Patents by Inventor Sungho Kang

Sungho Kang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240183834
    Abstract: Provided is a conductivity temperature depth (CTD) observation information calibrating method and the CTD observation information calibrating method incudes receiving CTD observation raw information; calibrating the CTD observation raw information; and outputting calibrated CTD observation information.
    Type: Application
    Filed: May 17, 2023
    Publication date: June 6, 2024
    Inventors: Hyeong Jun JO, Sungho CHOO, Kiryong KANG, Chulkyu LEE, Kyungsuck KO
  • Patent number: 12001954
    Abstract: An encoding apparatus connected to a learning circuit processing learning of a deep neural network and configured to perform encoding for reconfiguring connection or disconnection of a plurality of edges in a layer of the deep neural network using an edge sequence generated based on a random number sequence and dropout information indicating a ratio between connected edges and disconnected edges of a plurality of edges included in a layer of the deep neural network.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: June 4, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sungho Kang, Hyungdal Kwon, Cheon Lee, Yunjae Lim
  • Patent number: 12000891
    Abstract: The exemplary embodiments of the present invention provides a scan cluster reordering method and apparatus which perform a scan correlation aware scan cluster reordering to reduce a power generated during the scan test and place scan cells having a high correlation to be adjacent to each other by analyzing the correlation between scan cells, and reduce a test power generated during the scan test.
    Type: Grant
    Filed: September 9, 2022
    Date of Patent: June 4, 2024
    Assignee: UIF (University Industry Foundation), Yonsei University
    Inventors: Sungho Kang, Sang Jun Lee
  • Publication number: 20240168362
    Abstract: A lens driving apparatus includes a lens holder having a central opening so as to accommodate a lens, a carrier configured to accommodate the lens holder, an optical image stabilization (OIS) driving magnet holder having an OIS driving magnet mounted thereon, supported by the carrier, coupled to the lens holder, and configured to be driven in a direction perpendicular to an optical axis, and an OIS driving coil facing the OIS driving magnet at an interval, in a direction perpendicular to the optical axis and to a direction in which the OIS driving magnet is driven.
    Type: Application
    Filed: October 20, 2023
    Publication date: May 23, 2024
    Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.
    Inventors: Sungho KANG, Kum-Kyung LEE
  • Patent number: 11991928
    Abstract: A heterocyclic compound represented by Formula 1: wherein, Ar1 is a group represented by Formula 2, Ar1 includes at least one cyano group, A1, A2, L1, a1, Ar11, Ar12, Ar13, m1, R1, R10, R20, R30, b1, b10, b20, and b30 are the same as described in the present disclosure, and * and *? each indicate a binding site to a neighboring atom.
    Type: Grant
    Filed: March 12, 2021
    Date of Patent: May 21, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Yongsik Jung, Eunsuk Kwon, Hwangsuk Kim, Yeonsook Chung, Hosuk Kang, Joonghyuk Kim, Sungho Nam, Youngmok Son
  • Patent number: 11991927
    Abstract: An organic light-emitting device may include: a first electrode; a second electrode facing the first electrode; and an organic layer between the first electrode and the second electrode, wherein the organic layer may include an emission layer, the emission layer may include a first compound, a second compound, and a fluorescent dopant, the first compound, the second compound, and the fluorescent dopant may be different from one another, the total weight of the first compound and the second compound may be greater than a weight of the fluorescent dopant, and the first compound may be a compound represented by Formula 1: Formula 1 may be understood by referring to the description of Formula 1 provided herein.
    Type: Grant
    Filed: January 27, 2021
    Date of Patent: May 21, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Joonghyuk Kim, Hosuk Kang, Sangmo Kim, Sungho Nam, Youngmok Son, Hasup Lee, Yeonsook Chung, Yongsik Jung, Hyeonho Choi
  • Publication number: 20240159657
    Abstract: Provided is an apparatus configured to measure radical spatial density distribution including a process chamber including a viewport, a driving device configured to move a moving wall inside the process chamber, a light source configured to generate light, a collimator disposed in the viewport of the process chamber and configured to transmit light received from the light source to the moving wall and receive light reflected from the moving wall, and a spectrometer configured to receive the reflected light from the collimator, and measure radical spatial density based on analyzing an absorption amount of a spectrum of the received light.
