Abstract: A semiconductor device includes transmission lines for conveying signals and transition detectors, each of which checks whether a transmission signal on each of the plurality of transmission lines is transited. If the signal is transited, its transition shape is detected. A signal mode determining unit determines signal transmission modes between adjacent transmission lines in response to output signals from the plurality of transition detectors. Delay units are coupled to the respective transmission lines for adjusting transmission delays of the transmission signals depending on corresponding output signal from the signal mode determining units.

Abstract: A domain crossing circuit of a semiconductor memory apparatus, the domain crossing circuit comprising first and second count signals generated at substantially a same clock period, and representing predetermined clock differences with reference to an internal clock signal with respect to same bit combination data, and a data processing unit configured to provide output data corresponding to input data based on the second count signal in response to the input data synchronized to an external clock signal.

Abstract: A sampling circuit for use in a semiconductor device, includes a first sampling unit configured to sample a data signal in synchronism with a reference clock signal and output a first output signal, a second sampling unit configured to sample a delayed data signal in synchronism with the reference clock signal and output a second output signal, and an output unit configured to combine the first and second output signals and output a sampling data signal.

Abstract: A voltage measuring apparatus for a semiconductor integrated circuit includes a first delay unit configured to delay a reference clock in a first region, a second delay unit configured to delay the reference dock in a second region and an analysis unit configured to analyze a difference in voltage level between the regions based on the phases of associated with the delayed clock signals generated by the first and second delay units.

Abstract: A receiver circuit according to the invention includes a first phase transmission unit that is synchronized with a first clock, detects input data according to a plurality of detection levels, and transmits a first output signal, a first discharging control unit that controls a second phase transmission unit in response to the first output signal and adjusts the transmission speed of the second phase transmission unit by changing a node potential where an output of the second phase transmission is determined, and the second phase transmission unit that is synchronized with a second clock, detects the input data according to an output of the first discharging control unit, and transmits a second output signal.

Abstract: A Delay Locked Loop (DLL) includes a replica delay unit configured to delay an output clock to generate a feedback clock; a phase detector configured to measure a phase difference between the feedback clock and an input clock; a quantization unit configured to quantize the phase difference measured by the phase detector; and a delay unit configured to delay the input clock based on a quantization result from the quantization unit to generate the output clock.

Abstract: A voltage regulator with an adaptive bandwidth, including a first buffer chain, a voltage generating unit, a trimming capacitor unit, a second buffer chain, and a control unit. The first buffer chain delays a clock signal using an external voltage as a supply voltage. The voltage generating unit generates a regulated voltage on the basis a reference voltage. The trimming capacitor unit controls a load capacitance of the voltage generating unit. The second buffer chain delays the clock signal using the regulated voltage as a supply voltage. The control unit adjusts the load capacitance by detecting a delay difference of clocks output from the first and second buffer chains.

Abstract: A voltage adjustment circuit of a semiconductor memory apparatus includes a control voltage generating unit configured to distribute an external voltage for selectively outputting a plurality of distribution voltages as a control voltage in response to a control signal, the plurality of the distribution voltages each have different voltage levels, a comparing unit configured to include a voltage supply unit configured to control an external voltage supplied to a first node and a second node if a level of an output voltage is higher than a level of a reference voltage in response to a level of the control voltage, and a detection signal generating unit configured to drop potential levels of the first and second nodes according to the levels of the output voltage and the reference voltage, and to output the potential level of the second node as a detection signal, and a voltage generating unit configured to drive the external voltage according to a potential level of the detection signal and to output the exter

Abstract: A voltage measuring apparatus for a semiconductor integrated circuit includes a first delay unit configured to delay a reference clock in a first region, a second delay unit configured to delay the reference clock in a second region and an analysis unit configured to analyze a difference in voltage level between the regions based on the phases of associated with the delayed clock signals generated by the first and second delay units.

Abstract: A semiconductor memory device includes a delay locked loop circuit that can control input/output timing of data according to a system clock of a high frequency. The semiconductor memory device includes a phase comparator configured to detect a phase difference between an internal clock and a reference clock to output a state signal having a pulse width corresponding to the detected phase difference, a phase adjuster configured to generate a digital code for determining a delay time corresponding to the state signal for locking a phase of the internal clock, a digital-to-analog converter configured to convert the digital code to an analog voltage, and a multiphase delay signal generator configured to delay the internal clock according to a bias voltage corresponding to the analog voltage to feed back the delayed internal clock as the internal clock and generate multiphase delay signals.

