Abstract: A leak test apparatus includes a housing having an interior sized for retaining a plurality of instrument components including a control unit. A sniffer gun is linked to the instrument components, the sniffer gun having an intake point, and a test leak includes a gas reservoir, a constriction, an opening suited for introducing the intake point of said sniffer gun, and a temperature sensor. The temperature sensor is linked, either by means of a wired connection or wirelessly to the control unit for signal transfer.

Abstract: A leak detecting device includes a carrying device attached to a holder to be fastened to the body of an operator. From the carrying device, a flexible capillary line extends to a sniffing probe, which includes a gas inlet at its front end. The carrying device is connected with a basic device that includes a vacuum pump. In the carrying device, a test gas detector is arranged. The relatively short capillary line allows for a rapid response of the gas analyzer. The sniffing probe is of small and light-weight configuration such that it can be handled over a longer period without causing fatigue.

Abstract: A leak detecting device of the counterflow type includes a high vacuum pump having an inlet connected to a mass spectrometer. In addition, a prevacuum pump is provided having an inlet connected to an outlet of the high vacuum pump and a leak detecting device input. A connecting conduit is further provided between the leak detecting device input and an intermediate inlet of the high vacuum pump. A first valve of variable conductance is arranged in the course of the connecting conduit. Valves with a large inner diameter are expensive while valves with a small inner diameter show considerable resistance even in a fully opened state. A second valve arranged parallel to the first adjustable valve is provided in the course of the connecting conduit; thereby allowing the first and second valves to have relatively small inner diameters arranged in the connecting conduit, wherein the combined conductance of both opened valves is considerably increased.

Abstract: A leak test apparatus includes a housing having an interior sized for retaining a plurality of instrument components including a control unit. A sniffer gun is linked to the instrument components, the sniffer gun having an intake point, and a test leak includes a gas reservoir, a constriction, an opening suited for introducing the intake point of said sniffer gun, and a temperature sensor. The temperature sensor is linked, either by means of a wired connection or wirelessly to the control unit for signal transfer.

Abstract: A sniffing leak detector includes a handpiece, supporting a sniffing tip, the detector further including a gas sensor. To promote longer life and obtaining more accurate results, the leak detector is equipped with an acceleration sensor for recording the movements of the handpiece.

Abstract: A leak detecting device of the counterflow type includes a high vacuum pump having an inlet connected to a mass spectrometer. In addition, a prevacuum pump is provided having an inlet connected to an outlet of the high vacuum pump and a leak detecting device input. A connecting conduit is further provided between the leak detecting device input and an intermediate inlet of the high vacuum pump. A first valve of variable conductance is arranged in the course of the connecting conduit. Valves with a large inner diameter are expensive while valves with a small inner diameter show considerable resistance even in a fully opened state. A second valve arranged parallel to the first adjustable valve is provided in the course of the connecting conduit; thereby allowing the first and second valves to have relatively small inner diameters arranged in the connecting conduit, wherein the combined conductance of both opened valves is considerably increased.

Abstract: A semiconductor memory device has a particularly space-saving configuration of the memory areas and, in particular, of the selection devices assigned to the memory areas. During operation, each selection device can be assigned in a controllable manner to a plurality of memory areas such that selectively each of the selection devices can carry out an addressing and selection in one of the assigned memory areas.

Abstract: A leak detector operating according to the counterflow principle comprises a first high vacuum pump that operates in series with a primary pump. A second high vacuum pump is branched at a connecting point and an entry side thereof is connected to a mass spectrometer. A light test gas in the form of helium flows through the second high vacuum pump in a direction opposite to a transport direction. A conduit connecting an inlet to the entry side of the first high vacuum pump is devoid of restricted flow zones and valves in such a way that the pumping capacity of the leak detector is high for helium, thereby reducing the response time thereof. A valve for blocking the conduit leading via the first high vacuum pump is arranged between the exit side thereof and the entry side of the primary pump.

Abstract: A leak indicator including a housing that houses components of the indicator as well as a test leak, and test leaks that are suitable for integration into a leak indicator.

Abstract: A test gas leakage detector includes an inlet for gases to be analyzed for the presence of a test gas, a test gas detector and a first high vacuum pump connected to the test gas detector. An intermediate inlet is arranged on the first high vacuum pump that is used to supply the gases to be analyzed for the presence of a test gas. A fore-vacuum pump is connected to the first high vacuum pump and a line section fitted with a valve is located between the inlet and the fore-vacuum pump. In order to provide greater sensitivity and a quicker result time, a second high vacuum pump is provided between the inlet and the intermediate inlet. The second high vacuum pump has an outlet which is connected to the inlet of the fore-vacuum pump by means of a line section fitted with a valve.