    Type: Application
    Filed: May 26, 2023
    Publication date: May 16, 2024
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sejin OH, Sunggil KANG, Sangki NAM, Jeongmin BANG, Dougyong SUNG, Yeongkwang LEE, Sungho JANG, Jonghun PI
  • Publication number: 20240162226
    Abstract: A semiconductor device includes first and second external dummy areas, and a circuit area between the first and second external dummy areas. The circuit area includes circuit active regions and circuit gate lines. Each external dummy area includes an external dummy active region and external dummy gate lines overlapping the external dummy active region and spaced apart from the circuit gate lines. The external dummy active region has a linear shape extending in a first horizontal direction or a shape including active portions isolated from direct contact with each other and extending sequentially in the first horizontal direction. The circuit active regions are between the first and second external dummy active regions and include a first plurality of circuit active regions extending sequentially in the first horizontal direction and a second plurality of circuit active regions extending sequentially in a second horizontal direction perpendicular to the first horizontal direction.
    Type: Application
    Filed: January 18, 2024
    Publication date: May 16, 2024
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Seonah NAM, Byungju KANG, Byungsung KIM, Hyelim KIM, Sungho PARK, Yubo QIAN
  • Patent number: 11966846
    Abstract: An encoding apparatus connected to a learning circuit processing learning of a deep neural network and configured to perform encoding for reconfiguring connection or disconnection of a plurality of edges in a layer of the deep neural network using an edge sequence generated based on a random number sequence and dropout information indicating a ratio between connected edges and disconnected edges of a plurality of edges included in a layer of the deep neural network.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: April 23, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sungho Kang, Hyungdal Kwon, Cheon Lee, Yunjae Lim
  • Publication number: 20240107875
    Abstract: Provided are the organometallic compound represented by Formula 1 and an organic light-emitting device including the same: M, X1 to X4, X11, ring CY2 to ring CY4, T1, T2, R1 to R4, and a1 to a4 in Formula 1 are the same as described in the present specification.
    Type: Application
    Filed: October 30, 2023
    Publication date: March 28, 2024
    Inventors: Minsik MIN, Sangmo KIM, Hosuk KANG, Wook KIM, Sungho NAM, Hyejin BAE, Jhunmo SON, Yongsik JUNG, Jun CHWAE
  • Patent number: 11809954
    Abstract: An encoding apparatus connected to a learning circuit processing learning of a deep neural network and configured to perform encoding for reconfiguring connection or disconnection of a plurality of edges in a layer of the deep neural network using an edge sequence generated based on a random number sequence and dropout information indicating a ratio between connected edges and disconnected edges of a plurality of edges included in a layer of the deep neural network.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: November 7, 2023
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sungho Kang, Hyungdal Kwon, Cheon Lee, Yunjae Lim
  • Patent number: 11755904
    Abstract: The disclosure relates to an artificial intelligence (AI) system that simulates functions such as cognition and judgment of the human brain by utilizing machine learning algorithms such as deep learning and its applications.
    Type: Grant
    Filed: February 20, 2019
    Date of Patent: September 12, 2023
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hyungdal Kwon, Sungho Kang, Cheon Lee, Yunjae Lim
  • Publication number: 20230205172
    Abstract: There is provided a scan cell placing method including calculating a weight of each scan cell from a deterministic pattern input to a plurality of scan cells, dividing the scan cells into a coverage group and a power group on the basis of the weights, forming a plurality of power subgroups from a result of providing a pseudo random pattern to scan cells belonging to the power group, and scheduling one or more of the power subgroups to reduce peak power in a test process.
    Type: Application
    Filed: November 28, 2022
    Publication date: June 29, 2023
    Applicant: UIF (University Industry Foundation), Yonsei University
    Inventors: Sungho KANG, Sang Jun LEE
  • Publication number: 20230185168
    Abstract: A camera module is provided. The camera module includes a housing configured to have an inner space covered by a cover; a folded module which includes a reflective member configured to reflect light incident from the outside, and change a path of the light, and a moving holder on which the reflective member is mounted and configured to be movable in the inner space; a lens module positioned behind the folded module in the inner space and comprising a lens barrel including a plurality of lenses aligned in an optical axis direction and configured to allow light reflected from the reflective member to pass therethrough; and a damper positioned between the folded module and the lens module inside the housing, and comprising a first cushioning surface, a second cushioning surface, and a third cushioning surface which respectively face 3-axis directions orthogonal to each other.
    Type: Application
    Filed: October 24, 2022
    Publication date: June 15, 2023
    Applicant: Samsung Electro-Mechanics Co., Ltd.
