Patents by Inventor Shinya Fujiwara

Shinya Fujiwara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11258956
    Abstract: An image capturing apparatus including: an imaging sensor and a processor configured to set a first exposure time and a second exposure time obtained by dividing the first exposure time by an integer m where m is an integer equal to or larger than 2; control the imaging sensor to capture frames successively by repeatedly performing exposure including at least exposure for one frame having the first exposure time and exposure for m frames having the second exposure time as one set; acquire image data of each frame from the imaging sensor; generate image data of an average frame that is an average of pieces of image data of the m frames having the second exposure time in the one set; and generate a composite frame for recording or displaying a motion picture of an extended dynamic range according to image data of the one frame having the first exposure time and the image data of the average frame.
    Type: Grant
    Filed: August 31, 2020
    Date of Patent: February 22, 2022
    Assignee: FUJIFILM Corporation
    Inventor: Shinya Fujiwara
  • Patent number: 11202959
    Abstract: In order to select a content to be used in a specified game or game stage from a plurality of contents, a selection image including a plurality of contents is displayed in which possessed contents and unpossessed contents not possessed by a user are visually distinguishable, and at least a display form or display position of each content is varied based on parameters set for a combination of the content and the specified game or game stage, and at least one is selected from the plurality of contents displayed in the selection image.
    Type: Grant
    Filed: January 21, 2020
    Date of Patent: December 21, 2021
    Assignee: NINTENDO CO., LTD.
    Inventors: Yugo Hayashi, Shinya Fujiwara
  • Patent number: 11178370
    Abstract: An image correction device includes a reception unit, a detection unit and a correction unit. The reception unit receives a first-image and a second-image, which are obtained by a first-imaging device and a second-imaging device, and an imaging condition that is at least one piece of information on an imaging date and time or information on an imaging location corresponding to each of the first-image and the second-image. The detection unit detects the same scene between images indicated by the first-image and the second-image based on the imaging conditions corresponding to each of the first-image and the second-image. The correction unit extracts, from each of the images indicated by the first-image and the second-image corresponding to the same scene, a common subject which is common between the images, and performs, on the corresponding image, color correction of making colors of the extracted common subject similar to each other.
    Type: Grant
    Filed: November 17, 2020
    Date of Patent: November 16, 2021
    Assignee: FUJIFILM Corporation
    Inventors: Shinya Fujiwara, Akihiro Uchida, Kosuke Irie, Koichi Tanaka, Shinichiro Fujiki
  • Publication number: 20210268387
    Abstract: An example of an information processing system gives an in-game virtual reward associated with a first designated game stage to a user on condition that a result of a first game played by the user satisfies the reward giving condition. The information processing system gives the in-game virtual reward associated with a second designated game stage to the user on condition that a result of a second game played by the user satisfies the reward giving condition. Regardless of whether an in-game virtual reward is given based on the result of the first game played by the user or the result of the second game played by the user, the information processing system changes an in-game element in the first game mode from a state where it is not permitted to be played by the user to a state where it is permitted to be played by the user.
    Type: Application
    Filed: February 17, 2021
    Publication date: September 2, 2021
    Inventors: Kosuke YABUKI, Yugo HAYASHI, Shinya FUJIWARA
  • Patent number: 11089231
    Abstract: An image capturing apparatus having an imaging sensor and a processor configured to set n different exposure times for n successive frames, where n is an integer equal to or larger than two; control the imaging sensor to capture the n successive frames with the set n exposure times so as to make a blank period between frames shorter than the n exposure times; acquire n pieces of image data of the n successive frames captured by the imaging sensor; and generate a composite frame for recording or displaying a motion picture of an extended dynamic range from the n pieces of image data, wherein the processor is further configured to set the n exposure times so that a sum of the n exposure times matches a time for n frames for the composite frame or a time for one frame for the composite frame in accordance with a brightness of a photographic subject captured by the imaging sensor.
    Type: Grant
    Filed: July 20, 2020
    Date of Patent: August 10, 2021
    Assignee: FUJIFILM Corporation
    Inventor: Shinya Fujiwara
  • Patent number: 10995422
    Abstract: A GaAs substrate has a first surface. The sum of the number of particles having a longer diameter of more than or equal to 0.16 ?m which are present in the first surface, per cm2 of the first surface, and the number of damages having a longer diameter of more than or equal to 0.16 ?m which are present in a second surface, per cm2 of the second surface, is less than or equal to 2.1, the second surface being formed by etching the first surface by 0.5 ?m in a depth direction.
