Patents by Inventor Toshihito Kimura

Toshihito Kimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8193516
    Abstract: A sensing apparatus includes a prism, a metal film provided on a surface of the prism, a substrate that is provided on a surface of the prism and which has formed therein a channel for supplying a sample to the metal film, a light source for issuing light, an optical unit for incident light by which the light being issued from the light source is launched into the prism at such an angle that the light is totally reflected on a boundary surface between the prism and the metal film, the optical unit for incident light including a light intensity distribution adjusting section that reduces difference between the maximum and the minimum values in the intensity distribution of the light that is launched into the prism, and a light detecting unit for detecting the light that is generated in neighborhood of the metal film.
    Type: Grant
    Filed: February 25, 2009
    Date of Patent: June 5, 2012
    Assignee: FUJIFILM Corporation
    Inventor: Toshihito Kimura
  • Patent number: 8107071
    Abstract: A molecular analysis light detection apparatus is formed by: a sample plate provided with an enhancing member which is disposed at a small predetermined area of a sample contact surface contacting with a sample containing a substance to be analyzed and which generates an enhancing field for enhancing light generated from the substance to be analyzed at the predetermined area relative to the light at other areas of the sample contact surface when predetermined excitation light is applied; an excitation-light applying optical system for applying the excitation light to an illumination area which contains the predetermined area of the sample contact surface provided with the enhancing member and which is larger than the predetermined area; and a signal detector unit for detecting fluctuation of the light, which is enhanced by the enhancing field, generated from the substance to be analyzed.
    Type: Grant
    Filed: September 24, 2008
    Date of Patent: January 31, 2012
    Assignee: Fujifilm Corporation
    Inventor: Toshihito Kimura
  • Patent number: 8102533
    Abstract: A total reflection illuminated sensor chip is employed to detect a target substance, by: supplying a sample containing the target substance onto a detecting portion formed on a surface of a dielectric prism, irradiating a measuring light beam onto the interface between the prism and the detecting portion through a transmitting surface of the prism such that conditions for total reflection are satisfied, and utilizing evanescent waves generated at the detecting portion. The sensor chip includes a protective member for protecting the transmitting surface. The protective member is provided a predetermined distance away from the transmitting surface to form a transmitting space, which is open at least toward the downward direction. The sensor chip is configured such that the interface can be irradiated by the measuring light beam that enters the transmitting space from below the transmitting space and passes through the transmitting surface.
    Type: Grant
    Filed: November 24, 2009
    Date of Patent: January 24, 2012
    Assignee: Fujifilm Corporation
    Inventor: Toshihito Kimura
  • Patent number: 8097862
    Abstract: Fluorescence detection utilizes surface plasmon. The intensity of scattered light, which is substantially proportionate to the intensity of an electric field enhancing field generated on a metal film, is employed, to normalize and correct the intensity of fluorescence emitted by fluorescent labels with respect to the intensity of the electric field enhancing field.
    Type: Grant
    Filed: March 9, 2009
    Date of Patent: January 17, 2012
    Assignee: Fujifilm Corporation
    Inventor: Toshihito Kimura
  • Patent number: 8026494
    Abstract: An excitation light beam of a wavelength that excites fluorescent labels and a reference light beam having a wavelength longer than the excitation light beam are irradiated through a dielectric block toward an interface between the dielectric block and a metal film, to cause a first electric field enhancing field and a second electric field enhancing field on the upper surface of the metal film, in fluorescence detection that utilizes surface plasmon. The intensity of scattered light of the second electric field enhancing field, which is substantially proportionate to the intensity of the second electric field enhancing field, is employed to normalize and correct the intensity of fluorescence emitted by fluorescent labels with respect to the intensity of the first electric field enhancing field, based on the relationship between the intensities of the first and second electric field enhancing fields.
