Patents by Inventor Takashi Yoneyama
Takashi Yoneyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11869166Abstract: A microscope system comprising an eyepiece, an objective that guides light from a sample to the eyepiece, a tube lens that is disposed on a light path between the eyepiece and the objective and forms an optical image of the sample on the basis of light therefrom, a projection apparatus that projects a projection image including a first assistance image onto an image plane on which the optical image is formed, and a processor that performs processes. The processes include generating projection image data representing the projection image. The first assistance image is an image of the sample in which a region wider than an actual field of view corresponding to the optical image is seen, The first assistance image is projected onto a portion of the image plane that is close to an outer edge of the optical image.Type: GrantFiled: March 9, 2021Date of Patent: January 9, 2024Assignee: Evident CorporationInventors: Tatsuo Nakata, Akifumi Kabeya, Takashi Yoneyama, Hiroshi Sasaki
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Patent number: 11594051Abstract: A microscope system includes an eyepiece, an objective, a tube lens that is disposed between the eyepiece and the objective, a projection apparatus that projects a projection image onto an image plane on which an optical image is formed by the tube lens, and a processor that performs processes. The processes include performing for digital image data of the sample at least one analysis process selected from a plurality of analysis processes, and generating projection image data representing the projection image on the basis of the analysis result and the at least one analysis process. The projection image data indicates the analysis result in a display format including an image color corresponding to the at least one analysis process. The generating the projection image data includes determining a color for the projection image in accordance with the at least one analysis process selected from the plurality of analysis processes.Type: GrantFiled: March 9, 2021Date of Patent: February 28, 2023Assignee: Evident CorporationInventors: Takashi Yoneyama, Akifumi Kabeya, Yosuke Tani, Tatsuo Nakata, Masayoshi Karasawa
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Publication number: 20210192181Abstract: A microscope system includes an eyepiece, an objective, a tube lens that is disposed between the eyepiece and the objective, a projection apparatus that projects a projection image onto an image plane on which an optical image is formed by the tube lens, and a processor that performs processes. The processes include performing for digital image data of the sample at least one analysis process selected from a plurality of analysis processes, and generating projection image data representing the projection image on the basis of the analysis result and the at least one analysis process. The projection image data indicates the analysis result in a display format including an image color corresponding to the at least one analysis process. The generating the projection image data includes determining a color for the projection image in accordance with the at least one analysis process selected from the plurality of analysis processes.Type: ApplicationFiled: March 9, 2021Publication date: June 24, 2021Applicant: OLYMPUS CORPORATIONInventors: Takashi YONEYAMA, Akifumi KABEYA, Yosuke TANI, Tatsuo NAKATA, Masayoshi KARASAWA
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Publication number: 20210192179Abstract: A microscope system comprising an eyepiece, an objective that guides light from a sample to the eyepiece, a tube lens that is disposed on a light path between the eyepiece and the objective and forms an optical image of the sample on the basis of light therefrom, a projection apparatus that projects a projection image including a first assistance image onto an image plane on which the optical image is formed, and a processor that performs processes. The processes include generating projection image data representing the projection image. The first assistance image is an image of the sample in which a region wider than an actual field of view corresponding to the optical image is seen, The first assistance image is projected onto a portion of the image plane that is close to an outer edge of the optical image.Type: ApplicationFiled: March 9, 2021Publication date: June 24, 2021Applicant: OLYMPUS CORPORATIONInventors: Tatsuo NAKATA, Akifumi KABEYA, Takashi YONEYAMA, Hiroshi SASAKI
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Patent number: 8890947Abstract: Provided is a microscope apparatus including a macro-image, acquisition section that acquires a macro image of a glass slide having a specimen mounted thereon; an extraction section that extracts the specimen in the acquired macro image; a block setting section that sets, when the extracted specimen is scattered to form a plurality of lumps, a plurality of blocks that include the lumps of the specimen; an area dividing section that divides an area that includes the specimen in each of the blocks into a plurality of small regions; and a micro-image acquisition section that acquires, for each of the small regions, a micro image while performing an automatic focusing operation for the specimen in the small region, in which the micro-image acquisition section searches for an autofocusing in-focus position in each of the blocks set by the block setting section.Type: GrantFiled: June 14, 2011Date of Patent: November 18, 2014Assignee: Olympus CorporationInventors: Takashi Yoneyama, Chika Nakajima
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Patent number: 8837676Abstract: It is possible to create a virtual slide of a subject of observation in a simple configuration without setting a movement pattern in advance.Type: GrantFiled: March 7, 2011Date of Patent: September 16, 2014Assignee: Olympus CorporationInventors: Tetsuya Shirota, Takashi Yoneyama, Chika Nakajima, Yasuaki Natori
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Patent number: 8730315Abstract: The number of seams between magnified images in a created virtual slide is reduced to make the virtual slide clear and sharp. Provided is a microscope apparatus including an objective lens that collects light from a sample on a slide; a focus position detecting section that detects a focus position of the objective lens with respect to the sample; a focus state adjustment section that adjusts a focus state with respect to the sample based on a detection result from the focus position detecting section; and a magnified-image acquisition section that acquires a magnified image of each part of the sample, in which, if the focus position detected by the focus position detecting section is changed by more than a predetermined threshold with respect to a focus state in which an adjacent magnified image was obtained, the focus state adjustment section limits the adjustment in the focus state to the predetermined threshold or less.Type: GrantFiled: October 20, 2010Date of Patent: May 20, 2014Assignee: Olympus CorporationInventor: Takashi Yoneyama