    Inventor: Sungho KANG
  • Publication number: 20230072965
    Abstract: In a method of repairing through-electrodes, a plurality of through-electrodes are grouped into a plurality of through-electrode groups. A plurality of redundant through-electrodes are grouped into a plurality of redundant through-electrode groups. Repair paths for the plurality of through-electrodes are searched. When searching the repair paths, in response to a Y-th through-electrode included in an X-th through-electrode group being a defective through-electrode or in response to receiving a first signal from an (X?1)-th through-electrode group, it is determined whether a y-th redundant through-electrode included in an x-th redundant through-electrode group is available for performing signal transmission thereto. In response to the y-th redundant through-electrode being available for performing signal transmission thereto, a second signal input to the Y-th through-electrode is transmitted to the y-th redundant through-electrode.
    Type: Application
    Filed: April 27, 2022
    Publication date: March 9, 2023
    Inventors: Sungho Kang, Youngkwang Lee
  • Publication number: 20230070785
    Abstract: A semiconductor system, a semiconductor device, a through-silicon via (TSV) test method, and a method of manufacturing a semiconductor device are provided. The semiconductor system includes a semiconductor device including a buffer die and first to L-th (where L is an integer greater than or equal to 2) stack dies stacked on the buffer die and communicating with the buffer die through N (where N is a positive integer) TSVs; and a TSV test device that measures each of voltages at one end and voltages at another end on the N TSVs according to a clock signal, compares each of the voltages at the one end and the voltages at the other end with a reference voltage, and determines whether each of the N TSVs has a plurality of TSV defect types according to comparison results.
    Type: Application
    Filed: July 28, 2022
    Publication date: March 9, 2023
    Applicant: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
    Inventors: YOUNGKWANG LEE, SUNGHO KANG
  • Patent number: 11567132
    Abstract: Provided are scan device and method of diagnosing scan chain fault. The scan device for diagnosing a fault includes a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade. In the scan partition, connection paths of the scan flipflops are controllable. The connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.
    Type: Grant
    Filed: February 16, 2022
    Date of Patent: January 31, 2023
    Assignee: UIF (University Industry Foundation), Yonsei University
    Inventors: Sungho Kang, Seokjun Jang
  • Patent number: 11557449
    Abstract: A zero-power plasmonic microelectromechanical system (MEMS) device is capable of specifically sensing electromagnetic radiation and performing signal processing operations. Such devices are highly sensitive relays that consume no more than 10 nW of power, utilizing the energy in detected electromagnetic radiation to detect and discriminate a target without the need of any additional power source. The devices can continuously monitor an environment and wake up an electronic circuit upon detection of a specific trigger signature of electromagnetic radiation, such as vehicular exhaust, gunfire, an explosion, a fire, a human or animal, and a variety of sources of radiation from the ultraviolet to visible light, to infrared, to terahertz radiation.
    Type: Grant
    Filed: May 5, 2020
    Date of Patent: January 17, 2023
    Assignee: Northeastern University
    Inventors: Matteo Rinaldi, Zhenyun Qian, Sungho Kang, Vageeswar Rajaram
  • Patent number: 11531277
    Abstract: An EUV mask inspection system includes a mask receiving unit configured to receive a manufactured EUV mask, a main chamber configured to perform an inspection on the EUV mask, and a load-lock chamber disposed between the mask receiving unit and the main chamber. The load-lock chamber includes a mask table for loading the EUV mask, an UV lamp disposed adjacent the mask table in a first direction, a cold trap disposed adjacent the mask table in a second direction, and a vacuum pump. The first direction is a direction perpendicular to a sidewall of the mask table, and the second direction is a direction perpendicular to a top surface of the mask table. The UV lamp is configured to evaporate water molecules on the EUV mask by irradiating UV light onto the EUV mask. The cold trap is configured to trap the water molecules evaporated from the EUV mask.
    Type: Grant
    Filed: October 12, 2021
    Date of Patent: December 20, 2022
    Inventors: Jihoon Na, Sungho Kang, Jaewhan Sung, Hak-Seok Lee, Hyunjune Cho
  • Publication number: 20220381825
    Abstract: Provided are scan device and method of diagnosing scan chain fault. The scan device for diagnosing a fault includes a scan partition including a plurality of scan chains which include path control scan flipflops connected to scan flipflops in cascade. In the scan partition, connection paths of the scan flipflops are controllable. The connection paths of the path control scan flipflops are controlled to detect a position of a fault such that a fault range in the scan partition is reduced to diagnose the fault.
    Type: Application
    Filed: February 16, 2022
    Publication date: December 1, 2022
    Applicant: UIF (University Industry Foundation), Yonsei University
    Inventors: Sungho KANG, Seokjun JANG