    Type: Grant
    Filed: May 26, 2017
    Date of Patent: May 4, 2021
    Assignee: Sumitomo Electric Industries, Ltd.
    Inventors: Shinya Fujiwara, Yasuaki Higuchi
  • Patent number: 10964786
    Abstract: An InP substrate that is a group III-V compound semiconductor substrate includes particles of greater than or equal to 0.19 ?m in particle size at less than or equal to 0.22 particles/cm2 or particles of greater than or equal to 0.079 ?m in particle size at less than or equal to 20 particles/cm2 on the main surface. An epilayer-attached InP substrate that is an epilayer-attached group III-V compound semiconductor substrate includes the InP substrate mentioned above and an epitaxial layer disposed on the main surface of the InP substrate, and includes LPDs of greater than or equal to 0.24 ?m in circle-equivalent diameter at less than or equal to 10 defects/cm2 or LPDs of greater than or equal to 0.136 ?m in circle-equivalent diameter at less than or equal to 30 defects/cm2 on the main surface in a case where the epitaxial layer has a thickness of 0.3 ?m.
    Type: Grant
    Filed: May 1, 2018
    Date of Patent: March 30, 2021
    Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Shinya Fujiwara, Tomoaki Miyoshi
  • Publication number: 20210076019
    Abstract: An image correction device includes a reception unit, a detection unit and a correction unit. The reception unit receives a first-image and a second-image, which are obtained by a first-imaging device and a second-imaging device, and an imaging condition that is at least one piece of information on an imaging date and time or information on an imaging location corresponding to each of the first-image and the second-image. The detection unit detects the same scene between images indicated by the first-image and the second-image based on the imaging conditions corresponding to each of the first-image and the second-image. The correction unit extracts, from each of the images indicated by the first-image and the second-image corresponding to the same scene, a common subject which is common between the images, and performs, on the corresponding image, color correction of making colors of the extracted common subject similar to each other.
    Type: Application
    Filed: November 17, 2020
    Publication date: March 11, 2021
    Applicant: FUJIFILM Corporation
    Inventors: Shinya FUJIWARA, Akihiro UCHIDA, Kosuke IRIE, Koichi TANAKA, Shinichiro FUJIKI
  • Publication number: 20210057527
    Abstract: An InP substrate, being a group III-V compound semiconductor substrate, that includes, on a main surface thereof, 0.22 particles/cm2 that have a particle diameter of at least 0.19 ?m or 20 particles/cm2 that have a particle diameter of 0.079 ?m. An InP substrate with an epitaxial layer, being a group III-V compound semiconductor substrate with an epitaxial layer, includes: the InP substrate and an epitaxial layer arranged upon the main surface of the InP substrate; and, upon the main surface thereof when the thickness of the epitaxial layer is 0.3 ?m, no more than 10 LPD that have a circle-equivalent diameter of at least 0.24 ?m, per cm2, or no more than 30 LPD that have a circle-equivalent diameter of at least 0.136 ?m, per cm2. As a result, a group III-V compound semiconductor substrate capable of reducing defects in an epitaxial layer grown upon a main surface thereof and a group III-V compound semiconductor substrate with an epitaxial layer are provided.
    Type: Application
    Filed: October 26, 2020
    Publication date: February 25, 2021
    Applicant: Sumitomo Electric Industries, Ltd.
    Inventors: Shinya FUJIWARA, Tomoaki MIYOSHI
  • Publication number: 20200396369
    Abstract: An image capturing apparatus including: an imaging sensor and a processor configured to set a first exposure time and a second exposure time obtained by dividing the first exposure time by an integer m where m is an integer equal to or larger than 2; control the imaging sensor to capture frames successively by repeatedly performing exposure including at least exposure for one frame having the first exposure time and exposure for m frames having the second exposure time as one set; acquire image data of each frame from the imaging sensor; generate image data of an average frame that is an average of pieces of image data of the m frames having the second exposure time in the one set; and generate a composite frame for recording or displaying a motion picture of an extended dynamic range according to image data of the one frame having the first exposure time and the image data of the average frame.