    Type: Grant
    Filed: March 31, 2009
    Date of Patent: September 27, 2011
    Assignee: FUJIFILM Corporation
    Inventor: Toshihito Kimura
  • Patent number: 7944563
    Abstract: The sensing apparatus includes a measuring light emission device, a waveguide member including a sensing surface modified by a surface modification substance, a detection device and an analyzer. The measuring light of a predetermined polarized state is emitted from the emission device so that the measuring light is totally reflected on the sensing surface of the waveguide member holding target substances labeled by fine metal particles to illuminate the particles by evanescent light generated near the sensing surface. The amount of evanescent light scattered by the fine metal particles is detected by the detection device. The measuring light emission device, the waveguide member and the analyzer are included in an optical waveguide system which sets a polarized state of scattered light generated when no target substance is present on the sensing surface in a crossed nicol relation to the analyzer.
    Type: Grant
    Filed: October 21, 2008
    Date of Patent: May 17, 2011
    Assignee: FUJIFILM Corporation
    Inventors: Kazuyoshi Horii, Toshihito Kimura
  • Patent number: 7885769
    Abstract: Reference data are subtracted from corresponding actual measurement data, and unprocessed binding quantity data, each of which represents a quantity of binding of a ligand and each of analytes, are thereby acquired. Calculation is made to find a relationship between the reference data and the unprocessed binding quantity data acquired in cases where the binding does not occur. In accordance with the relationship, variation components, which are contained in the unprocessed binding quantity data, are calculated. The variation components are subtracted from the corresponding unprocessed binding quantity data, and processed binding quantity data are thereby acquired. The processed binding quantity data are utilized for extracting an analyte capable of binding with the ligand.
    Type: Grant
    Filed: January 24, 2007
    Date of Patent: February 8, 2011
    Assignee: FUJIFILM Corporation
    Inventors: Toshihito Kimura, Hisashi Ohtsuka, Hiroaki Yamamoto
  • Patent number: 7830521
    Abstract: Provided are a detection apparatus, a detection method and an optically transparent member, which can detect a decrease in a precision. A convolution is performed by a convolution portion 80 contained in an image processing portion 38, to acquire the distribution information indicating the light intensity distribution of a light beam, which is totally reflected at the interface and which is incident at a plurality of angles to an dielectric block 52 so as to be totally reflected at the interface of the dielectric block 52. A spatial frequency resolution is performed on the light intensity distribution indicated by the distribution information acquired, by a detection precision evaluating portion 86 contained in the image processing portion 38, to thereby derive the light intensity distribution of each spatial frequency of the light beam. The precision is detected by comparing the light intensity distribution derived, with a threshold value predetermined for each spatial frequency.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: November 9, 2010
    Assignee: Fujifilm Corporation
    Inventors: Hiroaki Yamamoto, Toshihito Kimura, Hitoshi Shimizu, Masashi Hakamata
  • Patent number: 7812955
    Abstract: A light beam irradiating optical system is associated with a dielectric material member having a surface, on which a thin film layer has been formed, a sample being brought into contact with a surface of the thin film layer. The light beam irradiating optical system produces and irradiates a light beam to an interface between the dielectric material member and the thin film layer. The light beam is constituted of light beam components, which have various different incidence angles with respect to the interface, and which have intensities varying in accordance with the incidence angles. A single measuring detector for outputting a signal representing an intensity of an entire area of received light is secured and located so as to receive the light beam having been reflected from the interface.
    Type: Grant
    Filed: August 2, 2005
    Date of Patent: October 12, 2010
    Assignee: FUJIFILM Corporation
    Inventor: Toshihito Kimura
  • Publication number: 20100231915
    Abstract: A total reflection illuminated sensor chip is employed in a detecting method for detecting a detection target substance including the steps of: supplying a sample that includes the detection target substance onto a metal film formed on a surface of a dielectric prism, irradiating a measuring light beam onto the interface between the dielectric prism and the metal film such that conditions for total reflection are satisfied at the interface, and utilizing evanescent waves which are generated due to the irradiation of the measuring light beam to detect the detection target substance. Polishing streaks in the region of a metal film formation surface of the dielectric film, on which the metal film is formed, have directional properties with respect to a single direction.
