Abstract: A defect inspection apparatus which includes a pattern image obtaining unit obtaining a pattern image of a predetermined part by causing focusing control to be performed in order to achieve focus on the predetermined part within an observation object according to set focusing control parameters, a pattern image storing unit storing the pattern image, and a detecting unit detecting the presence/absence of an abnormal condition of a part to be inspected by making a comparison between the pattern image of a reference part within the observation object, and the pattern image of the part to be inspected within the observation object. The focusing control parameters, set when the pattern image of the part to be inspected is obtained, are determined based on sample information obtained when the pattern image of the reference part is obtained.

Abstract: A focus detection device which is applied to a fluorescent observation device for observing a fluorescent image to be emitted from an observation sample on the basis of an evanescent light, includes an image pickup unit which detects a contrast of the fluorescent image by imaging the fluorescent image, and a detector which detects a focus on the basis of the detection result.

Abstract: A microscope system which is capable of changing observation states by driving various optical members and which includes a history record unit for recording history data related to a microscope operation history, a selection unit for selecting one or more microscope operation items from among a plurality of microscope operation items, and a state reproduction unit for reproducing a microscope state on the basis of a microscope operation item(s) selected by the selection unit and on the basis of a microscope operation history related to history data recorded in the history record unit.

Abstract: A microscope system that is capable of changing a status of observation of a sample comprises an instruction unit for giving instruction for driving one or more optical members including an objective lens or for changing a relative position of the sample and the objective lens; and an image capturing unit for capturing an observed image of the sample as a still image or a live image. The microscope system changes an order for performing operations in accordance with the instruction from the instruction unit, the operations including an operation of driving the one or more optical members or changing the relative position; an operation of switching the illumination light for the sample from being cut-off or reduced to being applied; and an operation of switching the image displayed in a display unit from the still image to the live image.

Abstract: A microscope system has a stage on which an observation sample, including an observation object and a transparent member, is to be placed. An objective lens is placed to face the observation sample placed on the stage, and a focusing unit moves at least one of the stage and the objective lens to perform a focusing operation. An autofocus unit controls a focusing driving unit by a so-called Through-the-Lens: TTL system. After autofocus is performed for the transparent member by the autofocus unit, the focusing driving unit makes at least one of the stage and the objective lens move by a predetermined constant amount.

Abstract: A focus detection device which is applied to a fluorescent observation device for observing a fluorescent image to be emitted from an observation sample on the basis of an evanescent light, includes an image pickup unit which detects a contrast of the fluorescent image by imaging the fluorescent image, and a detector which detects a focus on the basis of the detection result.

Abstract: A microscope system has a stage on which an observation sample, including an observation object and a transparent member, is to be placed. An objective lens is placed to face the observation sample placed on the stage, and a focusing unit moves at least one of the stage and the objective lens to perform a focusing operation. An autofocus unit controls a focusing driving unit by a so-called Through-the-Lens: TTL system. After autofocus is performed for the transparent member by the autofocus unit, the focusing driving unit makes at least one of the stage and the objective lens move by a predetermined constant amount.

Abstract: A microscope system has a stage on which an observation sample, including an observation object and a transparent member, is to be placed. An objective lens is placed to face the observation sample placed on the stage, and a focusing unit moves at least one of the stage and the objective lens to perform a focusing operation. An autofocus unit controls a focusing driving unit by a so-called Through-the-Lens: TTL system. After autofocus is performed for the transparent member by the autofocus unit, the focusing driving unit makes at least one of the stage and the objective lens move by a predetermined constant amount.

Abstract: Provided is a microscope having an immersion objective lens, a nozzle, and a liquid supplying mechanism. The immersion objective lens condenses light from a sample through liquid. The nozzle supplies the liquid to an upper surface of the immersion objective lens. The liquid supplying mechanism cooperates with one of a lens moving mechanism that moves the immersion objective lens and a sample moving mechanism that maintains and moves the sample, and moves the nozzle relative to the immersion objective lens to supply the liquid.

Abstract: An observation state obtainment unit obtains an observation state of a microscope at the time of obtaining the microscopic image of a specimen obtained by using the microscope. A motion image data generation unit generates data of a motion image from the microscopic images of a time series. A correlation addition unit adds, to data of the motion image, information that correlates microscopic images constituting the motion image with an observation state of the microscope at the time of obtaining the microscopic images. A record unit records data of the motion image and an observation state of the microscope correlated with the data.

