Abstract: Creating by a computer an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In accordance with aspects of the present disclosure, a computer-implemented method for statistical static timing analysis of an integrated circuit is provided. The method may comprise identifying a timing parameter that contributes to a delay calculation. The method may further comprise determining, by a processing device, whether the identified timing parameter significantly impacts the delay calculation. The method may also comprise, responsive to determining that the identified timing parameter does not significantly impact the delay calculation, avoiding a sensitivity calculation for the identified timing parameter.

Abstract: A first plurality of relational tables is obtained from a relational database. Each table of the first plurality of relational tables stores connectivity information for a graph that comprises a plurality of nodes and a plurality of edges connecting the nodes, and each of the nodes is assigned an initial identifier. The nodes are clustered into a plurality of clusters. Each cluster contains a subset of the nodes, and all nodes in each subset are close to each other according to a metric. Each node is assigned a new identifier. The new identifier comprises a concatenation of an identifier associated with the cluster to which the node belongs and an identifier associated with the node. A second plurality of relational tables is constructed and stores connectivity information for the graph. The node is identified in the second plurality of relational tables by the new identifier.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In accordance with aspects of the present disclosure, a computer-implemented method for statistical static timing analysis of an integrated circuit is provided. The method may comprise identifying a timing parameter that contributes to a delay calculation. The method may further comprise determining, by a processing device, whether the identified timing parameter significantly impacts the delay calculation. The method may also comprise, responsive to determining that the identified timing parameter does not significantly impact the delay calculation, avoiding a sensitivity calculation for the identified timing parameter.

Abstract: A first plurality of relational tables is obtained from a relational database. Each table of the first plurality of relational tables stores connectivity information for a graph that comprises a plurality of nodes and a plurality of edges connecting the nodes, and each of the nodes is assigned an initial identifier. The nodes are clustered into a plurality of clusters. Each cluster contains a subset of the nodes, and all nodes in each subset are close to each other according to a metric. Each node is assigned a new identifier. The new identifier comprises a concatenation of an identifier associated with the cluster to which the node belongs and an identifier associated with the node. A second plurality of relational tables is constructed and stores connectivity information for the graph. The node is identified in the second plurality of relational tables by the new identifier.

Abstract: Creating an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: Creating an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: Creating an integrated circuit with non-linear variations, the computer identifies an integrated circuit design; identifies a timing model associated with the identified integrated circuit design; defines one or more static single sided variables; defines one or more regions of one or more of the defined one or more static single sided variables that are treated linearly; defines one or more multi-sided variables based on the defined one or more regions of the one or more of the defined one or more static single sided variables; identifies one or more timing paths within the identified integrated circuit design; performs a statistical static timing analysis on the identified timing model for the identified one or more timing paths within the identified integrated circuit design utilizing the defined one or more multi-sided variables; provides one or more timing quantities that project within a multi-parameter space based on the performed statistical static timing analysis.

Abstract: Statistically modeling timing in a digital circuit through the use of canonical form models, where some terms of the form represent sources of variation sensitive to only a subset of timing regions of the circuit. When propagating the form through regions through which some set of terms in the model is not sensitive, those terms are collapsed by placing them in a cache and replacing them in the form with a single combined term that references the cached terms.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In one example according to aspects of the present disclosure, a computer-implemented method is provided. The method comprises performing an initial statistical static timing analysis of the integrated circuit to create a parameterized model of the integrated circuit for a plurality of paths using a plurality of timing corners to calculate a timing value for each of the plurality of paths, each of the plurality of timing corners representing a set of timing performance parameters. The method further comprises determining at least one worst timing corner from the parameterized model for each of the plurality of paths based on the initial statistical static timing analysis and calculated timing value for each of the plurality of paths. The method also comprises performing a subsequent analysis of the integrated circuit using the at least one worst timing corner.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In accordance with aspects of the present disclosure, a computer-implemented method for statistical static timing analysis of an integrated circuit is provided. The method may comprise identifying a timing parameter that contributes to a delay calculation. The method may further comprise determining, by a processing device, whether the identified timing parameter significantly impacts the delay calculation. The method may also comprise, responsive to determining that the identified timing parameter does not significantly impact the delay calculation, avoiding a sensitivity calculation for the identified timing parameter.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In one example according to aspects of the present disclosure, a computer-implemented method is provided. The method comprises performing an initial statistical static timing analysis of the integrated circuit to create a parameterized model of the integrated circuit for a plurality of paths using a plurality of timing corners to calculate a timing value for each of the plurality of paths, each of the plurality of timing corners representing a set of timing performance parameters. The method further comprises determining at least one worst timing corner from the parameterized model for each of the plurality of paths based on the initial statistical static timing analysis and calculated timing value for each of the plurality of paths. The method also comprises performing a subsequent analysis of the integrated circuit using the at least one worst timing corner.