    Type: Application
    Filed: March 10, 2010
    Publication date: September 16, 2010
    Inventor: Toshihito KIMURA
  • Publication number: 20100128274
    Abstract: A total reflection illuminated sensor chip is employed to detect a target substance, by: supplying a sample containing the target substance onto a detecting portion formed on a surface of a dielectric prism, irradiating a measuring light beam onto the interface between the prism and the detecting portion through a transmitting surface of the prism such that conditions for total reflection are satisfied, and utilizing evanescent waves generated at the detecting portion. The sensor chip includes a protective member for protecting the transmitting surface. The protective member is provided a predetermined distance away from the transmitting surface to form a transmitting space, which is open at least toward the downward direction. The sensor chip is configured such that the interface can be irradiated by the measuring light beam that enters the transmitting space from below the transmitting space and passes through the transmitting surface.
    Type: Application
    Filed: November 24, 2009
    Publication date: May 27, 2010
    Inventor: Toshihito KIMURA
  • Publication number: 20100068824
    Abstract: A sensing method comprises the steps of: allowing a liquid sample containing an analyte to flow through a channel, applying a force oriented in a given direction normal to a direction in which the liquid sample flows in the channel upon the analyte in a given position of the channel to move the analyte in the given direction so that the analyte is concentrated, causing the liquid sample to flow to a sensing surface forming a part of a wall surface of the channel located downstream of the given position and in the given direction against the channel, the sensing surface securing thereon a binding substance specifically reacting with the analyte, to allow the concentrated analyte to bind to the binding substance, and detecting a quantity of the analyte bound to the binding substance.
    Type: Application
    Filed: September 16, 2009
    Publication date: March 18, 2010
    Applicant: FUJIFILM CORPORATION
    Inventor: Toshihito KIMURA
  • Patent number: 7615759
    Abstract: After a sensor section has been dipped in a liquid sample, the sensor section is moved into a predetermined atmosphere, which is substantially free from occurrence of absorption or scattering of exciting light and fluorescence. In the state, in which the sensor section has been located in the predetermined atmosphere, exciting light is produced by a light source and is propagated through the interior of the sensor section. The exciting light is radiated out from an outside surface of the sensor section in order to excite a fluorescent substance for indicating the presence of a substance to be analyzed in the liquid sample. Fluorescence, which is produced by the fluorescent substance when the fluorescent substance is excited by the exciting light, is detected by a photodetector.
    Type: Grant
    Filed: January 11, 2008
    Date of Patent: November 10, 2009
    Assignee: FUJIFILM Corporation
    Inventors: Toshihito Kimura, Kiyoshi Fujimoto
  • Patent number: 7612349
    Abstract: Exciting light is irradiated through a dielectric material block toward an interface between the dielectric material block and a metal film formed on one surface of the dielectric material block, such that total reflection conditions may be satisfied. An intensity of analysis fluorescence produced by an analysis fluorescent substance, which is contained in a sample and produces the analysis fluorescence by being excited by an evanescent wave oozing out from the interface when the exciting light impinges upon the interface, is normalized in accordance with an intensity of reference fluorescence produced by a reference fluorescent substance, which has been located at a position for excitation by the exciting light.
    Type: Grant
    Filed: March 17, 2008
    Date of Patent: November 3, 2009
    Assignee: FUJIFILM Corporation
    Inventor: Toshihito Kimura
  • Publication number: 20090261269
    Abstract: A sensor chip includes a dielectric plate and a sensor portion having a metal layer deposited on a predetermined area on the dielectric plate. A photo-reactable labeling-substance of an amount corresponding to the amount of a substance to be detected in a sample binds to the sensor portion by contacting the sample with the sensor portion. The amount of the substance to be detected is obtained by irradiating the predetermined area with excitation light and by detecting light output from the photo-reactable labeling-substance in an enhanced electric field that has been generated on the metal layer by irradiation with the excitation light. The photo-reactable labeling-substance includes a photo-reactable substance enclosed by a light transmissive material that transmits light output from the photo-reactable substance to prevent metal quenching that occurs when the photo-reactable substance is located close to the metal layer.
