Patents by Inventor Toshinori Yoshimuta
Toshinori Yoshimuta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10980501Abstract: The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.Type: GrantFiled: April 20, 2018Date of Patent: April 20, 2021Assignee: Shimadzu CorporationInventors: Koichi Tanabe, Kenji Kimura, Toshinori Yoshimuta, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba, Naoki Morimoto
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Patent number: 10859512Abstract: Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period.Type: GrantFiled: March 15, 2017Date of Patent: December 8, 2020Assignee: Shimadzu CorporationInventors: Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Yukihisa Wada, Takuro Izumi, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba
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Patent number: 10772592Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.Type: GrantFiled: July 10, 2017Date of Patent: September 15, 2020Assignees: Shimadzu Corporation, OSAKA UNIVERSITYInventors: Satoshi Sano, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Yukihisa Wada, Takuro Izumi, Taro Shirai, Takahiro Doki, Akira Horiba, Takayoshi Shimura, Heiji Watanabe, Takuji Hosoi
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Patent number: 10729398Abstract: An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit and an arrangement pitch of phase shift sections related to a phase grating. A positional relationship among the multi-slit 3b, the phase grating, and an FPD is determined based on the arrangement pitch of the slits related to the multi-slit, the arrangement pitch of the phase shift sections related to the phase grating, and an arrangement pitch of detection elements related to the FPD. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections, the present invention can change the positional relationship among the multi-slit, the phase grating, and the FPD.Type: GrantFiled: July 28, 2017Date of Patent: August 4, 2020Assignees: Shimadzu Corporation, Osaka UniversityInventors: Satoshi Sano, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Yukihisa Wada, Takuro Izumi, Taro Shirai, Takahiro Doki, Akira Horiba, Takayoshi Shimura, Heiji Watanabe, Takuji Hosoi
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Patent number: 10732132Abstract: [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration [SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.Type: GrantFiled: February 22, 2017Date of Patent: August 4, 2020Assignees: Shimadzu Corporation, OSAKA UNIVERSITYInventors: Takahiro Doki, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Akihiro Nishimura, Taro Shirai, Satoshi Sano, Akira Horiba, Takayoshi Shimura, Heiji Watanabe, Takuji Hosoi
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Publication number: 20200158662Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).Type: ApplicationFiled: July 10, 2017Publication date: May 21, 2020Inventors: Akira HORIBA, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
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Patent number: 10643760Abstract: The method of producing this diffraction grating includes a step of generating a moire by a periodic pattern projected onto a plurality of unit diffraction gratings and a plurality of unit diffraction gratings, and a step of adjusting so that the extending directions of the gratings are aligned by relatively rotating at least one of a plurality of unit diffractions with respect to at least one of the others of the plurality of unit diffractions.Type: GrantFiled: February 7, 2018Date of Patent: May 5, 2020Assignee: Shimadzu CorporationInventors: Takahiro Doki, Yukihisa Wada, Satoshi Tokuda, Nobukazu Hayashi, Toshinori Yoshimuta
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Publication number: 20190343472Abstract: An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit and an arrangement pitch of phase shift sections related to a phase grating. A positional relationship among the multi-slit 3b, the phase grating, and an FPD is determined based on the arrangement pitch of the slits related to the multi-slit, the arrangement pitch of the phase shift sections related to the phase grating, and an arrangement pitch of detection elements related to the FPD. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections, the present invention can change the positional relationship among the multi-slit, the phase grating, and the FPD.Type: ApplicationFiled: July 28, 2017Publication date: November 14, 2019Inventors: Satoshi SANO, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
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Patent number: 10468365Abstract: In a method for manufacturing a radiation detector, counter pixel electrodes 33 are formed on a counter substrate 2 at positions facing a plurality of pixel electrodes formed on a signal reading substrate, and wall bump electrodes 34 are further formed on the counter pixel electrodes 33. In order to achieve the above, a resist R is applied, and the resist R is exposed to light to form openings O. When Au sputter deposition is performed on the openings O, only some of the Au is deposited on the bottom surface in the openings O as the counter pixel electrodes 33. The rest of the Au is not deposited on the bottom surface in the openings O, and the most of the remaining Au adheres to the inner walls of the openings O to form wall bump electrodes 34. The bump electrodes 34 are cylindrical, making it possible to reduce the pressure acting on the signal reading substrate by an extent corresponding to the decrease in the bonding area in comparison to conventional bump-shaped bump electrodes.Type: GrantFiled: November 12, 2015Date of Patent: November 5, 2019Assignees: SHIMADZU CORPORATION, TOHOKU-MICROTEC CO., LTD.Inventors: Hiroyuki Kishihara, Toshinori Yoshimuta, Satoshi Tokuda, Yukihisa Wada, Makoto Motoyoshi
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Patent number: 10393890Abstract: In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.Type: GrantFiled: March 1, 2016Date of Patent: August 27, 2019Assignee: SHIMADZU CORPORATIONInventors: Koichi Tanabe, Shingo Furui, Toshinori Yoshimuta, Kenji Kimura, Akihiro Nishimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba, Toshiyuki Sato
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Patent number: 10335109Abstract: Provided is a radiation phase difference imaging apparatus in which a separation distance between a phase grating and a radiation detector is optimized. The separation distance between the phase grating and a detection surface of an FPD is determined based on the magnitude of noise corruption in a self-image projected onto the detection surface. The magnitude of the effect of the noise is used as a basis for assessing the separation distance. It is determined whether a distance Zd is appropriate for imaging, based on the magnitude of noise corruption in the self-image in a self-image picture which is obtained when the distance Zd is the distance between the phase grating and the detection surface of the FPD. The separation distance can thus be optimized based on actual conditions of an actual X-ray source that emits a plurality of types of X-rays.Type: GrantFiled: March 6, 2015Date of Patent: July 2, 2019Assignee: Shimadzu CorporationInventors: Satoshi Sano, Toshiyuki Sato, Koichi Tanabe, Shingo Furui, Toshinori Yoshimuta, Hiroyuki Kishihara, Takahiro Doki, Akira Horiba