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Patent number: 8723942Abstract: A photomicroscopy system includes a microscope unit which outputs an enlarged image of a subject as a light flux, an image capturing unit which forms an image of the light flux output by the microscope unit and converts the formed image into digital data, a sensitivity changing unit which changes a sensitivity of the image capturing unit, and a computing unit which obtains an exposure time by using the digital data captured by the image capturing unit in a state where the sensitivity is increased to the high sensitivity after instructing the sensitivity changing unit to increase the sensitivity of the image capturing unit to the high sensitivity while calculating the exposure time for obtaining a suitable brightness by the image capturing unit, and sets the sensitivity of the image capturing unit to a low sensitivity after the exposure time is set in the image capturing unit.Type: GrantFiled: January 4, 2010Date of Patent: May 13, 2014Assignee: Olympus CorporationInventors: Hitoshi Ueda, Takashi Yoneyama, Yasuko Ishii
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Publication number: 20120293864Abstract: A microscope system that is capable of changing a status of observation of a sample comprises an instruction unit for giving instruction for driving one or more optical members including an objective lens or for changing a relative position of the sample and the objective lens; and an image capturing unit for capturing an observed image of the sample as a still image or a live image. The microscope system changes an order for performing operations in accordance with the instruction from the instruction unit, the operations including an operation of driving the one or more optical members or changing the relative position; an operation of switching the illumination light for the sample from being cut-off or reduced to being applied; and an operation of switching the image displayed in a display unit from the still image to the live image.Type: ApplicationFiled: July 31, 2012Publication date: November 22, 2012Applicant: OLYMPUS CORPORATIONInventors: Hideyuki Kawanabe, Tetsuya Shirota, Yasuko Ishii, Takashi Yoneyama
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Patent number: 8284246Abstract: A microscope system which is capable of changing observation states by driving various optical members and which includes a history record unit for recording history data related to a microscope operation history, a selection unit for selecting one or more microscope operation items from among a plurality of microscope operation items, and a state reproduction unit for reproducing a microscope state on the basis of a microscope operation item(s) selected by the selection unit and on the basis of a microscope operation history related to history data recorded in the history record unit.Type: GrantFiled: January 15, 2009Date of Patent: October 9, 2012Assignee: Olympus CorporationInventors: Tetsuya Shirota, Takashi Yoneyama, Yasuko Ishii
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Patent number: 8264768Abstract: A microscope system that is capable of changing a status of observation of a sample comprises an instruction unit for giving instruction for driving one or more optical members including an objective lens or for changing a relative position of the sample and the objective lens; and an image capturing unit for capturing an observed image of the sample as a still image or a live image. The microscope system changes an order for performing operations in accordance with the instruction from the instruction unit, the operations including an operation of driving the one or more optical members or changing the relative position; an operation of switching the illumination light for the sample from being cut-off or reduced to being applied; and an operation of switching the image displayed in a display unit from the still image to the live image.Type: GrantFiled: June 3, 2008Date of Patent: September 11, 2012Assignee: Olympus CorporationInventors: Hideyuki Kawanabe, Tetsuya Shirota, Yasuko Ishii, Takashi Yoneyama
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Publication number: 20110316999Abstract: Provided is a microscope apparatus including a macro-image, acquisition section that acquires a macro image of a glass slide having a specimen mounted thereon; an extraction section that extracts the specimen in the acquired macro image; a block setting section that sets, when the extracted specimen is scattered to form a plurality of lumps, a plurality of blocks that include the lumps of the specimen; an area dividing section that divides an area that includes the specimen in each of the blocks into a plurality of small regions; and a micro-image acquisition section that acquires, for each of the small regions, a micro image while performing an automatic focusing operation for the specimen in the small region, in which the micro-image acquisition section searches for an autofocusing in-focus position in each of the blocks set by the block setting section.Type: ApplicationFiled: June 14, 2011Publication date: December 29, 2011Applicant: Olympus CorporationInventors: Takashi Yoneyama, Chika Nakajima
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Publication number: 20110221881Abstract: It is possible to create a virtual slide of a subject of observation in a simple configuration without setting a movement pattern in advance.Type: ApplicationFiled: March 7, 2011Publication date: September 15, 2011Applicant: Olympus CorporationInventors: Tetsuya Shirota, Takashi Yoneyama, Chika Nakajima, Yasuaki Natori
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Patent number: 8014579Abstract: An observation state obtainment unit obtains an observation state of a microscope at the time of obtaining the microscopic image of a specimen obtained by using the microscope. A motion image data generation unit generates data of a motion image from the microscopic images of a time series. A correlation addition unit adds, to data of the motion image, information that correlates microscopic images constituting the motion image with an observation state of the microscope at the time of obtaining the microscopic images. A record unit records data of the motion image and an observation state of the microscope correlated with the data.Type: GrantFiled: May 10, 2007Date of Patent: September 6, 2011Assignee: Olympus CorporationInventors: Tetsuya Shirota, Takashi Yoneyama
