Abstract: Over time, the number of write cycles required to successfully program a multi-level cell (MLC) is reduced. Since a hard-coded value does not change over the lifetime of the device, the device may perform too many verify steps at one stage of the device lifetime and wait too long to begin verification at another stage of the device lifetime, reducing performance of the device. As discussed herein, verification for higher voltage level programming is delayed until verification for lower voltage level programming reaches at least a threshold level of success instead of using a hard-coded number of verify steps to skip. As a result, the performance drawbacks associated with skipping a hard-coded number of verify cycles may not occur.

Abstract: Memory devices might include a plurality of memory cell pairs each configured to be programmed to store a digit of data; and control circuitry configured to cause the memory device to compare the stored digit of data of each memory cell pair to a received digit of data, determine whether a match condition or a no-match condition is indicated between the stored digit of data of each memory cell pair and the received digit of data, and deem a match condition to be met between the received digit of data and the stored digits of data of the plurality of memory cell pairs in response to a match condition being determined for a majority of memory cell pairs of the plurality of memory cell pairs.

Abstract: Memories having a controller configured, during a pre-charge portion of a read operation, to apply a sequence of increasing voltage levels concurrently to each access line of a plurality of access lines, wherein each voltage level of the sequence of increasing voltage levels is higher than any previous voltage level of the sequence of increasing voltage levels and lower than any subsequent voltage level of the sequence of increasing voltage levels, and determine a particular voltage level of the sequence of increasing voltage levels corresponding to a point at which all memory cells of the plurality of strings of series-connected memory cells are first deemed to be activated while applying the sequence of increasing voltage levels.

Abstract: Memory systems and memory control methods are described.

Abstract: Over time, the number of write cycles required to successfully program a multi-level cell (MLC) is reduced. Since a hard-coded value does not change over the lifetime of the device, the device may perform too many verify steps at one stage of the device lifetime and wait too long to begin verification at another stage of the device lifetime, reducing performance of the device. As discussed herein, verification for higher voltage level programming is delayed until verification for lower voltage level programming reaches at least a threshold level of success instead of using a hard-coded number of verify steps to skip. As a result, the performance drawbacks associated with skipping a hard-coded number of verify cycles may not occur.

Abstract: Memory devices might include control circuitry that, when checking for a match of a stored digit of data and a received digit of data, might be configured to cause the memory device to apply a first voltage level to a control gate of a first memory cell of a memory cell pair, apply a second voltage level different than the first voltage level to a control gate of a second memory cell of that memory cell pair, determine whether that memory cell pair is deemed to be activated or deactivated in response to applying the first and second voltage levels, and deem a match between the stored digit of data and a received digit of data in response, in part, to whether that memory cell pair is deemed to be deactivated.

Abstract: Memory having a controller configured to cause the memory to determine a respective raw data value of a plurality of possible raw data values for each memory cell of a plurality of memory cells, count occurrences of each raw data value for a first set of memory cells of the plurality of memory cells, store a cumulative number of occurrences for each raw data value, determine a plurality of valleys of the stored cumulative number of occurrences for each raw data value with each valley corresponding to a respective raw data value of the plurality of possible raw data values, and, for each memory cell of a second set of memory cells of the plurality of memory cells, determine a data value for that memory cell in response to the raw data value for that memory cell and the respective raw data values of the plurality of valleys.

Abstract: Memory systems and memory control methods are described.

Abstract: Memories might include a plurality of strings of memory cells, a plurality of access lines each connected to the strings of memory cells, and a controller configured to cause the memory to determine a particular voltage level applied to each of the access lines that is deemed to activate each memory cell of a first subset of the strings of series-connected memory cells programmed to store respective data states that are each lower than or equal to a first data state of a plurality of data states, apply the particular voltage level to a particular access line of the plurality of access lines, and for each memory cell connected to the particular access line that is contained in a second subset of the strings of series-connected memory cells, determine whether that memory cell is deemed to be activated while applying the particular voltage level to the particular access line.

Abstract: Memory having a controller configured to cause the memory to determine a plurality of activation voltage levels for the plurality of memory cells, determine a plurality of activation voltage level distributions based on a subset of the plurality of activation voltage levels with each of the activation voltage level distributions corresponding to a respective first subset of memory cells of a plurality of first subsets of memory cells of the plurality of memory cells, determine a plurality of transition voltage levels based on the plurality of activation voltage level distributions, and assign a respective data state of a plurality of data states to each memory cell of a second subset of memory cells of the plurality of memory cells based on the determined activation voltage of that memory cell and the determined plurality of transition voltage levels.