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Publication number: 20190175126Abstract: Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period.Type: ApplicationFiled: March 15, 2017Publication date: June 13, 2019Inventors: Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Akira HORIBA
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Publication number: 20190167219Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.Type: ApplicationFiled: July 10, 2017Publication date: June 6, 2019Inventors: Satoshi SANO, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
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Patent number: 10295678Abstract: A X-ray detector having enhanced X-ray sensitivity, which enables dual energy imaging having high diagnostic performance. This X-ray detector includes: scintillator elements which are partitioned by light blocking walls and which convert low-energy X-rays to light; and scintillator elements which are partitioned by light blocking walls and which convert high-energy X-rays to light. When seen from the direction of incidence of the X-rays, the positional pattern of the light blocking walls and that of the light blocking walls are configured so as not to be in alignment with each other. Accordingly, the X-rays incident on the X-ray detector are converted to light by at least either one of the scintillator elements and are finally outputted as X-ray detection signals.Type: GrantFiled: January 26, 2016Date of Patent: May 21, 2019Assignee: Shimadzu CorporationInventors: Koichi Tanabe, Shingo Furui, Toshinori Yoshimuta, Kenji Kimura, Akihiro Nishimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba, Toshiyuki Sato
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Patent number: 10276276Abstract: A movable collimator is realized with a simple mechanism in a radiation phase-contrast image capturing device. A collimator is integrated with a multi-slit or a phase grating to provide a simpler device configuration. In some examples, the collimator and the multi-slit or phase grating may be configured to move while still providing image capturing.Type: GrantFiled: January 26, 2018Date of Patent: April 30, 2019Assignee: Shimadzu CorporationInventors: Akira Horiba, Shingo Furui, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Takahiro Doki, Satoshi Sano
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Patent number: 10254417Abstract: In a radiation detector, a Schottky electrode is formed such that an interdiffusion coefficient between the material of an outermost surface electrode formed on the Schottky electrode and the material of the Schottky electrode is smaller than an interdiffusion coefficient between the material of the outermost surface electrode and Al (aluminum). Consequently, the material of the outermost surface electrode does not diffuse into the Schottky electrode, and Schottky functions can be maintained, and at the same time, the material of the Schottky electrode does not diffuse into the outermost surface electrode, and the outermost surface electrode can be prevented from alloying.Type: GrantFiled: November 19, 2015Date of Patent: April 9, 2019Assignee: Shimadzu CorporationInventors: Satoshi Tokuda, Toshinori Yoshimuta, Hiroyuki Kishihara, Yukihisa Wada
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Publication number: 20190056336Abstract: [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration [SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.Type: ApplicationFiled: February 22, 2017Publication date: February 21, 2019Applicants: SHIMADZU CORPORATION, OSAKA UNIVERSITYInventors: Takahiro DOKI, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Akihiro NISHIMURA, Taro SHIRAI, Satoshi SANO, Akira HORIBA, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
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Publication number: 20180329081Abstract: In a radiation detector, a Schottky electrode is formed such that an interdiffusion coefficient between the material of an outermost surface electrode formed on the Schottky electrode and the material of the Schottky electrode is smaller than an interdiffusion coefficient between the material of the outermost surface electrode and Al (aluminum). Consequently, the material of the outermost surface electrode does not diffuse into the Schottky electrode, and Schottky functions can be maintained, and at the same time, the material of the Schottky electrode does not diffuse into the outermost surface electrode, and the outermost surface electrode can be prevented from alloying.Type: ApplicationFiled: November 19, 2015Publication date: November 15, 2018Applicant: Shimadzu CorporationInventors: Satoshi TOKUDA, Toshinori YOSHIMUTA, Hiroyuki KISHIHARA, Yukihisa WADA
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Publication number: 20180331060Abstract: In a method for manufacturing a radiation detector, counter pixel electrodes 33 are formed on a counter substrate 2 at positions facing a plurality of pixel electrodes formed on a signal reading substrate, and wall bump electrodes 34 are further formed on the counter pixel electrodes 33. In order to achieve the above, a resist R is applied, and the resist R is exposed to light to form openings O. When Au sputter deposition is performed on the openings O, only some of the Au is deposited on the bottom surface in the openings O as the counter pixel electrodes 33. The rest of the Au is not deposited on the bottom surface in the openings O, and the most of the remaining Au adheres to the inner walls of the openings O to form wall bump electrodes 34. The bump electrodes 34 are cylindrical, making it possible to reduce the pressure acting on the signal reading substrate by an extent corresponding to the decrease in the bonding area in comparison to conventional bump-shaped bump electrodes.Type: ApplicationFiled: November 12, 2015Publication date: November 15, 2018Inventors: Hiroyuki KISHIHARA, Toshinori YOSHIMUTA, Satoshi TOKUDA, Yukihisa WADA, Makoto MOTOYOSHI
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Publication number: 20180306735Abstract: The X-ray phase imaging apparatus includes a position switching mechanism for switching a relative position of one or more gratings between a retreated position which is an outside of a detection range on a detection surface of an image signal detector and a detection positon which is an inside of the detection range on the detection surface of the image signal detector and a focal diameter changing unit configured to change a focal diameter of the X-ray source in conjunction with switching of the relative position of the one or more gratings.Type: ApplicationFiled: April 20, 2018Publication date: October 25, 2018Inventors: Koichi TANABE, Kenji KIMURA, Toshinori YOSHIMUTA, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Akira HORIBA, Naoki MORIMOTO