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Patent number: 7949161Abstract: An obtainment unit obtains microscopic images in a time series obtained by picking up images of a specimen as a motion image and also obtains microscope information that is information correlated with each of the microscopic images and the information that indicates an observation state of the microscope when the microscopic image has been picked up. An image synthesis unit synthesizes individual microscopic images constituting the motion image based on position information which is included in the microscope information and which indicate positions of the specimen when the microscopic image has been picked up, thereby synthesizing a wider view image than the microscopic image.Type: GrantFiled: May 10, 2007Date of Patent: May 24, 2011Assignee: Olympus CorporationInventors: Hideyuki Kawanabe, Takashi Yoneyama, Tetsuya Shirota
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Publication number: 20110102571Abstract: The number of seams between magnified images in a created virtual slide is reduced to make the virtual slide clear and sharp. Provided is a microscope apparatus including an objective lens that collects light from a sample on a slide; a focus position detecting section that detects a focus position of the objective lens with respect to the sample; a focus state adjustment section that adjusts a focus state with respect to the sample based on a detection result from the focus position detecting section; and a magnified-image acquisition section that acquires a magnified image of each part of the sample, in which, if the focus position detected by the focus position detecting section is changed by more than a predetermined threshold with respect to a focus state in which an adjacent magnified image was obtained, the focus state adjustment section limits the adjustment in the focus state to the predetermined threshold or less.Type: ApplicationFiled: October 20, 2010Publication date: May 5, 2011Applicant: Olympus CorporationInventor: Takashi Yoneyama
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Patent number: 7929738Abstract: A microscope apparatus includes a capture unit for capturing a microscopic image of a specimen in a predetermined microscopy, a capture control unit controlling the capture unit and capturing a microscopic image about the same specimen with a plurality of predetermined resolutions, and a microscopy switch unit switching the microscopy. With the configuration, the capture control unit at least includes a first capture control unit allowing the capture unit to capture the specimen with a first resolution controlled in advance, a definition unit defining a plurality of small sections obtained by dividing a first microscopic image captured by the capture unit under control of the first capture control unit; and a second capture control unit allowing the capture unit to capture a portion corresponding to the small section of the specimen with a predetermined second resolution as a resolution higher than the first resolution.Type: GrantFiled: October 10, 2006Date of Patent: April 19, 2011Assignee: Olympus CorporationInventors: Tetsuya Shirota, Yasuko Ishii, Takashi Yoneyama
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Publication number: 20100214403Abstract: A photomicroscopy system includes a microscope unit which outputs an enlarged image of a subject as a light flux, an image capturing unit which forms an image of the light flux output by the microscope unit and converts the formed image into digital data, a sensitivity changing unit which changes a sensitivity of the image capturing unit, and a computing unit which obtains an exposure time by using the digital data captured by the image capturing unit in a state where the sensitivity is increased to the high sensitivity after instructing the sensitivity changing unit to increase the sensitivity of the image capturing unit to the high sensitivity while calculating the exposure time for obtaining a suitable brightness by the image capturing unit, and sets the sensitivity of the image capturing unit to a low sensitivity after the exposure time is set in the image capturing unit.Type: ApplicationFiled: January 4, 2010Publication date: August 26, 2010Applicant: OLYMPUS CORPORATIONInventors: Hitoshi UEDA, Takashi Yoneyama, Yasuko Ishii
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Patent number: 7756357Abstract: A host system defines a plurality of partial areas for a observation object which is a sample, obtains a partial image of an observation object in the partial area captured using a TV camera at the interval of the depth of focus of an objective lens in the depth-of-focus direction of the objective lens, generates from the partial images a focused partial image in which an object contained in the partial area is represented in a focusing state regardless of the difference in a position in the depth-of-focus direction, and generates and displays a focused image of an observation object by combining focused partial images generated in the respective partial area.Type: GrantFiled: June 17, 2004Date of Patent: July 13, 2010Assignee: Olympus CorporationInventor: Takashi Yoneyama
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Patent number: 7706597Abstract: A defect inspection apparatus which includes a pattern image obtaining unit obtaining a pattern image of a predetermined part by causing focusing control to be performed in order to achieve focus on the predetermined part within an observation object according to set focusing control parameters, a pattern image storing unit storing the pattern image, and a detecting unit detecting the presence/absence of an abnormal condition of a part to be inspected by making a comparison between the pattern image of a reference part within the observation object, and the pattern image of the part to be inspected within the observation object. The focusing control parameters, set when the pattern image of the part to be inspected is obtained, are determined based on sample information obtained when the pattern image of the reference part is obtained.Type: GrantFiled: February 6, 2004Date of Patent: April 27, 2010Assignee: Olympus CorporationInventors: Takashi Yoneyama, Eriko Tsuji