Abstract: Optimal routing line segments and associated buffers are pre-engineered for each family of ASIC chips by simulating wires segments of various lengths using distributed resistance and capacitance wire models, and by estimating crosstalk from neighboring line segments. During ASIC design, space is reserved on the ASIC substrate for fabricating the buffers, which are selectively connected by local metal and diffusion structures to form long distance interconnections. Signals are passed from an ASIC circuit structure to a selected long distance interconnection by connecting an output terminal of the ASIC structure either to the input terminal of a buffer located at one end of the interconnection, or by connecting the output terminal directed to a line segment of the interconnection.

Abstract: To prevent copying of a design implemented in a programmable logic device (PLD), the PLD itself stores a decryption key or keys loaded by the designer, and includes a decryptor for decrypting an encrypted configuration bitstream as it is loaded into the PLD. The PLD also includes logic for reading header information that indicates whether the bitstream is encrypted, and can accept both encrypted and unencrypted bitstreams. The encryption keys may be stored in non-volatile memory or backed up with a battery so that they are retained when power is removed.

Abstract: Programmable systems and devices that include programmable multiplexers designed to minimize the impact of single event upsets (SEUs) on triple modular redundancy (TMR) circuits. In a programmable routing multiplexer, each path through the multiplexer is controlled by a different configuration memory cell. A unidirectional buffer is included on each routing path through the multiplexer. Therefore, an SEU changing the state of any single memory cell does not short together any two input terminals of the multiplexer. Hence, when a TMR circuit is implemented using the multiplexer, an SEU affecting the multiplexer causes no more than one TMR module to become defective. The other two TMR modules together provide the correct output signal, outvoting the defective module, and the circuit continues to operate correctly.

Abstract: A security circuit for a reprogrammable logic IC includes an evolved circuit that ties the performance of the security circuit to the physical properties of that particular reprogrammable logic IC. The security circuit can be a decryption and/or encryption circuit that decrypts and/or encrypts, respectively, a configuration bitstream for the IC. Because of the link between the performance of the security circuit and the physical properties of the IC, the security circuit cannot be used in other ICs. For example, an encrypted bitstream that can be decrypted by the security circuit in a first IC will typically not be decrypted by the same security circuit in a second IC, since the physical properties of the two ICs will typically be different. The evolved circuit can comprise a portion of the security circuit, such as a security key generator, or it can comprise the full security circuit.

Abstract: A die having a bypass capacitor is stacked on another die having an active circuit. The active circuit draws a spike of current, for example, during a switching period of a voltage on its output lead from one digital logic level to another digital logic level. The bypass capacitor provides a portion of the spike of current through a conductive plug that extends from a plate of the bypass capacitor to a power lead of the active circuit. The length of the conductive plug is reduced by extending the conductive plug from the bypass capacitor to the active circuit orthogonally to the planar orientation of the dice. Reducing the length of the conductive plug reduces the resistance and inductance of the conductive plug and, in turn, reduces the drop in voltage between the voltage on the bypass capacitor and the voltage on the power lead of the active circuit.

Abstract: A PLD includes at least one portion of the programmable interconnect that can be time multiplexed. The time multiplexed interconnect allows signals to be routed on shared interconnect at different times to different destinations, thereby increasing the functionality of the PLD. Multiple sources can use the same interconnect at different times to send signals to their respective destinations. To ensure proper sharing of the interconnect, the sources can include selection devices (such as multiplexers), and the destinations can include capture devices (such as flip-flops), wherein the selection devices and the capture devices are controlled by the same time multiplexing signal. To optimize the time multiplexing interconnect, as much of the same interconnect is shared as possible.

Abstract: Structures and methods for generating high reliability designs for PLDs on which single event upsets have minimal impact. When standard triple modular redundancy (TMR) methods are used in PLDs, a single event upset can short together two module output signals and render two of the three voting circuit input signals invalid. The invention addresses this issue by providing quintuple modular redundancy (QMR) for high-reliability circuits implemented in PLDs. Thus, a single event upset that inadvertently shorts together two PLD interconnect lines can render invalid only two out of five module output signals. The majority of the five modules still provide the correct value, and the voting circuit is able to correctly resolve the error. In some embodiments, a user selects a high-reliability circuit implementation option and/or a PLD particularly suited to a QMR implementation, and the PLD implementation software automatically implements the QMR structure for the user circuit.

