Patents by Inventor Shunji Watanabe

Shunji Watanabe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5717132
    Abstract: A probe formed in a flexible portion of a cantilever is protected by a protection frame. This protection frame is separated from a support portion at a border of a groove between the protection frame and the support portion. A piezoelectric crystal layer is formed in the flexible portion, and when the flexible portion is bent by an interatomic force acting between the probe and a sample, a voltage induced between the both ends of the piezoelectric crystal layer changes.
    Type: Grant
    Filed: April 25, 1996
    Date of Patent: February 10, 1998
    Assignee: Nikon Corporation
    Inventors: Shunji Watanabe, Takamitsu Fujiu
  • Patent number: 5689063
    Abstract: Without necessitating complicated operations, an image of a low to medium magnification and an image of a high magnification are efficiently observed by an optical microscope and by an atomic force microscope, respectively. In the atomic force microscope, an atomic force microscope probe, whose size has been reduced since a device for detecting interatomic force is provided by a piezoelectric film, piezoresistance, or the like, is disposed between an objective lens of the optical microscope and a sample to be observed or at a position of the objective lens when the objective lens and the probe are constructed so as to be interchangeable, thereby enabling the optical microscope to confirm a scanning position of the atomic force microscope.
    Type: Grant
    Filed: December 4, 1995
    Date of Patent: November 18, 1997
    Assignee: Nikon Corporation
    Inventors: Takamitsu Fujiu, Shunji Watanabe, Tatsushi Nomura, Yoshinori Sango, Toru Fujii, Tetsuo Hattori
  • Patent number: 5679889
    Abstract: A method for extracting electrodes, comprises the steps of forming an electrode of a dielectric thin film on a first substrate member, forming a small projection on a second substrate member, forming a wiring pattern of an electrode extracting member communicating with the projection on the second substrate member, whereby the electrode extracting member on the projection constitutes a projection portion and the electrode of the first substrate member is brought into contact with the projection portion to the electrode extracting member on the second substrate member, whereby the electrode can be electrically connected to an external unit via the electrode extracting member.
    Type: Grant
    Filed: February 6, 1996
    Date of Patent: October 21, 1997
    Assignee: Nikon Corporation
    Inventors: Shunji Watanabe, Tetsuo Hattori
  • Patent number: 5537863
    Abstract: A scanning probe microscope according to present invention comprises a cantilever for interaction with a surface, the cantilever having a self vibrator therein for vibrating the cantilever, the cantilever having a self strain detector therein. The self vibrator and self strain detector comprise a piezoelectric layer and electrodes, and the piezoelectric layer is disposed between these electrodes.
    Type: Grant
    Filed: July 15, 1994
    Date of Patent: July 23, 1996
    Assignee: Nikon Corporation
    Inventors: Takamitsu Fujiu, Shunji Watanabe, Tatsushi Nomura, Toru Fujii, Yoshinori Sango
  • Patent number: 5214025
    Abstract: Monatomic layers each formed of a single metal are sequentially formed on a substrate using a molecular-beam epitaxy to form a multilayered metal film consisting of a plurality of types of metals, and sequentially with formation the monatomic layers, nitrogen dioxide gas as an oxidizer is supplied to oxidize the multilayered metal film. The same operation is repeatedly performed a predetermined number of times to form an oxide high-temperature superconductor thin film having a predetermined thickness.
    Type: Grant
    Filed: March 3, 1992
    Date of Patent: May 25, 1993
    Assignee: President of Tokyo Institute of Technology
    Inventors: Maki Kawai, Shunji Watanabe
  • Patent number: 5062888
    Abstract: An aqueous solution containing reducing agent such as potassium borohydride or sodium borohydride is added with another solution containing salt of an iron-triads-group element and salt of a rare earth element to conduct reaction to effect reduction to the iron-triads-group metal and the rare earth metal to thereby produce fine powder of rare earth magnet composed of alloy of the iron-triads-group metal and the rare earth metal.
    Type: Grant
    Filed: March 7, 1990
    Date of Patent: November 5, 1991
    Assignee: Seiko Instruments Inc.
    Inventor: Shunji Watanabe
  • Patent number: 4935069
    Abstract: An hard ornamental alloy can be obtained by subjecting a nickel-base alloy to cold working, warm working or both workings at a working reduction of 35% or above and then subjecting it to hot working at 800.degree. to 1000.degree. C. and at a strain rate of from 10.sup.-5 S.sup.-1 to 10.degree.S.sup.-1.
    Type: Grant
    Filed: September 7, 1988
    Date of Patent: June 19, 1990
    Assignee: Seiko Instruments Inc.
    Inventors: Isao Kuboki, Kenzo Kato, Shunji Watanabe
  • Patent number: 4614424
    Abstract: The present invention relates to a copying apparatus capable of changing the copying magnification, by moving and positioning optical members such as lens and mirror and changing the scanning speed of the scanning optical system, wherein the moving and positioning of optical members and the selecting of the scanning speed can be attained by a single motor.
    Type: Grant
    Filed: September 12, 1984
    Date of Patent: September 30, 1986
    Assignees: Casio Electronic, Mfg. Co. Ltd., Casio Computer Co., Ltd.
    Inventors: Akinori Endo, Tatsumi Shimanari, Shunji Watanabe