Abstract: A method, system, and computer program product to characterize and adaptively instantiate timing abstracts to perform timing analysis of an integrated circuit include generating an adaptable timing abstract for one or more macro models of a macro, the macro including two or more primitives of a component of the integrated circuit, the adaptable timing abstract being a parameterized timing model with at least one aspect represented by two or more models, and estimating requirements for the timing analysis, the requirements including accuracy, runtime, or memory requirements. Selecting a specific timing abstract, obtained by setting parameters of the adaptable timing abstract, is to perform the timing analysis based on the requirements.

Abstract: Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings.

Abstract: Methods for improving matrix multiplication runtimes are provided. A method includes determining, by a GPU, optimal partitions for matrix-by-matrix multiplication of two factor matrices having sizes known a priori. The determining step includes performing offline a plurality of matrix-by-matrix multiplication executions, each for a respective different combination of two-way partitions across a plurality of partition sizes. The determining step further includes determining offline a respective performance number for each of the executions based on runtime. The determining step also includes recursively repeating offline said performing and determining steps until the respective performance number ceases to improve for best-performing combinations of the two-way partitions and saving the best performing combinations of the two-way partitions as the optimal partitions.

Abstract: A method, system, and computer program product to perform parallel multi-threaded common path pessimism removal in integrated circuit design include constructing, using a processor, a thread-specific graphical representation (TSGR) relating to each data node and clock node pair and performing processes in parallel for each TSGR. The processes include determining initial arrival times at the data node and the clock node, computing initial test slack based on the initial arrival times at the data node and the clock node, identifying fan-out nodes among the additional nodes, each fan-out node being an origin of at least two of the edges in the two or more paths to the clock node, generating one or more tags based the fan-out nodes, determining adjusted arrival times based on the one or more tags, and computing adjusted test slack based on the adjusted arrival times.

Abstract: System and methods for achieving a timing closure in a design of an integrated circuit in presence of manufacturing variation. The method includes running a timing engine of a statistical timing analysis tool performing at least one optimization to fix at least one violation of at least one timing quantity at an integrated circuit location. The method includes choosing at least one optimization to apply and finding at least one failing timing quantity, where the quantity is failing due to at least one source of variability which the optimization would impact. The optimization is applied to at least one section of the path leading to the failing timing quantity, where the section contributes to the source of variability. Statistical sensitivity information in canonical form guides the optimization by providing a fully parameterized canonical form of the identified timing violations.

Abstract: A method of performing variation aware timing analysis for an integrated circuit, a system, and a computer program product are described. The method includes determining one or more voltage waveforms at an output of a first component of the integrated circuit based on respective one or more first processing conditions, and storing waveform information based on the one or more voltage waveforms. The method also includes obtaining an input voltage waveform at an input of a second component of the integrated circuit for a second processing condition based on processing the waveform information, the output of the first component being the input of the second component, and performing the variation aware timing analysis for the second component based on the input voltage waveform.

Abstract: Examples of techniques for statistical static timing analysis of an integrated circuit are disclosed. In accordance with aspects of the present disclosure, a computer-implemented method for statistical static timing analysis of an integrated circuit is provided. The method may comprise identifying a timing parameter that contributes to a delay calculation. The method may further comprise determining, by a processing device, whether the identified timing parameter significantly impacts the delay calculation. The method may also comprise, responsive to determining that the identified timing parameter does not significantly impact the delay calculation, avoiding a sensitivity calculation for the identified timing parameter.

Abstract: A method, system, and computer program product to characterize and adaptively instantiate timing abstracts to perform timing analysis of an integrated circuit include generating an adaptable timing abstract for one or more macro models of a macro, the macro including two or more primitives of a component of the integrated circuit, the adaptable timing abstract being a parameterized timing model with at least one aspect represented by two or more models, and estimating requirements for the timing analysis, the requirements including accuracy, runtime, or memory requirements. Selecting a specific timing abstract, obtained by setting parameters of the adaptable timing abstract, is to perform the timing analysis based on the requirements.