Abstract: Memory having an array of memory cells and configured to store a first value representative of a characteristic sensed from a first data line, store a second value representative of the characteristic sensed from a second data line, perform an operation on the first value and the data value at a first logic circuitry, and perform an operation on an output of the first logic circuitry and a threshold data value at a second logic circuitry.

Abstract: Memory devices might include control circuitry that, when checking for a match of a stored digit of data and a received digit of data, might be configured to cause the memory device to apply a first voltage level to a control gate of a first memory cell of a memory cell pair, apply a second voltage level different than the first voltage level to a control gate of a second memory cell of that memory cell pair, determine whether that memory cell pair is deemed to be activated or deactivated in response to applying the first and second voltage levels, and deem a match between the stored digit of data and a received digit of data in response, in part, to whether that memory cell pair is deemed to be deactivated.

Abstract: Memory might include a plurality of strings of memory cells, a plurality of access lines each connected to the strings of memory cells, and a controller configured to cause the memory to increase a voltage level applied to each of the access lines, determine a particular voltage level at which each memory cell of a first set of strings of memory cells is deemed to be activated while increasing the voltage level applied to the access lines, decrease the voltage level applied to a particular access line without decreasing the voltage level applied to each remaining access line, and, for each memory cell connected to the particular access line and contained in a second set of strings of memory cells, determine whether that memory cell is deemed to be activated while applying the particular voltage level to the particular access line.

Abstract: Memories having a controller configured, during a pre-charge portion of a read operation, to apply a sequence of increasing voltage levels concurrently to each access line of a plurality of access lines, wherein each voltage level of the sequence of increasing voltage levels is higher than any previous voltage level of the sequence of increasing voltage levels and lower than any subsequent voltage level of the sequence of increasing voltage levels, and determine a particular voltage level of the sequence of increasing voltage levels corresponding to a point at which all memory cells of the plurality of strings of series-connected memory cells are first deemed to be activated while applying the sequence of increasing voltage levels.

Abstract: A memory device might include control circuitry configured to cause the memory device to compare input data to data stored in memory cells connected to a data line, cause a first level of current to flow from the data line in response to a mismatch between one digit of the input data and data stored in a respective pair of memory cells, cause a second level of current to flow from the data line in response to a mismatch between a different digit of the input data and the data stored in a respective pair of memory cells, compare a representation of a level of current in the data line to a reference, and deem the input data to potentially match or not match the data stored in the plurality of memory cells in response to the comparison.

Abstract: Methods include receiving a pattern to be searched in a memory having a plurality of sets of memory elements with each set coupled to a separate data line and corresponding to a same set of bit positions of the pattern. Methods further include receiving a pattern of data to be programmed into a memory, programming a first data state into one memory cell of each cell pair of a plurality of cell pairs of a memory array, and programing a second data state into another memory cell of each cell pair of the plurality of cell pairs for each bit position of the pattern. Memory configured to facilitate such methods include a plurality of cell pairs, each cell pair of the plurality of cell pairs programmed to store a same bit of data corresponding to a particular bit position of a pattern to be searched in the memory.

Abstract: A method can include applying a first voltage to a first memory cell to activate the first memory cell, applying a second voltage to a second memory cell coupled in series with the first memory cell to activate the second memory cell so that current flows through the first and second memory cells, and generating an output responsive to the current. The first voltage and a threshold voltage of the second memory cell can be such that the current is proportional to a product of the first voltage and the threshold voltage of the second memory cell.

Abstract: Methods of operating a memory device include comparing input data to data stored in memory cells coupled to a data line, comparing a representation of a level of current in the data line to a reference, and determining that the input data potentially matches the data stored in the memory cells when the representation of the level of current in the data line is less than the reference. Methods of operating a memory device further include comparing input data to first data and to second data stored in memory cells coupled to a first data line or to a second data line, respectively, comparing representations of the levels of current in the first data line and in the second data line to a first reference and to a different second reference, and deeming one to be a closer match to the input data in response to results of the comparisons.

Abstract: Apparatus having plurality of data lines each selectively connected to a respective string of series-connected memory cells, a plurality of registers each configured to indicate a state of a respective data line, and logic configured to indicate when each data line of the plurality of data lines has a particular state might facilitate determination of a pass voltage of a read operation.

Abstract: Memory might include a plurality of strings of memory cells, a plurality of access lines each connected to the strings of memory cells, and a controller configured to cause the memory to increase a voltage level applied to each of the access lines, determine a particular voltage level at which each memory cell of a first set of strings of memory cells is deemed to be activated while increasing the voltage level applied to the access lines, decrease the voltage level applied to a particular access line without decreasing the voltage level applied to each remaining access line, and, for each memory cell connected to the particular access line and contained in a second set of strings of memory cells, determine whether that memory cell is deemed to be activated while applying the particular voltage level to the particular access line.