Abstract: Structures and methods for selectively applying a well bias to only those portions of a PLD where such a bias is necessary or desirable, e.g., applying a positive well bias to transistors on critical paths within a user's design. A substrate for an integrated circuit includes a plurality of wells, each of which can be independently and programmably biased with the same or a different well bias voltage. In one embodiment, FPGA implementation software automatically determines the critical paths and generates a configuration bitstream that enables positive well biasing only for the transistors participating in the critical paths, or only for programmable logic elements (e.g., CLBs or lookup tables) containing those transistors. In another embodiment, negative well biasing is selectively applied to reduce leakage current.

Abstract: Structures and methods for selectively applying a well bias to only those portions of a PLD where such a bias is necessary or desirable, e.g., applying a positive well bias to transistors on critical paths within a user's design. A substrate for an integrated circuit includes a plurality of wells, each of which can be independently and programmably biased with the same or a different well bias voltage. In one embodiment, FPGA implementation software automatically determines the critical paths and generates a configuration bitstream that enables positive well biasing only for the transistors participating in the critical paths, or only for programmable logic elements (e.g., CLBs or lookup tables) containing those transistors. In another embodiment, negative well biasing is selectively applied to reduce leakage current.

Abstract: Optimal routing line segments and associated buffers are pre-engineered for each family of ASIC chips by simulating wires segments of various lengths using distributed resistance and capacitance wire models, and by estimating crosstalk from neighboring line segments. During ASIC design, space is reserved on the ASIC substrate for fabricating the buffers, which are selectively connected by local metal and diffusion structures to form long distance interconnections. Signals are passed from an ASIC circuit structure to a selected long distance interconnection by connecting an output terminal of the ASIC structure either to the input terminal of a buffer located at one end of the interconnection, or by connecting the output terminal directed to a line segment of the interconnection.

Abstract: A programmable logic device includes a non-volatile permission memory block to enable a customer to utilize a proprietary core. In one embodiment, the core supplier designs its core to check for a specified permission bit or bit pattern in the permission memory block before the core will operate. If the permission bit or bit pattern is set properly, the core functions correctly when implemented in the PLD. If not, the core will not function. To prevent the customer from modifying the core such that it no longer depends upon the permission bits to function, the configuration bitstream used to program the PLD can be encrypted before and during transmission to the PLD. This encryption ensures security of the customer's logic design as well as the supplier's core design. In this manner, the customer remains dependent upon properly set permission memory bits, i.e. proper authorization, to obtain core functionality.

Abstract: Structures and methods for generating high reliability designs for PLDs on which single event upsets have minimal impact. When standard triple modular redundancy (TMR) methods are used in PLDS, a single event upset can short together two module output signals and render two of the three voting circuit input signals invalid. The invention addresses this issue by providing quintuple modular redundancy (QMR) for high-reliability circuits implemented in PLDs. Thus, a single event upset that inadvertently shorts together two PLD interconnect lines can render invalid only two out of five module output signals. The majority of the five modules still provide the correct value, and the voting circuit is able to correctly resolve the error. In some embodiments, a user selects a high-reliability circuit implementation option and/or a PLD particularly suited to a QMR implementation, and the PLD implementation software automatically implements the QMR structure for the user circuit.

Abstract: Structures and methods for selectively applying a well bias to only those portions of a PLD where such a bias is necessary or desirable, e.g., applying a positive well bias to transistors on critical paths within a user's design. A substrate for an integrated circuit includes a plurality of wells, each of which can be independently and programmably biased with the same or a different well bias voltage. In one embodiment, FPGA implementation software automatically determines the critical paths and generates a configuration bitstream that enables positive well biasing only for the transistors participating in the critical paths, or only for programmable logic elements (e.g., CLBs or lookup tables) containing those transistors. In another embodiment, negative well biasing is selectively applied to reduce leakage current.

