Abstract: A measuring apparatus includes a sensor well unit having a plurality of sample wells, which are formed in a dielectric block and a thin film layer provided on the inner bottom surface of each sample well. A light beam projector causes a plurality of light beams to impinge upon the interfaces of the inner bottom surfaces of one-dimensionally arranged sample wells out of the plurality of sample wells and the thin film layers at various angles of incidence so that total internal reflection conditions are satisfied at each of the interfaces, and the light beams reflected at the respective interfaces are received by a photodetector. A longitudinal tilt measuring system measures a longitudinal tilt of the interface from a predetermined reference position, and a corrected measured value corrected according to the longitudinal tilt measured by the longitudinal tilt measuring system is obtained.

Abstract: An image of a light beam, which has been totally reflected from an interface between a dielectric material block and a thin film layer of an analysis chip for supporting a sample, is detected with photodetector and as a two-dimensional image constituted of pixels arrayed in a beam width direction and an incidence angle direction, which are perpendicular to each other. An abnormal pixel row, which contains a pixel represented by abnormal pixel data, is extracted from among pixel rows, each of which extends in the incidence angle direction, in the array of the pixels constituting the two-dimensional image and in accordance with an output of the photodetector. A position of a dark line in the light beam, which has been totally reflected from the interface, is detected from the pixel data corresponding to the pixel rows other than the abnormal pixel row.

Abstract: A surface plasmon resonance sensor includes a light source emitting a light beam, a metal film provided on one surface of the dielectric block of a sensor unit, a light beam projecting system which causes the light beam to enter the dielectric block to impinge upon the interface between said one surface of the dielectric block and the metal film so that total internal reflection conditions are satisfied at the interface, and a photodetector which detects the intensity of the light beam reflected in total internal reflection at the interface and detects a state of attenuation in total internal reflection. The relation ?2×10?5?(n3·?n1?n1·?n3)?2×10?5 is satisfied wherein n1 and n3 represent refractive indexes of the solvent of the sample liquid and the dielectric block, and ?n1 and ?n3 represent the rates of temperature-change of the refractive indexes of the solvent of the sample liquid and the dielectric block.

Abstract: A measuring plate for use in a sensor utilizing the phenomenon of attenuation in total internal reflection provides a dielectric block and a film layer and includes a dielectric plate provided with a plurality of recesses each provided with a film layer and holding a sample in contact with the film layer, and a reflecting optical system including a reflecting surface which is formed on the dielectric plate for each of the recesses to cause the light beam emitted from the light source to impinge upon the interface between the film layer of the recess and the dielectric plate and/or to cause the light beam reflected at the interface between the film layer of the recess and the dielectric plate to travel toward a predetermined position.

Abstract: A measuring apparatus is disclosed which includes a measuring unit equipped with a dielectric block and a thin film layer; an incidence system for making a light beam enter the dielectric block so that a condition for total internal reflection is satisfied at an interface between the dielectric block and the thin film layer; and a photodetector for receiving the light beam totally reflected at the interface. The measuring unit is measured a plurality of times, and a change in the state of attenuated total reflection during the plurality of measurements is detected. The sensor further includes a tilt measurement section for measuring the longitudinal tilt of the interface which changes the incidence angles during the plurality of measurements, and a calculating section for obtaining a measured value in which errors due to the longitudinal tilt have been corrected.

Abstract: A sensor unit includes a dielectric block, a thin film layer and a reference surface. The thin film layer is formed on the upper surface of the dielectric block and the reference surface is coplanar with the upper surface of the dielectric block. The sensor unit is held in a predetermined position. A light beam is caused to enter the dielectric block to impinge upon the interface between the upper surface of the dielectric block and the thin film layer so that total internal reflection conditions are satisfied at the interface. Information on an analyte on the thin film layer is obtained on the basis of the light beam reflected at the interface. Displacement of the interface is measured by measuring displacement of the reference surface and the position of the sensor unit is adjusted according to the displacement of the reference surface.

Abstract: A state of attenuation in total internal reflection is detected by the use of a measuring apparatus having a measuring unit and a reference unit and a measuring system which corrects result of detection by the measuring unit on the basis of result of detection by the reference unit and measures the change of a state of attenuation in total internal reflection on the basis of the corrected result of detection by the measuring unit. The difference in sensitivity between the measuring unit and the reference unit is detected before initiating the measurement of the change of a state of attenuation in total internal reflection, and result of measurement by the measuring system is calibrated on the basis of the difference in sensitivity between the measuring unit and the reference unit.

Abstract: A state of attenuation in total internal reflection is detected by the use of a measuring apparatus having a measuring unit and a reference unit and a measuring system which corrects result of detection by the measuring unit on the basis of result of detection by the reference unit and measures the change of a state of attenuation in total internal reflection on the basis of the corrected result of detection by the measuring unit. The difference in sensitivity between the measuring unit and the reference unit is detected before initiating the measurement of the change of a state of attenuation in total internal reflection, and result of measurement by the measuring system is calibrated on the basis of the difference in sensitivity between the measuring unit and the reference unit.

Abstract: An image information reading apparatus of the optical head scanning type is designed to maintain the light amount to be detected at an uniform level while an optical head shifts its scanning position. A sample 10 is irradiated with a laser beam L by an optical head 50 and fluorescence K emitted by the sample 10 is led to a PMT 40, wherein the fluorescence K proceeding toward the PMT 40 as a diverging beam is refracted by a collective lens 90 located in the optical path between the optical head 50 and the PMT 40 so that the beam of the fluorescence K enters the PMT 40 with a contracted beam diameter.

