Abstract: A fixture is disclosed for connecting circuit cards having electronic components to a board test system. The fixture is vacuum actuated. The test fixture comprises a fixture base and a support assembly. The fixture base comprises a board test system interface, supports, probe plate and electrical connections. The probe plate contains an integral vacuum chamber with molded supports. The support assembly comprises a first seal, a support plate, a second seal, and a third seal. The circuit card is positioned by two tooling pins located in the probe assembly. The card is electrically connected to the test system through a probe, connecting wire, and a scanner pin. Two new seals are disclosed.