Patents by Inventor Tetsuya Matsui

Tetsuya Matsui has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8681328
    Abstract: By including an illumination system and a detection system, an information collecting function of monitoring an environment, such as temperature and atmospheric pressure, and an apparatus state managing function having a feedback function of comparing the monitoring result and a design value, a theoretical calculation value or an ideal value derived from simulation results and calibrating an apparatus so that the monitoring result is brought close to the ideal value, a unit for keeping the apparatus state and apparatus sensitivity constant is provided. A control unit 800 is configured to include a recording unit 801, a comparing unit 802, a sensitivity predicting unit 803, and a feedback control unit 804. In the comparing unit 802, the monitoring result transmitted from the recording unit 801 and an ideal value stored in a database 805 are compared with each other.
    Type: Grant
    Filed: January 20, 2010
    Date of Patent: March 25, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Atsushi Taniguchi, Taketo Ueno, Yukihiro Shibata, Shunji Maeda, Tetsuya Matsui
  • Patent number: 8621659
    Abstract: In a method of manufacturing this cantilever for the magnetic force microscope, a magnetic film is formed on a probe at a tip of the cantilever for the magnetic force microscope. When a non-magnetic rigid protective film is formed around the probe, the film is formed from the front of the probe of the cantilever for the magnetic force microscope at an angle (15° to 45°) and from the back of the probe of the cantilever for the magnetic force microscope in two directions each at an angle in a range of (15° to 30°).
    Type: Grant
    Filed: May 3, 2012
    Date of Patent: December 31, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kaifeng Zhang, Takenori Hirose, Masahiro Watanabe, Tetsuya Matsui, Tsuneo Nakagomi, Teruaki Tokutomi
  • Publication number: 20130160552
    Abstract: It is intended to provide an internal defect inspection method and an apparatus for implementing the method by which an ultrasonic wave is excited in a sample without contact with the sample and accordingly without damaging the sample, and an ultrasonic wave from any internal defect of the sample is detected without being affected by the sample surface, in a non-contact state and with high sensitivity. By the internal defect inspection method, an ultrasonic wave is emitted from an ultrasonic wave transmitter toward a sample, an ultrasonic wave reflected by the sample is detected as an interference signal with an imaging type common-path interferometer, an ultrasonic wave signal is obtained from the interference signal, and any defect within the sample is detected from the ultrasonic wave signal.
    Type: Application
    Filed: June 1, 2011
    Publication date: June 27, 2013
    Applicant: Hitachi, Ltd.
    Inventors: Toshihiko Nakata, Tetsuya Matsui, Takehiro Tachizaki, Kazushi Yoshimura, Masahiro Watanabe
  • Publication number: 20130003038
    Abstract: Disclosed is a distance measuring device using an optical comb. In order for the absolute distance to an object to be measured which has a surface with low reflection ratio or a scattering surface and is approximately 10 m apart, to be easily measured with accuracy of 0.1 mm or more using an optical and contactless method, the distance measuring device which measures the distance to the object to be measured is configured such that the distance to the object to be measured is measured by comparing the phase of the beat signal between a light source and a plurality of CW lasers which are reflected or scattered by the object with the phase of the beat signal between the light source and a plurality of CW lasers prior to being irradiated onto the object.
    Type: Application
    Filed: January 28, 2011
    Publication date: January 3, 2013
    Applicant: Hitachi, Ltd.
    Inventors: Takehiro Tachizaki, Masahiro Watanabe, Tatsuo Hariyama, Yasuhiro Yoshitake, Tetsuya Matsui, Hirokazu Matsumoto, Kiyoshi Takamasu
  • Publication number: 20120291161
    Abstract: In a method of manufacturing this cantilever for the magnetic force microscope, a magnetic film is formed on a probe at a tip of the cantilever for the magnetic force microscope. When a non-magnetic rigid protective film is formed around the probe, the film is formed from the front of the probe of the cantilever for the magnetic force microscope at an angle (15° to 45°) and from the back of the probe of the cantilever for the magnetic force microscope in two directions each at an angle in a range of (15° to 30°).
