Abstract: A memory cell of a magnetic memory device has an MTJ element and one end of the memory cell is selectively electrically connected to a ground potential line. A first bit line is electrically connected to the other end of the memory cell. A sense amplifier amplifies a difference in potential between the first bit line and a second bit line complementary to the first bit line so that the difference is equal to or larger than a difference between an internal power potential and a ground potential. A connection circuit disconnects the MTJ element from an electric connection between the ground potential line and the sense amplifier.

Abstract: A magnetic memory device includes first to n-th MTJ devices recording data and first to n-th transistors connected to the first to n-th MTJ devices, respectively. The word line generates a magnetic field to be applied to the first to n-th MTJ devices during a write operation. A read word line is connected to gates of the first to n-th transistors and applies a voltage for turning on the first to n-th transistors during a read operation. A first word line driver is connected to a first end or a second end of the write word line and drives the write word line. A second word line driver is connected to a first end of the read word line and drives the read word line. A second switching circuit selectively connects the second end of the read word line and the second end of the write word line.

Abstract: In an MRAM, a plurality of magnetic memory cells are arranges in rows and columns. Each of the plurality of magnetic memory cells is a magnetoresistive element having a tunnel magnetoresistive effect. Each of the plurality of magnetic memory cells includes two magnetoresistive elements that hold data items of opposite logic levels to each other and are connected in series.

Abstract: A plurality of cell arrays is provided with a plurality of word lines and bit line pairs. A plurality of sense amplifiers is connected so as to each of the plurality of bit line pairs. The plurality of sense amplifiers configures a memory core section together with the plurality of cell arrays. A pair of bit line kicker drive lines is arranged in the vicinity of the plurality of cell arrays, and a pair of bit line kickers is connected between the pair of bit line kicker drive lines and each of the plurality of bit line pairs. In the memory core section, a pair of drivers is arranged so as to correspond to each cell array, and each of the pair of drivers has an output node connected to the pair of bit line kicker drive lines. The pair of drivers drives the pair of bit line kicker drive lines so as to change a potential of one bit line of one of the plurality of bit line pairs via the pair of bit line kickers.

Abstract: A magnetic memory device includes first to n-th MTJ devices recording data and first to n-th transistors connected to the first to n-th MTJ devices, respectively. The word line generates a magnetic field to be applied to the first to n-th MTJ devices during a write operation. A read word line is connected to gates of the first to n-th transistors and applies a voltage for turning on the first to n-th transistors during a read operation. A first word line driver is connected to a first end or a second end of the write word line and drives the write word line. A second word line driver is connected to a first end of the read word line and drives the read word line. A second switching circuit selectively connects the second end of the read word line and the second end of the write word line.

Abstract: A magnetic memory device includes first to n-th MTJ devices recording data and first to n-th transistors connected to the first to n-th MTJ devices, respectively. The word line generates a magnetic field to be applied to the first to n-th MTJ devices during a write operation. A read word line is connected to gates of the first to n-th transistors and applies a voltage for turning on the first to n-th transistors during a read operation. A first word line driver is connected to a first end or a second end of the write word line and drives the write word line. A second word line driver is connected to a first end of the read word line and drives the read word line. A second switching circuit selectively connects the second end of the read word line and the second end of the write word line.

Abstract: In an MRAM, a plurality of magnetic memory cells are arranges in rows and columns. Each of the plurality of magnetic memory cells is a magnetoresistive element having a tunnel magnetoresistive effect. Each of the plurality of magnetic memory cells includes two magnetoresistive elements that hold data items of opposite logic levels to each other and are connected in series.

Abstract: After data readout, in equalizing a complementary pair of bit lines one of which has been overdriven with an overdrive voltage, excessive charges on the overdriven bit line are discharged by a discharge circuit. By adjusting the discharge period of the discharge circuit, the potential to which the bit lines are equalized is adjusted.

Abstract: A first delay line for forward pulses and a second delay line for backward pulses are composed of unit delay elements. A state holding section determines the input position of a backward pulse on the second delay line according to the transfer position of a forward pulse transferred along the first delay line. In the unit delay elements constituting the first and second delay lines, the accuracy of synchronization can be improved by increasing the current driving capability of the transistors related to the rising of the pulse signal.

Abstract: A semiconductor memory device is disclosed, in which a first word drive line control circuit which supplies a word drive voltage corresponding to the decode output of the decoding circuit to the first word drive line, and has a first reset circuit which resets the first word drive line to a first potential when a first control signal is activated and a second reset circuit which resets the first word drive line to a second potential when a second control signal is activated, and a two-stage reset control circuit which controls changeover from the activated state of the first control signal to the activated state of the second control signal on the basis of the potential of the first word drive line to change the potential of the first word drive line in two stages.