Abstract: Molding compositions made from a high-molecular-weight propylene polymer with a melt mass-flow rate MFR of from 0.3 to 1 g/10 min, to ISO 1133 at 230° C. and 5 kg, and with a proportion of ? modification crystallites in the range from 2 to 20% by weight. The molding compositions of the invention preferably comprise a quinacridone pigment as nucleating agent. The high-molecular-weight propylene polymer used preferably comprises a high-molecular-weight propylene copolymer with up to 30% by weight of other copolymerized olefins having up to 10 carbon atoms. One of the uses of the molding compositions of the invention is as materials for pipes.

Abstract: A leak detector includes an inlet, a high-vacuum pump, and a test gas detector, which is connected to the entry of the high-vacuum pump. A backing pump is connected to an outlet area of the high-vacuum pump, and a test gas line extends between the inlet of the leak detector and the backing pump, the test gas line being connected to the outlet area of the high-vacuum pump via a line section. In order to shorten the response time of the leak detector, the line and the backing pump are connected via separate connections to the outlet area of the high-vacuum pump.

Abstract: The invention relates to a test gas leakage detector (1), comprising an inlet (2) for gases to be analyzed for the presence of a test gas, a test gas detector (22), a high vacuum pump system (15) connected to the test gas detector, an intermediate inlet (14) arranged on the high vacuum pump system (15) and used to supply the gases to be analyzed for the presence of a test gas, a fore-vacuum pump (8) connected to high vacuum pump system (15) and a line section (3, 6) fitted with a valve (5) and located between the inlet (2) and the fore-vacuum pump (8). In order to provide a device of the above-mentioned category which is quicker and more sensitive, another high vacuum pump (11) is provided between the inlet (2) and the intermediate inlet (14), having an outlet (12) which is connected to the inlet (7) of the fore-vacuum pump (8) by means of a line section fitted with a valve (17).

Abstract: The invention relates to an MRAM configuration that includes a selection transistor connected to several MTJ memory cells. The selection transistor has an increased channel width.

Abstract: The invention relates to a sniffing leak detector (1) comprising a handpiece (2), supporting a sniffing tip (5) and with a gas sensor (11). According to the invention, a longer life and more accurate results may be achieved, whereby the leak detector is equipped with an acceleration sensor (16) for recording the movements of the handpiece (2).

Abstract: The invention relates to a leak indicator (1) comprising a housing (2) which houses components (3 to 6) of the indicator and a test leak (20), and to test leaks (20) that are suitable for integration into a leak indicator of the above-described kind.

Abstract: The invention relates to an MRAM configuration that includes a selection transistor connected to several MTJ memory cells. The selection transistor has an increased channel width.

Abstract: The invention relates to an infrared gas analyser (1), especially for use as a gas detector for leak detection using a sampling probe. Said gas analyser comprises a vessel (test vessel 2), through which a test gas flows, and an infrared light source (4, 5, 42) which produces an infrared light that shines through the test vessel (2). The analyser further encompasses a detector (35) that facilitates measurement of the infrared light absorption in the test gas. The aim of the invention is to provide at low costs an analyser that is apt for every day use. To this end, a reference vessel (3) through which a reference gas flows is provided in addition to the test vessel (2) through which the test gas flows. A reference gas is sucked from the environment of the test gas suction area. The same or an additional light source (4, 5, 42) and the same detector (35) are allocated to said reference vessel.

Abstract: A digital circuit configuration includes a memory matrix having M rows and N columns and P<M additional rows and Q<N additional columns, and an addressing device whose address connection contacts are sufficient precisely for addressing the M rows and N columns. To address the additional rows and columns as well, particularly, for test purposes, only a single control bit connection contact is provided with a changeover device responding to control bits from the control bit connection contact and from dedicated address connection contacts to associate applied address bits either with addressing of the M rows and N columns or the additional rows and columns. The numbers P and Q are chosen such that the addressing of P elements requires at least two bits fewer than the addressing of M elements, and such that the addressing of Q elements requires at least two bits fewer than the addressing of N elements.

Abstract: Method for producing non-grain-oriented electric sheet comprising: introducing steel input stock as a heated and prerolled slab into finishing rolls at a temperature of ≦1100° C. wherein the reheating temperature (TBR) corresponds to a reheating target temperature (TZBR) determined by the formula: TZBR(° C.)=1195° C.+12.716*(GSi+GAl) wherein TZBR(° C.)=target temperature of the reheated slab GSi=Si content in weight % GAl=Al content in weight % hot rolling to a thickness<3.5 mm at a final rolling temperature (TET)≧770° C. coiling at a temperature (THT) wherein THT(° C.)=154−1.8&agr;t+0.577 TET+111d/d0 wherein d0=reference thickness of the strip=3 mm d=actual thickness of the strip in mm t=time in seconds between the end of hot rolling and coiling &agr;=0.7/sec. to 1.3/sec. cooling factor pickling and cold rolling to a thickness of 0.2-1 mm.