    Type: Application
    Filed: May 3, 2012
    Publication date: November 15, 2012
    Inventors: Kaifeng ZHANG, Takenori Hirose, Masahiro Watanabe, Tetsuya Matsui, Tsuneo Nakagomi, Teruaki Tokutomi
  • Publication number: 20110286001
    Abstract: By including an illumination system and a detection system, an information collecting function of monitoring an environment, such as temperature and atmospheric pressure, and an apparatus state managing function having a feedback function of comparing the monitoring result and a design value, a theoretical calculation value or an ideal value derived from simulation results and calibrating an apparatus so that the monitoring result is brought close to the ideal value, a unit for keeping the apparatus state and apparatus sensitivity constant is provided. A control unit 800 is configured to include a recording unit 801, a comparing unit 802, a sensitivity predicting unit 803, and a feedback control unit 804. In the comparing unit 802, the monitoring result transmitted from the recording unit 801 and an ideal value stored in a database 805 are compared with each other.
    Type: Application
    Filed: January 20, 2010
    Publication date: November 24, 2011
    Inventors: Atsushi Taniguchi, Taketo Ueno, Yukihiro Shibata, Shunji Maeda, Tetsuya Matsui
  • Patent number: 7884924
    Abstract: A residual stress measuring method capable of measuring residual stress of the surface of an object to be inspected rapidly in a non-destructive non-contact manner, as well as a residual stress measuring system having such characteristics and being high in portability, are provided. The residual stress measuring system comprises a heating laser for heating an inspection area of an object to be inspected, a laser interferometer for irradiating the inspection area interferometric with laser light and measuring a deformation quantity within an elastic deformation range upon stress relief by heating in accordance with a laser interferometric method, and a data processor for measuring residual stress from the deformation quantity within the elastic deformation range upon stress relief of the object to be inspected.
    Type: Grant
    Filed: November 6, 2007
    Date of Patent: February 8, 2011
    Assignee: Hitachi, Ltd.
    Inventors: Shohei Numata, Atsushi Baba, Tetsuya Matsui
  • Patent number: 7872472
    Abstract: An eddy current testing method for a turbine rotor including a disc, a plurality of turbine blades disposed along the periphery of the disc, and a plurality of pins for joining a blade fork portion formed on each of the plurality of turbine blades to a disc fork portion formed on the disc, the method including inserting a probe having an eddy current testing sensor into a hole formed through the disc fork portion and the blade fork portion by pulling out one of the plurality of pins in a state that the blade fork portion is still inserted into the disc fork portion; and performing eddy current testing for at least part of an internal surface of the hole by using the probe.
    Type: Grant
    Filed: December 9, 2009
    Date of Patent: January 18, 2011
    Assignees: Hitachi, Ltd., Hitachi Engineering & Services Co., Ltd.
    Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
  • Patent number: 7841237
    Abstract: An ultrasonic testing apparatus for a turbine fork of a turbine blade joined to a turbine disc, comprising: an ultrasonic testing sensor; a sensor mounting apparatus for mounting the ultrasonic testing sensor on a flat portion on a side surface of the turbine fork with the turbine blade joined to the turbine disc; and an ultrasonic testing apparatus for inspecting internal and external surfaces of the turbine fork by using reflected waves, which is received by the ultrasonic testing sensor, from the internal surface of the turbine fork.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: November 30, 2010
    Assignees: Hitachi, Ltd., Hitachi Engineering & Services Co., Ltd.
    Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
  • Patent number: 7772840
    Abstract: The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.
    Type: Grant
    Filed: December 9, 2009
    Date of Patent: August 10, 2010
    Assignees: Hitachi, Ltd., Hitachi Engineering & Services Co., Ltd.
    Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
  • Publication number: 20100085043
    Abstract: The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.
    Type: Application
    Filed: December 9, 2009
    Publication date: April 8, 2010
    Applicants: HITACHI, LTD., HITACHI ENGINEERING & SERVICES CO., LTD.
    Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
  • Publication number: 20100085042
    Abstract: The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.
    Type: Application
    Filed: December 9, 2009
    Publication date: April 8, 2010
    Applicants: HITACHI, LTD., HITACHI ENGINEERING & SERVICES CO., LTD.
    Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
  • Patent number: 7536239
    Abstract: A chemical substance total management system aids for reduction of release and transferring amount of managing substances in business entities. The system retrieves releasing and transferring amount record relating to predetermined managing substance on the basis of total tabulation link information with correlation between the tabulation result record managing releasing and transferring amount of managing substance per releasing and transferring destination and releasing and transferring amount record to be a source generating tabulation result record.
    Type: Grant
    Filed: September 14, 2007
    Date of Patent: May 19, 2009
    Assignee: Hitachi, Ltd.