    Type: Application
    Filed: August 31, 2020
    Publication date: December 17, 2020
    Applicant: FUJIFILM Corporation
    Inventor: Shinya FUJIWARA
  • Publication number: 20200351428
    Abstract: An image capturing apparatus having an imaging sensor and a processor configured to set n different exposure times for n successive frames, where n is an integer equal to or larger than two; control the imaging sensor to capture the n successive frames with the set n exposure times so as to make a blank period between frames shorter than the n exposure times; acquire n pieces of image data of the n successive frames captured by the imaging sensor; and generate a composite frame for recording or displaying a motion picture of an extended dynamic range from the n pieces of image data, wherein the processor is further configured to set the n exposure times so that a sum of the n exposure times matches a time for n frames for the composite frame or a time for one frame for the composite frame in accordance with a brightness of a photographic subject captured by the imaging sensor.
    Type: Application
    Filed: July 20, 2020
    Publication date: November 5, 2020
    Applicant: FUJIFILM Corporation
    Inventor: Shinya FUJIWARA
  • Publication number: 20200230496
    Abstract: In order to select a content to be used in a specified game or game stage from a plurality of contents, a selection image including a plurality of contents is displayed in which possessed contents and unpossessed contents not possessed by a user are visually distinguishable, and at least a display form or display position of each content is varied based on parameters set for a combination of the content and the specified game or game stage, and at least one is selected from the plurality of contents displayed in the selection image.
    Type: Application
    Filed: January 21, 2020
    Publication date: July 23, 2020
    Inventors: Yugo HAYASHI, Shinya FUJIWARA
  • Patent number: 10717369
    Abstract: A charge control apparatus for an electric vehicle that includes: a traction motor; a traction battery to which charging current is supplied from an external power source and that supplies current to the traction motor; and an electric device actuated by part of the charging current during charging of the traction battery is provided. The charge control apparatus includes: an instruction unit to instruct decrease of load of the electric device in case that the electric device is actuated during charging of the traction battery; a restriction unit to restrict the charging current after instruction of the decrease of load; and a load decreasing unit for decreasing load of the electric device after restricting the charging current.
    Type: Grant
    Filed: August 16, 2017
    Date of Patent: July 21, 2020
    Assignee: MITSUBISHI JIDOSHA KOGYO KABUSHIKI KAISHA
    Inventors: Kazuya Koike, Shinya Fujiwara, Norihiko Hatsumi, Koichi Tano
  • Publication number: 20200206620
    Abstract: An in-game event occurring based on a user's input is detected in a game of each time, where the game is performed a plurality of times. A first parameter is increased or decreased based on the in-game event occurring in the game of each time, the first parameter being reset for the game of each time, to calculate a score in the game of each time. A second parameter is increased or decreased based on a result of the game determined based on an assessment parameter different from a final score, the second parameter being used in the game of the plurality of times without being reset for the game of each time.
    Type: Application
    Filed: December 20, 2019
    Publication date: July 2, 2020
    Inventors: Yugo HAYASHI, Miyuki KIMURA, Shinya FUJIWARA, Kyosuke SHIMOKAWA, Hiroaki TAMURA
  • Patent number: 10663277
    Abstract: An indium phosphide substrate, a method of inspecting thereof and a method of producing thereof are provided, by which an epitaxial film grown on the substrate is rendered excellently uniform, thereby allowing improvement in PL characteristics and electrical characteristics of an epitaxial wafer formed using this epitaxial film. The indium phosphide substrate has a first main surface and a second main surface, a surface roughness Ra1 at a center position on the first main surface, and surface roughnesses Ra2, Ra3, Ra4, and Ra5 at four positions arranged equidistantly along an outer edge of the first main surface and located at a distance of 5 mm inwardly from the outer edge. An average value m1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.5 nm or less, and a standard deviation ?1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.2 nm or less.
    Type: Grant
    Filed: August 14, 2019
    Date of Patent: May 26, 2020
    Assignee: SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventors: Shinya Fujiwara, Yasuaki Higuchi
  • Publication number: 20200052075
    Abstract: An InP substrate that is a group III-V compound semiconductor substrate includes particles of greater than or equal to 0.19 ?m in particle size at less than or equal to 0.22 particles/cm2 or particles of greater than or equal to 0.079 ?m in particle size at less than or equal to 20 particles/cm2 on the main surface. An epilayer-attached InP substrate that is an epilayer-attached group III-V compound semiconductor substrate includes the InP substrate mentioned above and an epitaxial layer disposed on the main surface of the InP substrate, and includes LPDs of greater than or equal to 0.24 ?m in circle-equivalent diameter at less than or equal to 10 defects/cm2 or LPDs of greater than or equal to 0.136 ?m in circle-equivalent diameter at less than or equal to 30 defects/cm2 on the main surface in a case where the epitaxial layer has a thickness of 0.3 ?m.