Abstract: A programmable capacitor in an integrated circuit (IC) comprises a conductive line located parallel to an interconnect. When a bias voltage is applied to the conductive line, a parasitic capacitance is created between the interconnect and the conductive line. By properly sizing and locating the conductive line, a desired capacitance can be coupled to the interconnect. A bias control circuit can apply or remove the bias voltage from the conductive line, thereby enabling the capacitance to be coupled or decoupled, respectively, from the interconnect. Because of its simple construction, multiple capacitive structures can be formed around a single interconnect to provide capacitive adjustment capability. By changing the number of conductive lines to which the bias voltage is applied, the total capacitance provided by the multiple capacitive structures can be varied. A feedback loop can be incorporated to provide adjustment during IC operation.

Abstract: Methods of detecting shorts affecting nets of a specified design in a partially defective PLD. The nets participating in the design are identified, along with the interconnect lines used to implement each net. The nets are then divided into two or more groups, where no two nets in a single group can be shorted together by the inadvertent enablement of a single programmable interconnect point between two interconnect lines. The groups are then tested for inadvertent shorts. According to a first aspect of the invention, each group is tested sequentially against all interconnect lines not in the group, or against all nets in other groups. According to another aspect, the groups are tested simultaneously by applying a different stimulus pattern to each group. By comparing a detected value pattern to the stimulus patterns applied to other groups, it can be determined which two groups are participating in the short.

Abstract: Described are a method of programming a programmable logic device using encrypted configuration data and a programmable logic device (PLD) adapted to use such encrypted data. A PLD is adapted to include a decryptor having access to a non-volatile memory element programmed with a secret decryption key. Some or all of the decryptor can be instantiated in configurable logic on the FPGA. Encrypted configuration data representing some desired circuit functionality is presented to the decryptor. The decryptor then decrypts the configuration data, using the secret decryption key, and configures the FPGA with the decrypted configuration data. Some embodiments include authentication circuitry that performs a hash function on the configuration data used to instantiate the decryptor on the PLD. The result of the hash function is compared to a proprietary hash key programmed into the PLD. Only those configuration data that produce the desired hash result will instantiate decryptors that have access to the decryption key.

Abstract: A programmable capacitor in an integrated circuit (IC) comprises a conductive line located parallel to an interconnect. When a bias voltage is applied to the conductive line, a parasitic capacitance is created between the interconnect and the conductive line. By properly sizing and locating the conductive line, a desired capacitance can be coupled to the interconnect. A bias control circuit can apply or remove the bias voltage from the conductive line, thereby enabling the capacitance to be coupled or decoupled, respectively, from the interconnect. Because of its simple construction, multiple capacitive structures can be formed around a single interconnect to provide capacitive adjustment capability. By changing the number of conductive lines to which the bias voltage is applied, the total capacitance provided by the multiple capacitive structures can be varied. A feedback loop can be incorporated to provide adjustment during IC operation.

Abstract: Methods for implementing a circuit in a programmable logic device (PLD) that protect the circuit from the effects of single event upsets. When routing nodes within the circuit using the interconnect lines of the PLD, two routed nodes are separated from each other by at least two programmable interconnect points (PIPs). Therefore, if a single event upset causes a PIP to become inadvertently enabled, the affected node is coupled to an unused interconnect line, instead of to another node within the circuit. In some embodiments, a triple modular redundancy (TMR) circuit is implemented. Signals in one module are separated from signals in another module by at least two PIPS. However, signals within the same module can be separated by only one PIP, because the TMR structure of the circuit can compensate for errors within a single module.

Abstract: A novel method and corresponding system are provided for safely reconfiguring a portion of a reprogrammable logic device. The method includes the steps of identifying the nets to be reprogrammed, identifying the device drivers that may induce signal contention during or after a new configuration on the identified nets, electrically isolating the identified drivers, and implementing the new configuration.

Abstract: Structures and methods for selectively applying a well bias to only those portions of a PLD where such a bias is necessary or desirable, e.g., applying a positive well bias to transistors on critical paths within a user's design. A substrate for an integrated circuit includes a plurality of wells, each of which can be independently and programmably biased with the same or a different well bias voltage. In one embodiment, FPGA implementation software automatically determines the critical paths and generates a configuration bitstream that enables positive well biasing only for the transistors participating in the critical paths, or only for programmable logic elements (e.g., CLBs or lookup tables) containing those transistors. In another embodiment, negative well biasing is selectively applied to reduce leakage current.