In some embodiments, the source conductor layer includes one or more conduction regions each including one or more of a metal, a metal alloy, and a metal silicide.Type: ApplicationFiled: September 21, 2020Publication date: January 7, 2021Applicant: Yangtze Memory Technologies Co., Ltd.Inventors: Yushi HU, Zhenyu LU, Qian TAO, Jun CHEN, Simon Shi-Ning YANG, Steve Weiyi YANG
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Patent number: 10804279Abstract: Embodiments of source structure of a three-dimensional (3D) memory device and method for forming the source structure of the 3D memory device are disclosed. In an example, a NAND memory device includes a substrate, an alternating conductor/dielectric stack, a NAND string, a source conductor layer, and a source contact. The alternating conductor/dielectric stack includes a plurality of conductor/dielectric pairs above the substrate. The NAND string extends vertically through the alternating conductor/dielectric stack. The source conductor layer is above the alternating conductor/dielectric stack and is in contact with an end of the NAND string. The source contact includes an end in contact with the source conductor layer. The NAND string is electrically connected to the source contact by the source conductor layer. In some embodiments, the source conductor layer includes one or more conduction regions each including one or more of a metal, a metal alloy, and a metal silicide.Type: GrantFiled: December 3, 2018Date of Patent: October 13, 2020Assignee: Yangtze Memory Technologies Co., Ltd.Inventors: Yushi Hu, Zhenyu Lu, Qian Tao, Jun Chen, Simon Shi-Ning Yang, Steve Weiyi Yang