Abstract: A static random access memory cell according to the present invention comprises first and second cross-coupled inverters. The first inverter includes a first P-Channel MOS transistor having a source connected to a first power supply node, a gate, and a drain, and a first N-Channel MOS transistor having a drain connected to the drain of the first P-Channel MOS transistor and forming an output node, a gate, and a source connected to a fixed power supply potential. The second inverter includes a second P-Channel MOS transistor having a source connected to the first power supply node, a gate, and a drain, and a second N-Channel MOS transistor having a drain connected to the drain of the second P-Channel MOS transistor, a gate, and a source connected to the fixed power supply potential.

Abstract: A pullup circuit for use with plurality of N-Channel pulldown transistors connected to a bit line includes a P-channel MOS pullup transistor connected between the bit line and a voltage rail. An inverter is connected between the bit line and the drain of an N-Channel MOS transistor having its gate connected to the voltage rail and its source connected to the gate of the P-Channel MOS pullup transistor. A first P-Channel MOS transistor is connected between the voltage rail and the gate of the P-Channel MOS pullup transistor. A second P-Channel MOS transistor having its gate connected to ground is connected between the bit line and the gate of the first P-Channel MOS transistor. Four P-Channel MOS divider transistors are connected between the drain of the first P-Channel MOS transistor and ground. The gates of the P-Channel MOS divider transistors are connected together to ground. The P-Channel MOS pullup transistor and the N-Channel MOS pulldown transistors are large.

Abstract: Apparatus for forcing a memory cell to a known state upon power-up includes circuitry for providing two signals PWRUP and PWRUPB which are used during chip power-up. At power-up, as V.sub.CC rises from 0 volt to 3.5 volts, the PWRUP signal follows V.sub.CC and the PWRUPB signal maintains 0 volts. The PWRUP and PWRUPB signals are used to drive the gates of P-Channel and N-Channel MOS transistors, respectively, including pass gates connected between word line driver circuits and bit line driver circuits driving the word lines and bit lines associated with the memory cells. In addition, the PWRUPB signal is used to drive P-Channel MOS pullup transistors connected between the word lines and V.sub.CC and the bit lines and V.sub.CC. During power-up, the pass gates are disabled, disconnecting the word lines and bit lines from their drivers. The word lines and bit lines are forced to follow the rise of V.sub.CC by the P-Channel pullup transistors. When V.sub.

Abstract: A level-shifting static random access memory cell includes a first stage having a first P-Channel MOS transistor having its source connected to a high voltage supply rail, and its drain connected to the drain of a first N-Channel MOS transistor. The source of the first N-Channel MOS transistor is connected to the drain of a second N-Channel MOS transistor. The source of the second N-channel MOS transistor is connected to a VSS power supply rail. A second stage comprises a second P-Channel MOS transistor having its source connected to the high voltage supply rail V.sub.HS, and its drain connected to the drain of a third N-Channel MOS transistor. The source of the third N-Channel MOS transistor is connected to the drain of a fourth N-Channel MOS transistor. The source of the fourth N-channel MOS transistor is connected to VSS. The gates of the first and second P-Channel MOS transistors are cross coupled and the gates of the second and fourth N-Channel MOS transistors are cross coupled.