    Type: Application
    Filed: May 1, 2018
    Publication date: February 13, 2020
    Applicant: Sumitomo Electric Industries, Ltd.
    Inventors: Shinya FUJIWARA, Tomoaki MIYOSHI
  • Publication number: 20200041247
    Abstract: An indium phosphide substrate, a method of inspecting thereof and a method of producing thereof are provided, by which an epitaxial film grown on the substrate is rendered excellently uniform, thereby allowing improvement in PL characteristics and electrical characteristics of an epitaxial wafer formed using this epitaxial film. The indium phosphide substrate has a first main surface and a second main surface, a surface roughness Ra1 at a center position on the first main surface, and surface roughnesses Ra2, Ra3, Ra4, and Ra5 at four positions arranged equidistantly along an outer edge of the first main surface and located at a distance of 5 mm inwardly from the outer edge. An average value m1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.5 nm or less, and a standard deviation ?1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.2 nm or less.
    Type: Application
    Filed: August 14, 2019
    Publication date: February 6, 2020
    Applicant: Sumitomo Electric Industries, Ltd.
    Inventors: Shinya FUJIWARA, Yasuaki HIGUCHI
  • Patent number: 10473445
    Abstract: An indium phosphide substrate, a method of inspecting thereof and a method of producing thereof are provided, by which an epitaxial film grown on the substrate is rendered excellently uniform, thereby allowing improvement in PL characteristics and electrical characteristics of an epitaxial wafer formed using this epitaxial film. The indium phosphide substrate has a first main surface and a second main surface, a surface roughness Ra1 at a center position on the first main surface, and surface roughnesses Ra2, Ra3, Ra4, and Ra5 at four positions arranged equidistantly along an outer edge of the first main surface and located at a distance of 5 mm inwardly from the outer edge. An average value m1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.5 nm or less, and a standard deviation ?1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.2 nm or less.
    Type: Grant
    Filed: December 7, 2015
    Date of Patent: November 12, 2019
    Assignee: Sumitomo Electric Industries, Ltd.
    Inventors: Shinya Fujiwara, Yasuaki Higuchi
  • Patent number: 10436566
    Abstract: An indium phosphide substrate, a method of inspecting thereof and a method of producing thereof are provided, by which an epitaxial film grown on the substrate is rendered excellently uniform, thereby allowing improvement in PL characteristics and electrical characteristics of an epitaxial wafer formed using this epitaxial film. The indium phosphide substrate has a first main surface and a second main surface, a surface roughness Ra1 at a center position on the first main surface, and surface roughnesses Ra2, Ra3, Ra4, and Ra5 at four positions arranged equidistantly along an outer edge of the first main surface and located at a distance of 5 mm inwardly from the outer edge. An average value m1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.5 nm or less, and a standard deviation ?1 of the surface roughnesses Ra1, Ra2, Ra3, Ra4, and Ra5 is 0.2 nm or less.
    Type: Grant
    Filed: December 7, 2015
    Date of Patent: October 8, 2019
    Assignee: Sumitomo Electric Industries, Ltd.
    Inventors: Shinya Fujiwara, Yasuaki Higuchi
  • Publication number: 20190279340
    Abstract: An image processing apparatus, an imaging apparatus, an image processing method, and a non-transitory computer readable medium for storing an image processing program capable of controlling the brightness of a desired color in a captured image are provided. A brightness and color difference conversion processing unit generates a reference first brightness signal “Y1” and color difference signals “Cb and Cr” from color signals “R1, G1, and B1” of three primary colors after gamma conversion. A second brightness signal generation unit generates a second brightness signal “Y2” in which a value of a brightness signal corresponding to a target color is decreased with respect to the first brightness signal “Y1” from the color signals “R1, G1, and B1”. The brightness of the desired target color can be controlled according to the reference first brightness signal “Y1” and the second brightness signal “Y2”.
    Type: Application
    Filed: May 30, 2019
    Publication date: September 12, 2019
    Applicant: FUJIFILM Corporation
    Inventor: Shinya FUJIWARA