Abstract: An obtainment unit obtains microscopic images in a time series obtained by picking up images of a specimen as a motion image and also obtains microscope information that is information correlated with each of the microscopic images and the information that indicates an observation state of the microscope when the microscopic image has been picked up. An image synthesis unit synthesizes individual microscopic images constituting the motion image based on position information which is included in the microscope information and which indicate positions of the specimen when the microscopic image has been picked up, thereby synthesizing a wider view image than the microscopic image.

Abstract: A focus detection device which is applied to a fluorescent observation device for observing a fluorescent image to be emitted from an observation sample on the basis of an evanescent light, includes an image pickup unit which detects a contrast of the fluorescent image by imaging the fluorescent image, and a detector which detects a focus on the basis of the detection result.

Abstract: A microscope apparatus includes a capture unit for capturing a microscopic image of a specimen in a predetermined microscopy, a capture control unit controlling the capture unit and capturing a microscopic image about the same specimen with a plurality of predetermined resolutions, and a microscopy switch unit switching the microscopy. With the configuration, the capture control unit at least includes a first capture control unit allowing the capture unit to capture the specimen with a first resolution controlled in advance, a definition unit defining a plurality of small sections obtained by dividing a first microscopic image captured by the capture unit under control of the first capture control unit; and a second capture control unit allowing the capture unit to capture a portion corresponding to the small section of the specimen with a predetermined second resolution as a resolution higher than the first resolution.

Abstract: An object of the invention is to provide a process for industrially producing fluorinated dicyanobenzenes using tetrachlorodicyanobenzene as a raw material. According to the present invention, fluorinated dicyanobenzene can be produced in a high yield by allowing tetrachlorodicyanobenzenes to react with a fluorinating agent in the presence of a non-protonic polar solvent in an amount of 0.1 to 3 times by mass based on the tetrachlorodicyanobenzene. Further, the above production can be conducted more efficiently by reacting while disintegrating or removing bulk solid matters.

Abstract: Provided is a microscope having an immersion objective lens, a nozzle, and a liquid supplying mechanism. The immersion objective lens condenses light from a sample through liquid. The nozzle supplies the liquid to an upper surface of the immersion objective lens. The liquid supplying mechanism cooperates with one of a lens moving mechanism that moves the immersion objective lens and a sample moving mechanism that maintains and moves the sample, and moves the nozzle relative to the immersion objective lens to supply the liquid.

Abstract: There is provided a packaging material for a photographic light-sensitive material, the packaging material being formed from a resin composition that contains a compound having an unsaturated double bond or that contains a poly(conjugated diene) component, a metal ion that can promote a catalytic oxidation reaction of the unsaturated double bond and the poly(conjugated diene), and a chelating agent that can coordinate the metal ion in an amount sufficient to suppress the catalytic oxidation reaction. There is also provided a photographic light-sensitive material package formed by housing the photographic light-sensitive material in the packaging material for the photographic light-sensitive material.

Abstract: A focus detection device which is applied to a fluorescent observation device for observing a fluorescent image to be emitted from an observation sample on the basis of an evanescent light, includes an image pickup unit which detects a contrast of the fluorescent image by imaging the fluorescent image, and a detector which detects a focus on the basis of the detection result.

Abstract: In a microscope system in which at least one of a stage on which a sample 4 is mounted and an objective lens 6 can move relatively in a direction of an optical axis, a contact judgment section 12 judges the possibility of contact between the sample 4 and the objective lens 6 based on a result of comparison between a detection output from a contact sensor 11 which detects contact between the sample 4 and the objective lens 6 and a preset threshold value, excessive contact between the sample 4 and the objective lens 6 is avoided based on a result of this judgment, and a threshold value in the contact judgment section 12 is updated based on the output from the contact sensor 11 every predetermined time.

Abstract: A defect inspection apparatus comprises a pattern image obtaining unit obtaining a pattern image of a predetermined part by causing focusing control to be performed in order to achieve focus on the predetermined part within an observation object according to set focusing control parameters, a pattern image storing unit storing the pattern image, and a detecting unit detecting the presence/absence of an abnormal condition of a part to be inspected by making a comparison between the pattern image of a reference part within the observation object, and the pattern image of the part to be inspected within the observation object. The focusing control parameters set when the pattern image of the part to be inspected is obtained are determined based on sample information obtained when the pattern image of the reference part is obtained.