Abstract: One (first level shift circuit) of first and second level shift circuits is provided in a local word-drive-line driving circuit located near memory cell arrays. The second level shift circuit is provided in a global word-drive-line driving circuit located remote from the memory cell arrays.

Abstract: After data readout, in equalizing a complementary pair of bit lines one of which has been overdriven with an overdrive voltage, excessive charges on the overdriven bit line are discharged by a discharge circuit. By adjusting the discharge period of the discharge circuit, the potential to which the bit lines are equalized is adjusted.

Abstract: A plurality of cell arrays is provided with a plurality of word lines and bit line pairs. A plurality of sense amplifiers is connected so as to each of the plurality of bit line pairs. The plurality of sense amplifiers configures a memory core section together with the plurality of cell arrays. A pair of bit line kicker drive lines is arranged in the vicinity of the plurality of cell arrays, and a pair of bit line kickers is connected between the pair of bit line kicker drive lines and each of the plurality of bit line pairs. In the memory core section, a pair of drivers is arranged so as to correspond to each cell array, and each of the pair of drivers has an output node connected to the pair of bit line kicker drive lines. The pair of drivers drives the pair of bit line kicker drive lines so as to change a potential of one bit line of one of the plurality of bit line pairs via the pair of bit line kickers.

Abstract: A semiconductor memory device is disclosed, in which a first word drive line control circuit which supplies a word drive voltage corresponding to the decode output of the decoding circuit to the first word drive line, and has a first reset circuit which resets the first word drive line to a first potential when a first control signal is activated and a second reset circuit which resets the first word drive line to a second potential when a second control signal is activated, and a two-stage reset control circuit which controls changeover from the activated state of the first control signal to the activated state of the second control signal on the basis of the potential of the first word drive line to change the potential of the first word drive line in two stages.

Abstract: One (first level shift circuit) of first and second level shift circuits is provided in a local word-drive-line driving circuit located near memory cell arrays. The second level shift circuit is provided in a global word-drive-line driving circuit located remote from the memory cell arrays.

Abstract: A semiconductor memory device has a segment type word line structure and comprises a plurality of main word lines and a plurality of sub word lines which are arranged at different levels. The semiconductor memory device is provided with a memory cell array divided into a plurality of cell array blocks. A plurality of sub row decoder areas, each for selecting one of the sub word lines, are defined between the cell array blocks. A plurality of first metal wiring lines formed by use of the same wiring layer as the main word lines are provided. The first metal wiring lines pass across the sub row decoder areas and the cell array blocks.

Abstract: There is provided a semiconductor memory device which comprises a plurality of memory cells, a plurality of bit lines connected with the plurality of memory cells, a plurality of word lines connected with the plurality of memory cells, a plurality of data line pairs, a plurality of transfer gates for effecting controlled connection of the plurality of bit lines with the plurality of data lines, a plurality of column select lines for controlling conductibility of the plurality of the transfer gates, and a column select line drive circuit for simultaneously selecting and driving at least two of the plurality of column select lines corresponding to one-time column address input from the outside of the chip.

Abstract: A first delay line for forward pulses and a second delay line for backward pulses are composed of unit delay elements. A state holding section determines the input position of a backward pulse on the second delay line according to the transfer position of a forward pulse transferred along the first delay line. In the unit delay elements constituting the first and second delay lines, the accuracy of synchronization can be improved by increasing the current driving capability of the transistors related to the rising of the pulse signal.

Abstract: A first delay line for forward pulses and a second delay line for backward pulses are composed of unit delay elements. A state holding section determines the input position of a backward pulse on the second delay line according to the transfer position of a forward pulse transferred along the first delay line. In the unit delay elements constituting the first and second delay lines, the accuracy of synchronization can be improved by increasing the current driving capability of the transistors related to the rising of the pulse signal.

Abstract: A semiconductor memory device has a segment type word line structure and comprises a plurality of main word lines and a plurality of sub word lines which are arranged at different levels. The semiconductor memory device is provided with a memory cell array divided into a plurality of cell array blocks. A plurality of sub row decoder areas, each for selecting one of the sub word lines, are defined between the cell array blocks. A plurality of first metal wiring lines formed by use of the same wiring layer as the main word lines are provided. The first metal wiring lines pass across the sub row decoder areas and the cell array blocks.