Abstract: A delay locked loop (DLL) circuit includes a phase detection unit configured to generate a phase detection signal by comparing a phase of a reference clock signal with a phase of a feedback clock signal. An update control apparatus is configured to generate a valid interval signal and an update control signal by determining a difference between the number of first logical values and the number of second logical values of the phase detection signal in response to the reference clock signal. A shift register configured to update a delay value granted to a delay line in response to the update control signal when the valid interval signal is enabled.

Abstract: A signal receiver circuit includes a first level detector for offset-controlling a first output node in response to a pair of first reference signals. A second level detector offset-controls a second output node in response to a pair of second reference signals.

Abstract: A power noise detecting device includes a plurality of power lines, and a power noise detecting part configured to detect power noise by rectifying voltages of the plurality of power lines and converting the rectified voltages into effective voltages.

Abstract: A phase detecting circuit includes a first node that outputs a pull-up control signal, a second node that outputs a pull-down control signal, an initializing unit that initializes voltage levels of the first and second nodes in response to a pre-charge signal, a data input unit to which receives a receiver data, a phase comparison unit that compares a phase of a receiver clock and a phase of the receiver data input to the data input unit to control the voltage levels of the first and second nodes, and a charging/discharging unit that charges or discharges electric charges that are applied to the first and second nodes.

Abstract: A DLL circuit for a semiconductor memory apparatus includes a delay line having a coarse delay chain, which has a plurality of coarse delayers connected in series and is inputted with a reference clock signal, and a plurality of fine delayers which receive output clock signals of the respective coarse delayers, and a delay control section for comparing phases of an output clock signal of a final coarse delayer among the coarse delayers with the reference clock signal and generating coarse control signals for controlling the coarse delayers and for comparing phases of an output clock signal of a fine delayer inputted with the output clock signals of the final coarse delayer, as a fine feedback clock signal, with the reference clock signal and generating fine control signals for controlling the fine delayers.

Abstract: A receiver of a semiconductor memory apparatus includes a first input transistor configured to be turned ON when an input signal is equal to or more than a predetermined level; a second input transistor configured to be turned ON when the input signal is equal to or less than the predetermined level; a first output node voltage control unit configured to increase a voltage level of an output node when the first input transistor is turned ON; a second output node voltage control unit configured to decrease the voltage level of the output node when the second input transistor is turned ON; a third input transistor configured to increase the voltage level of the output node when an inversion signal of the input signal is equal to or less than the predetermined voltage level; and a fourth input transistor configured to decrease the voltage level of the output node when the inversion signal of the input signal is equal to or more than the predetermined voltage level.

Abstract: A duty cycle correction apparatus includes a fixed delay unit configured to set a fixed delay time to a DLL clock signal and generate a delay rising clock signal; a variable delay unit configured to delay the DLL clock signal in response to a control signal and generate a delay falling clock signal; a duty cycle correction unit configured to generate a correction rising clock signal and a correction falling clock signal that are toggled in conformity with edge timing of the delay rising clock signal and the delay falling clock signal; and a delay control unit configured to detect duty cycles of the correction rising clock signal and the correction falling clock signal and generate the control signal.

Abstract: A latency control circuit includes a path calculator configured to calculate a delay value of a path that an input signal is to go through inside a chip and output the delay value as path information, a delay value calculator configured to output delay information representing a delay value for delaying the input signal based on a latency value of the input signal and the path information, and a delayer configured to delay the input signal by a delay corresponding to the delay information.

Abstract: A phase mixer includes a phase mixing unit configured to mix a phase of a first input signal and a phase of a second input signal in response to a phase control signal and output a phase mixed signal whose phase is varied by one or more units of a unit phase value, and a phase value adjusting unit configured to control an operation of the phrase mixing unit so that the unit phase value is adjusted in response to a code signal coding at least one of a process, voltage, or temperature (PVT) variation.

Abstract: A semiconductor apparatus includes a clock input buffer, an asynchronous data input buffer, and a synchronous data input buffer. The clock input buffer is configured to buffer an external clocks in order to generate an internal clock. The asynchronous data input buffer is configured to buffer data input through a data pad and output the buffered data. The synchronous data input buffer is configured to be synchronous with the internal clock to buffer the buffered data. The semiconductor apparatus is arranged so that the length of a line for transferring the internal clock to the synchronous data input buffer and the length of a line for transferring the buffered data to the synchronous data input buffer are substantially equal to each other.