    Inventors: Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Tetsuya Matsui, Kiyomi Funabashi
  • Publication number: 20090120192
    Abstract: An ultrasonic testing apparatus for a turbine fork of a turbine blade joined to a turbine disc, comprising: an ultrasonic testing sensor; a sensor mounting apparatus for mounting the ultrasonic testing sensor on a flat portion on a side surface of the turbine fork with the turbine blade joined to the turbine disc; and an ultrasonic testing apparatus for inspecting internal and external surfaces of the turbine fork by using reflected waves, which is received by the ultrasonic testing sensor, from the internal surface of the turbine fork.
    Type: Application
    Filed: September 27, 2007
    Publication date: May 14, 2009
    Inventors: Yutaka SUZUKI, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
  • Patent number: 7532946
    Abstract: A chemical substance total management system aids for reduction of release and transferring amount of managing substances in business entities. The system retrieves releasing and transferring amount record relating to predetermined managing substance on the basis of total tabulation link information with correlation between the tabulation result record managing releasing and transferring amount of managing substance per releasing and transferring destination and releasing and transferring amount record to be a source generating tabulation result record.
    Type: Grant
    Filed: September 14, 2007
    Date of Patent: May 12, 2009
    Assignee: Hitachi, Ltd.
    Inventors: Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Tetsuya Matsui, Kiyomi Funabashi
  • Patent number: 7433757
    Abstract: A chemical substance total management system aids for reduction of release and transferring amount of managing substances in business entities. The system retrieves releasing and transferring amount record relating to predetermined managing substance on the basis of total tabulation link information with correlation between the tabulation result record managing releasing and transferring amount of managing substance per releasing and transferring destination and releasing and transferring amount record to be a source generating tabulation result record.
    Type: Grant
    Filed: September 14, 2007
    Date of Patent: October 7, 2008
    Assignee: Hitachi, Ltd.
    Inventors: Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Tetsuya Matsui, Kiyomi Funabashi
  • Publication number: 20080123079
    Abstract: A residual stress measuring method capable of measuring residual stress of the surface of an object to be inspected rapidly in a non-destructive non-contact manner, as well as a residual stress measuring system having such characteristics and being high in portability, are provided. The residual stress measuring system comprises a heating laser for heating an inspection area of an object to be inspected, a laser interferometer for irradiating the inspection area interferometric with laser light and measuring a deformation quantity within an elastic deformation range upon stress relief by heating in accordance with a laser interferometric method, and a data processor for measuring residual stress from the deformation quantity within the elastic deformation range upon stress relief of the object to be inspected.
    Type: Application
    Filed: November 6, 2007
    Publication date: May 29, 2008
    Inventors: Shohei NUMATA, Atsushi Baba, Tetsuya Matsui
  • Publication number: 20080079426
    Abstract: The eddy current testing apparatus includes a probe having an eddy current testing sensor including a pair of eddy current testing coils. The apparatus also includes an eddy current testing flaw detector inputting detection signals from the eddy current testing sensor. The diameter of a magnetic core used in each of the pair of eddy current testing coils is within the range of 0.1 mm to 0.5 mm.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 3, 2008
    Inventors: Yutaka Suzuki, Masahiro Koike, Tetsuya Matsui, Kojirou Kodaira, Katsumi Isaka, Mitsuru Odakura, Kenji Tayama, Kazuhiro Suzuki, Kenji Kumasaka, Yuuji Adachi
  • Publication number: 20080040148
    Abstract: A chemical substance total management system aids for reduction of release and transferring amount of managing substances in business entities. The system retrieves releasing and transferring amount record relating to predetermined managing substance on the basis of total tabulation link information with correlation between the tabulation result record managing releasing and transferring amount of managing substance per releasing and transferring destination and releasing and transferring amount record to be a source generating tabulation result record.
    Type: Application
    Filed: September 14, 2007
    Publication date: February 14, 2008
    Inventors: Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Tetsuya Matsui, Kiyomi Funabashi
  • Publication number: 20080015732
    Abstract: A chemical substance total management system aids for reduction of release and transferring amount of managing substances in business entities. The system retrieves releasing and transferring amount record relating to predetermined managing substance on the basis of total tabulation link information with correlation between the tabulation result record managing releasing and transferring amount of managing substance per releasing and transferring destination and releasing and transferring amount record to be a source generating tabulation result record.
    Type: Application
    Filed: September 14, 2007
    Publication date: January 17, 2008
    Inventors: Yoshiaki Ichikawa, Takako Oono, Akira Sekine, Tetsuya Matsui, Kiyomi Funabashi