    Type: Application
    Filed: April 17, 2009
    Publication date: October 22, 2009
    Applicant: FUJIFILM Corporation
    Inventors: Kazuyoshi HORII, Toshihito Kimura
  • Publication number: 20090242802
    Abstract: An excitation light beam of a wavelength that excites fluorescent labels and a reference light beam having a wavelength longer than the excitation light beam are irradiated through a dielectric block toward an interface between the dielectric block and a metal film, to cause a first electric field enhancing field and a second electric field enhancing field on the upper surface of the metal film, in fluorescence detection that utilizes surface plasmon. The intensity of scattered light of the second electric field enhancing field, which is substantially proportionate to the intensity of the second electric field enhancing field, is employed to normalize and correct the intensity of fluorescence emitted by fluorescent labels with respect to the intensity of the first electric field enhancing field, based on the relationship between the intensities of the first and second electric field enhancing fields.
    Type: Application
    Filed: March 31, 2009
    Publication date: October 1, 2009
    Applicant: FUJIFILM Corporation
    Inventor: Toshihito KIMURA
  • Publication number: 20090230308
    Abstract: Fluorescence detection utilizes surface plasmon. The intensity of scattered light, which is substantially proportionate to the intensity of an electric field enhancing field generated on a metal film, is employed, to normalize and correct the intensity of fluorescence emitted by fluorescent labels with respect to the intensity of the electric field enhancing field.
    Type: Application
    Filed: March 9, 2009
    Publication date: September 17, 2009
    Applicant: FUJIFILM Corporation
    Inventor: Toshihito KIMURA
  • Publication number: 20090218499
    Abstract: A sensing apparatus comprises: a prism; a metal film provided on a surface of the prism; a substrate that is provided on a surface of the prism and which has formed therein a channel for supplying a sample to the metal film; a light source for issuing light; an optical unit for incident light by which the light being issued from the light source is launched into the prism at such an angle that the light is totally reflected on a boundary surface between the prism and the metal film, the optical unit for incident light including a light intensity distribution adjusting section that reduces difference between the maximum and the minimum values in the intensity distribution of the light that is launched into the prism; and a light detecting unit for detecting the light that is generated in neighborhood of the metal film.
    Type: Application
    Filed: February 25, 2009
    Publication date: September 3, 2009
    Applicant: FUJIFILM Corporation
    Inventor: Toshihito KIMURA
  • Publication number: 20090218496
    Abstract: A sensing apparatus comprises: a prism; a metal film provided on a surface of the prism and which has provided on its surface a material that binds to an analyte; a substrate that is provided on a surface of the prism and which has formed therein a channel for supplying a liquid sample to the metal film; a light source for issuing light; an optical unit for incident light by which the light issued from the light source is launched into the prism at a specified angle; a light detecting unit for detecting as a first detection signal the light being generated in neighborhood of the metal film before the liquid sample is supplied and for detecting as a second detection signal the light being generated in neighborhood of the metal film that has become dry after the liquid sample is supplied; and an analyte detection unit for detecting the analyte contained in the liquid sample based on a difference between the first and the second detection signals detected by the light detecting unit.
    Type: Application
    Filed: February 24, 2009
    Publication date: September 3, 2009
    Applicant: FUJIFILM Corporation
    Inventor: Toshihito KIMURA
  • Publication number: 20090221089
    Abstract: A probe chip comprises: a prism; a metal film provided on a surface of the prism and which has provided on its surface a first binding material that binds to the analyte; and a channel substrate that is provided on a side of the prism and which has formed therein a channel for supplying the liquid sample to the metal film by causing the liquid material to travel from a beginning end portion to a terminal end portion, the channel being formed in such a way that a zone from a point between the beginning end portion and the metal film to a position of contact with the metal film separates into a first branch and a second branch that has an area where a second binding material that is labeled with the fluorescent material and which binds to the analyte is placed.
    Type: Application
    Filed: February 24, 2009
    Publication date: September 3, 2009
    Applicant: FUJIFILM CORPORATION
    Inventor: Toshihito KIMURA