Abstract: Disclosed herein is a measuring apparatus utilizing attenuated total reflection. The measuring apparatus is equipped with a dielectric block, a thin film layer formed on one surface of the dielectric block, an optical system for making a light beam enter the dielectric block so that a condition for total internal reflection is satisfied at an interface between the dielectric block and the thin film layer, and a two-piece photodiode for detecting the light beam totally reflected at the interface. When attenuated total reflection is detected a plurality of times for a single sample, the two-piece photodiode is disposed at a predetermined position relative to a dark line when a first measurement is made. The two-piece photodiode is also disposed at the same position as the predetermined position stored in a storage unit when a second measurement and measurements thereafter are made.

Abstract: A test piece for use in biological analyses includes a plurality of different known specific binding substances disposed in predetermined positions on a substrate. The specific binding substances are disposed on a plurality of surfaces provided by the substrate and arranged in the direction of thickness of the substrate.

Abstract: A measuring plate for use in a sensor utilizing the phenomenon of attenuation in total internal reflection provides a dielectric block and a film layer and includes a dielectric plate provided with a plurality of recesses each provided with a film layer and holding a sample in contact with the film layer, and a reflecting optical system including a reflecting surface which is formed on the dielectric plate for each of the recesses to cause the light beam emitted from the light source to impinge upon the interface between the film layer of the recess and the dielectric plate and/or to cause the light beam reflected at the interface between the film layer of the recess and the dielectric plate to travel toward a predetermined position.

Abstract: An image reading apparatus includes a laser source, a stage on which an image carrier can be placed, a light detector for detecting light released from the image carrier, and an optical head for condensing the laser beam emitted from the laser source onto the image carrier and condensing light released from the image carrier to lead it to the light detector and being two-dimensionally movable parallel to the stage, and a perforated mirror formed with a hole at a center portion thereof, and fixed in a path of the laser beam so that the laser beam can pass through the hole and light released from the image carrier and condensed by the optical head can be reflected thereby in such a manner that a path of the light is branched off from the path of the laser beam.

Abstract: In a measuring method utilizing the phenomenon of attenuation in total internal reflection in which a light beam is caused to enter a dielectric block provided with a film layer to be brought into contact with a sample so that total internal reflection conditions are satisfied at the interface of the dielectric block and the film layer and various angles of incidence of the light beam to the interface of the dielectric block and the film layer can be obtained, and the intensity of the light beam reflected in total internal reflection at the interface is detected, the light beam is caused to intermittently impinge upon the dielectric block.

Abstract: A state of attenuation in total internal reflection is detected by the use of a measuring apparatus having a measuring unit and a reference unit and a measuring system which corrects result of detection by the measuring unit on the basis of result of detection by the reference unit and measures the change of a state of attenuation in total internal reflection on the basis of the corrected result of detection by the measuring unit. The difference in sensitivity between the measuring unit and the reference unit is detected before initiating the measurement of the change of a state of attenuation in total internal reflection, and result of measurement by the measuring system is calibrated on the basis of the difference in sensitivity between the measuring unit and the reference unit.

Abstract: An image reading apparatus includes a laser stimulating ray source for emitting a laser beam, a base made of transparent material and bearing thereon an image carrier which carries a fluorescence image formed by a fluorescent substance which can be excited and can release fluorescent light in response to irradiation by the laser beam, a laser beam scaner for upwardly scanning a bottom surface of the image carrier borne on the base with the laser beam emitted from the laser stimulating ray source through the base, a light detector provided below the base for photoelectrically detecting fluorescent light released from the image carrier, and an image carrier receiving portion provided on the base and containing a substance having a refractive index larger than that of air and closer to that of the image carrier than that of air, the substance filling gaps between the image carrier and the base.

Abstract: Disclosed herein is a measuring apparatus utilizing attenuated total reflection. The measuring apparatus is equipped with a dielectric block, a thin film layer formed on one surface of the dielectric block, an optical system for making a light beam enter the dielectric block so that a condition for total internal reflection is satisfied at an interface between the dielectric block and the thin film layer, and a two-piece photodiode for detecting the light beam totally reflected at the interface. When attenuated total reflection is detected a plurality of times for a single sample, the two-piece photodiode is disposed at a predetermined position relative to a dark line when a first measurement is made. The two-piece photodiode is also disposed at the same position as the predetermined position stored in a storage unit when a second measurement and measurements thereafter are made.

Abstract: Disclosed herein is a measuring apparatus equipped with a plurality of measuring units. Each measuring unit includes a dielectric block, a thin film layer formed on the dielectric block, and a sample holding mechanism for holding a sample on the thin film layer. The measuring apparatus is further equipped with an optical system for making a light beam enter the dielectric block at an angle of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer, and photodetectors for measuring the intensity of the light beam totally reflected at the interface. The optical system is constructed so that light beams simultaneously enter the dielectric blocks of the measuring units. The number of photodetectors corresponds to the number of the light beams.

Abstract: A measuring apparatus is disclosed which includes a measuring unit equipped with a dielectric block and a thin film layer; an incidence system for making a light beam enter the dielectric block so that a condition for total internal reflection is satisfied at an interface between the dielectric block and the thin film layer; and a photodetector for receiving the light beam totally reflected at the interface. The measuring unit is measured a plurality of times, and a change in the state of attenuated total reflection during the plurality of measurements is detected. The sensor further includes a tilt measurement section for measuring the longitudinal tilt of the interface which changes the incidence angles during the plurality of measurements, and a calculating section for obtaining a measured value in which errors due to the longitudinal tilt have been corrected.

Abstract: A test piece for use in biological analyses includes a plurality of different known specific binding substances disposed in predetermined positions on a substrate. The specific binding substances are disposed on a plurality of surfaces provided by the substrate and arranged in the direction of thickness of the substrate.